JP2005127810A5 - - Google Patents

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Publication number
JP2005127810A5
JP2005127810A5 JP2003362473A JP2003362473A JP2005127810A5 JP 2005127810 A5 JP2005127810 A5 JP 2005127810A5 JP 2003362473 A JP2003362473 A JP 2003362473A JP 2003362473 A JP2003362473 A JP 2003362473A JP 2005127810 A5 JP2005127810 A5 JP 2005127810A5
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Japan
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measurement
information
rotation
measuring
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JP2003362473A
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English (en)
Japanese (ja)
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JP2005127810A (ja
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Priority to JP2003362473A priority Critical patent/JP2005127810A/ja
Priority claimed from JP2003362473A external-priority patent/JP2005127810A/ja
Publication of JP2005127810A publication Critical patent/JP2005127810A/ja
Publication of JP2005127810A5 publication Critical patent/JP2005127810A5/ja
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JP2003362473A 2003-10-22 2003-10-22 ３次元座標測定方法及び装置 Pending JP2005127810A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003362473A JP2005127810A (ja) 2003-10-22 2003-10-22 ３次元座標測定方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003362473A JP2005127810A (ja) 2003-10-22 2003-10-22 ３次元座標測定方法及び装置

Publications (2)

Publication Number Publication Date
JP2005127810A JP2005127810A (ja) 2005-05-19
JP2005127810A5 true JP2005127810A5 (https=) 2006-11-30

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ID=34642125

Family Applications (1)

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JP2003362473A Pending JP2005127810A (ja) 2003-10-22 2003-10-22 ３次元座標測定方法及び装置

Country Status (1)

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JP (1) JP2005127810A (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119245896B (zh) * 2024-09-29 2025-07-04 上海理工大学 适用于复杂曲面多方向残余应力测试方法及法线调整装置

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