JP2004536300A5 - - Google Patents
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- JP2004536300A5 JP2004536300A5 JP2003511609A JP2003511609A JP2004536300A5 JP 2004536300 A5 JP2004536300 A5 JP 2004536300A5 JP 2003511609 A JP2003511609 A JP 2003511609A JP 2003511609 A JP2003511609 A JP 2003511609A JP 2004536300 A5 JP2004536300 A5 JP 2004536300A5
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- JP
- Japan
- Prior art keywords
- group
- substrate
- indicia
- imaging device
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000000034 method Methods 0.000 claims description 78
- 239000000758 substrate Substances 0.000 claims description 60
- 238000003384 imaging method Methods 0.000 claims description 36
- 238000012937 correction Methods 0.000 claims description 15
- 238000004458 analytical method Methods 0.000 claims description 9
- 238000004590 computer program Methods 0.000 claims description 5
- 238000012545 processing Methods 0.000 description 24
- 239000004020 conductor Substances 0.000 description 12
- 238000010586 diagram Methods 0.000 description 6
- 238000004364 calculation method Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000011960 computer-aided design Methods 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 238000013519 translation Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000003708 edge detection Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000010187 selection method Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP01401790 | 2001-07-04 | ||
| PCT/IB2002/002837 WO2003005793A2 (en) | 2001-07-04 | 2002-07-04 | Choice of reference markings for enabling fast estimating of the position of an imaging device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004536300A JP2004536300A (ja) | 2004-12-02 |
| JP2004536300A5 true JP2004536300A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 2008-09-04 |
Family
ID=8182793
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003511609A Pending JP2004536300A (ja) | 2001-07-04 | 2002-07-04 | 画像装置の位置の迅速な判断を可能にする基準のしるしの選択 |
Country Status (5)
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004086843A1 (en) | 2003-03-28 | 2004-10-07 | Koninklijke Philips Electronics N.V. | Method of determining at least one marking element on a substrate |
| JP2005229111A (ja) * | 2004-02-13 | 2005-08-25 | Assembleon Nv | 基体上の少なくとも１つの部品配置位置を推定する方法及びかかる方法を実施する装置 |
| US9046890B2 (en) * | 2008-09-05 | 2015-06-02 | Fanuc Robotics America, Inc. | Line tracking data over Ethernet |
| JP2011082243A (ja) * | 2009-10-05 | 2011-04-21 | Panasonic Corp | 部品実装装置および部品実装装置における実装状態検査方法 |
| US9128367B2 (en) | 2010-03-05 | 2015-09-08 | Panasonic Intellectual Property Management Co., Ltd. | 3D imaging device and 3D imaging method |
| JP5444452B2 (ja) * | 2010-03-05 | 2014-03-19 | パナソニック株式会社 | 立体撮像装置および立体撮像方法 |
| JP5432365B2 (ja) | 2010-03-05 | 2014-03-05 | パナソニック株式会社 | 立体撮像装置および立体撮像方法 |
| JP2011191943A (ja) * | 2010-03-12 | 2011-09-29 | Omron Corp | 画像処理装置および画像処理プログラム |
| WO2014020739A1 (ja) * | 2012-08-02 | 2014-02-06 | 富士機械製造株式会社 | 多関節型ロボットを備えた作業機および電気部品装着機 |
| EP2749843A1 (en) * | 2012-12-28 | 2014-07-02 | GN Store Nord A/S | Method for filtering and selecting geographical points of interest and mobile unit corresponding thereto |
| CN111263141B (zh) * | 2020-02-21 | 2021-11-02 | 深圳创维－Rgb电子有限公司 | 摄像头检测方法、装置、生产线系统 |
| CN113794875B (zh) * | 2021-11-15 | 2022-02-18 | 浪潮软件股份有限公司 | 一种重大项目现场视频偏移智能巡检的方法及装置 |
| CN118470281B (zh) * | 2024-06-04 | 2025-02-28 | 华翌智能装备(杭州)有限公司 | 一种pcb板电子元器件自动检测用最优点位计算方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5794608A (en) * | 1980-12-03 | 1982-06-12 | Nec Corp | Defect detecting method for printed wiring |
| US4860374A (en) * | 1984-04-19 | 1989-08-22 | Nikon Corporation | Apparatus for detecting position of reference pattern |
| JPH07234943A (ja) * | 1994-02-23 | 1995-09-05 | Matsushita Electric Ind Co Ltd | 位置認識方法及びその装置 |
| US5974169A (en) * | 1997-03-20 | 1999-10-26 | Cognex Corporation | Machine vision methods for determining characteristics of an object using boundary points and bounding regions |
| US6324299B1 (en) * | 1998-04-03 | 2001-11-27 | Cognex Corporation | Object image search using sub-models |
| GB9828109D0 (en) * | 1998-12-19 | 1999-02-17 | Kestra Ltd | Inspection equipment and methods of inspection |
| US6542630B1 (en) * | 1999-09-14 | 2003-04-01 | Teradyne, Inc. | Inspecting component placement relative to component pads |
| US6577758B1 (en) * | 1999-09-24 | 2003-06-10 | Cognex Technology And Investment Corporation | Image position detection technique in which input parameters can be easily determined |
| US6748104B1 (en) * | 2000-03-24 | 2004-06-08 | Cognex Corporation | Methods and apparatus for machine vision inspection using single and multiple templates or patterns |
| JP4740405B2 (ja) * | 2000-11-09 | 2011-08-03 | 東京エレクトロン株式会社 | 位置合わせ方法及びプログラム記録媒体 |
| US6915008B2 (en) * | 2001-03-08 | 2005-07-05 | Point Grey Research Inc. | Method and apparatus for multi-nodal, three-dimensional imaging |
| US7110591B2 (en) * | 2001-03-28 | 2006-09-19 | Siemens Corporate Research, Inc. | System and method for recognizing markers on printed circuit boards |
-
2002
- 2002-07-04 WO PCT/IB2002/002837 patent/WO2003005793A2/en active Application Filing
- 2002-07-04 US US10/482,141 patent/US7477774B2/en not_active Expired - Fee Related
- 2002-07-04 EP EP02745737A patent/EP1407647B1/en not_active Expired - Lifetime
- 2002-07-04 JP JP2003511609A patent/JP2004536300A/ja active Pending
- 2002-07-04 DE DE60238407T patent/DE60238407D1/de not_active Expired - Lifetime
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