JP2004251904A - デバイスの相反性を利用するマルチポートネットワークアナライザの校正 - Google Patents

デバイスの相反性を利用するマルチポートネットワークアナライザの校正 Download PDF

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JP2004251904A
JP2004251904A JP2004037400A JP2004037400A JP2004251904A JP 2004251904 A JP2004251904 A JP 2004251904A JP 2004037400 A JP2004037400 A JP 2004037400A JP 2004037400 A JP2004037400 A JP 2004037400A JP 2004251904 A JP2004251904 A JP 2004251904A
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calibration
parameters
parameter
standards
parameter values
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JP2004251904A5 (https=
Inventor
Tiberiu Jamneala
ティベリウ・ジャムネアラ
David A Feld
デビット・エイ・フェルド
Burhan Zaini
ブーハン・ザイニ
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Agilent Technologies Inc
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Agilent Technologies Inc
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Priority claimed from US10/368,179 external-priority patent/US7064555B2/en
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2004251904A publication Critical patent/JP2004251904A/ja
Publication of JP2004251904A5 publication Critical patent/JP2004251904A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2004037400A 2003-02-18 2004-02-13 デバイスの相反性を利用するマルチポートネットワークアナライザの校正 Pending JP2004251904A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/368,179 US7064555B2 (en) 2003-02-18 2003-02-18 Network analyzer calibration employing reciprocity of a device
US10/758,435 US7107170B2 (en) 2003-02-18 2004-01-14 Multiport network analyzer calibration employing reciprocity of a device

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JP2004251904A true JP2004251904A (ja) 2004-09-09
JP2004251904A5 JP2004251904A5 (https=) 2007-03-15

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JP2011172227A (ja) * 2010-02-18 2011-09-01 Ls Industrial Systems Co Ltd 送信漏れ信号の相殺信号探索方法
CN103364752A (zh) * 2013-07-19 2013-10-23 中国电子科技集团公司第十三研究所 一种在片负载牵引测量系统的现场校准方法
JP2014044205A (ja) * 2012-08-24 2014-03-13 Tektronix Inc 測定方法

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KR101157449B1 (ko) 2004-07-07 2012-06-22 캐스케이드 마이크로테크 인코포레이티드 멤브레인 서스펜디드 프로브를 구비한 프로브 헤드
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
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US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
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US7427866B2 (en) * 2005-09-12 2008-09-23 Analog Devices, Inc. Calibration method and system that generates an error signal for adjusting the time constant of circuit to be calibrated
JP2007285890A (ja) * 2006-04-17 2007-11-01 Agilent Technol Inc ネットワークアナライザの再校正方法、および、ネットワークアナライザ
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
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US7256585B1 (en) * 2006-07-21 2007-08-14 Agilent Technologies, Inc. Match-corrected power measurements with a vector network analyzer
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
DE102009018703B4 (de) 2008-12-19 2018-04-05 Rohde & Schwarz Gmbh & Co. Kg Netzwerkanalysator und ein Verfahren zum Betrieb eines Netzwerkanalysators mit 9-Term Kalibrierung
US8706433B2 (en) * 2010-02-01 2014-04-22 Teledyne Lecroy, Inc. Time domain reflectometry step to S-parameter conversion
US8917083B2 (en) 2010-11-24 2014-12-23 International Business Machines Corporation Structures and methods for RF de-embedding
EP2551650B1 (en) * 2011-07-27 2019-09-25 Endress+Hauser Consult AG Calibration method
US8928333B2 (en) 2011-11-30 2015-01-06 Raytheon Company Calibration measurements for network analyzers
US8681945B2 (en) * 2011-12-22 2014-03-25 Telefonaktiebolaget Lm Ericsson (Publ) Calibration of a line driving device
CN102680016B (zh) * 2012-05-14 2014-08-27 北京理工大学 一种光电编码器的误差补偿方法
CN103513208B (zh) * 2012-06-29 2016-06-29 中国船舶重工集团公司第七0九研究所 一种皮秒级集成电路测试系统总定时偏差校准的误差补偿方法
US9453863B2 (en) 2012-11-16 2016-09-27 International Business Machines Corporation Implementing frequency spectrum analysis using causality Hilbert Transform results of VNA-generated S-parameter model information
CN103925939B (zh) * 2014-04-10 2016-06-08 北京理工大学 一种光电编码器全量程的标定补偿方法
CN108761388B (zh) * 2018-06-06 2022-02-11 上海交通大学 基于uwb高精度测距定位系统的天线延迟校准方法
CN110149249A (zh) * 2019-06-27 2019-08-20 上海频语电子技术有限公司 一种矢量网络分析仪测试功能拓展系统及方法

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011172227A (ja) * 2010-02-18 2011-09-01 Ls Industrial Systems Co Ltd 送信漏れ信号の相殺信号探索方法
JP2014044205A (ja) * 2012-08-24 2014-03-13 Tektronix Inc 測定方法
CN103364752A (zh) * 2013-07-19 2013-10-23 中国电子科技集团公司第十三研究所 一种在片负载牵引测量系统的现场校准方法
CN103364752B (zh) * 2013-07-19 2015-12-23 中国电子科技集团公司第十三研究所 一种在片负载牵引测量系统的现场校准方法

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US7107170B2 (en) 2006-09-12
US20040162689A1 (en) 2004-08-19

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