JP2004239922A5 - - Google Patents

Download PDF

Info

Publication number
JP2004239922A5
JP2004239922A5 JP2004158631A JP2004158631A JP2004239922A5 JP 2004239922 A5 JP2004239922 A5 JP 2004239922A5 JP 2004158631 A JP2004158631 A JP 2004158631A JP 2004158631 A JP2004158631 A JP 2004158631A JP 2004239922 A5 JP2004239922 A5 JP 2004239922A5
Authority
JP
Japan
Prior art keywords
probe
charged particle
particle beam
sample
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004158631A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004239922A (ja
JP4134951B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2004158631A priority Critical patent/JP4134951B2/ja
Priority claimed from JP2004158631A external-priority patent/JP4134951B2/ja
Publication of JP2004239922A publication Critical patent/JP2004239922A/ja
Publication of JP2004239922A5 publication Critical patent/JP2004239922A5/ja
Application granted granted Critical
Publication of JP4134951B2 publication Critical patent/JP4134951B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP2004158631A 2004-05-28 2004-05-28 試料作製装置 Expired - Lifetime JP4134951B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004158631A JP4134951B2 (ja) 2004-05-28 2004-05-28 試料作製装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004158631A JP4134951B2 (ja) 2004-05-28 2004-05-28 試料作製装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP34255098A Division JP3613039B2 (ja) 1998-12-02 1998-12-02 試料作製装置

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP2006104806A Division JP4111227B2 (ja) 2006-04-06 2006-04-06 試料作製装置
JP2007331324A Division JP4572934B2 (ja) 2007-12-25 2007-12-25 試料作製装置

Publications (3)

Publication Number Publication Date
JP2004239922A JP2004239922A (ja) 2004-08-26
JP2004239922A5 true JP2004239922A5 (cg-RX-API-DMAC10.html) 2005-12-02
JP4134951B2 JP4134951B2 (ja) 2008-08-20

Family

ID=32960097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004158631A Expired - Lifetime JP4134951B2 (ja) 2004-05-28 2004-05-28 試料作製装置

Country Status (1)

Country Link
JP (1) JP4134951B2 (cg-RX-API-DMAC10.html)

Similar Documents

Publication Publication Date Title
JP2003202217A5 (cg-RX-API-DMAC10.html)
JP2006128068A5 (cg-RX-API-DMAC10.html)
JP2006032107A5 (cg-RX-API-DMAC10.html)
JP2013143197A5 (cg-RX-API-DMAC10.html)
EP2093561A4 (en) DEVICE AND METHOD FOR FAST PICTURE AND INSPECTION OF A POTENTIAL TARGET
JP2008153085A5 (cg-RX-API-DMAC10.html)
JP2018507435A (ja) レーザーマイクロディセクション方法およびレーザーマイクロディセクションシステム
JP2005181246A5 (cg-RX-API-DMAC10.html)
JP5981744B2 (ja) 試料観察方法、試料作製方法及び荷電粒子ビーム装置
JP2002118158A5 (cg-RX-API-DMAC10.html)
JP2009252854A5 (cg-RX-API-DMAC10.html)
JP2005083948A5 (cg-RX-API-DMAC10.html)
JP2005108472A5 (cg-RX-API-DMAC10.html)
JP2008171774A (ja) 電子顕微鏡
JP2007180403A5 (cg-RX-API-DMAC10.html)
JP2004014485A5 (cg-RX-API-DMAC10.html)
JP4588710B2 (ja) 対象物の画像を形成する方法及び装置
JP6285753B2 (ja) 透過電子顕微鏡
JP2004239922A5 (cg-RX-API-DMAC10.html)
JP2006329944A (ja) 蛍光ｘ線分析装置
JP2010266549A (ja) 顕微鏡
JP2006003370A5 (cg-RX-API-DMAC10.html)
JP2007003539A5 (cg-RX-API-DMAC10.html)
JP2004251915A5 (cg-RX-API-DMAC10.html)
JP6595856B2 (ja) 荷電粒子装置および測定方法