JP2004296725A - Package for housing electronic component - Google Patents

Package for housing electronic component Download PDF

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Publication number
JP2004296725A
JP2004296725A JP2003086194A JP2003086194A JP2004296725A JP 2004296725 A JP2004296725 A JP 2004296725A JP 2003086194 A JP2003086194 A JP 2003086194A JP 2003086194 A JP2003086194 A JP 2003086194A JP 2004296725 A JP2004296725 A JP 2004296725A
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JP
Japan
Prior art keywords
sealing
electronic component
layer
brazing material
metal lid
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Pending
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JP2003086194A
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Japanese (ja)
Inventor
Naoto Shibuichi
直人 澁市
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Kyocera Corp
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Kyocera Corp
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Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP2003086194A priority Critical patent/JP2004296725A/en
Publication of JP2004296725A publication Critical patent/JP2004296725A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a package for housing an electronic component by which an electronic device with high air tight reliability can be obtained. <P>SOLUTION: The package for housing an electronic component is provided with a mounting part 4 for mounting an electronic component 7 at the center of the upper surface of a square insulation substrate 1 and a square packaging metallized layer 2 in its outer circumferential part, and a metallic cover 6 is connected with the packaging metallized layer 2 by means of a brazing material. The central part of a pair of inner circumferential parts opposite to the packaging metallized layer 2 is projected to the mounting part 4, and such a projecting region 5 is covered with the brazing material. A joint area with the metallic cover 6 can be made large on the inner circumferential side of the packaging metallized layer 2 due to the projecting region 5, and a fillet 9 can be also formed there. Thus, the joint between the packaging metallized layer 2 and the metallic cover 6 is reinforced, and the packaging metallized layer 2 can be prevented from being peeled off from the insulation substrate 1 due to a stress generating during seam welding. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

【0001】
【発明の属する技術分野】
本発明は、内部に電子部品を収容するための小型の電子部品収納用パッケージに関するものである。
【0002】
【従来の技術】
従来、半導体素子や圧電振動子等の電子部品を収容するための小型の電子部品収納用パッケージは、酸化アルミニウム質焼結体や窒化アルミニウム質焼結体,ムライト質焼結体,ガラスセラミックス等のセラミックス材料から成り、その上面中央部に電子部品を収容するための凹状の搭載部を有するとともにこの搭載部内から下面外周部にかけて導出する複数のメタライズ配線導体および上面に搭載部を取り囲むように被着された四角枠状の封止用メタライズ層を有する絶縁基板と、この絶縁基板の上面の封止用メタライズ層にろう付けによって接合され、搭載部を気密封止する金属蓋体とから構成されている。
【0003】
そして、この従来の電子部品搭載用基板によれば、絶縁基板の搭載部の底面に電子部品を搭載するとともにこの電子部品の電極を搭載部内のメタライズ配線導体に例えばワイヤボンディング等の電気的接続手段を介して電気的に接続し、しかる後、封止用メタライズ層の上面に金属蓋体を、あらかじめ金属蓋体の下面に被着させておいたろう材を介してシーム溶接法により接合することによって絶縁基板と金属蓋体とから成る容器の内部に電子部品が気密に封止され、それにより製品としての電子装置となる。
【0004】
このシーム溶接法による接合の際、金属蓋体に当接されるシーム溶接用の一対のローラー電極の間に流れる電流で金属蓋体が発熱し、金属蓋体の下面のろう材が溶融して封止用メタライズ層と金属蓋体との間に濡れ広がり、このろう材の一定量が封止用メタライズ層の上面から金属蓋体の側面にかけてフィレットを形成するように這い上がることにより金属蓋体がろう材を介して封止用メタライズ層に強固に接合される。
【0005】
【特許文献1】
特開2001−291796号公報
【0006】
【発明が解決しようとする課題】
しかしながら、このような電子部品収納用パッケージにおいては、電子装置の小型化の要求に伴い、その大きさが数mm角程度の極めて小さなものとなってきており、その封止用メタライズ層の幅も300μm以下と極めて狭くなってきている。また、この電子部品収納用パッケージの外形寸法と比較して、収納する電子部品の寸法を大きくできるように、その封止用メタライズ層の幅を極めて狭くとるようになってきている。
【0007】
そして、このように封止用メタライズ層の幅が0.15〜0.45mm程度と狭い電子部品収納用パッケージにおいては、封止用メタライズ層と金属蓋体との接合面の幅が狭いこと、および封止用メタライズ層の縁辺部と金属蓋体の縁辺部との間の距離が例えば、0.05mm〜0.35mm程度と非常に狭く、この狭い領域にろう材のフィレットが十分に形成され難いこと等から、封止用メタライズ層上に金属蓋体をろう材を介してシーム溶接法により接合すると、接合後に金属蓋体が大きく熱収縮することによって発生する応力が封止用メタライズ層に大きく印加され、この応力によって絶縁基板の上面から封止用メタライズ層が剥離してしまい、この電子部品収納用パッケージを使用した電子装置の気密信頼性が著しく低下してしまうことがあるという問題点を有していた。
【0008】
なお、通常は、金属蓋体を封止用メタライズ層上に接合する際に封止用メタライズ層の外周部にろう材のフィレットを形成するために、封止用メタライズ層と金属蓋体とは、その各辺において金属蓋体が封止用メタライズ層の外周よりも若干小さくなるような大きさとされているので、この封止用メタライズ層および金属蓋体の外周側にはロウ材のフィレットが形成されるものの、これらの内周側では、封止用メタライズ層が直線状の縁辺部まで金属蓋体に覆われて接合されているのでフィレットが形成されにくくなっており、金属蓋体の封止用メタライズ層との接合は、外周側に比べて内周側が弱いものとなっている。
【0009】
本発明は、かかる問題点に鑑み案出されたものであり、その目的は、金属蓋体を封止用メタライズ層にシーム溶接法等により接合した後、金属蓋体が大きく熱収縮することによって封止用メタライズ層に大きな応力が印加されたとしても、絶縁基板の上面から封止用メタライズ層が剥離することがなく、得られる電子装置の気密封止を完全とし、内部に収容する電子部品を長期間にわたり正常、かつ安定に作動させることを可能とした気密信頼性の高い電子装置を得ることができる電子部品収納用パッケージを提供することにある。
【0010】
【課題を解決するための手段】
本発明の電子部品収納用パッケージは、四角形状の絶縁基板の上面の中央部に電子部品を搭載するための搭載部を有するとともに外周部に四角枠状の封止用メタライズ層を有しており、この封止用メタライズ層に金属蓋体がろう材を介して接合される電子部品収納用パッケージであって、前記封止用メタライズ層の対向する一対の内周辺の中央部が前記搭載部側に突出しており、これら突出した部位が前記ろう材により覆われることを特徴とするものである。
【0011】
本発明の電子部品収納用パッケージによれば、金属蓋体をろう付けするための封止用メタライズ層の対向する一対の内周辺の中央部に、互いに向かい合うように搭載部に向かって突出した部位を設けており、その突出した部位が、金属蓋体をろう付けするためのろう材により覆われることから、その突出した部位と金属蓋体とは、封止用メタライズ層および金属蓋体の外周側と同様にろう材のフィレットを形成して接合されることとなるので、封止用メタライズ層にシーム溶接法により金属蓋体を接合した後、金属蓋体が熱収縮することにより発生する応力が、封止用メタライズ層に印加されたとしても、その応力は封止用メタライズ層の突出した部位および外周部のろう材のフィレットに良好に分散され、その結果、封止用メタライズ層に金属蓋体を強固に接合させることができるとともに、封止用メタライズ層が絶縁基板から剥離することを有効に防止できる。
【0012】
【発明の実施の形態】
次に、本発明の電子部品収納用パッケージを添付の図面を基に説明する。
【0013】
図1(a)は本発明の電子部品収納用パッケージの実施の形態の一例を示した上面図であり、図1(b)はその断面図である。これらの図において、1は絶縁基板、2は封止用メタライズ層、3はメタライズ配線導体、4は電子部品7を搭載するための搭載部、5は封止用メタライズ層2のうち搭載部4に向かって突出した部位、6は電子部品7を封止するための金属蓋体である。
【0014】
絶縁基板1は、酸化アルミニウム質焼結体や窒化アルミニウム質焼結体,ムライト質焼結体,ガラスセラミックス等のセラミックス材料から成る3層のセラミック層を積層して成り、例えば一辺の長さが2〜20mm程度で厚みが0.5〜3mm程度の四角形状である。そして、その上面中央部に電子部品を搭載・収容するための略四角形の凹状の搭載部4が設けてあり、この搭載部4から側面を介して下面にかけては、タングステンやモリブデン,銅,銀等の金属粉末メタライズから成る複数のメタライズ配線導体3が被着形成されている。
【0015】
また、絶縁基板1の上面には、凹状の搭載部4を取り囲むようにして、タングステンやモリブデン,銅,銀等の金属粉末メタライズから成る略四角枠状の封止用メタライズ層2が、絶縁基板1の外周から0.05〜0.2mm程度離間して被着形成されている。なお、この例では、絶縁基板1は3層のセラミック層を積層することにより形成されているが、絶縁基板1は4層以上のセラミック層を積層することにより形成されていてもよい。
【0016】
このような絶縁基板1は、セラミック層が酸化アルミニウム質焼結体から成りかつメタライズ配線導体3および封止用メタライズ層2がタングステンメタライズから成る場合であれば、酸化アルミニウム,酸化珪素,酸化マグネシウム,酸化カルシウム等の原料粉末に適当な有機バインダ,溶剤,可塑剤等を添加混合して泥漿状となすとともに、これを例えばドクターブレード法等のシート成形法によりシート状となすことにより複数枚のセラミックグリーンシートを得て、次にそれらのセラミックグリーンシートに適当な打ち抜き加工を施すとともにメタライズ配線導体3や封止用メタライズ層2となる金属ペーストを印刷塗布し、しかる後、それらのセラミックグリーンシートを上下に積層するとともにその積層体を焼成することにより製作される。
【0017】
また、絶縁基板1の搭載部4の底面から側面を介して下面にかけて被着形成されたメタライズ配線導体3は、搭載部4に搭載される電子部品7の各電極を外部の電気回路に電気的に接続するための導電路として機能し、その搭載部4の底面部位には電子部品7の各電極が例えばワイヤボンディング等の電気的接続手段を介して電気的に接続され、絶縁基板1の下面に導出した部位は図示しない外部電気回路基板に半田等を介して電気的に接続される。
【0018】
なお、メタライズ配線導体3の露出表面には、メタライズ配線導体3の酸化腐食を防止するとともにメタライズ配線導体3と電子部品7の各電極との接続および外部電気回路基板との接続を強固なものとするために、通常であれば、1〜10μm程度の厚みのニッケルめっき層と0.1〜3μm程度の厚みの金めっき層とが順次被着されている。
【0019】
さらに、絶縁基板1の上面に凹状の搭載部4を取り囲むようにして設けられた封止用メタライズ層2は、絶縁基板1に金属蓋体6を、ろう材を介したシーム溶接法により接合するための下地金属として機能する。この封止用メタライズ層2は、厚みが10〜30μm程度、各辺の幅が0.2〜0.5mm程度である。
【0020】
本発明の電子部品収納用パッケージにおいては、封止用メタライズ層2の向かい合った一対の内周辺の中央部が搭載部4に向かって突出している。このように封止用メタライズ層2の対向する一対の内周辺の中央部を搭載部4側に向かって突出させておくことにより、金属蓋体6を封止用メタライズ層2にろう材を介して接合する際に、この突出した部位5もろう材で覆われることになるとともに、この突出した部位5において、金属蓋体6と封止用メタライズ層2との接合の幅を有効に広く確保することができるとともに、この突出した部位5の上面および側面から金属蓋体6の下面にかけてろう材のフィレット9を形成することができる。
【0021】
よって、封止用メタライズ層2と金属蓋体6とは、封止用メタライズ層2の外周部におけるフィレット8と同様に、その突出した部位5の上面および側面においてもろう材を介して金属蓋体6と接合していることから、封止用メタライズ層2にシーム溶接法によりろう材を介して金属蓋体6を接合した後、金属蓋体6が熱収縮することにより発生する応力が封止用メタライズ層2に印加されたとしても、その応力は封止用メタライズ層2の突出した部位5に形成されるろう材のフィレット9および金属蓋体6の外周部のフィレット8に良好に分散されることとなり、その結果、封止用メタライズ層2が絶縁基板1から剥離することが有効に防止される。
【0022】
このような突出した部位5は、封止用メタライズ層2の対向する一対の内周辺の中央部に、互いに向かい合うように設けておくことにより、対向する一対の内周辺に平行な方向および直交する方向の両方で、封止用メタライズ層2と金属枠体6との接合を効果的に補強することができるとともに、金属蓋体6を溶接したときの応力で封止用メタライズ層2が絶縁基板1から剥がれることを防止することができる。
【0023】
この場合、突出した部位5が封止用メタライズ層2の内周辺の1辺のみに設けられていたのでは、突出した部位5を設けた辺と設けていない辺との間で金属蓋体6のろう付け強度が大きく異なってしまうため、突出した部位5を設けていない辺から封止用メタライズ層2の剥がれが生じてしまうこととなる。これに対し、突出した部位5を封止用メタライズ層2の対向する一対の内周辺に設けた場合には、対向する一対の突出した部位5を設けた辺の内周と外周とで金属蓋体6のろう付け強度のバランスが取れるようになり、封止用メタライズ層2と金属枠体6との接合を効果的に補強することができるとともに、金属蓋体6を溶接したときの応力で封止用メタライズ層2が絶縁基板1から剥がれることを防止することができる。したがって、封止用メタライズ層2の突出した部位5は、対向する一対の内周辺に設ける必要がある。また、封止用メタライズ層2と絶縁基板1との間の剥がれは、幅の狭い接合領域が続く辺の中央部の内周側で特に生じやすいことから、突出した部位5は封止用メタライズ層2の内周辺の中央部に設ける必要がある。
【0024】
また、このように封止用メタライズ層2の内周辺に突出した部位5を形成する場合には、その高さを封止用メタライズ層2の高さよりも低くしておくと、この突出した部位の上面と金属蓋体6の下面との間にろう材の溜まりを形成することができるとともに、突出した部位5の上面および側面と金属蓋体6の下面との間で形成されるフィレット9をより大きなものとすることができるので、封止用メタライズ層2と金属枠体6との接合をより一層効果的に補強することができ、金属蓋体6を溶接したときの応力で封止用メタライズ層2が絶縁基板1から剥がれることをより確実に防止することができる。
【0025】
なお、封止用メタライズ層2の形状が長方形の枠状であるものについては、長辺側の対向する一対の内周辺の中央部に突出した部位5を形成することにより、金属蓋体6と封止用メタライズ層2との接合強度が比較的弱い長辺側において、金属蓋体6の剥がれの防止に特に有効となる。したがって、封止用メタライズ層2は、その形状が長方形の枠状であるものについては、長辺側の対向する一対の内周辺の中央部に、突出した部位5を形成することが好ましい。
【0026】
なお、この突出した部位5は、電子部品7との電気的接続を行なうメタライズ配線導体3を形成していない領域に形成することが好ましい。このように、メタライズ配線導体3が形成されていない領域に形成することにより、この突出した部位5がメタライズ配線導体3と電子部品7との効率的な電気的接続を阻害することを有効に防止することができる。
【0027】
なお、封止用メタライズ層2の表面には、封止用メタライズ層2とろう材との濡れ性を良好とするために、通常であれば、厚みが0.5〜5μm程度のニッケルめっき層が、金属蓋体6を接合する前に予め被着されている。
【0028】
かくして、以上のような本発明の電子部品収納用パッケージによれば、絶縁基板1の搭載部4内に電子部品7を搭載するとともに電子部品7の電極とメタライズ配線導体3とをボンディングワイヤ等を介して電気的に接続した後、封止用メタライズ層2に金属蓋体6をシーム溶接法によりろう材を介して接合して、絶縁基板1と金属蓋体6とから成る容器の内部に電子部品7を気密に封止することにより、気密信頼性に優れた電子装置となる。
【0029】
なお、本発明は以上の実施の形態の例に限定されるものではなく、本発明の要旨を逸脱しない範囲であれば種々の変更を加えることは何ら差し支えない。例えば、絶縁基板1および封止用メタライズ層2の形状を長方形型ではなく正方形型とし、その封止用メタライズ層2の対向する一対の内周辺の中央部に、互いに向かい合うように一対の突出した部位5を設けたものとしてもよい。
【0030】
【発明の効果】
本発明の電子部品収納用パッケージによれば、金属蓋体をろう付けするための封止用メタライズ層の対向する一対の内周辺の中央部に、互いに向かい合うように搭載部に向かって突出した部位を設けており、その突出した部位が、金属蓋体をろう付けするためのろう材により覆われることから、その突出した部位と金属蓋体とは、封止用メタライズ層および金属蓋体の外周側と同様にろう材のフィレットを形成して接合されることとなるので、封止用メタライズ層にシーム溶接法によりろう材を介して金属蓋体を接合した後、金属蓋体が熱収縮することにより発生する応力が封止用メタライズ層に印加されたとしても、その応力は封止用メタライズ層の突出した部位および外周部のろう材のフィレットに良好に分散され、その結果、封止用メタライズ層に金属蓋体を強固に接合させることができるとともに、封止用メタライズ層が絶縁基板から剥離することを有効に防止できる。
【0031】
よって、絶縁基板と封止用メタライズ層と金属蓋体とから成る容器の内部に電子部品を封止した場合において、内部に収容する電子部品を長期間にわたり正常、かつ安定に作動させることが可能となる。
【図面の簡単な説明】
【図1】(a)および(b)は、それぞれ本発明の電子部品収納用パッケージの実施の形態の一例を示す上面図および断面図である。
【符号の説明】
1・・・・・絶縁基板
2・・・・・封止用メタライズ層
3・・・・・メタライズ配線導体
4・・・・・搭載部
5・・・・・突出した部位
6・・・・・金属蓋体
7・・・・・電子部品
8・・・・・フィレット(外周部)
9・・・・・フィレット(突出した部位)
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a small electronic component housing package for housing electronic components therein.
[0002]
[Prior art]
Conventionally, small electronic component housing packages for housing electronic components such as semiconductor elements and piezoelectric vibrators are made of aluminum oxide-based sintered bodies, aluminum nitride-based sintered bodies, mullite-based sintered bodies, glass ceramics, and the like. It has a concave mounting part for accommodating electronic components in the center of the upper surface of the ceramic material, and has a plurality of metallized wiring conductors extending from the inside of the mounting part to the outer peripheral part of the lower surface. An insulating substrate having a rectangular frame-shaped sealing metallization layer formed thereon, and a metal lid body joined by brazing to the sealing metallization layer on the upper surface of the insulating substrate to hermetically seal the mounting portion. I have.
[0003]
According to the conventional electronic component mounting board, the electronic component is mounted on the bottom surface of the mounting portion of the insulating substrate, and the electrodes of the electronic component are electrically connected to the metallized wiring conductor in the mounting portion by, for example, an electrical connection means such as wire bonding. By electrically connecting the metal lid to the upper surface of the metallizing layer for sealing, and then joining the metal lid by a seam welding method via a brazing material previously adhered to the lower surface of the metal lid. Electronic components are hermetically sealed inside a container including an insulating substrate and a metal lid, thereby forming an electronic device as a product.
[0004]
At the time of joining by this seam welding method, the metal lid generates heat by an electric current flowing between a pair of roller electrodes for seam welding that comes into contact with the metal lid, and the brazing material on the lower surface of the metal lid melts. A certain amount of this brazing material crawls from the upper surface of the metallizing layer to the side of the metal lid so as to form a fillet. Is firmly joined to the sealing metallization layer via the brazing material.
[0005]
[Patent Document 1]
JP 2001-291796 A
[Problems to be solved by the invention]
However, in such an electronic component storage package, the size of the electronic device has become extremely small in the order of several mm square in accordance with the demand for miniaturization of the electronic device, and the width of the metallization layer for sealing has also been increased. It has become extremely narrow at 300 μm or less. Also, the width of the metallization layer for encapsulation has become extremely narrow so that the dimensions of the electronic components to be stored can be made larger than the external dimensions of the package for storing electronic components.
[0007]
And in such an electronic component storage package in which the width of the metallizing layer for sealing is as narrow as about 0.15 to 0.45 mm, the width of the joining surface between the metallizing layer for sealing and the metal lid is narrow; The distance between the edge of the metallization layer for sealing and the edge of the metal lid is very small, for example, about 0.05 mm to 0.35 mm, and a fillet of brazing material is sufficiently formed in this narrow area. Due to difficulties, when the metal lid is joined to the metallizing layer for sealing by seam welding via brazing material, the stress generated due to the large thermal shrinkage of the metal lid after joining causes a stress on the metallizing layer for sealing. The sealing metallization layer is peeled off from the upper surface of the insulating substrate due to this stress, and the hermetic reliability of an electronic device using the electronic component housing package is significantly reduced. Door had a problem in that.
[0008]
In addition, usually, in order to form a fillet of a brazing material on the outer peripheral portion of the metallizing layer for sealing when joining the metal lid on the metallizing layer for sealing, the metallizing layer for sealing and the metal lid are Since the metal lid is slightly smaller than the outer periphery of the metallizing layer on each side, a fillet of brazing material is provided on the outer peripheral side of the metallizing layer for sealing and the metal lid. Although formed, on the inner peripheral side, the metallization layer for sealing is covered with and joined to the metal lid up to the linear edge, so that it is difficult to form a fillet, so that the metal lid is sealed. Bonding with the metallization layer for stopping is weaker on the inner peripheral side than on the outer peripheral side.
[0009]
The present invention has been devised in view of such a problem, and an object of the present invention is to thermally shrink the metal lid body after joining the metal lid body to the sealing metallized layer by a seam welding method or the like. Even if a large stress is applied to the metallization layer for sealing, the metallization layer for sealing does not peel off from the upper surface of the insulating substrate, and the hermetic sealing of the obtained electronic device is completed, and the electronic component housed inside It is an object of the present invention to provide an electronic component storage package that can obtain an electronic device with high hermetic reliability that can operate normally and stably for a long period of time.
[0010]
[Means for Solving the Problems]
The electronic component storage package of the present invention has a mounting portion for mounting an electronic component at the center of the upper surface of a rectangular insulating substrate, and has a square frame-shaped sealing metallization layer on the outer peripheral portion. An electronic component storage package in which a metal lid is joined to the metallizing layer for sealing via a brazing material, wherein a central portion of a pair of inner peripheral portions of the metallizing layer facing each other is the mounting portion side. And these protruding portions are covered with the brazing material.
[0011]
According to the electronic component storage package of the present invention, a portion protruding toward the mounting portion so as to face each other is provided at a central portion of a pair of inner peripheries of the sealing metallization layer for brazing the metal cover. Since the protruding portion is covered with a brazing material for brazing the metal lid, the protruding portion and the metal lid are formed around the metallizing layer for sealing and the outer periphery of the metal lid. After joining the metal lid to the metallization layer for sealing by the seam welding method, the stress generated due to the heat shrinkage of the metal lid is to be formed by joining the brazing filler metal to the metallized layer for sealing. However, even if the stress is applied to the metallizing layer for sealing, the stress is satisfactorily dispersed in the protruding portion of the metallizing layer for sealing and the fillet of the brazing material on the outer peripheral portion, and as a result, It is possible to firmly bond the Shokufutatai, sealing metallized layer can be effectively prevented from peeling off from the insulating substrate.
[0012]
BEST MODE FOR CARRYING OUT THE INVENTION
Next, an electronic component storage package of the present invention will be described with reference to the accompanying drawings.
[0013]
FIG. 1A is a top view showing an example of an embodiment of an electronic component storage package according to the present invention, and FIG. 1B is a sectional view thereof. In these figures, 1 is an insulating substrate, 2 is a metallizing layer for sealing, 3 is a metallized wiring conductor, 4 is a mounting portion for mounting the electronic component 7, and 5 is a mounting portion 4 of the metallizing layer 2 for sealing. Reference numeral 6 denotes a metal cover for sealing the electronic component 7.
[0014]
The insulating substrate 1 is formed by laminating three ceramic layers made of a ceramic material such as an aluminum oxide sintered body, an aluminum nitride sintered body, a mullite sintered body, and a glass ceramic. It has a square shape of about 2 to 20 mm and a thickness of about 0.5 to 3 mm. A substantially rectangular concave mounting portion 4 for mounting and housing electronic components is provided at the center of the upper surface, and tungsten, molybdenum, copper, silver, or the like extends from the mounting portion 4 to the lower surface via the side surface. A plurality of metallized wiring conductors 3 made of metallized metal powder are deposited.
[0015]
On the upper surface of the insulating substrate 1, a substantially square frame-shaped sealing metallization layer 2 made of metal powder of metal such as tungsten, molybdenum, copper, silver or the like is provided so as to surround the concave mounting portion 4. 1 is formed so as to be separated from the outer periphery by about 0.05 to 0.2 mm. In this example, the insulating substrate 1 is formed by laminating three ceramic layers, but the insulating substrate 1 may be formed by laminating four or more ceramic layers.
[0016]
If the ceramic layer is made of an aluminum oxide sintered body and the metallized wiring conductor 3 and the encapsulating metallized layer 2 are made of tungsten metallized, such an insulating substrate 1 is made of aluminum oxide, silicon oxide, magnesium oxide, An appropriate organic binder, a solvent, a plasticizer, and the like are added to and mixed with a raw material powder such as calcium oxide to form a slurry, and this is formed into a sheet by a sheet forming method such as a doctor blade method, thereby forming a plurality of ceramics. Green sheets are obtained, and then the ceramic green sheets are subjected to appropriate punching, and a metal paste to be the metallized wiring conductor 3 and the metallizing layer 2 for sealing is printed and applied. By laminating up and down and firing the laminate It is created.
[0017]
Further, the metallized wiring conductor 3 attached and formed from the bottom surface of the mounting portion 4 to the lower surface via the side surface of the insulating substrate 1 electrically connects each electrode of the electronic component 7 mounted on the mounting portion 4 to an external electric circuit. Each electrode of the electronic component 7 is electrically connected to a bottom portion of the mounting portion 4 through an electrical connection means such as wire bonding, for example. Are electrically connected to an external electric circuit board (not shown) via solder or the like.
[0018]
The exposed surface of the metallized wiring conductor 3 is provided with a material that prevents the metallized wiring conductor 3 from being oxidized and corroded and has a strong connection between the metallized wiring conductor 3 and each electrode of the electronic component 7 and a connection with the external electric circuit board. In order to do so, a nickel plating layer having a thickness of about 1 to 10 μm and a gold plating layer having a thickness of about 0.1 to 3 μm are usually sequentially applied.
[0019]
Further, the metallization layer 2 for sealing provided on the upper surface of the insulating substrate 1 so as to surround the concave mounting portion 4 joins the metal lid 6 to the insulating substrate 1 by a seam welding method via a brazing material. Function as a base metal for The metallization layer 2 for sealing has a thickness of about 10 to 30 μm and a width of each side of about 0.2 to 0.5 mm.
[0020]
In the electronic component storage package of the present invention, the central portions of a pair of inner peripheries of the metallizing layer 2 facing each other project toward the mounting portion 4. By protruding the central portions of a pair of inner peripheral portions of the metallization layer 2 for sealing toward the mounting portion 4 side in this manner, the metal cover 6 is attached to the metallization layer 2 for sealing via a brazing material. At the time of joining, the protruding portion 5 is also covered with the brazing material, and the width of the joining between the metal cover 6 and the metallization layer 2 for sealing is effectively and widely secured at the protruding portion 5. In addition, the filler material 9 of the brazing material can be formed from the upper surface and the side surface of the projecting portion 5 to the lower surface of the metal lid 6.
[0021]
Therefore, like the fillet 8 on the outer peripheral portion of the metallizing layer 2 for sealing, the metallizing layer 2 for sealing and the metal lid 6 are also provided on the upper surface and side surfaces of the protruding portion 5 via the brazing material. Since the metal cover 6 is joined to the metallizing layer 2 for sealing by a seam welding method via a brazing material, the stress generated by the heat shrinkage of the metal cover 6 is sealed. Even if the stress is applied to the metallization layer 2 for sealing, the stress is well dispersed in the fillet 9 of the brazing material formed on the protruding portion 5 of the metallization layer 2 for sealing and the fillet 8 on the outer peripheral portion of the metal lid 6. As a result, the sealing metallized layer 2 is effectively prevented from peeling off from the insulating substrate 1.
[0022]
By providing such protruding portions 5 at the central portions of a pair of inner peripheral sides of the sealing metallized layer 2 so as to face each other, the protruding portions 5 are orthogonal to and perpendicular to the pair of inner peripheral sides facing each other. In both directions, the joining between the metallizing layer 2 for sealing and the metal frame 6 can be effectively reinforced, and the metallizing layer 2 for sealing is formed by the stress when the metal lid 6 is welded. 1 can be prevented from being peeled off.
[0023]
In this case, since the protruding portion 5 is provided only on one side of the inner periphery of the metallization layer 2 for sealing, the metal cover 6 is provided between the side where the protruding portion 5 is provided and the side where the protruding portion 5 is not provided. Since the brazing strength of the sealing metallized layer 2 is greatly different, the sealing metallized layer 2 is peeled off from the side where the projecting portion 5 is not provided. On the other hand, when the protruding portions 5 are provided on a pair of opposing inner peripheries of the metallizing layer 2 for sealing, the inner and outer peripheries of the side where the pair of opposing protruding portions 5 are provided are covered with a metal cover. The brazing strength of the body 6 can be balanced, and the joining between the metallizing layer 2 for sealing and the metal frame 6 can be effectively reinforced, and the stress generated when the metal lid 6 is welded can be obtained. It is possible to prevent the metallization layer 2 for sealing from peeling off from the insulating substrate 1. Therefore, the projecting portion 5 of the metallizing layer 2 for sealing needs to be provided on a pair of inner peripheral portions facing each other. Moreover, since the peeling between the sealing metallization layer 2 and the insulating substrate 1 is particularly likely to occur on the inner peripheral side of the center of the side where the narrow bonding region continues, the protruding portion 5 is formed by the sealing metallization. It is necessary to provide it at the center of the inner periphery of the layer 2.
[0024]
When the projecting portion 5 is formed on the inner periphery of the metallizing layer 2 for sealing as described above, if the height is set to be lower than the height of the metallizing layer 2 for sealing, the projecting portion 5 is formed. Can be formed between the upper surface of the metal cover 6 and the lower surface of the metal cover 6, and the fillet 9 formed between the upper surface and the side surface of the projecting portion 5 and the lower surface of the metal cover 6 can be formed. Since it can be made larger, the joining between the metallizing layer for sealing 2 and the metal frame 6 can be more effectively reinforced, and the sealing when the metal lid 6 is welded is used. The metallized layer 2 can be more reliably prevented from peeling off from the insulating substrate 1.
[0025]
In the case where the shape of the metallization layer 2 for sealing is a rectangular frame, by forming a protruding portion 5 at the center of a pair of inner peripheries facing each other on the long side, the metal lid 6 and the metal lid 6 are formed. This is particularly effective for preventing the metal lid 6 from peeling off on the long side where the bonding strength with the metallizing layer 2 for sealing is relatively weak. Therefore, when the metallization layer 2 for sealing has a rectangular frame shape, it is preferable to form the protruding portion 5 at the center of a pair of opposed inner peripheries on the long side.
[0026]
The projecting portion 5 is preferably formed in a region where the metallized wiring conductor 3 for making an electrical connection with the electronic component 7 is not formed. By forming the metallized wiring conductor 3 in a region where the metallized wiring conductor 3 is not formed, the projecting portion 5 effectively prevents the efficient electrical connection between the metallized wiring conductor 3 and the electronic component 7 from being hindered. can do.
[0027]
In order to improve the wettability between the metallizing layer 2 for sealing and the brazing material, a nickel plating layer having a thickness of about 0.5 to 5 μm is usually provided on the surface of the metallizing layer 2 for sealing. Are attached before the metal lid 6 is joined.
[0028]
Thus, according to the electronic component storage package of the present invention as described above, the electronic component 7 is mounted in the mounting portion 4 of the insulating substrate 1 and the electrodes of the electronic component 7 and the metallized wiring conductors 3 are bonded with bonding wires or the like. After electrical connection, the metal lid 6 is joined to the metallization layer 2 for sealing via a brazing material by a seam welding method, so that an electron is placed inside a container composed of the insulating substrate 1 and the metal lid 6. By hermetically sealing the component 7, an electronic device having excellent airtight reliability can be obtained.
[0029]
It should be noted that the present invention is not limited to the above-described embodiment, and various changes may be made without departing from the scope of the present invention. For example, the shape of the insulating substrate 1 and the metallization layer 2 for sealing is not a rectangular shape but a square shape, and a pair of protruding portions are formed at central portions of a pair of inner peripheral portions of the metallization layer 2 for sealing so as to face each other. The portion 5 may be provided.
[0030]
【The invention's effect】
According to the electronic component storage package of the present invention, a portion protruding toward the mounting portion so as to face each other is provided at a central portion of a pair of inner peripheries of the sealing metallization layer for brazing the metal cover. Since the protruding portion is covered with a brazing material for brazing the metal lid, the protruding portion and the metal lid are formed around the metallizing layer for sealing and the outer periphery of the metal lid. Since the filler is formed by forming a fillet of the brazing material in the same manner as on the side, the metal lid is thermally contracted after the metal lid is joined to the metallizing layer for sealing via the brazing material by the seam welding method. Even if the stress generated by this is applied to the metallizing layer for sealing, the stress is well dispersed in the protruding portion of the metallizing layer for sealing and the fillet of the brazing material at the outer peripheral portion. Me It is possible to firmly bond the metal lid to rise layer, sealing the metallized layer can be effectively prevented from peeling off from the insulating substrate.
[0031]
Therefore, when the electronic component is sealed inside the container including the insulating substrate, the metallization layer for sealing, and the metal lid, the electronic component contained therein can be operated normally and stably for a long period of time. It becomes.
[Brief description of the drawings]
FIGS. 1A and 1B are a top view and a cross-sectional view, respectively, showing an example of an embodiment of an electronic component storage package according to the present invention.
[Explanation of symbols]
1 ... insulating substrate 2 ... metallization layer 3 for sealing ... metallized wiring conductor 4 ... mounting part 5 ... protruding part 6 ...・ Metal cover 7 ・ ・ ・ ・ ・ ・ ・ Electronic parts 8 ・ ・ ・ ・ ・ ・ ・ Fillet (outer periphery)
9 Fillet (projected part)

Claims (1)

四角形状の絶縁基板の上面の中央部に電子部品を搭載するための搭載部を有するとともに外周部に四角枠状の封止用メタライズ層を有しており、該封止用メタライズ層に金属蓋体がろう材を介して接合される電子部品収納用パッケージであって、前記封止用メタライズ層の対向する一対の内周辺の中央部が前記搭載部側に突出しており、これら突出した部位が前記ろう材により覆われることを特徴とする電子部品収納用パッケージ。A square-shaped insulating substrate has a mounting portion for mounting electronic components at the center of the upper surface, and has a square frame-shaped metallizing layer for sealing on the outer peripheral portion, and a metal cover is provided on the metallizing layer for sealing. An electronic component storage package in which a body is joined via a brazing material, wherein a central portion of a pair of inner peripheral portions of the sealing metallized layer protrudes toward the mounting portion, and these protruding portions are An electronic component storage package covered by the brazing material.
JP2003086194A 2003-03-26 2003-03-26 Package for housing electronic component Pending JP2004296725A (en)

Priority Applications (1)

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Publications (1)

Publication Number Publication Date
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Family

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Country Status (1)

Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010161271A (en) * 2009-01-09 2010-07-22 Panasonic Corp Semiconductor package
JP7417121B2 (en) 2021-10-29 2024-01-18 日亜化学工業株式会社 light emitting device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010161271A (en) * 2009-01-09 2010-07-22 Panasonic Corp Semiconductor package
JP7417121B2 (en) 2021-10-29 2024-01-18 日亜化学工業株式会社 light emitting device

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