JP2005181325A5 - - Google Patents
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- Publication number
- JP2005181325A5 JP2005181325A5 JP2004364984A JP2004364984A JP2005181325A5 JP 2005181325 A5 JP2005181325 A5 JP 2005181325A5 JP 2004364984 A JP2004364984 A JP 2004364984A JP 2004364984 A JP2004364984 A JP 2004364984A JP 2005181325 A5 JP2005181325 A5 JP 2005181325A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/737,716 | 2003-12-16 | ||
| US10/737,716 US7136773B2 (en) | 2003-12-16 | 2003-12-16 | Testing apparatus and testing method |
| US10/824,763 | 2004-04-14 | ||
| US10/824,763 US7397847B2 (en) | 2003-12-16 | 2004-04-14 | Testing device for testing electronic device and testing method thereof |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005181325A JP2005181325A (ja) | 2005-07-07 |
| JP2005181325A5 true JP2005181325A5 (ru) | 2011-02-03 |
| JP5170939B2 JP5170939B2 (ja) | 2013-03-27 |
Family
ID=34798985
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004364984A Expired - Fee Related JP5170939B2 (ja) | 2003-12-16 | 2004-12-16 | 試験装置、及び試験方法 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP5170939B2 (ru) |
| DE (1) | DE102004061510A1 (ru) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7313496B2 (en) * | 2005-02-11 | 2007-12-25 | Advantest Corporation | Test apparatus and test method for testing a device under test |
| JP4895551B2 (ja) * | 2005-08-10 | 2012-03-14 | 株式会社アドバンテスト | 試験装置および試験方法 |
| US7596173B2 (en) * | 2005-10-28 | 2009-09-29 | Advantest Corporation | Test apparatus, clock generator and electronic device |
| US8744798B2 (en) * | 2007-06-12 | 2014-06-03 | Tektronix International Sales Gmbh | Signal generator and user interface for adding amplitude noise to selected portions of a test signal |
| US8090009B2 (en) * | 2007-08-07 | 2012-01-03 | Advantest Corporation | Test apparatus |
| US7808252B2 (en) * | 2007-12-13 | 2010-10-05 | Advantest Corporation | Measurement apparatus and measurement method |
| JP2010169504A (ja) | 2009-01-22 | 2010-08-05 | Anritsu Corp | ジッタ伝達特性測定装置 |
| JP7481881B2 (ja) | 2020-03-31 | 2024-05-13 | 日本放送協会 | ジッタ発生装置 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0850156A (ja) * | 1994-08-05 | 1996-02-20 | Anritsu Corp | ジッタ耐力測定装置 |
| US5793822A (en) * | 1995-10-16 | 1998-08-11 | Symbios, Inc. | Bist jitter tolerance measurement technique |
| JP3857011B2 (ja) * | 2000-02-29 | 2006-12-13 | アンリツ株式会社 | ディジタルハイパスフィルタおよびディジタルハイパスフィルタを用いたジッタ測定器 |
| WO2003007578A1 (fr) * | 2001-07-13 | 2003-01-23 | Anritsu Corporation | Instrument de mesure de la resistance a la gigue et procede permettant une mesure efficace et une evaluation adequate de la caracteristique de resistance a la gigue. |
| WO2003067273A1 (fr) * | 2002-02-06 | 2003-08-14 | Fujitsu Limited | Procede de diagnostic de tolerance de gigue, et dispositif correspondant |
| DE10392318T5 (de) * | 2002-02-26 | 2005-07-07 | Advantest Corp. | Messvorrichtung und Messverfahren |
| US7054358B2 (en) * | 2002-04-29 | 2006-05-30 | Advantest Corporation | Measuring apparatus and measuring method |
-
2004
- 2004-12-16 DE DE200410061510 patent/DE102004061510A1/de not_active Withdrawn
- 2004-12-16 JP JP2004364984A patent/JP5170939B2/ja not_active Expired - Fee Related