JP2004272322A5 - - Google Patents

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Publication number
JP2004272322A5
JP2004272322A5 JP2003058005A JP2003058005A JP2004272322A5 JP 2004272322 A5 JP2004272322 A5 JP 2004272322A5 JP 2003058005 A JP2003058005 A JP 2003058005A JP 2003058005 A JP2003058005 A JP 2003058005A JP 2004272322 A5 JP2004272322 A5 JP 2004272322A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2003058005A
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JP2004272322A (ja
JP4314843B2 (ja
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Priority claimed from JP2003058005A external-priority patent/JP4314843B2/ja
Priority to JP2003058005A priority Critical patent/JP4314843B2/ja
Priority to TW093105646A priority patent/TWI254255B/zh
Priority to CNB2004100074919A priority patent/CN1331085C/zh
Priority to US10/794,674 priority patent/US7225986B2/en
Priority to KR1020040014933A priority patent/KR100580229B1/ko
Publication of JP2004272322A publication Critical patent/JP2004272322A/ja
Publication of JP2004272322A5 publication Critical patent/JP2004272322A5/ja
Publication of JP4314843B2 publication Critical patent/JP4314843B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003058005A 2003-03-05 2003-03-05 画像読取装置及び個人認証システム Expired - Fee Related JP4314843B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2003058005A JP4314843B2 (ja) 2003-03-05 2003-03-05 画像読取装置及び個人認証システム
TW093105646A TWI254255B (en) 2003-03-05 2004-03-04 Image read out device
KR1020040014933A KR100580229B1 (ko) 2003-03-05 2004-03-05 화상판독장치
US10/794,674 US7225986B2 (en) 2003-03-05 2004-03-05 Image reading system
CNB2004100074919A CN1331085C (zh) 2003-03-05 2004-03-05 图像读取系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003058005A JP4314843B2 (ja) 2003-03-05 2003-03-05 画像読取装置及び個人認証システム

Publications (3)

Publication Number Publication Date
JP2004272322A JP2004272322A (ja) 2004-09-30
JP2004272322A5 true JP2004272322A5 (ja) 2005-09-15
JP4314843B2 JP4314843B2 (ja) 2009-08-19

Family

ID=32984378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003058005A Expired - Fee Related JP4314843B2 (ja) 2003-03-05 2003-03-05 画像読取装置及び個人認証システム

Country Status (5)

Country Link
US (1) US7225986B2 (ja)
JP (1) JP4314843B2 (ja)
KR (1) KR100580229B1 (ja)
CN (1) CN1331085C (ja)
TW (1) TWI254255B (ja)

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AT413897B (de) * 2004-09-08 2006-07-15 Nanoident Technologies Ag Vorrichtung zum erfassen eines fingerabdruckes
AT413896B (de) 2004-09-08 2006-07-15 Nanoident Technologies Ag Vorrichtung zum erfassen eines fingerabdruckes
JP4552197B2 (ja) * 2005-08-11 2010-09-29 カシオ計算機株式会社 画像読取装置
JP4632129B2 (ja) * 2005-08-11 2011-02-16 カシオ計算機株式会社 画像読取装置
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JP4680158B2 (ja) * 2006-09-13 2011-05-11 株式会社日立製作所 生体認証装置
TWI319623B (en) * 2006-09-14 2010-01-11 Au Optronics Corp Transistor structure and control unit comprising the same
JP4844481B2 (ja) * 2007-06-25 2011-12-28 株式会社日立製作所 撮像装置及びこれを搭載した装置
EP2172977A1 (en) 2008-10-03 2010-04-07 Semiconductor Energy Laboratory Co., Ltd. Display device
CN103928476A (zh) 2008-10-03 2014-07-16 株式会社半导体能源研究所 显示装置及其制造方法
KR20210135349A (ko) 2008-10-03 2021-11-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 전자기기
KR20160072845A (ko) 2008-10-24 2016-06-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
US8106400B2 (en) 2008-10-24 2012-01-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
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KR102437444B1 (ko) 2008-11-21 2022-08-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
US20100208953A1 (en) * 2009-02-17 2010-08-19 Validity Sensors, Inc. Illuminated Fingerprint Sensor and Method
JP2010197066A (ja) * 2009-02-23 2010-09-09 Casio Computer Co Ltd 圧力センサ及び圧力センサの圧力測定方法
JP4780204B2 (ja) 2009-02-23 2011-09-28 カシオ計算機株式会社 圧力センサ及び圧力センサの圧力測定方法
KR101046194B1 (ko) * 2009-07-07 2011-07-04 (주)세현 이미지 인식기
KR102528026B1 (ko) 2009-09-04 2023-05-03 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치 및 발광 장치를 제작하기 위한 방법
WO2011034012A1 (en) 2009-09-16 2011-03-24 Semiconductor Energy Laboratory Co., Ltd. Logic circuit, light emitting device, semiconductor device, and electronic device
KR101767035B1 (ko) * 2009-10-01 2017-08-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
WO2011070900A1 (en) * 2009-12-08 2011-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR101426515B1 (ko) * 2010-09-15 2014-08-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 표시 장치
JP2013084333A (ja) 2011-09-28 2013-05-09 Semiconductor Energy Lab Co Ltd シフトレジスタ回路
CN102819997B (zh) * 2012-07-13 2015-05-20 深圳邦健生物医疗设备股份有限公司 用于显示加速的显示方法和装置
CN106875842B (zh) * 2015-12-11 2020-02-07 印象认知（北京）科技有限公司 具有指纹采集功能的显示屏
KR102458660B1 (ko) 2016-08-03 2022-10-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
US10068551B1 (en) * 2017-05-01 2018-09-04 Microsoft Technology Licensing, Llc Localized high brightness mode
CN107292235B (zh) * 2017-05-22 2019-12-13 Oppo广东移动通信有限公司 指纹的采集方法及相关产品
KR102560800B1 (ko) * 2017-10-30 2023-07-31 삼성전자주식회사 디스플레이를 이용하여 지문을 인식하기 위한 전자 장치
CN108229388B (zh) * 2017-12-30 2021-10-26 柳州梓博科技有限公司 感光驱动电路、感光装置及电子设备
CN108648691B (zh) * 2018-05-14 2020-03-20 上海天马有机发光显示技术有限公司 显示面板及其驱动方法、显示装置
CN110793564A (zh) * 2018-08-02 2020-02-14 昆山博威泰克电子科技有限公司 视觉检测设备和视觉检测方法
CN109343811B (zh) * 2018-09-30 2022-06-24 维沃移动通信有限公司 一种显示调整方法及终端设备
CN114223022A (zh) 2019-09-18 2022-03-22 索尼集团公司 指纹认证装置、指纹认证方法和程序

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JP3898330B2 (ja) 1998-03-12 2007-03-28 カシオ計算機株式会社 読取装置
JP4308376B2 (ja) * 1999-08-09 2009-08-05 セイコーインスツル株式会社 指紋読み取り装置
KR100341462B1 (ko) 1999-12-18 2002-06-21 안준영 지문인식기가 내장된 정보단말기
US6681992B2 (en) 2000-08-03 2004-01-27 Tomomi Iihama Image reading apparatus
JP2002163629A (ja) * 2000-11-28 2002-06-07 Omron Corp カードおよび制御装置
JP3793560B2 (ja) * 2000-11-30 2006-07-05 京セラ株式会社 低温焼成磁器およびその製造方法
JP4729798B2 (ja) * 2001-03-02 2011-07-20 富士電機リテイルシステムズ株式会社 ユーザ認証システム及びユーザ認証装置
JP2002258745A (ja) * 2001-03-06 2002-09-11 Sony Corp 電子署名装置
JP2002279412A (ja) 2001-03-21 2002-09-27 Ohira Giken Kogyo Kk 指紋認証機能付き携帯端末及び指紋読取方法
KR20010107545A (ko) 2001-04-03 2001-12-07 경두수 지문인식용 단말기 및 이를 이용한 지문인식시스템

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