JP2006216981A - Mounted substrate inspection method/system and component mount board manufacturing method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To remarkably improve inspection accuracy in the inspection method/system that conduct image processing for each board for inspection after execution of at least the last process or two or more processes including the last process among multiple processes required for manufacturing mounted substrates. <P>SOLUTION: An inspection device 1 is arranged in every process in a mounted substrate manufacturing process. The inspection devices 1 interconnect with each other via a network line 2. Each inspection device 1 saves the inspection result, measured data and image data used for inspection in the memory each time before conducting inspection. In addition, each inspection device 1 (solder print inspection device 1B, mounted substrate inspection device 1C, post-reflow inspection device 1D) excluding the bare substrate inspection device 1A (first inspection device) receives the board inspection information saved by an inspection device 1 in the preceding process and then uses it for inspection. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

According to the present invention, at least a final process among a plurality of processes executed for manufacturing a component mounting board, or two or more processes including the final process, an inspection by image processing is performed on the board after the process is executed. The present invention relates to the inspection method and system. In addition, this invention
The present invention relates to a method of manufacturing a component mounting board while performing the above inspection.

The general manufacturing process of a component mounting board includes a process of printing cream solder on a printed wiring board (solder printing process), a process of mounting a part at a position where cream solder is applied (component mounting process), and after mounting the part. The process of heating the board | substrate and soldering components to a board | substrate (soldering process) is included. In order to prevent defective substrates generated in each process from flowing downstream, a board inspection line is provided for each process in order to carry out inspections. There is one in which the substrate determined to be removed is removed.

The following patent document 1 is given as an example of a substrate inspection system provided with an inspection machine for each process.
In the substrate inspection system described in Patent Document 1, each inspection machine is connected to a host computer (process control device) via a management computer so as to transmit inspection results, measurement data at the time of inspection, and the like. I have to. This process control apparatus is set with a function for analyzing whether or not there is a correlation that causes a defect between measurement data obtained from each inspection machine.

JP-A-11-298200

Each inspection machine placed in the conventional board manufacturing process creates information individually for inspection information such as inspection area setting data and reference information for discriminating measurement data obtained in that inspection area. An algorithm check is performed. This point is the same in the system of Patent Document 1.

In recent inspection machines, an inspection region is often set based on board design data such as CAD data on the assumption that a printed wiring board serving as a base is created according to design data. For example, in the inspection after solder printing, an image of solder is extracted from the inspection region, the area and position of the solder are measured, and the measured value is compared with a reference value based on the board design data.
However, in the manufacturing process of the printed wiring board, a small variation occurs in the land formation position due to the positional deviation of the resist, and the land position and size are not always in accordance with the design data.

On the other hand, recent boards have a higher density, and the land shape tends to be smaller as the component shape becomes finer. For this reason, if the solder is printed out of position with respect to the land formation position, there is a possibility that the mounting and soldering of components cannot be performed properly. However, if the inspection area and the reference value for determination are set based on the board design data, there is a possibility that the deviation of the solder printing position cannot be detected.
For example, in the board after solder printing, even if the solder is printed at the reference position based on the board design data, if the actual land is deviated from the reference position based on the board design data, the gap between the land and the solder There is a possibility that misalignment exceeding the allowable range may occur. But,
In the inspection after solder printing, if the solder is printed at the reference position based on the board design data, a good determination is made, and thus the above-described deviation cannot be detected.

The present invention has been made paying attention to the above-described problem, and an object thereof is to appropriately inspect a substrate to be inspected using information generated in a previous process.

An inspection method for a first component mounting board according to the present invention includes an inspection machine in each of two or more processes including a final process among a plurality of processes executed for manufacturing a component mounting board. For each inspection machine, the board is inspected using an image of the board after the process in which the inspection machine is provided is executed. In this method, in an inspection machine deployed in a process subsequent to the process in which another inspection machine is deployed, information generated when the inspection target board is inspected by the inspection machine in the previous process is input and the input is performed. The inspection is performed using the information.

In the above method, the plurality of steps can include a solder printing step, a component mounting step, and a soldering step. Further, a printed wiring board manufacturing process can be provided before the solder printing process. It is desirable that a conveyor device for transporting the substrate is provided between these processes, but this is not always necessary, and a certain process and the next process may be physically separated. . The inspection machine is most preferably provided in all processes, but conversely, it may be provided only in the final process and one other process.

Each inspection machine can be configured as an appearance inspection apparatus having a camera. Or it can also be set as the inspection apparatus using the fluoroscopic image by X-rays.
Each inspection machine is preferably connected to a network line such as a LAN line and inputs information necessary for the inspection via this line. However, the present invention is not limited to this, and wireless communication may be performed between inspection machines. Further, a server computer may be interposed in communication between the inspection machines. Alternatively, instead of communication, information generated by inspection may be stored in a predetermined storage medium, and the information may be input by introducing the information into another inspection machine.

In the above, the “inspection machine for the previous process” is not limited to the inspection machine for the immediately preceding process, but may be an inspection machine for the process before a predetermined stage. Further, the number of inspection machines in the previous process is not limited to one, and information generated by a plurality of inspection machines may be input for one inspection.
The “information generated when the substrate to be inspected is inspected by the inspection machine in the previous process” can include an inspection result for the substrate and measurement data extracted for the inspection. further,
Image data generated for inspection can also be included. The image data is not limited to a grayscale image input from a camera or the like, but can also be a binary image or an edge image generated by converting the grayscale image. Moreover, it is also possible to obtain image data only for a region required by a post-process inspection machine that executes inspection.
Note that it is not essential for the inspection machine in the previous process to make a determination / discrimination, and it is only necessary to execute processing for acquiring an image to be transmitted to the inspection machine in the subsequent process.

In order to realize the inspection method for the first component mounting board according to the present invention, the inspection result in the manufacturing process of the printed wiring board is not necessarily an essential requirement. Even when a printed wiring board manufacturing process is included in a plurality of processes and an inspection machine is provided in this manufacturing process, the printed wiring board is used to realize the inspection method for the first component mounting board. This is because it is sufficient to input the information generated by the inspection machine for inspecting the board to the inspection machine provided in the subsequent process and execute the inspection using the input information. Even when the solder printing process and component mounting process are included in multiple processes,
Similarly, in realizing the inspection method for the first component mounting board, it can be considered that the inspection results in these steps do not have to be indispensable requirements.

According to the first method, in the inspection machine deployed in the process after the process in which another inspection machine is deployed, when the same substrate is inspected with the inspection machine in the previous process for the actual inspection target substrate. An inspection can be performed using the information generated in step (b). Therefore, it is possible to perform appropriate discrimination processing according to the actual configuration of the substrate. In addition, in order to use the information generated when inspecting with the inspection machine of the previous process, not only for the inspection of the previous process but also for the inspection with the inspection machine of the subsequent process
Inspection information can be used effectively.

In the inspection method of a preferred aspect, each inspection machine is set to be able to communicate with each other, and in the inspection machine in the process before the final process, information generated at the time of inspection is stored in the memory of the inspection machine for each substrate, When a post-process inspection machine requests transmission of information related to a substrate to be inspected by the inspection machine, information corresponding to the request is read from the memory and transmitted to the post-process inspection machine. In addition, the post-process inspection machine that requests the transmission of the information performs the inspection by inputting the information transmitted in response to the request. In this way, the post-process inspection machine outputs necessary information by outputting a request for transmission of information whenever the information generated by the pre-process inspection machine becomes necessary as the inspection progresses. Can be obtained. Alternatively, prior to the inspection, necessary information may be fetched from the inspection machine in the previous process and stored in the memory, and the information may be taken out from the memory and used as necessary during the inspection.

When a manufacturing process of a printed wiring board is included in the plurality of processes, in the inspection machine deployed in this process, the position information of the land or the information indicating the formation range of the land is extracted at the time of the inspection, and the extraction The post-process inspection machine can input the processed information.
Note that representative points such as the center of gravity can be obtained as the land position information. Further, as information indicating the formation range of the land, coordinates of all the constituent pixels of the land or the edge constituent points can be obtained. Further, since the land is generally rectangular, the coordinates of four points corresponding to each vertex can be obtained, and an array based on these coordinates can be used as information indicating the formation range. The information indicating the land formation range is also information indicating the position of the land.

For example, when the information extracted by the inspection machine in the printed wiring board manufacturing process is input by the inspection apparatus in the solder printing process, the solder printing process inspection machine uses the solder printing process to inspect the solder from the image of the board to be inspected. It is possible to extract position information or information indicating the printing range of solder, and determine whether the extracted information is appropriate based on information extracted by an inspection machine in the printed wiring board manufacturing process. More specifically, solder misalignment can be detected by determining the suitability of the solder position on the basis of the land position information. Further, by determining whether or not the solder formation range is appropriate based on the land formation range, it is possible to determine whether or not the amount of solder on the land is appropriate, and to detect solder that has protruded from the land.

In addition, when the information extracted by the inspection device for the manufacturing process of the printed wiring board is input by the inspection device for the component mounting process or the soldering process, Information indicating the position of the component or the range in which the component is mounted is extracted from the image of the board, and the suitability of the extracted information is determined based on the information extracted by the inspection machine in the manufacturing process of the printed wiring board Can do. More specifically, it is determined whether the mounting position of the component is appropriate based on the land position, or the preferred mounting range of the component is determined based on the formation range of multiple lands, and the inspection machine extracts it. Depending on whether or not the mounting range of the selected component matches the preferable mounting range, it is possible to detect the positional deviation and inclination of the component.

In addition, when the information extracted by the inspection machine of the manufacturing process of the printed wiring board is input by the inspection machine of the soldering process, in the inspection machine of the soldering process, for the image of the board to be inspected, An inspection area can be set based on the input information, and the suitability of the soldering part can be determined using an image in the inspection area. For example, it is possible to extract a soldering site in an inspection region set based on the land position or formation range, and to measure the position and size thereof. As described above, since the state of the soldering portion is determined based on the actual land, it is possible to accurately determine whether or not appropriate soldering is performed.

Further, when a manufacturing process of a printed wiring board is included in the plurality of processes, an image used for inspection by an inspection machine arranged in this process is set so that the inspection machine in the subsequent process inputs the image. You can also
For example, an image used in an inspection machine deployed in the manufacturing process of the printed wiring board is input by an inspection machine in a component mounting process or a soldering process, and the inspection is performed in the inspection machine in the component mounting process or the soldering process. The suitability of the component mounting state can be determined by comparing the image of the target board with the input image. In this way, in the inspection after the component mounting process or the soldering process, the image of the region corresponding to the same component can be compared between the image after executing the process and the input image, It is possible to detect missing parts and large positional deviations.

Further, when a solder printing process is included in the plurality of processes, in the inspection machine provided in this process, the position information of the solder or the information indicating the printing range of the solder is extracted at the time of the inspection, and the extracted information is extracted. The information can be set so that the inspection machine in the subsequent process inputs it. As for the position information of the solder and the information indicating the printing range, the same type of information as the information indicating the position information of the land and the information indicating the formation range of the land can be extracted.

When information extracted by the solder printing process inspection machine is input by the component mounting process inspection machine, the component position or component is mounted from the image of the board to be inspected by the component mounting process inspection machine. It is possible to extract information indicating the range to be processed and determine whether the extracted information is appropriate based on the input information. More specifically, it is possible to detect missing or misaligned parts by comparing the position information of the solder with the position of the parts. In addition, it is possible to detect component displacement and inclination by determining the preferred mounting range of components based on the printing range of multiple solders and comparing this with the mounting range of components extracted by the inspection machine Become.

Further, in the case where a solder printing process is included in the plurality of processes, an image used for inspection by an inspection machine arranged in this process can be input by an inspection machine in a subsequent process.
For example, an image used in an inspection machine in the solder printing process is input by an inspection machine in a component mounting process. In the inspection machine in the component mounting process, an image of a board to be inspected is compared with the input image. Appropriateness of the component mounting state can be determined. In this way, the image corresponding to the mounting position of the same component can be compared between the image of the board after the component mounting process and the image of the board before the process, and the missing or significant component Misalignment can be detected.

In the inspection method for a second component mounting board according to the present invention, an inspection machine is arranged in at least the final process among a plurality of processes executed for manufacturing the component mounting board.
The inspection of the board is executed using the image of the board after the process in which the inspection machine is provided is executed. That is, in this method, it can be considered that it is sufficient to perform the inspection in the final process at a minimum. Of course, also in this method, inspection may be performed in two or more steps, and further, inspection may be performed in all steps.

In one aspect of the inspection method described above, in a step prior to the step in which the inspection machine is provided, a step of imaging the substrate after the execution of the step, and a step before the step obtained from the image obtained by the imaging The step of extracting the configuration attached to the substrate is executed, and the extraction result is input by the inspection machine and used for the inspection.

In the above, the “process before the process in which the inspection machine is deployed” is not limited to the immediately preceding process,
It may be a process before a predetermined stage. For example, when an inspection machine is provided for each of the solder printing process, the component mounting process, and the soldering process, the manufacturing process of the printed wiring board can be set as the “previous process” for each of these processes. .

The “configuration attached to the substrate in the previous step” is added to the substrate by executing “a step before the step in which the inspection machine is provided”. For example, if the previous process is a printed wiring board manufacturing process, it can be considered that the land formed on the substrate becomes the “configuration attached to the substrate”. Also, if the solder printing process is the previous process, the cream solder printed on the board will be "configuration applied to the board", and if the component mounting process is the previous process, the mounted components Can be considered as “a structure attached to the substrate”.

According to said method, the structure (for example, land) which was attached to the board | substrate before the process by which the inspection machine was deployed on the basis of the structure (for example, land) which was attached to the board in the process by which the said inspection machine was deployed ( For example, it is possible to determine the suitability of cream solder, parts, solder fillets).
For example, based on the formation range of the land, it is possible to determine the excessive amount of solder with respect to the land,
It becomes possible to detect the positional deviation of the component and to determine whether the solder fillet is formed properly.

Next, in another aspect according to the second inspection method, in a step before the step in which the inspection machine is arranged, the step of imaging the substrate after the execution of the step, and the image obtained by the imaging A step of storing an image, and the inspection machine inputs the stored image and uses it for the inspection.
For example, in the printed wiring board manufacturing process, the above two steps are executed, and when the inspection is performed by deploying an inspection machine in the component mounting process or the soldering process, in each inspection machine, the printed wiring board manufacturing process By comparing the image stored in (1) with the image generated by the device itself, it is possible to detect missing parts or significant positional deviation.

An inspection system for a component mounting board according to the present invention includes an inspection machine in each of two or more processes including a final process among a plurality of processes executed for manufacturing a component mounting board. Each time, the inspection of the board is performed using the image of the board after the process in which the inspection machine is deployed, and the inspection machines are installed in a state where they can communicate with each other.
The inspection machine deployed in the process prior to the final process of this system has an information storage means for storing information generated at the time of inspection in a memory for each substrate, and the inspection machine is an inspection target from the inspection machine in the subsequent process. And an information transmission means for reading out information corresponding to the request from the memory and transmitting it to the inspection machine in the subsequent process when transmission of information on the substrate is requested. Also, a transmission request means for requesting an inspection machine deployed in a process subsequent to a process in which another inspection machine is deployed to the previous process inspector to transmit information relating to a substrate to be inspected by the apparatus itself. And a processing means for executing an inspection using information transmitted from an inspection machine in a previous process in response to the request.

Each inspection machine introduced into the inspection system can be configured as an appearance inspection apparatus having a camera, but is not limited thereto, and may be an inspection apparatus using a fluoroscopic image by X-rays. The information storage means, information transmission means, transmission request means, and processing means can all be configured by a computer in which a program for executing the means is set.

In the above inspection system, each inspection machine is preferably provided with a means for recognizing identification information relating to a substrate to be inspected. This recognition means can extract the identification code attached to the board from the image to be inspected, for example, and recognize the contents. The board identification code can be represented by a bar code, a two-dimensional code, a character string, or the like, and is preferably attached to a predetermined position on the board.

According to the above inspection system, each inspection machine before the final process,
Information (inspection results, measurement data, image data, etc.) generated for the substrate to be inspected can be stored in a memory in association with the identification code. In addition, in an inspection machine deployed in a process subsequent to a process in which another inspection machine is deployed, the transmission request may include a message specifying the content of necessary information including the board identification code. it can. The inspection machine in the previous process that has received this transmission request can read out the corresponding information from the memory based on the identification code, and can transmit it to the inspection machine that has made the transmission request. Therefore, in the post-process inspection machine, processing such as setting an inspection area and comparing measurement data and image data is performed using information generated when the pre-process inspection machine inspects the same substrate. be able to.

In the component mounting board manufacturing method according to the present invention, a plurality of processes are sequentially performed to manufacture a component mounting board, and an inspection machine is provided in each of two or more processes including the final process. Then, the substrate is inspected using the image of the substrate after the process in which the inspection machine is deployed. Each inspection machine is installed in a state where it can communicate with each other. In each inspection machine deployed in the process prior to the final process, the information generated at the time of inspection is stored in the memory for each substrate, and the subsequent process is performed. When an inspection machine requests that the inspection machine send information about the board to be inspected,
Information corresponding to the request is read from the memory and transmitted to the inspection machine in the subsequent process. Further, in a post-process inspection machine that requests transmission of the information, when information corresponding to the request is transmitted from the pre-process inspection machine, the transmission information is used to perform the inspection.

In the above manufacturing method, the plurality of processes can include a solder printing process, a component mounting process, and a soldering process, and a printed wiring board manufacturing process can be provided before the solder printing process. Also for this manufacturing method, the considerations and aspects of the inspection method and system for the component mounting board described above can be applied.
Moreover, it is desirable that at least the solder printing process, the component mounting process, and the soldering process among the plurality of processes described above are mechanically connected via a conveyor device. In this case, a production line for completing the component mounting board while sequentially sending the board to be processed to these three processes will be configured, and the board after each process execution is promptly inspected and sent to the subsequent process. Can do. Even when the manufacturing process of the printed wiring board is separated from the manufacturing line, the inspection apparatus in this process can be provided at the head position of the manufacturing line.

According to the present invention, after executing a predetermined process related to the manufacture of a substrate, when inspecting whether or not the process by the process is appropriately performed, the same substrate generated in the process before the process Since the inspection using the image and information extracted from the image is executed, the inspection according to the actual configuration of the substrate can be appropriately performed.

FIG. 1 shows a configuration of a substrate production line to which the present invention is applied.
The board production line of this embodiment includes a solder printer 3, a high-speed mounter 4, a deformed mounter 5,
In addition to each manufacturing apparatus of the reflow furnace 6, a plurality of inspection machines 1 and information analysis apparatuses 7 are included. Inspection machine 1
Are arranged in a total of four locations before the solder printer 3, between the solder printer 3 and the high speed mounter 4, between the deformed mounter 5 and the reflow furnace 6, and after the reflow furnace 6.
In addition, in FIG. 1, each inspection machine 1 is shown with the code | symbol of 1A, 1B, 1C, 1D in order of arrangement | positioning. Also in the following description, when it is necessary to indicate the inspection machine 1 individually, these reference numerals are used.

The information analysis device 7 is a computer having a large-capacity hard disk and can be connected to a terminal device (not shown) such as a personal computer.
Each inspection machine 1 and information analysis device 7 are set in a state where they can communicate with each other via a network line 2 such as a LAN line. Each device except the information analysis device 7 is arranged in the order shown in the figure via a conveyor device (not shown) for substrate conveyance.

The solder printer 3 receives the supply of the printed wiring board and executes a solder printing process in which cream solder is applied to the soldering position of each component. The high-speed mounter 4 mounts chip components at high speed, and the odd-shaped mounter 5 mounts components other than the chip components. A component mounting process is executed by these two types of mounters 4 and 5. The reflow furnace 6 performs a soldering process by heating the substrate after the component mounting process.

The inspection machine 1A on the upstream side of the solder printer is a bare board (
A printed wiring board before solder printing on which a silk printing pattern or land such as a component code is formed. ) To inspect the position and size of the land and the silk printing status. The inspection machine 1B between the solder printer 3 and the high-speed mounter 4 is for inspecting the application state of the solder on the board that has undergone the solder printing process. Hereinafter, the inspection machine 1A is referred to as “bare board inspection machine 1A”, and the inspection machine 1B is referred to as “solder printing inspection machine 1B”.

The inspection machine 1C between the profile mounter 5 and the reflow furnace 6 inspects the presence / absence of components, positional deviation, and appropriateness of directions, etc., on a substrate that has undergone a component mounting process. Hereinafter, this inspection machine 1C is referred to as “
This is referred to as “component mounting inspection machine 1C”.
In addition, the inspection machine 1D downstream of the reflow furnace 6 determines whether or not the solder fillet (hereinafter simply referred to as “fillet”) formed by heat treatment is targeted for the substrate that has undergone the soldering process in the reflow furnace 6. In addition, the same inspection as that of the component mounter 1C is performed on the component. Hereinafter, this inspection machine 1D is referred to as “post-reflow inspection machine 1D”.

Each of the inspection machines 1 described above includes a CCD camera (not shown) for color image generation and a substrate support stage, and performs an appearance inspection using the substrate image obtained by the camera. In any of the inspection machines 1, prior to the inspection, the setting data of the inspection area and the color of the inspection site (for example, solder in the solder printing inspection machine 1B and the component in the component mounting inspection machine 1C become the inspection site). Teaches a binarization threshold necessary for extracting a target, a program for inspecting a region to be inspected extracted by the binarization threshold, a reference value for comparison with measurement data for the region to be inspected, etc. Processing is performed (hereinafter, information taught for these inspections is referred to as “inspection information”).

The information analysis device 7 receives measurement data and inspection results from each inspection machine 1 and accumulates the information. Then, when a defective substrate is generated, the accumulated data before and after the generation is analyzed, and based on the analysis result, processing for correcting the inspection information used in each inspection machine 1 is executed. The corrected inspection information is transmitted to each inspection machine 1. The inspection machine 1 updates the inspection information registered in its own device in response to this transmission.

The bare substrate is manufactured by a manufacturing process of a printed wiring board (not shown). In this step, a bar code label indicating an identification code unique to the substrate is affixed to an appropriate position on the substrate after manufacture. Further, positioning marks are respectively formed at the lower left and upper right corners of the substrate.

FIG. 2 shows an example of an image obtained by imaging the bare substrate. In FIG. 2, for simplicity of explanation, two parts are mounted on the substrate, and an area in which these parts are mounted is enlarged.
In FIG. 2, a bar code label (not shown) indicating the above-described substrate identification code is attached to a region 21 surrounded by a dotted line. M1 and M2 are the positioning marks described above, and the character strings R1 and R2 represent the component codes described above. These character strings R1, R
2 and the adjacent frames 22 and 23 are both formed by silk printing as described above. The frames 22 and 23 indicate areas allocated to the respective components at the time of board design, and are set to a size that sufficiently includes the components and lands. In each inspection machine 1, after an image of a substrate to be inspected is generated, an inspection region is set with reference to frames 22 and 23 on the image. Note that chip components are mounted in the frames 22 and 23 in this example. Since FIG. 2 is an image of the bare substrate before the solder or component is mounted, the entire image of the lands 31 and 32 connected to the electrodes at both ends of the chip component appears in the frames 22 and 23. .

Each inspection machine 1 of this embodiment is configured to execute an inspection while communicating with other inspection machines 1 and the information analysis device 7 by communication via the network line 2. In particular, the solder printing inspection machine 1B, the component mounting inspection machine 1C, and the post-reflow inspection machine 1D appropriately store information necessary for the inspection from the previous inspection machine 1 on the board to be inspected taken into the support stage of its own apparatus. The transmission is received, and the inspection is executed using the received information. Hereinafter, the configuration of each inspection machine 1 and a specific example of inspection will be described in order.

FIG. 3 shows a configuration common to the inspection machines 1.
The inspection machine 1 according to this embodiment includes an image input unit 11, an XY unit, and a control unit 10 including a computer.
A stage unit 12, an input unit 13, a monitor 14, a working memory (RAM) 15, an inspection information storage unit 16, an inspection result storage unit 17, a communication interface 18 and the like are connected.
In addition to the CPU, the control unit 10 includes a ROM that stores basic programs.

The image input unit 11 includes an interface circuit for image input and an A / D conversion circuit. The digital image generated here is stored in the work memory 15. The XY stage control unit 12 controls the positions of the substrate support stage and the camera support unit according to an instruction from the control unit 10 to position the camera in a predetermined imaging target region. The input unit 13 is a keyboard, a mouse, or the like, and is used for the purpose of inputting the type of a board to be inspected at the start of inspection or inputting various setting data at teaching.
The monitor 14 is used to display a user interface during teaching, an image to be inspected, an inspection result, and the like.

The inspection information storage unit 16 is a memory for storing the above-described inspection information. The inspection information is filed for each type of board, and by inputting the board type name from the input unit at the time of inspection, the inspection information file corresponding to the input is read out and stored in the work memory 15. Set.

The inspection result accumulating unit 17 is for storing information obtained in the inspection for each substrate, and is configured by a large-capacity hard disk device. In this embodiment, in addition to the inspection result, the result of measuring the color pattern extracted by the binarization threshold (pattern position information, size information, etc.), the image data of the substrate used for the inspection, etc. The result is stored in the inspection result storage unit 17. When information is stored in the test result storage unit 17, a folder having a board identification code as a folder name is set for each board, and information filed for each part to be inspected is stored in this folder. Can be stored.
The communication interface 18 is for communicating with other inspection machines 1 and the information analysis device 7 via the network line 2.

Further, in addition to the above-described configuration, the post-reflow inspection machine 1D is provided with an illumination unit (not shown) including red, green, and blue annular light sources. This illumination unit is for inspecting the tilt state of the fillet. By making the diameters of the respective light sources different, the illuminating unit irradiates the substrate with red, green and blue colored lights from different elevation angles. Is set. The camera is arranged with the optical axis in the vertical direction with the optical axis aligned with the center of each light source. Since the solder after melting has high specularity, most of the colored light from each light source is specularly reflected on the surface of the fillet. For this reason, the color light incident on the camera varies depending on the inclination angle of the reflection position. Therefore, in the fillet on the image generated by the post-reflow inspection machine 1D, the red, green, and blue color regions are distributed along the direction in which the gradient changes. Inspection machine after reflow 1
In D, each color region is extracted from the image of the substrate to be inspected, each area and position is measured, and each measured value is compared with a pre-registered reference value, thereby determining whether the fillet size and inclination state are appropriate. Determine.
For the principle and detailed processing of the fillet inspection, refer to the following Patent Document 2.

Japanese Patent Publication No.6-1173

In the board production line having the above configuration, each inspection machine 1B, 1C, except for the bare board inspection machine 1A,
1D can receive the transmission of the information stored in the inspection result storage unit 17 by the inspection machine in the previous process, and execute the inspection using the transmitted information. For this reason, a color tone correction function is set in the control unit 10 of each inspection machine 1, and the brightness between images of each inspection machine 1 is based on parameters obtained by comparing images in each inspection machine 1 in advance. Adjustment is performed so that the difference in the sheath color is within an allowable range.

FIG. 4 shows a table 1 that lists information acquired by each inspection machine 1 and information used for the inspection performed by each inspection machine 1 (information acquired from the previous inspection machine and Table 2 associated with (extracted by the apparatus). In addition, about the bare board | substrate test | inspection machine 1A, since the test | inspection which does not use the information from the other test | inspection machine 1 is performed as mentioned above, only acquired information is demonstrated below.

First, various acquisition information a to k described in the table 1 will be described. Each inspection machine 1 extracts information shown in the table 1 from an image obtained by imaging the substrate (hereinafter referred to as “inspection target image”) each time the substrate is inspected. The extracted information is stored in the inspection information storage unit 16 after being used for the inspection in its own apparatus. Further, when a transmission request is made for the stored information from the inspection machine 1 in the subsequent process, the requested information is read and transmitted to the inspection machine 1 that issued the request. The inspection machine 1 that has requested the information uses this transmitted information for the inspection in its own device.

FIG. 5 shows information extracted by the bare board inspection machine 1A. In FIG. 5 and the subsequent drawings up to FIG. 13, the frame 22 shown in FIG. 2 is obtained from the inspection target images generated by the various inspection machines 1.
The image inside is extracted and shown. In these drawings, the same reference numerals are assigned to images of the same part and corresponding regions.

According to the table 1, the bare board inspection machine 1A extracts four types of information, a, b, c, and d. Hereinafter, these pieces of information are referred to as “a information”, “b information”, “c information”, and “d information”.
The a information represents the position and size of the land. In this embodiment, the image to be inspected is binarized, the lands 31 and 32 on the image are extracted, the coordinates of each pixel constituting the land are obtained for each of the lands 31 and 32, and the set of the coordinates is obtained. a information.

The b information is the coordinates of the centroids g1 and g2 of the lands 31 and 32. The coordinates of the centroids g1 and g2 are calculated using the coordinates of each constituent pixel obtained as the a information.

The c information includes points constituting the four corners of the lands 31 and 32 (points a1 and b1 for the land 31).
, C1, d1, and land 32 are points a2, b2, c2, d2. ) Coordinates. In this embodiment, pixels constituting the edges of the lands 31 and 32 are extracted using the a information, and a straight line approximated based on these pixels is set to obtain four straight lines. Further, the intersection of each straight line is regarded as a constituent point of the four corners of the land, and the coordinates of each intersection are calculated.

The d information is an image between the lands 31 and 32. In this embodiment, based on the a information and c information, a cutout region 24 having a width and a length approximating the distance between the lands and the length of each land is set between the two lands 31 and 32. And this cutout area 2
4 is extracted as d information.

Note that the coordinates included in each of the information a, b, and c are replaced with relative coordinates based on the mark M1. Taking the center of gravity g1 in FIG. 5 as an example, the coordinates of the center of gravity g1 are (lx, ly). Similarly, the other inspection machines 1 use the mark M1 as a reference for relative coordinates so that the positions and coordinates of the various pieces of acquired information a to k are matched.
The image cut out as d information is not a binary image but a color gray image composed of R, G, and B gradation data. The same applies to the following pieces of information h to k.

FIG. 6 shows information extracted by the solder printing inspection machine 1B.
According to the table 1, the solder printing inspection machine 1B extracts four types of information of e, f, g, and h. Hereinafter, these pieces of information are referred to as “e information”, “f information”, “g information”, and “h information”.

The e information represents the position and size of the solder. In this embodiment, the bare substrate inspection machine 1
Similarly to the a information of A, the solder 41 and 42 on the inspection target image are extracted by binarization, the coordinates of the constituent pixels are obtained for each of the solder 41 and 42, and a set of the coordinates is set as e information.

The f information is the coordinates of the centroids G1 and G2 of the solders 41 and 42, and is calculated using the e information. The g information is coordinates of points constituting the four corners of the solders 41 and 42 (points A1, B1, C1, and D1 for the solder 41 and points A2, B2, C2, and D2 for the solder 42). The coordinates of these points are calculated by the same method as the above-mentioned c information, that is, by setting four straight lines that approximate the solder edge and obtaining the coordinates of the intersections of the straight lines. The e information is also used for this calculation.

The h information is an image between the solders 41 and 42. In this embodiment, a cutout area 25 is set between the solder 41 and the solder 42 in the same manner as the d information of the bare board inspection machine 1A based on the e information and the g information, and an image 27 in the cutout area 25 is set. Are extracted as h information.

FIG. 7 shows information extracted by the component mounting inspection machine 1C. In FIG. 7, in order to clearly indicate the range of the extracted information, the illustration of components in the image is omitted.

According to the table 1, the component mounting inspection machine 1C extracts two types of information i and j. Hereinafter, these are referred to as “i information” and “j information”.
The i information is an image between lands. In this embodiment, by receiving the supply of a information and c information from the bare board inspection machine 1A, the same cutout area 24 as set by the bare board inspection machine 1A is set, and the cutout area 24 in the cutout area is set. The image 26 is extracted as i information. In the bare board inspection machine 1A, the coordinates of each component pixel in the cutout area 24 are stored when the d information is extracted, and the component mounting inspection machine 1C acquires these coordinates to extract the i information. good.

The j information is an image between solders. In this embodiment, the solder printing inspection machine 1B to e
By receiving the supply of information and g information, a cutout area 25 similar to that set by the solder printing inspection machine 1B is set, and an image 27 in the cutout area 25 is extracted as j information. In the solder printing inspection machine 1B, the coordinates of the constituent pixels of the cutout area 25 are stored when the h information is extracted, and the component mounting inspection machine 1C acquires these coordinates to extract the j information. .

Further, according to Table 1, the post-reflow inspection machine 1D extracts k information. Hereinafter, this is referred to as “k information”.
The k information is an image between lands. The k information is extracted by the same method as the i information of the component mounting inspection machine 1C, and is not shown. In addition, the post-reflow inspection machine 1D extracts each color information of red, green, and blue for the above-described fillet inspection.

Next, the purpose and method of inspection will be described in order for the eight types of inspection shown in Table 2. In the following, each inspection is referred to as “inspection 1” to “inspection 8” based on the numbers described in the “inspection content” column of table 2.

(1) Inspections 1, 2, and 3 in the solder printer 1B In the solder printer inspection machine 1B, the cream solder mounted on the land is used as an inspection site.
Tests 1, 2, and 3 are performed. Among these, in the inspection 1, it is determined whether or not the solder is displaced from the land.
If the solder is greatly displaced with respect to the land, the amount of solder contributing to the fillet will be insufficient even if a component is subsequently mounted and put into the reflow furnace 6, and an appropriate fillet will not be formed. As a result, the electrical connection between the land and the component electrode cannot be secured. In consideration of such a problem, it is possible to detect the positional deviation of the solder after the execution of the soldering process and before the transition to the next process.

FIG. 8 shows a specific example of the process executed in the inspection 1. In this process, the b information supplied from the bare board inspection machine 1A and the f information acquired by the own apparatus are used. Specifically, for each corresponding land-solder pair, the difference Δx between the x-coordinates of each centroid and the difference Δy between the y-coordinates
y is calculated. In FIG. 8, only the measurement process for the set of the land 31 and the solder 41 is shown, but the same measurement process is executed for the other set of the land 32 and the solder 42.
The measured values Δx and Δy obtained by the above processing are each compared with a predetermined threshold value. Here, if any measured value exceeds the threshold value, it is determined that the solder is displaced from the land.

In inspection 2, it is determined whether or not a sufficient amount of solder is mounted on the land. This is because if a sufficient amount of solder is not mounted, a fillet is not formed even when the soldering process is executed, and there is a possibility that a contact failure of components may occur.

FIG. 9 shows a specific example of the processing executed in this inspection 2. This inspection 2 is performed using the a information supplied from the bare board inspection machine 1A and the e information acquired by the own apparatus. Specifically, the land 3 is extracted by extracting the pixels included in the information of a and e.
1 is a region 43 on which the solder 41 is mounted (hereinafter referred to as “solder mounting region 43”).
To extract. Further, the area ratio of the solder mounting region 43 with respect to the entire land 31 is obtained and compared with a predetermined threshold value. Here, when the area ratio is below the threshold value, it is determined that the amount of solder is insufficient.
Although not shown in FIG. 9, for the other land 32 and the solder 42, the solder mounting region 43 is extracted by the same method, and the suitability of the solder amount is determined based on the area ratio with respect to the land 32.

In inspection 3, it is determined whether or not a predetermined amount or more of solder has protruded outside the land. This is because if a solder exceeding a predetermined amount protrudes from the land, the solder that has undergone the soldering process is hardened into a ball shape, and a defect such as contact with the land of an adjacent component may occur.

FIG. 10 shows a specific example of the process executed in this inspection 3. This inspection 3 is also performed using the a information supplied from the bare substrate inspection machine 1A and the e information acquired by the own apparatus, as in the case of the inspection 2. In this inspection 3, by extracting pixels that are included in the e information but not in the a information, an area 44 corresponding to solder outside the land (hereinafter referred to as “solder deviation area 44”) is extracted. To do. Further, the area of the solder departure area 44 is obtained and compared with a predetermined threshold value. Here, when the area exceeds the threshold value, it is determined that the solder exceeding the predetermined amount protrudes outside the land 31.
Although not shown in FIG. 10, for the other land 32 and the solder 42, the solder deviation region 44 is extracted by the same method, and the amount of solder protruding outside the land 32 is determined based on the area. To do.

In the conventional solder printing inspection, an inspection window is set so as to include a land based on the board design data, and measurement processing for the inspection is executed in this window. For this reason, in the actual board, the solder is at the reference position based on the board design data. However, since the land is deviated from the reference position based on the board design data, the deviation between the land and the solder exceeds the allowable range. Even if it occurred, the failure could not be detected. In addition, solder misalignment occurs in the same direction as the land misalignment. As a result, even when the solder is properly mounted on the land, the solder deviates from the reference position based on the board design data. In some cases, it was determined as defective.
On the other hand, according to the above inspections 1, 2, and 3, based on the actual position and size of the land, the amount of misalignment of the solder with respect to the land, the amount of solder mounted on the land, and the solder outside the land Since the amount of protrusion is measured, it is possible to obtain a measurement value that appropriately represents the relationship to the actual land. Therefore, it is possible to perform an appropriate inspection on the soldering site.

Note that inspection 1 is a simple inspection method, and inspection 2 and inspection 3 are strict inspection methods. The user can select whether to execute the inspection 1 which is a simple method or the inspection 2 or the inspection 3 which is a strict inspection method according to the purpose. For inspections 2 and 3, even if the result of inspection 2 is good, the result of inspection 3 may be defective. It is preferable to perform both tests 3.

(2) Inspections 4 and 5 in the component mounting machine 1C In the inspection 4 of the component mounting inspection machine 1C, it is inspected whether or not a component is mounted at each component mounting position. The inspection 5 is performed on the components that are determined to be mounted in the inspection 4, and inspects whether or not the components have been displaced from the land or solder (including displacement due to rotation). To do. This is because if the component is displaced with respect to the land or solder, there is a high possibility that the soldering is not properly performed.

In the inspection 4, the d information extracted by the bare board inspection machine 1A or the h information extracted by the solder printing inspection machine 1B is supplied, and among the i information and j information extracted by the own apparatus, supply Use the one corresponding to the information provided.
FIG. 11 specifically shows the processing executed in the inspection 4. In this example, the solder printing inspection machine 1B
To h information (an image between the solders 41 and 42, shown as 27a in this example), and corresponding j information (shown as 27b in this example) is used.

In the above example, the image 27a corresponding to the h information is cut out from the image to be inspected in the solder printing process, and therefore no part is included in this image. On the other hand, since the j information is an image of the image 27b in the same range as the h information with respect to the board image after component mounting, it is included in the j information but is not included in the h information. Can be considered to correspond to parts.

In the example of FIG. 11, based on the above principle, the difference calculation process is executed for the images 27 a and 27 b indicated by the respective information of h and j, and the j information is included in the h information from the difference processed image 51. Feature 52 not included is extracted. Thereafter, the area of the extracted feature 52 is calculated and compared with a predetermined threshold value. If this area exceeds the threshold value, it is determined that the component is mounted.
Note that the same processing as described above can be performed when images between the lands 31 and 32 are compared using the d information and the i information.

Next, in the inspection 5, the c information extracted by the bare board inspection machine 1A or the g information extracted by the solder printing inspection machine 1B is supplied, and each vertex P, Q, R, S of the component is received. Extraction is performed, and the extraction result is compared with the supplied information.

FIG. 12 shows a specific example of processing executed in the inspection 5.
In this example, the g information (coordinates of the constituent points of the four corners of the solder) is supplied from the solder printing inspection machine 1B, and among the points included in the g information, the points A1, C1, B2, D2 located at the outer positions are provided. Are compared with the vertices P, Q, R, and S of the parts closest to that point, respectively.

In the process of comparing two corresponding points, an x-coordinate difference Ux and a y-coordinate difference Uy between the two points are calculated. In FIG. 12, only the calculation process between B2 and R is shown, but the same applies to other corresponding points A1 and P, C1 and Q, and D2 and S. Each calculated difference value is compared with a predetermined threshold value. Here, if any value exceeds the threshold value, it is determined that the component 50 is displaced.
In addition, also when this test | inspection 5 is performed using c information, the processing content is the same as the above.

In the conventional component mounting inspection, an inspection window is set at a position where a component is mounted based on the board design data, and an image of the component is extracted in the window. For this reason, in the actual board, the component is mounted at the reference position based on the board design data. However, since the solder or the land is deviated from the reference position based on the board design data, the part is not located on the solder or the land. Even if it deviated beyond the allowable range, the failure could not be detected. In addition, there is a component misalignment in the same direction as the solder or land misalignment. As a result, even if appropriate component mounting is ensured, the component deviates from the reference position based on the board design data. If it was, it was determined as defective.

On the other hand, in the inspection 5, since the positional deviation of the component is determined based on the actual land or solder extracted in the previous process, the mounting state of the component can be appropriately inspected. Similarly, in the inspection 4, since the presence / absence of the component is determined based on the image between the actual lands extracted in the previous process and the image between the solder, the component mounting / inspection can be performed more appropriately. it can.

In the component mounting inspection, the user may appropriately select whether the determination is made based on the land formation position or the solder printing position. In the reflow process after component mounting, the so-called self-alignment effect can be expected due to the surface tension at the time of melting of the solder, so appropriate soldering is expected if the component is properly mounted within the solder printing range. can do. From such a point of view, there is a demand that the component mounting inspection should be determined based on the solder position. On the other hand, since the target position of the component after reflow is the land position, there is a demand that it is better to make a determination based on the position of the land also in the inspection of component mounting.
In the above inspection 4 and inspection 5, in order to meet such a demand, information (d, c) from the bare substrate inspection machine 1A or information from the solder printing inspection machine 1B (
h, g) can be selected.
In addition, according to the above-described purpose, in the inspection 5, it is possible to make the determination criteria more gradual than the inspection 7 in the next process.

(3) Inspections 6, 7 and 8 in the post-reflow inspection machine 1D The inspections 6 and 7 executed by the post-reflow inspection machine 1D are the same as the inspections 4 and 5 executed by the component mounting inspection machine 1C. Detailed description will be omitted. Since it is desirable to perform the component inspection after the reflow with reference to the land, the inspections 6 and 7 use the information d and c from the bare board inspection machine 1A.

The inspection 8 is to determine the state of the fillet formed in the soldering process. Also in this inspection 8, since it is necessary to check the relation of the fillet to the land, a information and c information are supplied from the bare substrate inspection machine 1A.

FIG. 13 shows a specific example of processing executed in the inspection 8. In this example, among the images in the frame 22, an image of a partial region 22A including the left land 31 is enlarged.

In the inspection 8, an inspection window 28 having a size including the land 31 is set in the inspection target image based on the a information and the c information supplied from the bare board inspection machine 1A. Then, the image in the window 28 is binarized for each gradation of R, G, and B, and the color regions 45R, 45G, and 45B are extracted. Further, for each of these color regions 45R, 45G, and 45B, the area and position are measured, and the measured values are compared with a predetermined threshold value to determine the suitability of the fillet inclination state.

In the conventional fillet inspection, an inspection window is set based on the board design data, and binarization processing is executed for each pixel in the window. For this reason, if the actual land formation position is deviated, even if the fillet is correctly formed on the misaligned land, in the inspection in the inspection window based on the board design data, the misaligned fillet is targeted. Therefore, it is impossible to accurately determine the inclination state of the fillet.
According to the inspection 8 described above, the fillet inspection window is set based on the actual position and size of the land, so that an appropriate fillet inspection can be performed.

FIG. 14 shows an inspection procedure common to the respective inspection machines 1 of the solder printing inspection machine 1B, the component mounting inspection machine 1C, and the post-reflow inspection machine 1D. In FIG. 14 and the following description, each processing step is indicated as “ST”. The procedure shown in FIG. 14 is executed for one substrate. When a plurality of substrates are processed, it is necessary to repeat the procedure shown in FIG. 14 for each substrate.

First, in ST1, a substrate to be inspected is carried in from an upstream conveyor device. In the next ST2, the camera and the substrate are aligned using the XY stage control unit 12, and then imaging is started. At the start of imaging, first, the barcode label on the substrate is imaged, and the barcode in the image is decoded to recognize the substrate identification code (ST3).

Hereinafter, in ST4 to ST9, the imaging target regions are sequentially imaged while moving the camera and the stage as necessary, and the inspection is executed. In the first ST4, based on the inspection information, an inspection region is set at the site to be inspected. The inspection area set here has a size including the frames 22 and 23, and is set based on the extraction position after the frames 22 and 23 on the image are extracted. Therefore, any inspection machine 1 can set inspection areas of the same size at the same position. Further, since each coordinate in the inspection area is replaced with a relative coordinate based on the mark M1, consistency between the inspection machines 1 can be ensured.

In the next ST5, based on the inspection logic executed in this inspection area, it is determined whether or not information on the previous process is necessary. If information on the previous process is necessary, the process proceeds to ST6, and a message designating the type of necessary information is transmitted to the inspection machine 1 holding the information. This message includes the board identification code and the component code to be inspected. On the other hand, the counterpart inspection machine 1 reads information corresponding to the message from the inspection result storage unit 17 and returns it to the inspection machine 1 that is executing the inspection.

When the information necessary for the inspection is acquired in this way, the process proceeds to ST7, and the inspection is executed using the acquired information.
If information on the previous process is not required, the process skips ST6 and proceeds to ST7, and executes an inspection using only the inspection information held by the own apparatus. Examples of inspections that do not use the information of the previous process include inspection of bridges by solder printing inspection machine 1B and component mounting inspection machine 1C, and component mounting error inspection by component mounting inspection machine 1C and post-reflow inspection machine 1D. is there.

When the inspection is completed, the process proceeds to ST8, and a file in which the inspection result, the measurement data used for the inspection, images corresponding to the respective information of d, h to k, etc. are associated with the component code is created and inspected. The result is stored in the result storage unit 17.

Thereafter, the same processing as described above is repeated for each part to be examined. When the inspection has been completed for all the parts to be inspected, the process proceeds to ST10, and the quality of the entire substrate is determined based on the inspection result of each part to be inspected. In ST11, the determination result is displayed on the monitor 14 or transmitted to the information analysis device 7 via the network line 2. Thereafter, the process proceeds to ST12, the substrate is carried out to the downstream side, and the processing is ended.

Note that the processing at ST5 and ST6 is not executed even in the first bare substrate inspection apparatus 1A, and the inspection is executed according to the same flow as in FIG.

Further, in the procedure of FIG. 14, each time information from the inspection machine in the previous process is required, a message requesting transmission of information is transmitted to the inspection machine in the previous process, and necessary information is acquired. This is suitable when the information source is different. On the other hand, when information is obtained only from one specific inspection machine 1, all necessary information is transmitted and stored in the work memory 15 prior to inspection. Good.

It is explanatory drawing which shows an example of the board | substrate manufacturing line to which this invention was applied. It is explanatory drawing which shows the example of the image of a bare board | substrate. It is a block diagram of an inspection machine. It is the table which shows the information which each inspection machine acquires, and the table which shows the contents of the inspection performed, and the information used in correspondence. It is explanatory drawing which shows the example of the information extracted with a bare board | substrate inspection machine. It is explanatory drawing which shows the example of the information extracted with a solder printing inspection machine. It is explanatory drawing which shows the example of the information extracted with a component mounting inspection machine. It is explanatory drawing which shows the specific example of the test | inspection 1. FIG. It is explanatory drawing which shows the specific example of the test | inspection 2. FIG. It is explanatory drawing which shows the specific example of the test | inspection 3. FIG. It is explanatory drawing which shows the specific example of the test | inspection 4. FIG. It is explanatory drawing which shows the specific example of the test | inspection 5. FIG. It is explanatory drawing which shows the specific example of the test | inspection 8. FIG. It is a flowchart which shows the procedure of a test | inspection.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Inspection machine 2 Network line 3 Solder printer 4 High-speed mounter 5 Deformed mounter 6 Reflow furnace 10 Control part 11 Image input part 17 Inspection result storage part 18 Communication interface 31, 32 Land 41, 42 Solder 50 Parts

Claims (16)

Among a plurality of processes executed for manufacturing a component mounting board, an inspection machine is deployed in each of two or more processes including the final process, and the process in which the inspection machine is deployed is executed for each inspection machine. A method of performing an inspection of the substrate using an image of the substrate after being performed,
In the inspection machine deployed in the process after the process where other inspection machines are deployed, input the information generated when inspecting the board to be inspected with the inspection machine in the previous process, and use the input information Inspection method for component mounting board that performs inspection. The method of claim 1, wherein
Each inspection machine is deployed to communicate with each other,
In each inspection machine deployed in the process prior to the final process, the information generated at the time of inspection is stored in the memory of the inspection machine for each substrate, and the inspection machine related to the substrate to be inspected from the inspection machine in the subsequent process When the transmission of information is requested, the information according to the request is read from the memory and transmitted to the post-process inspection machine, and the post-process inspection machine that requests the transmission of the information responds to the request. An inspection method for a component mounting board, in which the transmitted information is input to perform inspection. The method according to claim 1 or 2, wherein
The plurality of processes include a printed wiring board manufacturing process, and the inspection machine deployed in this process extracts land position information or information indicating a land formation range at the time of inspection,
A component mounting board inspection method in which the extracted information is input by a post-process inspection machine. The method of claim 3, wherein
The information extracted by the inspection machine in the manufacturing process of the printed wiring board is input by the inspection machine in the solder printing process. In the inspection machine in the solder printing process, the solder position information or the solder An inspection method for a component mounting board, in which information indicating a printing range is extracted, and whether or not the extracted information is appropriate is determined based on information extracted by an inspection machine in the printed wiring board manufacturing process. The method of claim 3, wherein
Information extracted by an inspection machine in the manufacturing process of the printed wiring board is input by an inspection machine in a component mounting process or a soldering process, and an image of a board to be inspected in the inspection machine in the component mounting process or the soldering process. Component information extracted from the information indicating the position of the component or the range in which the component is mounted, and the suitability of the extracted information is determined based on the information extracted by the inspection machine of the printed wiring board manufacturing process Inspection method for substrates. The method of claim 3, wherein
Information extracted by an inspection machine in the manufacturing process of the printed wiring board is input by an inspection machine in the soldering process, and the input information is used as a reference for the image of the board to be inspected in the inspection machine in the soldering process. An inspection method for a component mounting board, in which an inspection area is set in the inspection area and an image in the inspection area is used to determine the suitability of the soldering part. The method according to claim 1 or 2, wherein
The plurality of processes include a printed wiring board manufacturing process, and an image used for inspection by an inspection machine deployed in this process is input to a component mounting board by a subsequent process inspection machine. Inspection method. The method of claim 7, wherein
An image used in an inspection machine deployed in the printed wiring board manufacturing process is input by an inspection machine in a component mounting process or a soldering process, and in the inspection machine in the component mounting process or the soldering process, An inspection method for a component mounting board, in which an image of the board is compared with the input image to determine whether the component mounting state is appropriate. The method according to claim 1 or 2, wherein
The plurality of processes include a solder printing process, and an inspection machine deployed in this process extracts the solder position information or the information indicating the solder printing range at the time of the inspection, and the extracted information is displayed. An inspection method for a component mounting board that is input by an inspection machine in a subsequent process. The method according to claim 9, wherein
The information extracted by the inspection device in the solder printing process is input by the inspection device in the component mounting process, and the position of the component or the range in which the component is mounted from the image of the inspection target board in the inspection device in the component mounting process An inspection method for a component mounting board, in which information indicating the above is extracted and the suitability of the extracted information is determined based on the input information. The method according to claim 1 or 2, wherein
The plurality of processes include a solder printing process, and an inspection method for a component mounting board in which an image used in an inspection by an inspection machine provided in this process is input by a subsequent inspection machine . The method of claim 11, wherein
The image used in the solder printing process inspection machine is input by the component mounting process inspection machine, and the component mounting process inspection machine compares the image of the board to be inspected with the input image. An inspection method for a component mounting board that determines whether or not a mounting state is appropriate. An inspection machine is deployed in at least the final process among a plurality of processes executed for manufacturing a component mounting board. In each inspection machine, an image of the board after the process in which the inspection machine is deployed is executed. A method of performing an inspection of the board using the method,
In a step prior to the step in which the inspection machine is deployed, a step of imaging the substrate after the execution of the step, and a step of extracting the configuration attached to the substrate in the previous step from the image obtained by the imaging The inspection method for a component mounting board in which the extraction result is input to the inspection machine and used for the inspection. An inspection machine is deployed in at least the final process among a plurality of processes executed for manufacturing a component mounting board. In each inspection machine, an image of the board after the process in which the inspection machine is deployed is executed. A method of performing an inspection of the board using the method,
In a step prior to the step in which the inspection machine is deployed, the step of imaging the substrate after the execution of the step and the step of storing the image obtained by the imaging are performed, and the stored image is An inspection method for component mounting boards that is input by an inspection machine and used for inspection. Among a plurality of processes executed for manufacturing a component mounting board, an inspection machine is deployed in each of two or more processes including the final process, and the process in which the inspection machine is deployed is executed for each inspection machine. A system in which the inspection of the substrate is performed using the image of the substrate after being performed, and the inspection machines are installed in a state where they can communicate with each other,
The inspection machine deployed in the process prior to the final process has information storage means for storing information generated at the time of inspection in a memory for each substrate, and information on the substrate to be inspected by the inspection machine from the inspection machine in the subsequent process Information transmission means for reading out information corresponding to the request from the memory and transmitting the information to the inspection device in the subsequent process when requested to transmit
An inspection machine deployed in a process subsequent to a process in which another inspection machine is deployed includes a transmission request means for requesting transmission of information related to a substrate to be inspected by the previous apparatus to the previous process, and the request And a processing means for executing an inspection using information transmitted from an inspection machine in the previous process according to the above. A plurality of processes are executed in order to manufacture a component mounting board, and an inspection machine is deployed in each of two or more processes including the final process, and the process in which the inspection machine is deployed is performed for each inspection machine. In the method of manufacturing a component mounting board that performs the inspection of the board using the image of the board after
Each inspection machine is installed so that it can communicate with each other.
In each inspection machine deployed in the process before the final process, the information generated at the time of inspection is stored in the memory for each substrate, and the information on the substrate that is inspected by the inspection machine is transmitted from the inspection machine in the subsequent process. When requested, information corresponding to the request is read from the memory and transmitted to the inspection machine in the subsequent process,
In the post-process inspection machine that requested the transmission of the information, when the information corresponding to the request is transmitted from the pre-process inspection machine, the component mounting board is manufactured using the transmission information. Method.

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