JP2005135897A5 - - Google Patents

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Publication number
JP2005135897A5
JP2005135897A5 JP2004207641A JP2004207641A JP2005135897A5 JP 2005135897 A5 JP2005135897 A5 JP 2005135897A5 JP 2004207641 A JP2004207641 A JP 2004207641A JP 2004207641 A JP2004207641 A JP 2004207641A JP 2005135897 A5 JP2005135897 A5 JP 2005135897A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004207641A
Other languages
Japanese (ja)
Other versions
JP4812070B2 (ja
JP2005135897A (ja
Filing date
Publication date
Priority claimed from GB0316628A external-priority patent/GB0316628D0/en
Application filed filed Critical
Publication of JP2005135897A publication Critical patent/JP2005135897A/ja
Publication of JP2005135897A5 publication Critical patent/JP2005135897A5/ja
Application granted granted Critical
Publication of JP4812070B2 publication Critical patent/JP4812070B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2004207641A 2003-07-16 2004-07-14 質量分析計 Expired - Fee Related JP4812070B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0316628A GB0316628D0 (en) 2003-07-16 2003-07-16 Mass spectrometer
GBGB-0316628.7 2003-07-16

Publications (3)

Publication Number Publication Date
JP2005135897A JP2005135897A (ja) 2005-05-26
JP2005135897A5 true JP2005135897A5 (pt) 2011-01-27
JP4812070B2 JP4812070B2 (ja) 2011-11-09

Family

ID=27763920

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004207641A Expired - Fee Related JP4812070B2 (ja) 2003-07-16 2004-07-14 質量分析計

Country Status (4)

Country Link
JP (1) JP4812070B2 (pt)
CA (1) CA2474836C (pt)
DE (3) DE102004064078B4 (pt)
GB (2) GB0316628D0 (pt)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005041655B4 (de) * 2005-09-02 2010-05-20 Bruker Daltonik Gmbh Erzeugung mehrfach geladener Ionen für die Tandem Massenspektrometrie
CN103069538B (zh) 2010-08-19 2016-05-11 莱克公司 具有软电离辉光放电和调节器的质谱仪
TWI488216B (zh) * 2013-04-18 2015-06-11 Univ Nat Sun Yat Sen 多游離源的質譜游離裝置及質譜分析系統
JP2013254752A (ja) * 2013-09-25 2013-12-19 Shimadzu Corp 液体クロマトグラフ質量分析装置
US20220208539A1 (en) * 2019-04-29 2022-06-30 Ohio State Innovation Foundation Method and apparatus for mass spectrometry

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA928199A (en) * 1971-06-25 1973-06-12 I. Schiff Harold Method of gas analysis
JPH077660B2 (ja) * 1984-05-16 1995-01-30 株式会社日立製作所 大気圧イオン化質量分析計
JPS63193454A (ja) * 1987-02-03 1988-08-10 Hitachi Ltd 質量分析装置
JP2834136B2 (ja) * 1988-04-27 1998-12-09 株式会社日立製作所 質量分析計
GB8826966D0 (en) * 1988-11-18 1988-12-21 Vg Instr Group Plc Gas analyzer
JP2902197B2 (ja) * 1992-02-04 1999-06-07 株式会社日立製作所 大気圧イオン化質量分析装置
JPH06302295A (ja) * 1993-04-14 1994-10-28 Hitachi Ltd 質量分析装置および差動排気装置
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
DE19608963C2 (de) * 1995-03-28 2001-03-22 Bruker Daltonik Gmbh Verfahren zur Ionisierung schwerer Moleküle bei Atmosphärendruck
AU3909100A (en) * 1999-03-22 2000-10-09 Analytica Of Branford, Inc. Direct flow injection analysis nebulization electrospray and apci mass spectrometry
US6573510B1 (en) * 1999-06-18 2003-06-03 The Regents Of The University Of California Charge exchange molecular ion source
US6545419B2 (en) * 2001-03-07 2003-04-08 Advanced Technology Materials, Inc. Double chamber ion implantation system
GB0107311D0 (en) * 2001-03-23 2001-05-16 Secr Defence Corona ionisation source
JP3660279B2 (ja) * 2001-07-23 2005-06-15 株式会社日立製作所 試料イオン化装置及び質量分析計

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