JP2005127810A - ３次元座標測定方法及び装置 - Google Patents
３次元座標測定方法及び装置 Download PDFInfo
- Publication number
- JP2005127810A JP2005127810A JP2003362473A JP2003362473A JP2005127810A JP 2005127810 A JP2005127810 A JP 2005127810A JP 2003362473 A JP2003362473 A JP 2003362473A JP 2003362473 A JP2003362473 A JP 2003362473A JP 2005127810 A JP2005127810 A JP 2005127810A
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- rotation
- holding member
- measuring
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 25
- 238000005259 measurement Methods 0.000 claims abstract description 79
- 239000000523 sample Substances 0.000 claims abstract description 45
- 230000007246 mechanism Effects 0.000 claims abstract description 20
- 230000002093 peripheral effect Effects 0.000 claims abstract description 12
- 238000012360 testing method Methods 0.000 claims description 33
- 238000001514 detection method Methods 0.000 claims description 12
- 238000000691 measurement method Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 238000004458 analytical method Methods 0.000 abstract description 8
- 238000007689 inspection Methods 0.000 abstract 1
- 238000013461 design Methods 0.000 description 18
- 230000003287 optical effect Effects 0.000 description 15
- 238000006073 displacement reaction Methods 0.000 description 9
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000012937 correction Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 230000014509 gene expression Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000003796 beauty Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
Images
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003362473A JP2005127810A (ja) | 2003-10-22 | 2003-10-22 | ３次元座標測定方法及び装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003362473A JP2005127810A (ja) | 2003-10-22 | 2003-10-22 | ３次元座標測定方法及び装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005127810A true JP2005127810A (ja) | 2005-05-19 |
| JP2005127810A5 JP2005127810A5 (https=) | 2006-11-30 |
Family
ID=34642125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003362473A Pending JP2005127810A (ja) | 2003-10-22 | 2003-10-22 | ３次元座標測定方法及び装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2005127810A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119245896A (zh) * | 2024-09-29 | 2025-01-03 | 上海理工大学 | 适用于复杂曲面多方向残余应力测试方法及法线调整装置 |
-
2003
- 2003-10-22 JP JP2003362473A patent/JP2005127810A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119245896A (zh) * | 2024-09-29 | 2025-01-03 | 上海理工大学 | 适用于复杂曲面多方向残余应力测试方法及法线调整装置 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5399304B2 (ja) | 非球面体測定方法および装置 | |
| JP4732362B2 (ja) | 多軸計測システムの幾何学配置を較正するための方法 | |
| CN106767290B (zh) | 一种薄壁壳体无损综合测量装置 | |
| WO2017107777A1 (zh) | 一种旋转对称未知非球面面形误差的测量方法及其测量装置 | |
| JPH1183438A (ja) | 光学式測定装置の位置校正方法 | |
| KR20020092838A (ko) | 형상 측정 장치 및 방법, 및 피측정물의 제조 방법 | |
| CN110006367B (zh) | 偏摆角、俯仰角测量方法和装置 | |
| JP2010164388A (ja) | 測定方法及び測定装置 | |
| CN104511794B (zh) | 用于相对于工件定位工具的装置 | |
| JP4764040B2 (ja) | レンズの非球面の偏心軸の偏心測定方法 | |
| US7328125B2 (en) | Measuring method of cylindrical body | |
| CN102087097A (zh) | 非球面体测定方法以及装置 | |
| US7142313B2 (en) | Interaxis angle correction method | |
| Ibaraki et al. | Experimental comparison of non-contact and tactile R-Test instruments in dynamic measurement | |
| JP2005127810A (ja) | ３次元座標測定方法及び装置 | |
| JP2000097663A (ja) | 干渉計 | |
| JP4802134B2 (ja) | 姿勢変化測定方法および装置 | |
| JP4311952B2 (ja) | ３次元座標測定方法 | |
| JP2005195545A (ja) | ３次元形状測定方法及び装置 | |
| JP2008008879A (ja) | 測定装置、測定基準及び精密工作機械 | |
| JPH08233506A (ja) | 非球面形状測定方法及び装置・非球面評価方法 | |
| JP4922905B2 (ja) | 回転中心線の位置変動測定方法および装置 | |
| JP2008268000A (ja) | 変位測定方法および装置 | |
| JP2001227929A (ja) | 角度測定方法及び角度測定装置 | |
| JP2012002607A (ja) | 円錐面測定装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20061018 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20061018 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090424 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090512 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20091027 |