JP2004191166A - Conveyance mechanism for sheet or tape-like substrate, and inspection device using the same - Google Patents

Conveyance mechanism for sheet or tape-like substrate, and inspection device using the same Download PDF

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Publication number
JP2004191166A
JP2004191166A JP2002359140A JP2002359140A JP2004191166A JP 2004191166 A JP2004191166 A JP 2004191166A JP 2002359140 A JP2002359140 A JP 2002359140A JP 2002359140 A JP2002359140 A JP 2002359140A JP 2004191166 A JP2004191166 A JP 2004191166A
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Japan
Prior art keywords
inspection
holder
tape
leaf
inspected
Prior art date
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JP2002359140A
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Japanese (ja)
Inventor
Yoshihisa Yoshida
美久 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
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Toppan Printing Co Ltd
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Publication date
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Priority to JP2002359140A priority Critical patent/JP2004191166A/en
Publication of JP2004191166A publication Critical patent/JP2004191166A/en
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a conveyance mechanism, along with an inspection device comprising the same, capable of conveying a printed wiring board or various semiconductor package boards (BGA, CSP, TAB or the like) that is to be inspected, regardless of its mode, tape or sheet. <P>SOLUTION: This conveying mechanism is constituted of a feed side, a receiving side, a holder 11 for fixing the tapelike substrate or the sheet, and a guide rail 12 for moving the holder 11. This inspection device 100 is constituted of the conveying mechanism 10, an O/S inspection part 20, and a hopper integrated type loader 30, and a stocker integrated type unloader 40. The inspected object 14 is transferred to the holder 11 of the conveying mechanism 10 standing-by in the feed side by a loader part 31 to be heldly fixed, is inspected by the O/S inspection part 20, is moved to a prescribed position in the receiving side, the holding and the fixation for the inspected object 14 are released, and the holder 11 is returned to a prescribed position in the feed side of the conveying mechanism 10. <P>COPYRIGHT: (C)2004,JPO&NCIPI

Description

【0001】
【発明の属する技術分野】
本発明はプリント配線板および各種パッケージ用基板の各種製造装置もしくは各種検査機に用いられている搬送機構および検査機に関するものである。
【0002】
【従来の技術】
プリント配線板および各種パッケージ用基板の搬送機構として各種の搬送機構が用いられているが、ここでは、プリント配線板および各種パッケージ用基板のO/S検査装置を例に説明をする。
【0003】
図6に被検査体が毎葉の場合の検査装置の構成の一例を示す。
被検査体が毎葉の場合、被検査体14はホッパ71に収納されており、ローダ70によってO/S検査部20のステージ23へ運ばれ、ステージ23でO/S検査が行われた後、被検査体14はアンローダ80によってストッカ81に収納される。
【0004】
ローダ70およびアンローダ80がO/S検査部20の内部に入り込んでおり、被検査体14は図7(a)に示すようなバキュームパッド91を有するピックアップ90によって搬送される。
【0005】
このような構成の場合、検査前の被検査体14をステージ23へロードする際、または検査の終了した被検査体14をステージ23からアンロードする際、O/S検査部20の上検査ヘッド21を大きく上方へ退避させなければならない。
【0006】
したがって、上検査ヘッド21の退避機構が必要となり、検査装置のコストアップにつながる。また、退避動作をすることによる処理能力の低下が生じる。
【0007】
更に、ローダ70およびアンローダ80が故障した場合、O/S検査部20のみを手動で稼働させることが実際上できないため、稼働率の低下にもつながる。
【0008】
図8に被検査体15がテープの場合の検査装置の構成の一例を示す。
被検査体15のテープはテープ搬送機(巻出し側)110から検査スピードに合わせて連続もしくは断続的に送られ、テープ搬送機(巻取り側)120に巻き取られる。
被検査体15の送りは、テープ搬送機(巻出し側)110およびテープ搬送機(巻取り側)120に設けられた駆動ローラ111及び駆動ローラ121によってコントロールされる。
【0009】
以上のように、被検査体が毎葉とテープの場合とではまったく異なる搬送機構を使わなければならず、共用はできない。同一の工程に両方の形態の被検査体が投入される場合(通常の流れとして、両方の形態の被検査体が投入される場合、あるいはテープ状の被検査体を何らかの理由で毎葉に切断し再度投入する場合等)どちらにも対応できるよう2種類の検査装置を準備しなければならない。
【0010】
【発明が解決しようとする課題】
本発明は上記問題点に鑑み考案されたもので、プリント配線板および各種半導体パッケージ用基板(BGA,CSP,TAB等)等の被検査体がテープもしくは毎葉のいずれの場合であっても搬送可能な搬送機構とその搬送機構を有する検査装置を提供することを目的とする。
【0011】
【課題を解決するための手段】
本発明において上記の課題を解決するために、まず請求項1の発明は、プリント配線板および各種半導体パッケージ用基板(BGA,CSP,TAB等)の毎葉もしくはテープ状基板を移動する搬送機構であって、プリント配線板および各種半導体パッケージ用基板(BGA,CSP,TAB等)の毎葉もしくはテープ状基板を移動する搬送機構であって、少なくとも投入側、受取側、ホルダーとで構成されており、前記投入側で毎葉もしくはテープ状基板を前記ホルダーで保持・固定する手段と、前記ホルダーを所定量移動し、停止する手段と、前記受取側で毎葉もしくはテープ状基板の保持・固定を解除し、前記ホルダーを前記投入側の所定位置に移動し、停止する手段とを有することを特徴とする毎葉もしくはテープ状基板の搬送機構としたものである。
【0012】
また、請求項2の発明は、請求項1に記載の搬送機構とO/S検査部を有する毎葉もしくはテープ状基板の検査装置としたものである。
【0013】
【発明の実施の形態】
以下、本発明の実施の形態につき説明する。
図1は本発明の搬送機構10及びO/S検査部20を組み込んだ検査装置の基本形である。搬送機構10は投入側と、受取側と、毎葉もしくはテープ状基板を固定するホルダー11と、ホルダー11を移動させるためのガイドレール12とから構成されている。
【0014】
ホルダー11は単に移動式のステージということではなく、毎葉もしくはテープ状基板を投入側でホルダー11に保持・固定する機構と、所定の範囲を移動し、O/S検査部20の所定位置に移動、停止する機構と、受取側で毎葉もしくはテープ状基板の保持・固定をホルダー11から解除し、ホルダー11を投入側の所定位置に移動し、停止する機構とを有し、毎葉もしくはテープ状基板の検査を連続的に行うことができる。
【0015】
投入側と受取側はともにO/S検査部20の外に出ており、これにより、上検査ヘッド21を大きく退避させる機構が不要になり、コストアップや処理能力の低下を防ぐことができる。
【0016】
また、後記するように、ローダおよびアンローダ、あるいはテープ搬送機が一体となっていないため、被検査体の形態によって両者を付けかえて運用することができ、被検査体が毎葉の場合は、ローダもしくはアンローダが故障した場合でも、O/S検査部20を手動で独立して稼働させることができ、稼働率の低下を防ぐことができる。
【0017】
図2は本発明の検査装置の一例を示す構成概略図である。
本発明の検査装置100は、被検査体が毎葉の場合の検査装置で、搬送機構10と、O/S検査部20と、ホッパ一体型ローダ30と、ストッカ一体型アンローダ40とから構成されている。
ホッパ一体型ローダ30のホッパ部32に収納された被検査体14がローダ部31によって投入側で待機中の搬送機構10のホルダー11に移され保持・固定される。ホルダー11はガイドレール12上を移動し、O/S検査部20の上検査ヘッド21と下検査ヘッド22の間の所定の位置で停止し、O/S検査が行われる。O/S検査が終了したら、ホルダー11はガイドレール12上を受取側の所定の位置まで移動し、停止する。被検査体14の保持・固定が解除され、ストッカ一体型アンローダ40のアンローダ部41によって被検査体14がホルダー11からストッカ部42へ移され、ホルダー11は搬送機構10の投入側の所定の位置まで移動し、停止する。
以下、上記工程を所定回数繰り返すことにより毎葉の被検査体の検査を連続的に行うことができる。
【0018】
図3は本発明の検査装置の他の例を示す構成概略図である。
本発明の検査装置200は、被検査体がテープ状の場合の検査装置で、搬送機構10と、O/S検査部20と、テープ搬送機(巻出し側)50と、テープ搬送機(巻取り側)60とから構成されている。
テープ搬送機(巻出し側)50より供給されるテープ状の被検査体15は投入側のホルダー11にて保持・固定され、ガイドレール12上を移動し、O/S検査部20の上検査ヘッド21と下検査ヘッド22の間の所定の位置で停止し、O/S検査が行われる。O/S検査が終了したら、被検査体15の保持・固定が解除され、ホルダー11だけがガイドレール12上を搬送機構10の投入側の所定位置まで移動し、停止する。
以下、上記工程を所定回数繰り返すことによりテープ状の被検査体の検査を連続的に行うことができる。
【0019】
テープ搬送機(巻出し側)50、テープ搬送機(巻取り側)60ともに、積極的にテープの搬送を行うことはせず、ホルダー11の動きにしたがって一定量のテープ状の被検査体の巻出し、巻取りを行うだけである。
【0020】
被検査体15がテープの場合、製品の検査単位が連続してテープ上に作り込まれているため、ホルダー11は図3に示すように、投入側とO/S検査部20の上検査ヘッド21および下検査ヘッド22の間の所定の位置を往復するだけで、受取側には移動しない。また、投入側の戻る位置は検査単位がテープ上に作り込まれているピッチとホルダーの構造、サイズによって決まる。
【0021】
図4および図5に搬送機構10のホルダーで被検査体を保持・固定する方式の一例を示す。図4は被検査体を挟み込んで保持・固定するブック式ホルダー11aを、図5は被検査体をバキュームで保持・固定するバキューム式ホルダー11bをそれぞれ示す。
【0022】
【発明の効果】
本発明の搬送機構は、被検査体が毎葉もしくはテープのいずれの場合でも搬送ができるため、被検査体の種別毎に、ローダ、アンローダ、テープ搬送機(巻出し側)及びテープ搬送機(巻取り側)を容易に付け替えることができ、稼働効率の高い検査装置を提供することができる。
【図面の簡単な説明】
【図1】本発明の搬送機構及び検査装置の基本形を示す構成概略図である。
【図2】本発明の検査装置の一例を示す構成概略図である。
【図3】本発明の検査装置の他の例を示す構成概略図である。
【図4】本発明の搬送機構のホルダーで毎葉もしくはテープ状の被検査体を保持・固定する方式の一例を示す構成概略図である。
【図5】本発明の搬送機構のホルダーで毎葉もしくはテープ状の被検査体を保持・固定する方式の他の例を示す構成概略図である。
【図6】従来の検査装置の一例を示す構成概略図である。
【図7】(a)は、従来の検査装置で用いられるピックアップの一例を示す構成概略図である。
(b)は、ピックアップで被検査体を保持した状態を示す説明図である。
【図8】従来の検査装置の他の例を示す構成概略図である。
【符号の説明】
10…搬送機構
11…ホルダー
11a…ブック式ホルダー
11b…バキューム式ホルダー
12…ガイドレール
14…毎葉被検査体
15…テープ状検査体
20…O/S(オープン/ショート)検査部
21…上検査ヘッド
22…下検査ヘッド
23…ステージ
30…ホッパー一体型ローダ
31…ローダ部
32…ホッパ部
40…ストッカ一体型アンローダ
41…アンローダ部
42…ストッカ部
50、110…テープ搬送機(巻出し側)
60、120…テープ搬送機(巻取り側)
70…ローダ
71…ホッパ
80…アンローダ
81…ストッカ
90…ピックアップ
91…バキュームパッド
100、200、300、400…検査装置
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a transport mechanism and an inspection machine used for various manufacturing apparatuses or various inspection machines for printed wiring boards and various package substrates.
[0002]
[Prior art]
Various transport mechanisms are used as a transport mechanism for a printed wiring board and various package substrates. Here, an O / S inspection device for a printed wiring board and various package substrates will be described as an example.
[0003]
FIG. 6 shows an example of the configuration of the inspection apparatus when the inspected object is every leaf.
When the object to be inspected is every leaf, the object to be inspected 14 is housed in the hopper 71, carried by the loader 70 to the stage 23 of the O / S inspection unit 20, and after the O / S inspection is performed on the stage 23. The inspection object 14 is stored in the stocker 81 by the unloader 80.
[0004]
The loader 70 and the unloader 80 enter the inside of the O / S inspection unit 20, and the inspection object 14 is transported by a pickup 90 having a vacuum pad 91 as shown in FIG.
[0005]
In the case of such a configuration, when loading the inspection object 14 before inspection onto the stage 23 or unloading the inspection object 14 after inspection from the stage 23, the upper inspection head of the O / S inspection unit 20 is used. 21 has to be largely retracted upward.
[0006]
Therefore, a retracting mechanism for the upper inspection head 21 is required, which leads to an increase in the cost of the inspection apparatus. In addition, the processing capability is reduced due to the evacuation operation.
[0007]
Furthermore, if the loader 70 and the unloader 80 fail, it is practically impossible to operate only the O / S inspection unit 20 manually, which leads to a reduction in the operation rate.
[0008]
FIG. 8 shows an example of the configuration of an inspection apparatus when the inspection object 15 is a tape.
The tape of the inspection object 15 is continuously or intermittently sent from the tape transporter (unwinding side) 110 according to the inspection speed, and is wound up by the tape transporting machine (winding side) 120.
The feeding of the test object 15 is controlled by drive rollers 111 and 121 provided on the tape transport device (unwinding side) 110 and the tape transport device (winding side) 120.
[0009]
As described above, a completely different transport mechanism must be used when the test object is a leaf and a tape, and cannot be shared. When both types of test objects are loaded in the same process (when both types of test objects are loaded as a normal flow, or when a tape-shaped test object is cut every leaf for some reason) And then re-enter) two types of inspection devices must be prepared to handle both.
[0010]
[Problems to be solved by the invention]
The present invention has been devised in view of the above problems, and conveys an object to be inspected such as a printed wiring board and various semiconductor package substrates (BGA, CSP, TAB, etc.) in a tape or every leaf. It is an object of the present invention to provide a possible transport mechanism and an inspection apparatus having the transport mechanism.
[0011]
[Means for Solving the Problems]
In order to solve the above-mentioned problems in the present invention, first, the invention of claim 1 is a transport mechanism for moving each leaf or tape-like substrate of a printed wiring board and various semiconductor package substrates (BGA, CSP, TAB, etc.). A transfer mechanism for moving a printed wiring board and each substrate or a tape-shaped substrate of various semiconductor package substrates (BGA, CSP, TAB, etc.), and includes at least a loading side, a receiving side, and a holder. Means for holding and fixing each leaf or tape-shaped substrate on the input side with the holder, means for moving and stopping the holder by a predetermined amount, and holding and fixing of each leaf or tape-shaped substrate on the receiving side. Means for releasing, moving the holder to a predetermined position on the loading side, and stopping the transport mechanism for each leaf or tape-shaped substrate. One in which the.
[0012]
According to a second aspect of the present invention, there is provided an inspection apparatus for a leaf- or tape-shaped substrate having the transport mechanism according to the first aspect and an O / S inspection unit.
[0013]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of the present invention will be described.
FIG. 1 shows a basic form of an inspection apparatus incorporating a transport mechanism 10 and an O / S inspection section 20 according to the present invention. The transport mechanism 10 includes a loading side, a receiving side, a holder 11 for fixing each leaf or tape-shaped substrate, and a guide rail 12 for moving the holder 11.
[0014]
The holder 11 is not simply a movable stage, but a mechanism for holding and fixing each leaf or a tape-shaped substrate on the input side to the holder 11, and moving in a predetermined range to a predetermined position of the O / S inspection unit 20. A mechanism for moving and stopping, and a mechanism for releasing the holding and fixing of each leaf or the tape-shaped substrate from the holder 11 on the receiving side, moving the holder 11 to a predetermined position on the loading side, and stopping. Inspection of the tape-shaped substrate can be performed continuously.
[0015]
Both the input side and the receiving side are out of the O / S inspection unit 20, so that a mechanism for largely retracting the upper inspection head 21 is not required, and it is possible to prevent an increase in cost and a decrease in processing capacity.
[0016]
In addition, as described later, since the loader and unloader or the tape transporter are not integrated, they can be operated by changing both depending on the form of the test object. When the test object is every leaf, Even if the loader or the unloader breaks down, the O / S inspection unit 20 can be manually operated independently and independently, and a decrease in the operation rate can be prevented.
[0017]
FIG. 2 is a schematic configuration diagram showing an example of the inspection device of the present invention.
The inspection apparatus 100 according to the present invention is an inspection apparatus in a case where an object to be inspected is every leaf, and is configured by a transport mechanism 10, an O / S inspection unit 20, a hopper integrated loader 30, and a stocker integrated unloader 40. ing.
The test object 14 housed in the hopper 32 of the hopper-integrated loader 30 is transferred to the holder 11 of the transport mechanism 10 on standby at the loading side by the loader 31 and held and fixed. The holder 11 moves on the guide rail 12, stops at a predetermined position between the upper inspection head 21 and the lower inspection head 22 of the O / S inspection unit 20, and the O / S inspection is performed. When the O / S inspection is completed, the holder 11 moves on the guide rail 12 to a predetermined position on the receiving side and stops. The holding and fixing of the inspection object 14 are released, and the inspection object 14 is moved from the holder 11 to the stocker unit 42 by the unloader unit 41 of the stocker-integrated unloader 40, and the holder 11 is moved to a predetermined position on the loading side of the transport mechanism 10. Move up and stop.
Hereinafter, by repeating the above-described steps a predetermined number of times, the inspection of the inspection object of each leaf can be continuously performed.
[0018]
FIG. 3 is a schematic configuration diagram showing another example of the inspection apparatus of the present invention.
An inspection apparatus 200 according to the present invention is an inspection apparatus in a case where an object to be inspected is in a tape shape. Take-up side) 60.
The tape-shaped inspection object 15 supplied from the tape transporter (unwinding side) 50 is held and fixed by the holder 11 on the input side, moves on the guide rail 12, and inspects the O / S inspection unit 20. It stops at a predetermined position between the head 21 and the lower inspection head 22, and the O / S inspection is performed. When the O / S inspection is completed, the holding and fixing of the inspection object 15 is released, and only the holder 11 moves on the guide rail 12 to a predetermined position on the loading side of the transport mechanism 10 and stops.
Hereinafter, the inspection of the tape-shaped inspection object can be continuously performed by repeating the above-described steps a predetermined number of times.
[0019]
Neither the tape transporter (unwinding side) 50 nor the tape transporter (winding side) 60 actively transports the tape. Just unwind and rewind.
[0020]
When the inspection object 15 is a tape, since the inspection unit of the product is continuously formed on the tape, the holder 11 is mounted on the input side and the upper inspection head of the O / S inspection unit 20 as shown in FIG. It only reciprocates in a predetermined position between 21 and the lower inspection head 22 and does not move to the receiving side. Also, the return position on the input side is determined by the pitch of the inspection unit formed on the tape and the structure and size of the holder.
[0021]
FIGS. 4 and 5 show an example of a method of holding and fixing an object to be inspected by a holder of the transport mechanism 10. FIG. 4 shows a book-type holder 11a for holding and fixing the object to be inspected, and FIG. 5 shows a vacuum-type holder 11b for holding and fixing the object to be inspected by vacuum.
[0022]
【The invention's effect】
Since the transport mechanism of the present invention can transport the inspected object whether it is a leaf or a tape, a loader, an unloader, a tape transporter (unwinding side), and a tape transporter (unwinder) are provided for each type of inspected object. The rewinding side can be easily replaced, and an inspection device with high operation efficiency can be provided.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram showing a basic form of a transport mechanism and an inspection device of the present invention.
FIG. 2 is a schematic configuration diagram illustrating an example of an inspection apparatus according to the present invention.
FIG. 3 is a schematic configuration diagram showing another example of the inspection device of the present invention.
FIG. 4 is a schematic configuration diagram showing an example of a system for holding and fixing a leaf- or tape-shaped test object with a holder of the transport mechanism of the present invention.
FIG. 5 is a schematic configuration diagram showing another example of a method of holding and fixing a leaf- or tape-like test object with a holder of the transport mechanism of the present invention.
FIG. 6 is a schematic configuration diagram illustrating an example of a conventional inspection device.
FIG. 7A is a schematic configuration diagram illustrating an example of a pickup used in a conventional inspection device.
(B) is an explanatory view showing a state where the object to be inspected is held by the pickup.
FIG. 8 is a schematic configuration diagram showing another example of a conventional inspection device.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 10 ... Conveying mechanism 11 ... Holder 11a ... Book-type holder 11b ... Vacuum-type holder 12 ... Guide rail 14 ... Each test object 15 ... Tape test object 20 ... O / S (open / short) test part 21 ... Top test Head 22, lower inspection head 23, stage 30, hopper integrated loader 31, loader unit 32, hopper unit 40, stocker integrated unloader 41, unloader unit 42, stocker units 50, 110, tape transporter (unwinding side)
60, 120: Tape transporter (winding side)
70 Loader 71 Hopper 80 Unloader 81 Stocker 90 Pickup 91 Vacuum pad 100, 200, 300, 400 Inspection device

Claims (2)

プリント配線板および各種半導体パッケージ用基板(BGA,CSP,TAB等)の毎葉もしくはテープ状基板を移動する搬送機構であって、少なくとも投入側、受取側、ホルダーとで構成されており、前記投入側で毎葉もしくはテープ状基板を前記ホルダーで保持・固定する手段と、前記ホルダーを所定量移動し、停止する手段と、前記受取側で毎葉もしくはテープ状基板の保持・固定を解除し、前記ホルダーを前記投入側の所定位置に移動し、停止する手段とを有することを特徴とする毎葉もしくはテープ状基板の搬送機構。A transport mechanism for moving each leaf or a tape-shaped substrate of a printed wiring board and various semiconductor package substrates (BGA, CSP, TAB, etc.), comprising at least a loading side, a receiving side, and a holder. A means for holding and fixing each leaf or tape-like substrate with the holder on the side, a means for moving the holder by a predetermined amount and stopping, and releasing the holding and fixing of every leaf or tape-like substrate on the receiving side, Means for moving the holder to a predetermined position on the loading side and stopping the holder. 請求項1に記載の搬送機構とO/S(オープン/ショート)検査部を有する毎葉もしくはテープ状基板の検査装置。An inspection apparatus for each leaf or tape-shaped substrate, comprising the transport mechanism according to claim 1 and an O / S (open / short) inspection unit.
JP2002359140A 2002-12-11 2002-12-11 Conveyance mechanism for sheet or tape-like substrate, and inspection device using the same Withdrawn JP2004191166A (en)

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JP2002359140A JP2004191166A (en) 2002-12-11 2002-12-11 Conveyance mechanism for sheet or tape-like substrate, and inspection device using the same

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Application Number Priority Date Filing Date Title
JP2002359140A JP2004191166A (en) 2002-12-11 2002-12-11 Conveyance mechanism for sheet or tape-like substrate, and inspection device using the same

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008039725A (en) * 2006-08-10 2008-02-21 Matsushita Electric Ind Co Ltd Method and apparatus for electrically inspecting printed wiring board
CN103084341A (en) * 2011-11-08 2013-05-08 日本电产理德株式会社 Substrate inspection apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008039725A (en) * 2006-08-10 2008-02-21 Matsushita Electric Ind Co Ltd Method and apparatus for electrically inspecting printed wiring board
CN103084341A (en) * 2011-11-08 2013-05-08 日本电产理德株式会社 Substrate inspection apparatus

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