JP2005105184A - Epoxy resin composition for encapsulation of media card and media card system - Google Patents
Epoxy resin composition for encapsulation of media card and media card system Download PDFInfo
- Publication number
- JP2005105184A JP2005105184A JP2003342425A JP2003342425A JP2005105184A JP 2005105184 A JP2005105184 A JP 2005105184A JP 2003342425 A JP2003342425 A JP 2003342425A JP 2003342425 A JP2003342425 A JP 2003342425A JP 2005105184 A JP2005105184 A JP 2005105184A
- Authority
- JP
- Japan
- Prior art keywords
- epoxy resin
- resin composition
- media card
- organic substrate
- card system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 0 *c1ccccc1 Chemical compound *c1ccccc1 0.000 description 4
Abstract
Description
本発明は、電子情報の記録媒体となるメディアカードシステムの製造に用いるメディアカード封止用エポキシ樹脂組成物及びメディアカードシステムに関するものである。 The present invention relates to an epoxy resin composition for sealing a media card and a media card system used for manufacturing a media card system that is a recording medium for electronic information.
従来、電子情報の記録媒体となるメディアカードシステムは半導体装置が実装された有機基板を予め成形されたプラスチック製キャップによって中空状態でカバーすることによって製造されている。
しかしながら、有機基板を中空でカバーするため強度が劣ったり、製造工程の煩雑化による問題が解決できずにいた。
メディアカードを外部環境から保護するという観点では、メディアカードをカードフォルダーに挿入する際の擦過傷を防ぐための手法が開示されている(例えば、特許文献1参照。)が、使用時に誤ってメディアカードを落下させた場合のカード自体の破損を防止するという点では不充分であった。
こうした問題を解決できるような製造方法およびその材料が求められている。
2. Description of the Related Art Conventionally, a media card system serving as a recording medium for electronic information is manufactured by covering an organic substrate on which a semiconductor device is mounted in a hollow state with a pre-molded plastic cap.
However, since the organic substrate is covered with a hollow, the strength is inferior, and problems due to complicated manufacturing processes cannot be solved.
From the viewpoint of protecting the media card from the external environment, a technique for preventing scratches when the media card is inserted into the card folder is disclosed (for example, see Patent Document 1). It was not sufficient in terms of preventing damage to the card itself when the card was dropped.
There is a need for manufacturing methods and materials that can solve these problems.
本発明は上記のような従来の問題を解決するためになされたもので、その目的とするところはメディアカードシステムを落下させた際にもクラックや欠けが発生しないという優れた耐落下性を有するエポキシ樹脂組成物及びこれを用いて製造されたメディアカードシステムを提供するものである。 The present invention has been made in order to solve the above-described conventional problems. The object of the present invention is to have excellent drop resistance such that cracks and chips do not occur even when the media card system is dropped. An epoxy resin composition and a media card system manufactured using the same are provided.
本発明は、
[1] (A)エポキシ樹脂、(B)硬化剤、(C)硬化促進剤及び(D)無機充填材を必須成分とするエポキシ樹脂組成物であって、該無機充填材を全エポキシ樹脂組成物中に20〜80重量%含み、該エポキシ樹脂組成物が有機基板及び有機基板に搭載された半導体装置を一体封止することを特徴とするメディアカード封止用エポキシ樹脂組成物、
[2] 上記エポキシ樹脂として一般式(1)で表されるエポキシ樹脂を含む第[1]項記載のメディアカード封止用エポキシ樹脂組成物、
である。
The present invention
[1] An epoxy resin composition comprising (A) an epoxy resin, (B) a curing agent, (C) a curing accelerator, and (D) an inorganic filler as essential components, wherein the inorganic filler is a total epoxy resin composition. An epoxy resin composition for sealing a media card, comprising 20 to 80% by weight in a product, wherein the epoxy resin composition integrally seals an organic substrate and a semiconductor device mounted on the organic substrate,
[2] The epoxy resin composition for sealing a media card according to item [1], including an epoxy resin represented by the general formula (1) as the epoxy resin,
It is.
本発明の方法に従うと、メディアカードシステムを落下させた際にもクラックや欠けが発生しないという優れた耐落下性を有するメディアカードシステムを得ることができるうえに、メディアカードシステムの製造工程においてもその簡略化が図れるので、工業的なメディアカードシステムの製造方法として好適である。 According to the method of the present invention, it is possible to obtain a media card system having excellent drop resistance in which cracks and chips do not occur even when the media card system is dropped, and also in the manufacturing process of the media card system Since it can be simplified, it is suitable as an industrial media card system manufacturing method.
本発明は、メディアカードシステム自体の構造上の欠陥及び無機充填材量により変化する封止材料の弾性率に着目し、メディアカードシステムを落下させた際に局所的に加わる応力を抑制することができるとの知見をもとになされたものであり、エポキシ樹脂、硬化剤、硬化促進剤及び無機充填材を必須成分とし、該無機充填材を全エポキシ樹脂組成物中に20〜80重量%含み、好ましくはエポキシ樹脂としてビフェニレン骨格を有するフェノールアラルキル型エポキシ樹脂を含み、より好ましくは硬化剤としてビフェニレン骨格を有するフェノールアラルキル樹脂を含むエポキシ樹脂組成物を用いて、有機基板及び有機基板に搭載された半導体装置を一体封止することにより、メディアカードシステムを落下させた際にもクラックや欠けが発生しないという優れた耐落下性を有するメディアカードシステムを得ることができ、更に本レジンシステムの導入により成形材料として望まれている難燃性も同時に得ることが可能で、且つメディアカードシステムの製造工程においてもその簡略化が図れることを見出したものである。
以下、本発明について詳細に説明する。
The present invention focuses on the structural defects of the media card system itself and the elastic modulus of the sealing material that varies depending on the amount of inorganic filler, and suppresses locally applied stress when the media card system is dropped. It is made based on the knowledge that it can be made, and includes an epoxy resin, a curing agent, a curing accelerator and an inorganic filler as essential components, and the inorganic filler is contained in the entire epoxy resin composition in an amount of 20 to 80% by weight. The epoxy resin composition preferably includes a phenol aralkyl type epoxy resin having a biphenylene skeleton as an epoxy resin, and more preferably an epoxy resin composition including a phenol aralkyl resin having a biphenylene skeleton as a curing agent. Even if the media card system is dropped by sealing the semiconductor device integrally, cracks and chips It is possible to obtain a media card system having excellent drop resistance that does not occur, and furthermore, by introducing this resin system, it is possible to simultaneously obtain the flame retardancy desired as a molding material, and manufacture of the media card system It has been found that the process can be simplified.
Hereinafter, the present invention will be described in detail.
本発明に用いるエポキシ樹脂としては、1分子中にエポキシ基を2個以上有するモノマー、オリゴマー、ポリマー全般を言い、その分子量、分子構造は特に限定されるものではないが、例えばフェニレン及び/又はビフェニレン骨格を有するアラルキル型エポキシ樹脂、ビフェニル型エポキシ樹脂、ビスフェノール型エポキシ樹脂、フェノールノボラック型エポキシ樹脂、クレゾールノボラック型エポキシ樹脂、ビスフェノール型エポキシ樹脂、ナフタレン型エポキシ樹脂、ジシクロペンタジエン変性フェノール型エポキシ樹脂、アルキル変性トリフェノールメタン型エポキシ樹脂、トリアジン核含有エポキシ樹脂等が挙げられる。
その中でも特に架橋点間距離が長く、強靱性を有しているフェニレン及び/又はビフェニレン骨格を有するフェノールアラルキル型エポキシ樹脂は落下試験に非常に効果的であり、ビフェニレン骨格を有するアラルキル型エポキシ樹脂がより好ましい。
また、樹脂組成物の耐湿性向上のためには、不純物としてClイオン、Naイオン等の不純物イオンが極力少ないことが望ましく、また、硬化性の観点からエポキシ当量としては150〜300g/eqが望ましい。
The epoxy resin used in the present invention refers to monomers, oligomers, and polymers in general having two or more epoxy groups in one molecule, and the molecular weight and molecular structure are not particularly limited. For example, phenylene and / or biphenylene Aralkyl epoxy resin having skeleton, biphenyl epoxy resin, bisphenol epoxy resin, phenol novolac epoxy resin, cresol novolac epoxy resin, bisphenol epoxy resin, naphthalene epoxy resin, dicyclopentadiene modified phenol epoxy resin, alkyl Examples thereof include modified triphenol methane type epoxy resin, triazine nucleus-containing epoxy resin and the like.
Among them, a phenol aralkyl type epoxy resin having a long phenylene and / or biphenylene skeleton having a long toughness between cross-linking points is very effective for a drop test, and an aralkyl type epoxy resin having a biphenylene skeleton is a More preferred.
Moreover, in order to improve the moisture resistance of the resin composition, it is desirable that impurity ions such as Cl ions and Na ions are as few as possible, and an epoxy equivalent of 150 to 300 g / eq is desirable from the viewpoint of curability. .
本発明に用いる硬化剤としては、フェノール系、アミン系、ポリアミノアミド系、酸無水物系が挙げられ、それらの分子構造は特に限定されるものではないが、例えばフェノール系ではフェノールノボラック樹脂、クレゾールノボラック樹脂、ジシクロペンタジエン変性フェノール樹脂、フェニレン及び/又はビフェニレン骨格を有するフェノールアラルキル樹脂、トリフェノールメタン樹脂、テルペン変性フェノール樹脂、トリフェノールメタン型フェノール樹脂等、アミン系では脂肪族ジアミンやポリアミン、芳香族ジアミンやポリアミン等、酸無水物系では脂肪族、脂環式、芳香族系が挙げられる。耐落下強度及び難燃性の観点からビフェニレン骨格を有するフェノールアラルキル樹脂が望ましい。 Examples of the curing agent used in the present invention include phenolic, amine-based, polyaminoamide-based, and acid anhydride-based types, and their molecular structures are not particularly limited. For example, phenolic novolak resins and cresols are used for phenol-based curing agents. Novolak resin, dicyclopentadiene modified phenol resin, phenol aralkyl resin having phenylene and / or biphenylene skeleton, triphenol methane resin, terpene modified phenol resin, triphenol methane type phenol resin, etc., amine type aliphatic diamine, polyamine, aromatic Aliphatic, alicyclic, and aromatic types are included in acid anhydrides such as aromatic diamines and polyamines. A phenol aralkyl resin having a biphenylene skeleton is desirable from the viewpoint of the drop strength and flame retardancy.
本発明に用いる硬化促進剤は、エポキシ樹脂と硬化剤の反応を促進するものであればよく、一般に封止材料に使用されているものを利用することができる。例えば1,8−ジアザビシクロ(5,4,0)ウンデセン−7等のジアザビシクロアルケン及びその誘導体、トリフェニルホスフィン等の有機ホスフィン類、2−メチルイミダゾール等のイミダゾール化合物等があり、これらは単独でも混合して用いてもよい。 The hardening accelerator used for this invention should just accelerate | stimulate reaction of an epoxy resin and a hardening | curing agent, and what is generally used for the sealing material can be utilized. For example, there are diazabicycloalkenes such as 1,8-diazabicyclo (5,4,0) undecene-7 and derivatives thereof, organic phosphines such as triphenylphosphine, imidazole compounds such as 2-methylimidazole, and the like. However, they may be mixed and used.
本発明に用いる無機充填材としては、溶融シリカ、結晶シリカ、アルミナ、窒化珪素等が挙げられ、流動性、低収縮性より球状の溶融シリカが好ましい。
本発明は無機充填材を全エポキシ樹脂組成物中に20〜80重量%含有していることを特徴としているが、好ましくは40〜80重量%、より好ましくは45〜80重量%である。無機充填材の量が上記下限値を下回ると硬化物全体の収縮率が大きくなりメディアカードシステムの反り量を抑えることができなくなる。また、無機充填材の量が上記上限値を越えるとエポキシ樹脂組成物の弾性率が高くなり耐落下性が確保できないばかりでなく、粘度が高くなり成形時に基板のシフトを生じさせ成形外観不良となる。
Examples of the inorganic filler used in the present invention include fused silica, crystalline silica, alumina, silicon nitride, and the like, and spherical fused silica is preferred from the viewpoint of fluidity and low shrinkage.
The present invention is characterized in that an inorganic filler is contained in the entire epoxy resin composition in an amount of 20 to 80% by weight, preferably 40 to 80% by weight, more preferably 45 to 80% by weight. When the amount of the inorganic filler is less than the lower limit, the shrinkage rate of the entire cured product becomes large, and the warp amount of the media card system cannot be suppressed. In addition, if the amount of the inorganic filler exceeds the above upper limit, not only the elastic modulus of the epoxy resin composition becomes high and the drop resistance cannot be secured, but also the viscosity becomes high, causing a shift of the substrate at the time of molding, resulting in poor molding appearance. Become.
本発明のエポキシ樹脂組成物は、(A)〜(D)成分を必須とするが、これ以外に必要に応じてシランカップリング剤、難燃剤、難燃助剤、離型剤及びシリコーン系や合成ゴム系の低応力剤等の種々の添加剤、着色剤等を適宜配合しても差し支えない。
本発明のエポキシ樹脂組成物は、例えば(A)〜(D)成分及びその他の添加剤をミキサー等により混合した後、更に熱ロールやニーダー等で溶融混練し、冷却後粉砕して製造すればよい。
The epoxy resin composition of the present invention essentially comprises the components (A) to (D). In addition to these, a silane coupling agent, a flame retardant, a flame retardant aid, a release agent, a silicone-based Various additives such as a synthetic rubber-based low stress agent, a coloring agent, and the like may be appropriately blended.
The epoxy resin composition of the present invention can be produced by, for example, mixing the components (A) to (D) and other additives with a mixer, etc., further melt-kneading with a hot roll or kneader, etc., cooling and pulverizing. Good.
本発明は、上記のエポキシ樹脂組成物を用いて有機基板及び有機基板に搭載された半導体装置を一体封止することを特徴とする。本発明のエポキシ樹脂組成物を用いて有機基板及び有機基板に搭載された半導体装置を一体封止しメディアカードシステムを製造するには、トランスファーモールド、コンプレッションモールド、インジェクションモールド等の従来からの成形方法で硬化成形すればよい。本発明の方法によれば、有機基板及び有機基板に搭載された半導体装置をエポキシ樹脂組成物で一度に一体封止成形できるため、従来の製法である、半導体素子をエポキシ樹脂組成物で封止した半導体装置を有機基板に搭載したものをキャップにいれ、接着剤等で固定する等の煩雑な工程を取り除けるという利点を有している。 The present invention is characterized by integrally sealing an organic substrate and a semiconductor device mounted on the organic substrate using the epoxy resin composition described above. In order to manufacture a media card system by integrally sealing an organic substrate and a semiconductor device mounted on the organic substrate using the epoxy resin composition of the present invention, a conventional molding method such as transfer molding, compression molding, injection molding, etc. Then, it may be cured and molded. According to the method of the present invention, since an organic substrate and a semiconductor device mounted on the organic substrate can be integrally sealed with an epoxy resin composition at a time, a semiconductor element, which is a conventional manufacturing method, is sealed with an epoxy resin composition. Such a semiconductor device mounted on an organic substrate is put in a cap and has an advantage that a complicated process such as fixing with an adhesive or the like can be eliminated.
以下本発明を実施例にて具体的に説明するが、本発明はこれらに限定されるものではない。配合割合は重量部とする。
実施例1
Hereinafter, the present invention will be specifically described with reference to examples, but the present invention is not limited thereto. The blending ratio is parts by weight.
Example 1
エポキシ樹脂1:式(1)で示されるビフェニレン骨格を有するフェノールアラルキル型エポキシ樹脂(軟化点58℃、エポキシ当量272g/eq) 100重量部
フェノール樹脂1:式(2)で示されるビフェニレン骨格を有するフェノールアラルキル樹脂(軟化点65℃、エポキシ当量200g/eq) 70重量部
1,8−ジアザビシクロ(5,4,0)ウンデセン−7(以下、DBUという)
2重量部
溶融シリカ粉末(平均粒径20μm) 200重量部
カルナバワックス 3重量部
をミキサーにて常温混合し、80〜110℃で二軸混練機により混練し、冷却後粉砕しエポキシ樹脂組成物を得た。評価結果を表1に示す。
1,8-diazabicyclo (5,4,0) undecene-7 (hereinafter referred to as DBU)
2 parts by weight Fused silica powder (average particle size 20 μm) 200 parts by weight Carnauba wax 3 parts by weight are mixed at room temperature with a mixer, kneaded at 80 to 110 ° C. with a twin-screw kneader, cooled and pulverized to obtain an epoxy resin composition. Obtained. The evaluation results are shown in Table 1.
評価方法
スパイラルフロー:EMMI−1−66に準じた金型を用い、前記樹脂組成物をトランスファー成形機にて、金型温度175℃、注入圧力6.9MPa、保圧時間120秒の条件にて成形しスパイラルフローを測定した。単位はcm。流動性の指標としては120cm以上を合格とした。
耐落下性:得られた樹脂組成物を用いて、低圧トランスファー成形機をにて、金型温度180℃、注入圧力9.8MPa、硬化時間90秒の条件で、メディアカード(メディアカードシステムサイズ20mm×31mm×厚さ1.6mm)を一体封止成形した。得られたメディアカードシステムの成形品を1.8mの高さから1サンプルにつき20回落下させ、樹脂クラックや欠け等の発生を実体顕微鏡にて確認した。落下させる床の材質はリノリウム性のタイル張りで実施した。外観検査にてクラックや欠けの発生したものを不良とした。試験はn=20個にて実施し不良0を合格とした。
反り:耐落下性試験と同様にしてメディアカードを一体封止成形して得られたメディアカードシステムの成形品について、その長辺方向の両端間の反り量を接触型の表面粗さ計にて測定を行った。単位はmm。反り量は後工程の矯正作業にて矯正が困難である1mmを越えるものを不合格とした。
シフト:耐落下性試験と同様にしてメディアカードを一体封止成形して得られたメディアカードシステム成形品について、その断面を切断し基板の両端を測定位置とし設計値に対しどれだけ動いたかを測定した。単位はμm。シフト量の合否は絶対値として100μm以下を合格とした。ここで云うシフト量とは有機基板の設計上の位置からの移動距離を指す。
難燃性:低圧トランスファー成形機を用いて、金型温度175℃、注入圧力9.8MPa、硬化時間120秒の条件で、長さ127mm、幅12.7mm、厚さ1.6mmの試験片を成形し、ポストキュアとして175℃、8時間加熱処理した後、23℃、相対湿度50%の環境下で48時間加湿処理し、UL−94に準じて難燃性試験を行った。
Evaluation Method Spiral Flow: Using a mold according to EMMI-1-66, the resin composition was transferred using a transfer molding machine under conditions of a mold temperature of 175 ° C., an injection pressure of 6.9 MPa, and a holding time of 120 seconds. Molding and measuring the spiral flow. The unit is cm. As an index of fluidity, 120 cm or more was regarded as acceptable.
Drop resistance: Media card (media card system size 20 mm) using the obtained resin composition on a low-pressure transfer molding machine under conditions of a mold temperature of 180 ° C., an injection pressure of 9.8 MPa, and a curing time of 90 seconds. × 31 mm × thickness 1.6 mm) was integrally sealed. The obtained molded product of the media card system was dropped 20 times per sample from a height of 1.8 m, and occurrence of resin cracks, chips, etc. was confirmed with a stereomicroscope. The material of the floor to be dropped was tiled with linoleum. Those with cracks or chips in the appearance inspection were regarded as defective. The test was carried out with n = 20, and the defect 0 was regarded as acceptable.
Warpage: For a molded product of the media card system obtained by integrally sealing and molding the media card in the same manner as the drop resistance test, the amount of warpage between both ends in the long side direction is measured with a contact type surface roughness meter. Measurements were made. The unit is mm. The amount of warpage exceeding 1 mm, which is difficult to correct in the post-correction work, was rejected.
Shift: For a media card system molded product obtained by integrally molding a media card in the same manner as the drop resistance test, cut the cross section and measure how much the board moved with respect to the design value with both ends of the board being measured. It was measured. The unit is μm. As for the pass / fail of the shift amount, an absolute value of 100 μm or less was accepted. Here, the shift amount refers to the moving distance from the design position of the organic substrate.
Flame retardancy: Using a low-pressure transfer molding machine, a test piece having a length of 127 mm, a width of 12.7 mm, and a thickness of 1.6 mm was obtained under the conditions of a mold temperature of 175 ° C., an injection pressure of 9.8 MPa, and a curing time of 120 seconds. After being molded and subjected to a heat treatment at 175 ° C. for 8 hours as a post cure, it was humidified for 48 hours in an environment of 23 ° C. and a relative humidity of 50%, and a flame retardancy test was performed according to UL-94.
実施例2〜6、比較例1〜6
表1、表2の処方に従って配合し、実施例1と同様にして樹脂組成物を得、同様に評価した。評価結果を表1、表2に示す。
実施例1以外で用いた成分について、以下に示す。
エポキシ樹脂2:ビフェニル型エポキシ樹脂(ジャパンエポキシレジン製、YX4000、融点105℃、エポキシ当量190g/eq)
エポキシ樹脂3:ジシクロペンタジエン変性フェノール型エポキシ樹脂(大日本インキ化学工業製、HP7200、軟化点60℃、エポキシ当量263g/eq)
フェノール樹脂2:フェニレン骨格を有するフェノールアラルキル樹脂(三井化学製、XL225LL、軟化点75℃、水酸基当量175g/eq)
フェノール樹脂3:フェノールノボラック樹脂(三井化学製、VR9305、軟化点80℃、エポキシ当量104g/eq)
トリフェニルホスフィン
臭素化エポキシ樹脂(臭素含有量49%、軟化点70℃、エポキシ当量360g/eq)
三酸化アンチモン
カーボンブラック
Examples 2-6, Comparative Examples 1-6
It compounded according to prescription of Table 1 and Table 2, and obtained the resin composition like Example 1, and evaluated similarly. The evaluation results are shown in Tables 1 and 2.
The components used in other than Example 1 are shown below.
Epoxy resin 2: biphenyl type epoxy resin (manufactured by Japan Epoxy Resin, YX4000, melting point 105 ° C., epoxy equivalent 190 g / eq)
Epoxy resin 3: dicyclopentadiene-modified phenol type epoxy resin (manufactured by Dainippon Ink and Chemicals, HP7200, softening point 60 ° C., epoxy equivalent 263 g / eq)
Phenol resin 2: Phenol aralkyl resin having a phenylene skeleton (Mitsui Chemicals, XL225LL, softening point 75 ° C., hydroxyl group equivalent 175 g / eq)
Phenol resin 3: Phenol novolac resin (Mitsui Chemicals, VR9305, softening point 80 ° C., epoxy equivalent 104 g / eq)
Triphenylphosphine brominated epoxy resin (bromine content 49%, softening point 70 ° C., epoxy equivalent 360 g / eq)
Antimony trioxide carbon black
本発明は、電子情報の記録媒体となるメディアカードシステムの製造に用いるメディアカード封止用エポキシ樹脂組成物及びメディアカードシステムとして好適に使用できるものである。その利用範囲はデジタルカメラ、携帯電話、パソコンを始め多くの電子機器製品の記録媒体として多くの産業用、民生用製品に及ぶものである。また、その生産方式はICパッケージを組み立て、更に基盤に実装し最後に従来のケース状の成形品を重ね合わせて生産するといった長い工程を経る必要が無く、簡便にしかも短工程で製品を一括に製造できるという利点がある。
INDUSTRIAL APPLICATION This invention can be conveniently used as an epoxy resin composition for media card sealing used for manufacture of the media card system used as a recording medium of electronic information, and a media card system. The range of use extends to many industrial and consumer products as recording media for many electronic device products such as digital cameras, mobile phones and personal computers. In addition, the production method does not require a long process of assembling an IC package, mounting it on a base board, and finally stacking the conventional case-shaped molded products, making it easy to package products in a short process. There is an advantage that it can be manufactured.
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003342425A JP4349054B2 (en) | 2003-09-30 | 2003-09-30 | Epoxy resin composition for media card sealing and media card system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003342425A JP4349054B2 (en) | 2003-09-30 | 2003-09-30 | Epoxy resin composition for media card sealing and media card system |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005105184A true JP2005105184A (en) | 2005-04-21 |
JP4349054B2 JP4349054B2 (en) | 2009-10-21 |
Family
ID=34536698
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003342425A Expired - Lifetime JP4349054B2 (en) | 2003-09-30 | 2003-09-30 | Epoxy resin composition for media card sealing and media card system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4349054B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007077179A (en) * | 2005-09-09 | 2007-03-29 | Shin Etsu Chem Co Ltd | Sealing epoxy resin composition |
JP2007191521A (en) * | 2006-01-17 | 2007-08-02 | Somar Corp | Epoxy resin composition and epoxy resin varnish, bonding sheet and cover-lay film by using the same |
JP2012251151A (en) * | 2012-07-17 | 2012-12-20 | Somar Corp | Epoxy resin composition and epoxy resin varnish, bonding sheet and cover-lay film using the same |
-
2003
- 2003-09-30 JP JP2003342425A patent/JP4349054B2/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007077179A (en) * | 2005-09-09 | 2007-03-29 | Shin Etsu Chem Co Ltd | Sealing epoxy resin composition |
JP4628912B2 (en) * | 2005-09-09 | 2011-02-09 | 信越化学工業株式会社 | Epoxy resin composition for sealing |
JP2007191521A (en) * | 2006-01-17 | 2007-08-02 | Somar Corp | Epoxy resin composition and epoxy resin varnish, bonding sheet and cover-lay film by using the same |
JP2012251151A (en) * | 2012-07-17 | 2012-12-20 | Somar Corp | Epoxy resin composition and epoxy resin varnish, bonding sheet and cover-lay film using the same |
Also Published As
Publication number | Publication date |
---|---|
JP4349054B2 (en) | 2009-10-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20070036981A1 (en) | Molding compositions containing quaternary organophosphonium salts | |
JP2011184650A (en) | Resin composition for electronic component encapsulation and electronic component device using the same | |
TW201902975A (en) | Liquid resin composition for compression molding and electronic component device | |
US8048969B2 (en) | Semiconductor encapsulating epoxy resin composition and semiconductor device | |
TWI786121B (en) | Liquid resin composition for sealing and electronic component device | |
TWI391420B (en) | Epoxy resin composition for semiconductor sealing and semiconductor device | |
KR102570038B1 (en) | Thermosetting epoxy resin sheet for sealing semiconductor, semiconductor device, and manufacturing method thereof | |
KR101955754B1 (en) | Epoxy resin composition for encapsulating semiconductor device and semiconductor device encapsulated by using the same | |
JP4493929B2 (en) | Adhesive film for coating electronic components | |
JP4349054B2 (en) | Epoxy resin composition for media card sealing and media card system | |
WO2019131096A1 (en) | Encapsulating epoxy resin composition for ball grid array package, cured epoxy resin object, and electronic component/device | |
JP4628912B2 (en) | Epoxy resin composition for sealing | |
WO2020241594A1 (en) | Encapsulating resin composition and electronic component device | |
JPH10173103A (en) | Epoxy resin compsn. for sealing semiconductor | |
EP3242321A1 (en) | Method for encapsulating a base material with a large-area semiconductor element | |
JP2626377B2 (en) | Epoxy resin composition and semiconductor device | |
JP2007262384A (en) | Epoxy resin composition for sealing semiconductor and semiconductor device | |
KR101266542B1 (en) | Epoxy resin composition for encapsulating semiconductor device and semiconductor device package using the same | |
JPS63226951A (en) | Resin sealed semiconductor device | |
JP4835851B2 (en) | Epoxy resin composition for semiconductor encapsulation and semiconductor device | |
JP2006257309A (en) | Epoxy resin composition for sealing semiconductor and semiconductor device | |
KR100504604B1 (en) | Epoxy molding compound for sealing of semiconductor device | |
US7683138B1 (en) | Molding compositions | |
JP2007045884A (en) | Resin composition for sealing and semiconductor device | |
KR102545654B1 (en) | Epoxy Resin Composition for Sealing Semiconductor |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20060413 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20081120 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20081125 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090126 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20090630 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20090713 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120731 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4349054 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120731 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130731 Year of fee payment: 4 |