JP2004219262A5 - - Google Patents

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Publication number
JP2004219262A5
JP2004219262A5 JP2003007400A JP2003007400A JP2004219262A5 JP 2004219262 A5 JP2004219262 A5 JP 2004219262A5 JP 2003007400 A JP2003007400 A JP 2003007400A JP 2003007400 A JP2003007400 A JP 2003007400A JP 2004219262 A5 JP2004219262 A5 JP 2004219262A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003007400A
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JP2004219262A (ja
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Publication date
Application filed filed Critical
Priority to JP2003007400A priority Critical patent/JP2004219262A/ja
Priority claimed from JP2003007400A external-priority patent/JP2004219262A/ja
Publication of JP2004219262A publication Critical patent/JP2004219262A/ja
Publication of JP2004219262A5 publication Critical patent/JP2004219262A5/ja
Pending legal-status Critical Current

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JP2003007400A 2003-01-15 2003-01-15 ウェーハ欠陥の高速オンライン電気光学的検出のための方法及びシステム Pending JP2004219262A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003007400A JP2004219262A (ja) 2003-01-15 2003-01-15 ウェーハ欠陥の高速オンライン電気光学的検出のための方法及びシステム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003007400A JP2004219262A (ja) 2003-01-15 2003-01-15 ウェーハ欠陥の高速オンライン電気光学的検出のための方法及びシステム

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2010028061A Division JP5519313B2 (ja) 2010-02-10 2010-02-10 ウェーハ欠陥の高速オンライン電気光学的検出のための方法及びシステム

Publications (2)

Publication Number Publication Date
JP2004219262A JP2004219262A (ja) 2004-08-05
JP2004219262A5 true JP2004219262A5 (ja) 2006-03-02

Family

ID=32897515

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003007400A Pending JP2004219262A (ja) 2003-01-15 2003-01-15 ウェーハ欠陥の高速オンライン電気光学的検出のための方法及びシステム

Country Status (1)

Country Link
JP (1) JP2004219262A (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6758929B2 (ja) * 2016-06-03 2020-09-23 株式会社ニューフレアテクノロジー 検査方法
CN112330590A (zh) * 2020-09-25 2021-02-05 上海华力微电子有限公司 晶圆缺陷的验证方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03221848A (ja) * 1990-01-26 1991-09-30 Canon Inc 異物検査装置
JPH0518901A (ja) * 1991-07-15 1993-01-26 Toshiba Corp ウエーハ表面検査装置
JPH05144913A (ja) * 1991-11-19 1993-06-11 Hitachi Electron Eng Co Ltd ウエハ異物検出光学系
JPH0666530A (ja) * 1992-08-24 1994-03-08 Matsushita Electric Ind Co Ltd 半田接合部の検査装置
JP3271425B2 (ja) * 1994-03-30 2002-04-02 ソニー株式会社 異物検査装置及び異物検査方法
JPH1048138A (ja) * 1996-08-06 1998-02-20 Nkk Corp 金属板表面の疵情報入力装置
JP3271549B2 (ja) * 1997-05-20 2002-04-02 日産自動車株式会社 表面検査装置
JP2000338048A (ja) * 1999-05-31 2000-12-08 Hamamatsu Photonics Kk 表面検査方法及び検査装置

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