JP2004170189A - プローブ及びこれを用いた電気的接続装置 - Google Patents

プローブ及びこれを用いた電気的接続装置 Download PDF

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Publication number
JP2004170189A
JP2004170189A JP2002335149A JP2002335149A JP2004170189A JP 2004170189 A JP2004170189 A JP 2004170189A JP 2002335149 A JP2002335149 A JP 2002335149A JP 2002335149 A JP2002335149 A JP 2002335149A JP 2004170189 A JP2004170189 A JP 2004170189A
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Japan
Prior art keywords
probe
needle
conductive
rear end
coating
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JP2002335149A
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Japanese (ja)
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JP2004170189A5 (enExample
Inventor
Yoshie Hasegawa
義栄 長谷川
Masahiko Sho
雅彦 庄
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Micronics Japan Co Ltd
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Micronics Japan Co Ltd
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Priority to JP2002335149A priority Critical patent/JP2004170189A/ja
Publication of JP2004170189A publication Critical patent/JP2004170189A/ja
Publication of JP2004170189A5 publication Critical patent/JP2004170189A5/ja
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2002335149A 2002-11-19 2002-11-19 プローブ及びこれを用いた電気的接続装置 Pending JP2004170189A (ja)

Priority Applications (1)

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JP2002335149A JP2004170189A (ja) 2002-11-19 2002-11-19 プローブ及びこれを用いた電気的接続装置

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JP2002335149A JP2004170189A (ja) 2002-11-19 2002-11-19 プローブ及びこれを用いた電気的接続装置

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JP2004170189A true JP2004170189A (ja) 2004-06-17
JP2004170189A5 JP2004170189A5 (enExample) 2005-09-29

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JP2002335149A Pending JP2004170189A (ja) 2002-11-19 2002-11-19 プローブ及びこれを用いた電気的接続装置

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008224266A (ja) * 2007-03-09 2008-09-25 Japan Electronic Materials Corp プローブ及びプローブカード
JP2010071718A (ja) * 2008-09-17 2010-04-02 Japan Electronic Materials Corp プローブカード
JP2011145200A (ja) * 2010-01-15 2011-07-28 Micronics Japan Co Ltd 電気的試験用プローブ及びその製造方法、並びに電気的接続装置及びその製造方法
JP2013142691A (ja) * 2012-01-10 2013-07-22 Star Technologies Inc プローブの電気的接点を強化した構造を備えた集積回路用プローブカード
TWI416120B (enExample) * 2009-09-16 2013-11-21
TWI453423B (zh) * 2012-04-25 2014-09-21 探針阻抗匹配方法
TWI630394B (zh) * 2017-09-29 2018-07-21 中華精測科技股份有限公司 探針組件及其電容式探針

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008224266A (ja) * 2007-03-09 2008-09-25 Japan Electronic Materials Corp プローブ及びプローブカード
JP2010071718A (ja) * 2008-09-17 2010-04-02 Japan Electronic Materials Corp プローブカード
TWI416120B (enExample) * 2009-09-16 2013-11-21
JP2011145200A (ja) * 2010-01-15 2011-07-28 Micronics Japan Co Ltd 電気的試験用プローブ及びその製造方法、並びに電気的接続装置及びその製造方法
JP2013142691A (ja) * 2012-01-10 2013-07-22 Star Technologies Inc プローブの電気的接点を強化した構造を備えた集積回路用プローブカード
TWI453423B (zh) * 2012-04-25 2014-09-21 探針阻抗匹配方法
TWI630394B (zh) * 2017-09-29 2018-07-21 中華精測科技股份有限公司 探針組件及其電容式探針

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