JPS5794608A - Defect detecting method for printed wiring - Google Patents
Defect detecting method for printed wiringInfo
- Publication number
- JPS5794608A JPS5794608A JP55170423A JP17042380A JPS5794608A JP S5794608 A JPS5794608 A JP S5794608A JP 55170423 A JP55170423 A JP 55170423A JP 17042380 A JP17042380 A JP 17042380A JP S5794608 A JPS5794608 A JP S5794608A
- Authority
- JP
- Japan
- Prior art keywords
- conductor pattern
- electric conductor
- line
- scanning
- width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
Landscapes
- Engineering & Computer Science (AREA)
- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
PURPOSE:To detect a defect quickly and exactly, by making a vertical part of an electric conductor pattern meet at right angles with a scanning line, so that a picture output signal of the relevant part can be made equal to width of the electric conductor pattern. CONSTITUTION:When positions of a leading edge and a trailing edge of an electric conductor pattern 3 in case when the left end being a scanning start point of a printed circuit board 1 has been made a reference are denoted as A and B, B is constant and A is varied monotonously in the section to scanning lines 4-1-4-n being a shifting part to an oblique line from a vertical line, and in the section to scanning lines 4'-1-4'-n being a shifting part to the vertical line from the oblique line. In a 45 deg. refracted part of the electric conductor pattern 3, its width variation is continued for some period, therefore, it can be discriminated from hair or a flaw, also can be discriminated from a swing since its motion is different. Therefore, a picture output signal of the electric conductor pattern 3 is processed by dividing it into a straight line part and an oblique line part, and a defect is decided with high accuracy by use of a width set value.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55170423A JPS5794608A (en) | 1980-12-03 | 1980-12-03 | Defect detecting method for printed wiring |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55170423A JPS5794608A (en) | 1980-12-03 | 1980-12-03 | Defect detecting method for printed wiring |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5794608A true JPS5794608A (en) | 1982-06-12 |
Family
ID=15904639
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55170423A Pending JPS5794608A (en) | 1980-12-03 | 1980-12-03 | Defect detecting method for printed wiring |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5794608A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003005793A3 (en) * | 2001-07-04 | 2003-05-08 | Koninkl Philips Electronics Nv | Choice of reference markings for enabling fast estimating of the position of an imaging device |
-
1980
- 1980-12-03 JP JP55170423A patent/JPS5794608A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003005793A3 (en) * | 2001-07-04 | 2003-05-08 | Koninkl Philips Electronics Nv | Choice of reference markings for enabling fast estimating of the position of an imaging device |
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