JP2005164497A - Component mounting substrate inspection device equipped with mean value acquisition function of reference value - Google Patents

Component mounting substrate inspection device equipped with mean value acquisition function of reference value Download PDF

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JP2005164497A
JP2005164497A JP2003406485A JP2003406485A JP2005164497A JP 2005164497 A JP2005164497 A JP 2005164497A JP 2003406485 A JP2003406485 A JP 2003406485A JP 2003406485 A JP2003406485 A JP 2003406485A JP 2005164497 A JP2005164497 A JP 2005164497A
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component mounting
inspection
average value
mounting board
reference value
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Hiroshi Yamazaki
洋 山崎
Hiroshi Otsuki
博 大槻
Yutaka Igarashi
豊 五十嵐
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Sony Corp
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Sony Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a component mounting substrate inspection device equipped with a mean value acquisition function of a reference value capable of improving remarkably accuracy of a determination result of inspection of the component mounting substrate. <P>SOLUTION: This component mounting substrate inspection device equipped with the mean value acquisition function has a mean value calculation function for storing numerical data of thresholds in image data acquired by solder print inspection such as a solder print area, a solder print width or a solder print position after printing the solder on electric circuit patterns on a plurality of component mounting substrates, and determining the mean value thereof. A reference value calculated by the mean value calculation function is used for actual inspection of the component mounting substrate thereafter. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

本発明は、部品実装基板上の半田印刷後の半田の印刷面積、半田の印刷幅、半田の印刷位置などを精密に検査するための基準値の平均値取得機能を備えた部品実装基板検査装置に関するものである。   The present invention relates to a component mounting board inspection apparatus having a reference value average value acquisition function for accurately inspecting a solder printing area, a solder printing width, a solder printing position, and the like after solder printing on a component mounting board. It is about.

従来技術の部品実装基板用検査装置においては、部品実装基板の各検査ポイントの基準値を取得する場合、各検査データのパラメーター取得時に検査基準となる部品実装基板1枚の半田印刷の状態を画像処理装置を用いて取り込み、これら取り込んだ半田の印刷面積、印刷幅、印刷位置などを基準として検査を行っていた。   In the conventional component mounting board inspection apparatus, when acquiring the reference value of each inspection point of the component mounting board, the image of the solder printing state of one component mounting board that becomes the inspection reference when acquiring the parameter of each inspection data It was taken in using a processing apparatus and inspected based on the print area, print width, print position, etc. of the taken-in solder.

このような半田印刷の検査ではないが、ほぼ同様の技術思想で半導体ウエハーの表面に形成された回路パターンの検査に画像認識した画像データを予めティーチングしてある基準値と比較して、その半導体ウエハーの良否を検査する画像認識技術が特開2003−242482、特開平5−108800などに開示されている。
特開2003−242482(第1頁、要約及び図1) 特開平5−108800(第1頁、要約及び図1)
It is not such a solder printing inspection, but the image data recognized for the inspection of the circuit pattern formed on the surface of the semiconductor wafer with substantially the same technical idea is compared with a reference value that has been previously taught, and the semiconductor An image recognition technique for inspecting the quality of a wafer is disclosed in Japanese Patent Laid-Open Nos. 2003-242482 and 5-108800.
JP2003-242482 (first page, abstract and FIG. 1) Japanese Patent Laid-Open No. 5-108800 (first page, abstract and FIG. 1)

前記の部品実装基板の場合、基準値取得時に得られる数値が基準となるため、部品実装基板1枚のみで基準値を取得すると、半田印刷の繰り返し精度、温度変化などにより半田の経時変化及びその他の要因による半田の印刷後の変化に対応した正しい基準値の取得、精度の高い検査ができないという可能性がある。   In the case of the above component mounting board, the numerical value obtained at the time of obtaining the reference value is the reference. Therefore, if the reference value is obtained with only one component mounting board, the solder printing repeatability, temperature change, etc. There is a possibility that correct reference values corresponding to changes in solder after printing due to the above factors cannot be obtained and inspection with high accuracy cannot be performed.

また、印刷半田の検査における基準値との絶対比較を行う場合、基準値取得時に採用した部品実装基板がベースとなるため、製造工程での品質保証が難しくなる。   In addition, when an absolute comparison with a reference value in the inspection of printed solder is performed, since the component mounting board adopted at the time of acquiring the reference value is a base, quality assurance in the manufacturing process becomes difficult.

更に、検査プログラムの作成は生産開始初期に行うため、基準となる印刷済み基板自体も未だ品質的に安定状態になっているとは言い切れない場合があり、機械的な全自動基準値取得では実質的に運用困難であった。   In addition, since the inspection program is created at the beginning of production, the printed circuit board used as a reference may not be in a stable state in terms of quality. It was practically difficult to operate.

本発明は、これらの課題を解決しようとするものであって、部品実装基板の検査の判定結果の精確性を格段に向上させることができる基準値の平均値取得機能を備えた部品実装基板検査装置を得ることを目的とする。   The present invention is intended to solve these problems, and is a component mounting board inspection having a reference value average value acquisition function capable of significantly improving the accuracy of the determination result of the component mounting board inspection. The object is to obtain a device.

本発明の基準値の平均値取得機能を備えた部品実装基板検査装置は、複数の部品実装基板の電気回路パターンに半田を印刷した後の該半田の印刷面積、半田の印刷幅、半田の印刷位置などの半田印刷検査で得た画像データにおける閾値の数値データを記憶し、それらの平均値を求める平均算出機能を有することを特徴とする。   The component mounting board inspection apparatus provided with the average value acquisition function of the reference value according to the present invention includes a solder printing area, a solder printing width, and solder printing after the solder is printed on the electric circuit patterns of the plurality of component mounting boards. It is characterized by having an average calculation function for storing numerical value data of threshold values in image data obtained by solder printing inspection such as position and obtaining an average value thereof.

前記基準値の平均値取得機能を備えた部品実装基板検査装置には、前記複数の部品実装基板における半田の印刷面積、半田の印刷幅、半田の印刷位置などの記憶された数値情報から前記平均値算出処理に有効/無効とするデータの選択機能を持たせることにより、より精度の高い平均値処理を行うことができる平均値対象外項目選択機能を持たせることが好ましく、また、前記複数の部品実装基板の半田印刷の検査時の画像データの中から予め設定した許容値を超えた画像データを制御装置内の記録メディアに保存する機能を有することで平均値処理を行う前に作業者が前記検査結果の検査ポイント画像認識エリアの画像を目視で確認し、平均値算出に適応するか否かの判断を行うことで、より信頼性の高い平均値処理を行うことができる画像一時保存機能を持たせることも好ましく、更に、複数回の部品実装基板の画像認識で得た前記画像データをバラツキの大きい順にソートし、問題となる画像認識ポイントの把握を瞬時に行うことができるソート機能を持たせることも望ましい。   In the component mounting board inspection apparatus having an average value acquisition function of the reference value, the average is obtained from stored numerical information such as a solder printing area, a solder printing width, and a solder printing position on the plurality of component mounting boards. It is preferable to provide a function of selecting data to be validated / invalidated in the value calculation process so as to have a function of selecting items that are not subject to average values that can perform average value processing with higher accuracy. Before performing average value processing, the operator has a function to save image data exceeding the preset allowable value from the image data at the time of inspection of solder printing on the component mounting board. The image of the inspection point image recognition area of the inspection result is visually confirmed, and it is determined whether or not to apply to the average value calculation, whereby an image that can perform the average value processing with higher reliability can be performed. It is also preferable to have a temporary storage function, and furthermore, the image data obtained by the image recognition of the component mounting board a plurality of times can be sorted in descending order so that the image recognition points in question can be grasped instantly. It is also desirable to have a sort function.

本発明の基準値の平均値取得機能を備えた部品実装基板検査装置によれば、
1.検査の判定結果の精確性が向上する
2.判定基準となる基準値取得が安定して得られる
3.検査基準となる実装基板を特定するのではなく、製造現場にある実装基板からの検査 データの数値が容易に得られ、かつ数値データに信頼性のある情報が得られる
4.民生機器の製品の品質が向上する
5.生産工程の品質解析、工場管理能力が向上する
6.前工程での半田印刷の品質確認にも応用できる
など、数々の優れた効果が得られる。
According to the component mounting board inspection apparatus provided with the average value acquisition function of the reference value of the present invention,
1. 1. The accuracy of the test result is improved. 2. Obtaining a reference value as a judgment criterion can be obtained stably. Rather than specifying the mounting board that will be the inspection standard, the numerical value of the inspection data from the mounting board at the manufacturing site can be easily obtained, and reliable information can be obtained in the numerical data. 4. Product quality of consumer products is improved. 5. Improve production process quality analysis and factory management capabilities. Numerous excellent effects can be obtained, such as being applicable to quality confirmation of solder printing in the previous process.

以下、図を用いて、本発明の実施例の基準値の平均値取得機能を備えた部品実装基板検査装置(以下、単に「部品実装基板検査装置」と略記する)を説明する。   Hereinafter, a component mounting board inspection apparatus (hereinafter simply referred to as “component mounting board inspection apparatus”) having an average reference value acquisition function according to an embodiment of the present invention will be described with reference to the drawings.

なお、本発明の具体的説明を行う前に部品実装基板検査計測技術の開発における半田印刷検査装置の概要を簡単に説明する。   An outline of a solder printing inspection apparatus in development of a component mounting board inspection and measurement technique will be briefly described before a specific description of the present invention.

半田印刷検査装置は、半田印刷機によりプリント基板などの部品実装基板にクリーム半田を印刷した基板の半田印刷状態を画像処理装置を用いて印刷の良否を判定する装置である。印刷の良否の判定手法は、検査装置に予め設定している半田印刷の情報(半田の印刷面積、半田の印刷幅、半田印刷の位置)を基に部品実装基板上の半田印刷の状態を画像処理装置を用いて取り込まれた情報と比較処理することで半田印刷の良否の判定を行う。この判定処理においては、判定が精確に行えることが重要である。   The solder printing inspection apparatus is an apparatus that determines the quality of printing by using an image processing apparatus for the solder printing state of a board in which cream solder is printed on a component mounting board such as a printed board by a solder printer. The printing quality judgment method is based on the solder printing information (solder printing area, solder printing width, solder printing position) preset in the inspection device. The quality of solder printing is judged by comparing the information taken in using the processing device. In this determination process, it is important that the determination can be performed accurately.

本発明はこの判定の精確性を確立するために発明された手法であり以下に具体的な説明を行う。   The present invention is a technique invented to establish the accuracy of this determination, and will be specifically described below.

図1は本発明装置の一実施例の部品実装基板検査装置のシステムの概念図、図2は図1に示した部品実装基板検査装置の主制御装置のシステムブロック図、図3は図1及び図2に示した部品実装基板検査装置における基板検査の基準値平均化を説明するためのフローチャート、図4は平均化操作で仮基準値に対して基準値が許容値を超えたNG画像の比較を行う操作画面図、図5は平均化操作画面で実際に複数枚検査した時の検査ポイント毎の検査データを数値化して表に示した平均値取得メイン画面図、そして図6は部品実装基板の検査ポイントの検査情報を表す画面図である。   1 is a conceptual diagram of a system of a component mounting board inspection apparatus according to an embodiment of the present invention apparatus, FIG. 2 is a system block diagram of a main controller of the component mounting board inspection apparatus shown in FIG. 1, and FIG. FIG. 4 is a flowchart for explaining the reference value averaging of the board inspection in the component mounting board inspection apparatus shown in FIG. 2, and FIG. 4 is a comparison of NG images in which the reference value exceeds the allowable value with respect to the temporary reference value in the averaging operation. FIG. 5 is a main screen diagram showing the average value obtained by quantifying the inspection data for each inspection point when actually inspecting a plurality of sheets on the averaging operation screen, and FIG. 6 is a component mounting board. It is a screen figure showing the inspection information of this inspection point.

先ず、図1及び図2を用いて本発明の一実施例の部品実装基板検査装置の構成を説明する。   First, the configuration of a component mounting board inspection apparatus according to an embodiment of the present invention will be described with reference to FIGS.

図1において、符号1は全体として部品実装基板検査装置を指す。この部品実装基板検査装置1は大別して主制御装置10、ロボット筐体ブロック20、機構制御装置30などから構成されている。   In FIG. 1, reference numeral 1 indicates a component mounting board inspection apparatus as a whole. The component mounting board inspection apparatus 1 is roughly divided into a main controller 10, a robot housing block 20, a mechanism controller 30, and the like.

主制御装置10は、後記するように、コンピュータを中心に構成されていて、画像処理制御機能と演算処理機能を備えている。   As will be described later, the main control device 10 is mainly configured by a computer and has an image processing control function and an arithmetic processing function.

ロボット筐体ブロック20は、照明用鏡筒21と画像取り込み用のカメラ22とが共に一体化されたブロックである。鏡筒21の内面には、半田Sを照明するのに好適な赤色光を発する半導体発光素子と反射鏡(いずれも不図示)が組み込まれている。カメラ22は、例えば、CCDのような固体撮像素子を備えており、前記反射鏡で反射された映像を取り込み、主制御装置10に伝送する。   The robot housing block 20 is a block in which an illumination barrel 21 and an image capturing camera 22 are integrated together. A semiconductor light emitting element that emits red light suitable for illuminating the solder S and a reflecting mirror (both not shown) are incorporated in the inner surface of the lens barrel 21. The camera 22 includes a solid-state imaging device such as a CCD, for example, captures an image reflected by the reflecting mirror, and transmits it to the main control device 10.

機構制御装置30は主制御装置10とインターフェイスIfが取られおり、その主制御装置10の指示に従ってロボット筐体ブロック20を駆動、制御し、また、鏡筒21内の照明灯の明るさを適切に調整する装置である。またカメラ22のシャッターをコントロールする。この機構制御装置30は主制御装置10の元に制御され、ロボット筐体ブロック20を同一水平面でXY方向に所定のシーケンスに従って駆動、制御する。   The mechanism control device 30 is connected to the main control device 10 and the interface If. The mechanism control device 30 drives and controls the robot housing block 20 in accordance with an instruction from the main control device 10, and the brightness of the illumination lamp in the lens barrel 21 is set appropriately. It is a device to adjust to. It also controls the shutter of the camera 22. The mechanism control device 30 is controlled by the main control device 10, and drives and controls the robot housing block 20 in the XY direction on the same horizontal plane according to a predetermined sequence.

また、図1には、ペースト状の半田Sが電気回路パターン(不図示)の所定の位置に印刷された部品実装基板Pも図示した。電気回路パターンも含めて半田Sは多数の検査単位であるセクションに分割されており、各セクションは前記のように機構制御装置30の下で鏡筒21により照明される。   FIG. 1 also shows a component mounting board P on which paste solder S is printed at a predetermined position of an electric circuit pattern (not shown). The solder S including the electric circuit pattern is divided into a number of sections which are inspection units, and each section is illuminated by the lens barrel 21 under the mechanism control device 30 as described above.

主制御装置10は、図2に示したように、画像データ変換制御部110、主制御盤120、情報処理部130などから構成されており、更に、画像データ変換制御部110は撮影画像データ記憶部111、画像処理アプリケーションソフトウエア112から構成されており、主制御盤120は画面操作部121、データベース131へのアクセス部122から構成されており、そして情報処理部130はデータベース部131、検査結果データ記憶部132、画像データ保存部133、平均基準値取得データ記憶部134、演算処理部135などから構成されている。   As shown in FIG. 2, the main control device 10 includes an image data conversion control unit 110, a main control panel 120, an information processing unit 130, and the like. Further, the image data conversion control unit 110 stores captured image data. Unit 111 and image processing application software 112, the main control panel 120 is composed of a screen operation unit 121 and an access unit 122 to the database 131, and the information processing unit 130 is composed of a database unit 131 and an inspection result. A data storage unit 132, an image data storage unit 133, an average reference value acquisition data storage unit 134, an arithmetic processing unit 135, and the like are included.

画面操作部121の操作により、画像データ変換制御部110の撮影画像データ記憶部111にはカメラ22が撮影した画像データが入力され、記憶される。記憶された画像データは画像処理アプリケーションソフトウエア112で数値化される。   By the operation of the screen operation unit 121, the image data captured by the camera 22 is input and stored in the captured image data storage unit 111 of the image data conversion control unit 110. The stored image data is digitized by the image processing application software 112.

数値化された画像データはアクセス部122の動作によりデータベース131へ書き込まれ、或いは、読み出される。   The digitized image data is written to or read from the database 131 by the operation of the access unit 122.

データベース131には基板データ、画像データ、検査結果データの他、鏡筒21を移動させるデータ、照明の輝度を可変させるデータなどが記憶されている。   The database 131 stores substrate data, image data, inspection result data, data for moving the lens barrel 21, data for changing the brightness of illumination, and the like.

検査結果データ記憶部132には検査された部品実装基板の全ての数値データが保存される。   The inspection result data storage unit 132 stores all numerical data of the inspected component mounting board.

画像データ保存部133には、データベース131から作業者が必要とするデータ、例えば、半田Sの印刷面積、半田Sの印刷幅、半田Sの印刷位置などの画像データが引き出され、保存される。   In the image data storage unit 133, data required by the operator, for example, image data such as the printing area of the solder S, the printing width of the solder S, and the printing position of the solder S is extracted from the database 131 and stored.

平均基準値取得データ記憶部134には後記する手法で得られた、部品実装基板の検査に用いられる平均基準値が記憶され、保存される。   The average reference value acquisition data storage unit 134 stores and stores an average reference value used for inspection of the component mounting board obtained by the method described later.

演算処理部135は基準値平均化処理、画像データより得られた半田情報を基に平均化処理を実行する。   The arithmetic processing unit 135 executes a reference value averaging process and an averaging process based on the solder information obtained from the image data.

次に、図3に示したフローチャートを用いて、本発明の部品実装基板検査装置1の動作を説明する。   Next, the operation of the component mounting board inspection apparatus 1 according to the present invention will be described using the flowchart shown in FIG.

先ず、画面操作部121を操作して部品実装基板検査装置1を始動させる(ステップS1)。   First, the component mounting board inspection apparatus 1 is started by operating the screen operation unit 121 (step S1).

次に、ステップS2で検査しようとする種類の部品実装基板の最初の部品実装基板Pがロボット筐体ブロック20の下方の載置盤(不図示)に載置、投入され、ロボット筐体ブロック20内の照明装置(不図示)でその部品実装基板Pを照明しながら、カメラ22でその部品実装基板Pの検査ポイントを所定のシーケンスに従って順次撮影して行く。   Next, the first component mounting board P of the type of component mounting board to be inspected in step S2 is placed and placed on a mounting board (not shown) below the robot casing block 20, and the robot casing block 20 is loaded. While illuminating the component mounting board P with an internal illumination device (not shown), the camera 22 sequentially photographs the inspection points of the component mounting board P according to a predetermined sequence.

撮影した画像データは主制御装置10のデータベース131に溜め込まれる(ステップS3)。この画像データは一枚目の部品実装基板Pのデータの仮基準値として設定され、演算処理部135に取り込まれる(ステップS4)。   The captured image data is stored in the database 131 of the main controller 10 (step S3). This image data is set as a temporary reference value for the data of the first component mounting board P, and is taken into the arithmetic processing unit 135 (step S4).

ステップS5ではステップS2以下の作業と同じ作業で2枚目以降の部品実装基板Pの検査を行う。   In step S5, the second and subsequent component mounting boards P are inspected by the same operation as that in step S2 and subsequent steps.

次に、ステップS4で取り込んだ仮基準値と2枚目以降の各部品実装基板Pの画像データとをそれぞれ演算処理部135で比較する(ステップS6)。   Next, the temporary reference value acquired in step S4 and the image data of the second and subsequent component mounting boards P are respectively compared by the arithmetic processing unit 135 (step S6).

この比較で仮基準値との差がなければ、画像データとして先ず取得し、検査結果データ記憶部132に取り込む(ステップS7)。この一連の作業が終了しなければ、更に何枚かの部品実装基板Pを流して画像データを採る。何枚かの部品実装基板Pの画像データを採って作業者が良いと判断したら止める。なお、このステップS7における「NO」は次の新しい部品実装基板Pを見るか、という意味である。   If there is no difference from the tentative reference value in this comparison, the image data is first acquired and taken into the inspection result data storage unit 132 (step S7). If this series of operations is not completed, some component mounting boards P are further flowed to collect image data. If the operator determines that the image data of some component mounting boards P is taken and the operator decides that it is good, stop. Note that “NO” in step S7 means whether to see the next new component mounting board P.

ステップS6において、取得した2枚目以降の部品実装基板Pの画像データが仮基準値から外れているとNG(No Goodの略)とされてステップS8へ進み、これも検査結果データ記憶部132に保存される。   In step S6, if the acquired image data of the second and subsequent component mounting boards P deviates from the temporary reference value, it is determined as NG (abbreviation of No Good) and the process proceeds to step S8, which is also the inspection result data storage unit 132. Saved in.

NG警告は画面操作部121の画面上に、図4に示したような画面として表示される。左側の仮基準値を取得した部品実装基板Pの1検査ポイントの半田部分を表示し、右側は二枚目以降の部品実装基板Pを検査して前記仮基準値から許容値を超えたNGの部品実装基板Pの前記と同一の1検査ポイントの半田部分を表示した詳細確認画面を示している。   The NG warning is displayed on the screen of the screen operation unit 121 as a screen as shown in FIG. The solder portion of one inspection point of the component mounting board P that has acquired the temporary reference value on the left side is displayed, and the right side shows the NG of the NG that exceeds the allowable value from the temporary reference value by inspecting the second and subsequent component mounting boards P The detail confirmation screen which displayed the solder part of 1 inspection point same as the above of the component mounting board P is shown.

そして、それぞれの画面の下方には、それぞれの各種データの表の画像が、それぞれの検査ポイントの名称、判定などの欄を区分して表示され、そして上閾値、下閾値、半田の印刷位置ずれ検査、2値化、表示拡大、表示縮小、検査、ヒストグラムなどのボタンが表示されている。   In the lower part of each screen, a table image of each type of data is displayed with the fields of each inspection point, such as the name of each inspection, judgment, etc. displayed, and the upper threshold value, lower threshold value, and solder printing position deviation. Buttons such as inspection, binarization, display enlargement, display reduction, inspection, and histogram are displayed.

また、図5に平均値取得メイン画面として示したように、ハッチングで示した部分を作業者に、その比較結果がNGだったことが明確に判るように、例えば、赤字で表示することができる。このNG警告は警告だけを行って引き続いて他の部品実装基板Pを次々に比較して行くことも可能である。そして、例えば、5枚の部品実装基板Pを検査、比較した後に、このNG警告の画像データを詳細を見て行くことができる。   Further, as shown as the average value acquisition main screen in FIG. 5, the hatched portion can be displayed in red, for example, so that the operator can clearly see that the comparison result is NG. . This NG warning can be performed only by warning and subsequently comparing the other component mounting boards P one after another. For example, after inspecting and comparing five component mounting boards P, the image data of the NG warning can be viewed in detail.

なお、図5の平均値取得メイン画面において、上左側の画面は仮基準値の部品実装基板Pの1検査リージョンを表示しており、これに対して上右側の画面はNGとされた部品実装基板Pの1検査リージョンで、両者比較対照できるように表示されている。そして下半分の画面に表示されている表は検査に掛けられた部品実装基板Pの各検査ポイント毎の数値データを示したもので、右端の「履歴表示」の欄に矢示Aで示したように、半田の印刷面積の数値を示している。この他、半田の印刷幅(X方向幅、Y方向幅)、半田のずれ量(重心X軸、重心Y軸)でも表示することができる。   In the mean value acquisition main screen of FIG. 5, the upper left screen displays one inspection region of the component mounting board P of the temporary reference value, while the upper right screen displays NG component mounting. In one inspection region of the substrate P, it is displayed so that both can be compared and contrasted. The table displayed on the lower half screen shows numerical data for each inspection point of the component mounting board P subjected to the inspection, and is indicated by an arrow A in the “history display” column at the right end. Thus, the numerical value of the solder printing area is shown. In addition, it is also possible to display the print width of solder (X-direction width, Y-direction width) and the amount of solder displacement (center of gravity X axis, center of gravity Y axis).

ステップS10で検査結果データ記憶部132からNGの検査ポイントの抽出を行い、ステップS11で前記NG検査ポイントの平均化処理への採用不採用の判定を作業者が目視で行う。   In step S10, NG inspection points are extracted from the inspection result data storage unit 132, and in step S11, the operator visually determines whether or not to adopt the NG inspection point in the averaging process.

この目視による判定は数値データで行ってもよいが、図4に示した詳細確認画面の「ヒストグラム」というボタンをクリックすることにより、画面操作部121上に図6の右下画面に示したような2値化データのヒストグラムとして表示でき、平均化処理への採用不採用の判定を作業者が目視で行い易くすることが好ましい。このヒストグラムは半田Sの印刷面積を表しており、縦軸は明るさの面積、横軸は明るさの分布を指す。この右側のヒストグラムは半田S部分を、左側のヒストグラムは電気回路パターンPa(銅)部分を指す。   This visual judgment may be made with numerical data, but by clicking the “histogram” button on the detail confirmation screen shown in FIG. 4, as shown in the lower right screen of FIG. 6 on the screen operation unit 121. It is preferable to make it easier for the operator to visually determine whether or not to adopt the averaging process. This histogram represents the printing area of the solder S, where the vertical axis indicates the brightness area and the horizontal axis indicates the brightness distribution. The right histogram indicates the solder S portion, and the left histogram indicates the electric circuit pattern Pa (copper) portion.

なお、上右側の画面はその部品実装基板Pの全体図であって、検査ポイントを含む全検査リージョンを長方形の線で示した。上左側の画面は1検査リージョン内の1検査ポイントを拡大して示したもので、薄い灰色の四角の部分は半田S部分を指し、やや濃い灰色の部分は電気回路パターンPa部分である。そしてこのヒストグラムは半田の印刷面積を表しており、この他、半田の印刷幅の大きさ、半田の印刷位置のずれ量を同様に表すことができる。   The upper right screen is an overall view of the component mounting board P, and all inspection regions including inspection points are indicated by rectangular lines. The upper left screen is an enlarged view of one inspection point in one inspection region. The light gray square portion indicates the solder S portion, and the slightly dark gray portion is the electric circuit pattern Pa portion. This histogram represents the solder printing area, and in addition, the size of the solder printing width and the amount of deviation of the solder printing position can be similarly represented.

ステップS11での目視はヒストグラムで行っても良いし、図5の下表に示したように、半田の印刷面積の平均値と基準値との比をとり、比率の大きい順に並び換えて数値で比較し易いように、例えば、[表1]でハッチングを施した部分を赤字で表示して採用不採用の判定を行ってもよい。この比較で「不採用」と判定した場合、平均値算出の条件設定キーのKの「削除」キーをクリックすることにより、その測定結果は削除され、平均値算出に採り入れられないことができる。[表1]は4カ所の検査ポイントのみを取り出し、拡大して示した。   Visual observation in step S11 may be performed by a histogram, or, as shown in the lower table of FIG. 5, the ratio of the average value of the printed area of the solder and the reference value is taken and rearranged in descending order of the ratio. For easy comparison, for example, the hatched portion in [Table 1] may be displayed in red to determine whether or not to adopt. If it is determined as “not adopted” in this comparison, by clicking the “delete” key of the average value calculation condition setting key K, the measurement result can be deleted and not taken into the average value calculation. In [Table 1], only four inspection points are extracted and enlarged.

ステップS11で不採用と判定した検査ポイントの検査結果データは捨て、採用と判定した検査結果データはステップS7で取得した検査結果データと共に演算処理部135に加えられ、それらを平均化して平均基準値を出す(ステップS12)。この操作を繰り返し実行することにより、基準値の平均化処理の精度を向上させることができる。   The inspection result data of the inspection point determined not to be adopted in step S11 is discarded, and the inspection result data determined to be adopted is added to the arithmetic processing unit 135 together with the inspection result data acquired in step S7, and is averaged to obtain an average reference value. (Step S12). By repeating this operation, the accuracy of the reference value averaging process can be improved.

この平均化処理で得られた数値が各検査ポイントの基準値となる。それぞれの基準値は平均基準値取得データ記憶部134に取り込み、部品実装基板検査装置1はこれらの基準値を基にして部品実装基板Pの半田印刷後の絶対値判定を画像認識処理で実行することになる。   A numerical value obtained by the averaging process becomes a reference value for each inspection point. The respective reference values are taken into the average reference value acquisition data storage unit 134, and the component mounting board inspection apparatus 1 executes absolute value determination after solder printing of the component mounting board P based on these reference values by image recognition processing. It will be.

この部品実装基板検査装置1を用いることにより、製造現場で精度の高い検査数値データの確保が容易にできるようになり、検査判定の精度向上、信頼性の向上が実現する。   By using this component mounting board inspection apparatus 1, it is possible to easily secure highly accurate inspection numerical data at the manufacturing site, thereby improving the accuracy of inspection determination and the reliability.

本発明装置の一実施例の部品実装基板検査装置のシステムの概念図である。It is a conceptual diagram of the system of the component mounting board inspection apparatus of one Example of this invention apparatus. 図1に示した部品実装基板検査装置の主制御装置のシステムブロック図である。It is a system block diagram of the main controller of the component mounting board inspection apparatus shown in FIG. 図1及び図2に示した部品実装基板検査装置における基板検査の基準値平均化を説明するためのフローチャートである。3 is a flowchart for explaining reference value averaging of board inspection in the component mounting board inspection apparatus shown in FIGS. 1 and 2. 平均化操作で仮基準値に対して基準値を許容値を超えたNG画像の比較を行う操作画面図である。It is an operation screen figure which compares the NG image which exceeded the reference value with respect to the temporary reference value by the averaging operation. 平均化操作画面で実際に複数枚検査した時の検査ポイント毎の検査データを数値化して表に表した平均値取得メイン画面図である。It is the average value acquisition main screen figure which digitized the inspection data for every inspection point when actually inspecting a plurality of sheets on the averaging operation screen, and displayed it in a table. 部品実装基板の検査ポイントの検査情報を表す画面図である。It is a screen figure showing the inspection information of the inspection point of a component mounting board.

符号の説明Explanation of symbols

1 本発明の一実施例の部品実装基板検査装置
10 主制御装置
110 画像データ変換制御部
111 撮影画像データ記憶部
112 画像処理アプリケーションソフトウエア
120 主制御盤
121 画面操作部
122 データベース131へのアクセス部
130 情報処理部
131 データベース
132 検査結果データ記憶部
133 画像データ保存部
134 平均基準値取得データ記憶部
135 演算処理部
20 ロボット筐体ブロック
21 鏡筒
22 カメラ
30 機構制御装置
S 半田
P 部品実装基板
If インターフェイス
DESCRIPTION OF SYMBOLS 1 Component mounting board inspection apparatus of one Example of this invention 10 Main control apparatus 110 Image data conversion control part 111 Shooting image data storage part 112 Image processing application software 120 Main control panel 121 Screen operation part 122 Access part to database 131 DESCRIPTION OF SYMBOLS 130 Information processing part 131 Database 132 Inspection result data storage part 133 Image data storage part 134 Average reference value acquisition data storage part 135 Arithmetic processing part 20 Robot housing block 21 Lens barrel 22 Camera 30 Mechanism control device S Solder P Component mounting board If The interface

Claims (4)

複数の部品実装基板の電気回路パターンに半田を印刷した後の該半田の印刷面積、半田の印刷幅、半田の印刷位置などの半田印刷検査で得た画像データにおける閾値の数値データを記憶し、それらの平均値を求める平均算出機能を有することを特徴とする基準値の平均値取得機能を備えた部品実装基板検査装置。   Stores numerical data of threshold values in image data obtained by solder printing inspection such as the solder printing area, the solder printing width, and the solder printing position after the solder is printed on the electric circuit patterns of a plurality of component mounting boards, A component mounting board inspection apparatus provided with an average value acquisition function of a reference value, characterized in that it has an average calculation function for obtaining an average value thereof. 前記複数の部品実装基板における半田の印刷面積、半田の印刷幅、半田の印刷位置などの記憶された数値情報から前記平均値算出処理に有効/無効とするデータの選択機能を持たせることにより、より精度の高い平均値処理を行うことができる平均値対象外項目選択機能を有することを特徴とする請求項1に記載の基準値の平均値取得機能を備えた部品実装基板検査装置。   By providing a function for selecting data to be valid / invalid in the average value calculation process from stored numerical information such as a solder printing area, a solder printing width, and a solder printing position on the plurality of component mounting boards, 2. The component mounting board inspection apparatus having a reference value average value acquisition function according to claim 1, further comprising an average value non-target item selection function capable of performing average value processing with higher accuracy. 前記複数の部品実装基板の半田印刷の検査時の画像データの中から予め設定した許容値を超えた画像データを制御装置内の記録メディアに保存する機能を有することで平均値処理を行う前に作業者が前記検査結果の検査ポイント画像認識エリアの画像を目視で確認し、平均値算出に適応するか否かの判断を行うことで、より信頼性の高い平均値処理を行うことができる画像一時保存機能を有することを特徴とする請求項1または請求項2に記載の基準値の平均値取得機能を備えた部品実装基板検査装置。   Before performing average value processing by having a function of storing image data that exceeds a preset allowable value among the image data at the time of inspection of solder printing of the plurality of component mounting boards on a recording medium in the control device An image in which the worker can visually confirm the image of the inspection point image recognition area of the inspection result and determine whether or not to apply the calculation to the average value, so that the average value processing with higher reliability can be performed. The component mounting board inspection apparatus having a reference value average value obtaining function according to claim 1, further comprising a temporary storage function. 複数回の部品実装基板の画像認識で得た前記画像データをバラツキの大きい順にソートし、問題となる画像認識ポイントの把握を瞬時に行うことができるソート機能を有することを特徴とする請求項1、請求項2または請求項3に記載の基準値の平均値取得機能を備えた部品実装基板検査装置。
2. The image processing apparatus according to claim 1, further comprising: a sorting function capable of sorting the image data obtained by the image recognition of the component mounting board a plurality of times in the descending order and quickly grasping the image recognition points in question. 4. A component mounting board inspection apparatus comprising the reference value average value obtaining function according to claim 2.
JP2003406485A 2003-12-04 2003-12-04 Component mounting substrate inspection device equipped with mean value acquisition function of reference value Pending JP2005164497A (en)

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JP2002036513A (en) * 2000-07-31 2002-02-05 Dainippon Printing Co Ltd Printed product inspecting device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04104043A (en) * 1990-08-24 1992-04-06 Toshiba Corp Defect discriminating apparatus
JPH05332746A (en) * 1992-03-31 1993-12-14 Toshiba Corp Recognizing device of solder paste form
JPH05332740A (en) * 1992-05-28 1993-12-14 Yamatake Honeywell Co Ltd Method for detecting connected state of circuit part
JPH0627031A (en) * 1992-07-08 1994-02-04 Matsushita Electric Ind Co Ltd Cream solder print inspecting method
JPH08247960A (en) * 1995-03-14 1996-09-27 Adtec Eng:Kk Visual inspection device
JP2001183307A (en) * 1999-12-27 2001-07-06 Nagoya Electric Works Co Ltd Method and apparatus for automatically adjusting criteria in apparatus for inspecting packaged printed circuit board
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JP2002019084A (en) * 2000-07-12 2002-01-22 Matsushita Electric Ind Co Ltd Method and apparatus for inspecting printing state of cream solder
JP2002036513A (en) * 2000-07-31 2002-02-05 Dainippon Printing Co Ltd Printed product inspecting device

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