JPS5794608A - Defect detecting method for printed wiring - Google Patents

Defect detecting method for printed wiring

Info

Publication number
JPS5794608A
JPS5794608A JP55170423A JP17042380A JPS5794608A JP S5794608 A JPS5794608 A JP S5794608A JP 55170423 A JP55170423 A JP 55170423A JP 17042380 A JP17042380 A JP 17042380A JP S5794608 A JPS5794608 A JP S5794608A
Authority
JP
Japan
Prior art keywords
conductor pattern
electric conductor
line
scanning
width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55170423A
Other languages
Japanese (ja)
Inventor
Yukio Nishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55170423A priority Critical patent/JPS5794608A/en
Publication of JPS5794608A publication Critical patent/JPS5794608A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages

Landscapes

  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

PURPOSE:To detect a defect quickly and exactly, by making a vertical part of an electric conductor pattern meet at right angles with a scanning line, so that a picture output signal of the relevant part can be made equal to width of the electric conductor pattern. CONSTITUTION:When positions of a leading edge and a trailing edge of an electric conductor pattern 3 in case when the left end being a scanning start point of a printed circuit board 1 has been made a reference are denoted as A and B, B is constant and A is varied monotonously in the section to scanning lines 4-1-4-n being a shifting part to an oblique line from a vertical line, and in the section to scanning lines 4'-1-4'-n being a shifting part to the vertical line from the oblique line. In a 45 deg. refracted part of the electric conductor pattern 3, its width variation is continued for some period, therefore, it can be discriminated from hair or a flaw, also can be discriminated from a swing since its motion is different. Therefore, a picture output signal of the electric conductor pattern 3 is processed by dividing it into a straight line part and an oblique line part, and a defect is decided with high accuracy by use of a width set value.
JP55170423A 1980-12-03 1980-12-03 Defect detecting method for printed wiring Pending JPS5794608A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55170423A JPS5794608A (en) 1980-12-03 1980-12-03 Defect detecting method for printed wiring

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55170423A JPS5794608A (en) 1980-12-03 1980-12-03 Defect detecting method for printed wiring

Publications (1)

Publication Number Publication Date
JPS5794608A true JPS5794608A (en) 1982-06-12

Family

ID=15904639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55170423A Pending JPS5794608A (en) 1980-12-03 1980-12-03 Defect detecting method for printed wiring

Country Status (1)

Country Link
JP (1) JPS5794608A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003005793A3 (en) * 2001-07-04 2003-05-08 Koninkl Philips Electronics Nv Choice of reference markings for enabling fast estimating of the position of an imaging device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003005793A3 (en) * 2001-07-04 2003-05-08 Koninkl Philips Electronics Nv Choice of reference markings for enabling fast estimating of the position of an imaging device

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