JP2004354383A5 - - Google Patents

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Publication number
JP2004354383A5
JP2004354383A5 JP2004156988A JP2004156988A JP2004354383A5 JP 2004354383 A5 JP2004354383 A5 JP 2004354383A5 JP 2004156988 A JP2004156988 A JP 2004156988A JP 2004156988 A JP2004156988 A JP 2004156988A JP 2004354383 A5 JP2004354383 A5 JP 2004354383A5
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JP
Japan
Prior art keywords
component
ray
defect
detection panel
arbitrary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004156988A
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English (en)
Japanese (ja)
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JP2004354383A (ja
JP4642381B2 (ja
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Publication date
Priority claimed from US10/250,010 external-priority patent/US7065176B2/en
Application filed filed Critical
Publication of JP2004354383A publication Critical patent/JP2004354383A/ja
Publication of JP2004354383A5 publication Critical patent/JP2004354383A5/ja
Application granted granted Critical
Publication of JP4642381B2 publication Critical patent/JP4642381B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004156988A 2003-05-28 2004-05-27 構成部品を検査する方法及び装置 Expired - Fee Related JP4642381B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/250,010 US7065176B2 (en) 2003-05-28 2003-05-28 Method and system to inspect a component

Publications (3)

Publication Number Publication Date
JP2004354383A JP2004354383A (ja) 2004-12-16
JP2004354383A5 true JP2004354383A5 (enExample) 2007-07-12
JP4642381B2 JP4642381B2 (ja) 2011-03-02

Family

ID=33298123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004156988A Expired - Fee Related JP4642381B2 (ja) 2003-05-28 2004-05-27 構成部品を検査する方法及び装置

Country Status (3)

Country Link
US (1) US7065176B2 (enExample)
EP (1) EP1486773A1 (enExample)
JP (1) JP4642381B2 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7698010B2 (en) * 2004-09-29 2010-04-13 Haeger, Inc. Methods, systems and computer program products for altering video images to aid an operator of a fastener insertion machine
DE102005048391B3 (de) * 2005-10-10 2007-04-05 Siemens Ag Stativ für ein Bestrahlungstherapiegerät sowie eine dieses Stativ aufweisende Bestrahlungseinrichtung
US7497620B2 (en) * 2006-03-28 2009-03-03 General Electric Company Method and system for a multiple focal spot x-ray system
JP2007315834A (ja) * 2006-05-24 2007-12-06 Shimadzu Corp Ｘ線透視装置
JP5022045B2 (ja) * 2007-01-24 2012-09-12 富士通株式会社 作業位置を特定するためのシステム、作業セル、方法、製品の製造方法、およびマーカ
US8010315B2 (en) * 2007-11-27 2011-08-30 General Electric Company Multi-modality inspection method with data validation and data fusion
US7840367B2 (en) * 2007-11-28 2010-11-23 General Electric Company Multi-modality inspection system
US8238635B2 (en) * 2008-03-21 2012-08-07 General Electric Company Method and system for identifying defects in radiographic image data corresponding to a scanned object
US8131107B2 (en) * 2008-05-12 2012-03-06 General Electric Company Method and system for identifying defects in NDT image data
CN102565103B (zh) * 2011-12-16 2014-03-19 清华大学 一种基于x射线图像的焊缝缺陷跟踪检测方法
CN103975233B (zh) * 2012-02-06 2017-01-04 株式会社日立高新技术 X射线检查装置、检查方法以及x射线检测器
US9275769B2 (en) * 2013-03-14 2016-03-01 Pcc Structurals, Inc. Marking template for radiography
CN105758877B (zh) * 2016-04-19 2019-01-25 南京越辰智能科技有限公司 检测工字型焊件缺陷的x射线实时成像检测系统及其检测方法
US20190193156A1 (en) * 2017-12-09 2019-06-27 Linbo Yang Simultaneous 3D printing and NDT with Computer Tomography using LDA
JP7448139B2 (ja) * 2020-03-27 2024-03-12 リョーエイ株式会社 自動車ボディーのｘ線ｃｔ撮影方法及びｘ線ｃｔ撮影装置
CN118661094A (zh) 2022-01-31 2024-09-17 佳能安内华股份有限公司 检查装置以及检查方法
CN115201234A (zh) * 2022-08-25 2022-10-18 中国航发北京航空材料研究院 一种复合材料制件数字射线检测装置及检测方法
CN115855987B (zh) * 2022-12-24 2024-11-29 重庆日联科技有限公司 一种用于x射线检测焊缝的虚拟标尺标记方法
US20250166401A1 (en) * 2023-11-20 2025-05-22 International Business Machines Corporation Hardware integrity validation

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4260889A (en) * 1979-11-28 1981-04-07 The Firestone Tire & Rubber Company Defect marker method and apparatus for use with tire inspection machines
JPH0820382B2 (ja) 1988-05-27 1996-03-04 株式会社ウロコ製作所 原木の欠点検出方法
JPH069574B2 (ja) * 1990-03-30 1994-02-09 株式会社メディランド 体内３次元位置表示装置
US5119408A (en) 1990-10-31 1992-06-02 General Electric Company Rotate/rotate method and apparatus for computed tomography x-ray inspection of large objects
JPH07153803A (ja) * 1993-11-30 1995-06-16 Toshiba Corp ラミノグラフ
JPH08141946A (ja) * 1994-11-17 1996-06-04 Kawasaki Heavy Ind Ltd ならい機構付ペンホルダー
US5778043A (en) * 1996-09-20 1998-07-07 Cosman; Eric R. Radiation beam control system
JPH10318951A (ja) * 1997-05-22 1998-12-04 Nkk Corp 核磁気共鳴及びｘ線による木材検査装置
US5985680A (en) * 1997-08-08 1999-11-16 Applied Materials, Inc. Method and apparatus for transforming a substrate coordinate system into a wafer analysis tool coordinate system
AU3401099A (en) 1998-04-17 1999-11-08 Cae Electronics Ltd. Method and apparatus for identification of probable defects in a workpiece
JP2001337053A (ja) * 2000-05-25 2001-12-07 Anritsu Corp 異物検査装置
US6459760B1 (en) 2000-07-28 2002-10-01 Exotic Metals Forming Company, Inc. Apparatuses and methods for non-destructive inspection

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