JP2005116343A5 - - Google Patents

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Publication number
JP2005116343A5
JP2005116343A5 JP2003349203A JP2003349203A JP2005116343A5 JP 2005116343 A5 JP2005116343 A5 JP 2005116343A5 JP 2003349203 A JP2003349203 A JP 2003349203A JP 2003349203 A JP2003349203 A JP 2003349203A JP 2005116343 A5 JP2005116343 A5 JP 2005116343A5
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JP
Japan
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JP2003349203A
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JP2005116343A (ja
JP4182853B2 (ja
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Priority to JP2003349203A priority Critical patent/JP4182853B2/ja
Priority claimed from JP2003349203A external-priority patent/JP4182853B2/ja
Priority to US10/959,433 priority patent/US7091480B2/en
Publication of JP2005116343A publication Critical patent/JP2005116343A/ja
Publication of JP2005116343A5 publication Critical patent/JP2005116343A5/ja
Application granted granted Critical
Publication of JP4182853B2 publication Critical patent/JP4182853B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003349203A 2003-10-08 2003-10-08 質量分析方法及び質量分析装置 Expired - Fee Related JP4182853B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2003349203A JP4182853B2 (ja) 2003-10-08 2003-10-08 質量分析方法及び質量分析装置
US10/959,433 US7091480B2 (en) 2003-10-08 2004-10-07 Method of determining mass-to-charge ratio of ions and mass spectrometer using the method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003349203A JP4182853B2 (ja) 2003-10-08 2003-10-08 質量分析方法及び質量分析装置

Publications (3)

Publication Number Publication Date
JP2005116343A JP2005116343A (ja) 2005-04-28
JP2005116343A5 true JP2005116343A5 (ja) 2006-02-02
JP4182853B2 JP4182853B2 (ja) 2008-11-19

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ID=34419695

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003349203A Expired - Fee Related JP4182853B2 (ja) 2003-10-08 2003-10-08 質量分析方法及び質量分析装置

Country Status (2)

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US (1) US7091480B2 (ja)
JP (1) JP4182853B2 (ja)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4182843B2 (ja) * 2003-09-02 2008-11-19 株式会社島津製作所 飛行時間型質量分析装置
JP4182844B2 (ja) * 2003-09-03 2008-11-19 株式会社島津製作所 質量分析装置
JP4033133B2 (ja) * 2004-01-13 2008-01-16 株式会社島津製作所 質量分析装置
JP4980583B2 (ja) * 2004-05-21 2012-07-18 日本電子株式会社 飛行時間型質量分析方法及び装置
JP4506481B2 (ja) * 2005-01-20 2010-07-21 株式会社島津製作所 飛行時間型質量分析装置
GB0513047D0 (en) * 2005-06-27 2005-08-03 Thermo Finnigan Llc Electronic ion trap
CA2639903C (en) 2006-04-13 2012-01-03 Thermo Fisher Scientific (Bremen) Gmbh Ion energy spread reduction for mass spectrometer
GB0607542D0 (en) * 2006-04-13 2006-05-24 Thermo Finnigan Llc Mass spectrometer
JP4957187B2 (ja) * 2006-11-01 2012-06-20 株式会社島津製作所 飛行時間型質量分析装置
WO2009066354A1 (ja) 2007-11-21 2009-05-28 Shimadzu Corporation 質量分析装置
US7932487B2 (en) * 2008-01-11 2011-04-26 Thermo Finnigan Llc Mass spectrometer with looped ion path
JP5136650B2 (ja) * 2008-10-30 2013-02-06 株式会社島津製作所 質量分析装置
WO2010052752A1 (ja) * 2008-11-05 2010-05-14 株式会社島津製作所 多重周回飛行時間型質量分析装置
WO2010052756A1 (ja) * 2008-11-10 2010-05-14 株式会社島津製作所 質量分析方法及び質量分析装置
JP5419047B2 (ja) * 2010-03-19 2014-02-19 株式会社島津製作所 質量分析データ処理方法及び質量分析装置
JP5585394B2 (ja) 2010-11-05 2014-09-10 株式会社島津製作所 多重周回飛行時間型質量分析装置
JPWO2023282149A1 (ja) * 2021-07-09 2023-01-12
GB2616595B (en) * 2022-03-08 2024-06-12 Thermo Fisher Scient Bremen Gmbh Disambiguation of cyclic ion analyser spectra
CN116660358B (zh) * 2023-08-01 2023-11-24 浙江迪谱诊断技术有限公司 一种高分辨飞行时间质谱检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6107625A (en) * 1997-05-30 2000-08-22 Bruker Daltonics, Inc. Coaxial multiple reflection time-of-flight mass spectrometer
JP3539848B2 (ja) 1997-10-30 2004-07-07 日本電子株式会社 飛行時間型質量分析計におけるイオン光学系
JP3392345B2 (ja) 1998-04-09 2003-03-31 住友重機械工業株式会社 飛行時間型質量分析装置
US6037586A (en) * 1998-06-18 2000-03-14 Universite Laval Apparatus and method for separating pulsed ions by mass as said pulsed ions are guided along a course

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