JP2004022907A - Semiconductor device and its manufacturing method - Google Patents
Semiconductor device and its manufacturing method Download PDFInfo
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- JP2004022907A JP2004022907A JP2002177674A JP2002177674A JP2004022907A JP 2004022907 A JP2004022907 A JP 2004022907A JP 2002177674 A JP2002177674 A JP 2002177674A JP 2002177674 A JP2002177674 A JP 2002177674A JP 2004022907 A JP2004022907 A JP 2004022907A
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- H01L23/5389—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
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Abstract
Description
【0001】
【発明の属する技術分野】
本発明は、一般的に半導体装置に関し、特に、パッケージ内に複数の半導体基板(以下、「チップ」ともいう)が実装されたシステムインパッケージ(Systemin Package)と呼ばれる半導体装置に関する。さらに、本発明は、そのような半導体装置の製造方法に関する。
【0002】
【従来の技術】
パッケージ内に複数のチップが実装されたシステムインパッケージと呼ばれる半導体装置においては、例えば、1つのメイン基板上に複数のチップを実装し、これらのチップに設けられたパッド間を配線することにより、システムが構成される。その際に用いられる配線技術としては、ワイアボンディングが主流であるが、半導体装置を小型化するために、メタルスパッタ及びエッチング処理によって配線をパターン形成することにより10μm程度の線幅の配線で結線する方法(マイクロコネクト)も考えられる。
【0003】
【発明が解決しようとする課題】
しかしながら、メタルスパッタ及びエッチング処理を行う場合には、高価な装置やクリーンルームが必要になると共に、製造工程も複雑になってしまう。また、試作段階において少数のシステムインパッケージを製造する際にも、量産する場合と同様の高価な装置やクリーンルームが必要になってしまう。
【0004】
そこで、上記の点に鑑み、本発明は、1つのメイン基板上に複数のチップを実装することによって構成される半導体装置において、メタルスパッタやエッチング処理を行わずに複数のチップ間を10μm程度の線幅の配線で結線することにより、半導体装置を小型化すると共に、製造工程を簡素化して製造コストを削減することを目的とする。
【0005】
【課題を解決するための手段】
上記の課題を解決するために、本発明の第1の観点に係る半導体装置は、複数の溝が形成された絶縁性を有するチップアダプタと、入出力パッド及び所定の回路が形成され、チップアダプタの複数の溝にそれぞれ挿入された複数の半導体基板と、複数の半導体基板及びチップアダプタ上に形成され、複数の半導体基板間において入出力パッド同士を電気的に接続する配線とを具備する。
【0006】
ここで、配線が、インクジェット方式のプリンタを用いて導電性材料を含むインクを複数の半導体基板及びチップアダプタ上に塗布することによって形成されたものであっても良い。
【0007】
また、本発明の第2の観点に係る半導体装置は、メイン基板と、入出力パッド及び所定の回路が形成され、メイン基板上に固定された複数の半導体基板と、メイン基板の所定の領域に形成された絶縁体と、複数の半導体基板及び絶縁体又はメイン基板上に形成され、複数の半導体基板間において入出力パッド同士を電気的に接続する配線とを具備する。
【0008】
ここで、配線が、インクジェット方式のプリンタを用いて導電性材料を含むインクを複数の半導体基板及び絶縁体又はメイン基板上に塗布することによって形成されたものであっても良い。
【0009】
本発明の第1の観点に係る半導体装置の製造方法は、入出力パッド及び所定の回路が形成された複数の半導体基板を、絶縁性を有するチップアダプタに形成された複数の溝にそれぞれ挿入するステップ(a)と、複数の半導体基板及びチップアダプタ上に配線を形成し、複数の半導体基板間において入出力パッド同士を電気的に接続するステップ(b)とを具備する。
【0010】
ここで、ステップ(b)が、インクジェット方式のプリンタを用いて導電性材料を含むインクを複数の半導体基板及びチップアダプタ上に塗布することによって配線を形成することを含んでも良い。
【0011】
また、本発明の第2の観点に係る半導体装置の製造方法は、入出力パッド及び所定の回路が形成された複数の半導体基板をメイン基板上に固定するステップ(a)と、メイン基板の所定の領域に絶縁体を形成するステップ(b)と、複数の半導体基板及び絶縁体又はメイン基板上に配線を形成し、複数の半導体基板間において入出力パッド同士を電気的に接続するステップ(c)とを具備する。
【0012】
ここで、ステップ(c)が、インクジェット方式のプリンタを用いて導電性材料を含むインクを複数の半導体基板及び絶縁体又はメイン基板上に塗布することによって配線を形成することを含んでも良い。
【0013】
本発明によれば、複数の溝が形成された絶縁性を有するチップアダプタを用いるか、あるいは、メイン基板上に絶縁体を形成することにより、チップアダプタ又は絶縁体の高さと複数の半導体基板の高さとを揃え、インクジェット方式のプリンタ等を用いて、複数のチップ間に10μm程度の線幅の配線を容易に形成することができる。これにより、半導体装置を小型化すると共に、製造工程を短縮して製造コストを削減することが可能となる。
【0014】
【発明の実施の形態】
以下に、本発明の実施の形態について、図面を参照しながら詳しく説明する。なお、同一の構成要素には同一の参照番号を付して、説明を省略する。
図1は、本発明の第1の実施形態に係る半導体装置の平面図であり、図2は、図1に示す2−2における断面図である。
【0015】
図1及び図2に示すように、この半導体装置は、複数の溝が形成された絶縁性を有するチップアダプタ10と、入出力パッドP及び所定の回路が形成され、チップアダプタ10の複数の溝にそれぞれ挿入された複数のチップ(LSI)11〜19と、これらのLSI及びチップアダプタ10上に形成され、複数のLSI間において入出力パッド同士を電気的に接続する配線20とを含んでいる。
【0016】
本発明の第1の実施形態に係る半導体装置の製造方法について説明する。
まず、絶縁基板に、LSI11〜19の厚さとほぼ等しい深さを有する複数の溝をそれぞれ形成することにより、チップアダプタ10を作成する。次に、これらのLSIを、チップアダプタ10に形成された複数の溝にそれぞれ挿入して固定する。各々のLSIには、入出力パッドP及び所定の回路が形成されており、図2に示すように、入出力パッドPが上側を向くように、これらのLSIが配置される。このようにして、各々のLSIの高さとチップアダプタ10の高さとの間に、なるべく段差を与えないようにする。
【0017】
次に、インクジェット方式のプリンタを用いて、配線20を印刷によって形成する。即ち、導電性材料を含むインクをLSI11〜19及びチップアダプタ10上に塗布することにより、10μm程度の線幅を有する配線20を形成する。導電性材料としては、例えば、導電性ポリマやAg−Pd(銀−パラジウム)合金を用いることができる。なお、Ag−Pd合金を用いる場合には、印刷工程の後に、焼成工程を設けることが望ましい。配線20の形成により、複数のLSI間において、入出力パッド同士が電気的に接続される。
【0018】
本実施形態においては、配置・配線プログラムを用いて設計された半導体装置のパターンデータを、印刷による配線の形成にも利用している。これにより、コンピュータによって自動的にプリンタを操作することが可能となり、配線を形成するためのコストを省き、工程を大幅に短縮することができる。
【0019】
次に、本発明の第2の実施形態に係る半導体装置について説明する。図3は、本発明の第2の実施形態に係る半導体装置の一部を示す断面図である。
図3に示すように、この半導体装置は、メイン基板30と、入出力パッドP及び所定の回路が形成され、メイン基板30上に固定された複数のチップ(LSI)12及び13と、メイン基板30の所定の領域に形成された絶縁体40と、複数のLSI及び絶縁体40上に形成され、複数のLSI間において入出力パッド同士を電気的に接続する配線50とを含んでいる。なお、メイン基板30は、絶縁性を有していても導電性を有していてもかまわない。
【0020】
本発明の第2の実施形態に係る半導体装置の製造方法について説明する。
まず、メイン基板30上において、LSI11〜19の厚さとほぼ等しい厚さを有する絶縁体40を所定の領域に形成する。例えば、LSI12及び13の厚さが400μmである場合には、絶縁体40の厚さも、ほぼ400μmとする。
次に、LSI12及び13を、メイン基板30上において絶縁体40が形成されてない領域に固定する。なお、絶縁体を形成する工程とLSIを固定する工程との順序は、逆にしても良い。各々のLSIには、入出力パッドP及び所定の回路が形成されており、図3に示すように、入出力パッドPが上側を向くように、これらのLSIが配置される。このようにして、各々のLSIの高さと絶縁体40の高さとの間に、なるべく段差を与えないようにする。
【0021】
次に、インクジェット方式のプリンタを用いて、配線50を印刷によって形成する。即ち、導電性材料を含むインクをLSI12及び13と絶縁体40上に塗布することにより、10μm程度の線幅を有する配線50を形成する。配線50の形成により、複数のLSI間において、入出力パッド同士が電気的に接続される。
【0022】
次に、本発明の第3の実施形態に係る半導体装置について説明する。図4は、本発明の第3の実施形態に係る半導体装置の一部を示す断面図である。本発明の第3の実施形態においては、絶縁体に滑らかなスロープを設けている点が、第2の実施形態と異なっている。
【0023】
図4に示すように、本実施形態においては、メイン基板60上において、LSI12及び13の近傍における所定の領域のみに絶縁体70が形成されている。
従って、配線80は、これらのLSI及び絶縁体70上のみならず、メイン基板60上にも形成されることになる。そのため、メイン基板60は、絶縁性を有する必要がある。
【0024】
本発明の第3の実施形態に係る半導体装置の製造方法について説明する。
まず、LSI12及び13を、メイン基板60上の所定の領域に固定する。各々のLSIには、入出力パッドP及び所定の回路が形成されており、図4に示すように、入出力パッドPが上側を向くように、これらのLSIが配置される。次に、メイン基板60上において、これらのLSIの近傍における所定の領域のみに絶縁体70を形成する。
【0025】
次に、インクジェット方式のプリンタを用いて、配線80を印刷によって形成する。即ち、導電性材料を含むインクを、LSI12及び13と、絶縁体70と、メイン基板60の上に塗布することにより、10μm程度の線幅を有する配線80を形成する。配線80の形成により、複数のLSI間において、入出力パッド同士が電気的に接続される。
【0026】
【発明の効果】
以上述べたように、本発明によれば、1つのメイン基板上に複数のチップを実装することによって構成される半導体装置において、メタルスパッタやエッチング処理を行わずに複数のチップ間を10μm程度の線幅の配線で結線することができる。これにより、半導体装置を小型化すると共に、製造工程を短縮して製造コストを削減することが可能となる。
【図面の簡単な説明】
【図1】本発明の第1の実施形態に係る半導体装置の平面図である。
【図2】図1に示す2−2における断面図である。
【図3】本発明の第2の実施形態に係る半導体装置の一部を示す断面図である。
【図4】本発明の第3の実施形態に係る半導体装置の一部を示す断面図である。
【符号の説明】
10 チップアダプタ
11〜19 LSI
20、50、80 配線
30、60 メイン基板
40、70 絶縁体[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention generally relates to a semiconductor device, and more particularly to a semiconductor device called a system-in-package (System Package) in which a plurality of semiconductor substrates (hereinafter, also referred to as “chips”) are mounted in a package. Further, the present invention relates to a method for manufacturing such a semiconductor device.
[0002]
[Prior art]
In a semiconductor device called a system-in-package in which a plurality of chips are mounted in a package, for example, by mounting a plurality of chips on one main substrate and wiring between pads provided on these chips, The system is configured. As the wiring technique used at that time, wire bonding is the mainstream, but in order to reduce the size of the semiconductor device, the wiring is patterned by metal sputtering and etching to connect with a wiring having a line width of about 10 μm. A method (microconnect) is also conceivable.
[0003]
[Problems to be solved by the invention]
However, when performing metal sputtering and etching, expensive equipment and a clean room are required, and the manufacturing process becomes complicated. Also, when a small number of system-in-packages are manufactured at the prototype stage, expensive devices and clean rooms are required as in the case of mass production.
[0004]
In view of the above, the present invention provides a semiconductor device configured by mounting a plurality of chips on a single main substrate, in which the distance between the plurality of chips is about 10 μm without performing metal sputtering or etching. It is an object of the present invention to reduce the size of the semiconductor device and simplify the manufacturing process to reduce the manufacturing cost by connecting with a line width wiring.
[0005]
[Means for Solving the Problems]
In order to solve the above problems, a semiconductor device according to a first aspect of the present invention includes a chip adapter having an insulating chip adapter having a plurality of grooves, an input / output pad, and a predetermined circuit. And a wiring formed on the plurality of semiconductor substrates and the chip adapter and electrically connecting the input / output pads between the plurality of semiconductor substrates.
[0006]
Here, the wiring may be formed by applying an ink containing a conductive material to the plurality of semiconductor substrates and the chip adapter using an inkjet printer.
[0007]
In addition, a semiconductor device according to a second aspect of the present invention includes a main substrate, a plurality of semiconductor substrates on which input / output pads and a predetermined circuit are formed and fixed on the main substrate, and a predetermined region of the main substrate. The semiconductor device includes the formed insulator, and a plurality of semiconductor substrates and a wiring formed on the insulator or the main substrate and electrically connecting input / output pads between the plurality of semiconductor substrates.
[0008]
Here, the wiring may be formed by applying ink containing a conductive material to a plurality of semiconductor substrates and insulators or a main substrate using an inkjet printer.
[0009]
In a method of manufacturing a semiconductor device according to a first aspect of the present invention, a plurality of semiconductor substrates on which input / output pads and a predetermined circuit are formed are respectively inserted into a plurality of grooves formed in an insulating chip adapter. Step (a) and Step (b) of forming wiring on the plurality of semiconductor substrates and the chip adapter and electrically connecting the input / output pads between the plurality of semiconductor substrates.
[0010]
Here, the step (b) may include forming a wiring by applying an ink containing a conductive material to the plurality of semiconductor substrates and the chip adapter using an inkjet printer.
[0011]
Further, in the method of manufacturing a semiconductor device according to the second aspect of the present invention, a step (a) of fixing a plurality of semiconductor substrates on which input / output pads and predetermined circuits are formed on a main substrate; (B) forming an insulator in the region of (b) and forming wiring on the plurality of semiconductor substrates and the insulator or the main substrate, and electrically connecting input / output pads between the plurality of semiconductor substrates (c). ).
[0012]
Here, the step (c) may include forming a wiring by applying an ink containing a conductive material to a plurality of semiconductor substrates and insulators or a main substrate using an ink jet printer.
[0013]
According to the present invention, the height of the chip adapter or the insulator and the height of the plurality of semiconductor substrates are reduced by using an insulating chip adapter having a plurality of grooves or by forming an insulator on the main board. Wirings having a line width of about 10 μm can be easily formed between a plurality of chips by using an inkjet printer or the like with the same height. This makes it possible to reduce the size of the semiconductor device, shorten the manufacturing process, and reduce the manufacturing cost.
[0014]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Note that the same components are denoted by the same reference numerals, and description thereof will be omitted.
FIG. 1 is a plan view of a semiconductor device according to the first embodiment of the present invention, and FIG. 2 is a cross-sectional view taken along a line 2-2 shown in FIG.
[0015]
As shown in FIGS. 1 and 2, the semiconductor device includes an
[0016]
A method for manufacturing a semiconductor device according to the first embodiment of the present invention will be described.
First, the
[0017]
Next, the
[0018]
In the present embodiment, pattern data of a semiconductor device designed using an arrangement / wiring program is also used for forming wiring by printing. As a result, the printer can be automatically operated by the computer, the cost for forming the wiring can be omitted, and the process can be greatly reduced.
[0019]
Next, a semiconductor device according to a second embodiment of the present invention will be described. FIG. 3 is a sectional view showing a part of the semiconductor device according to the second embodiment of the present invention.
As shown in FIG. 3, the semiconductor device includes a
[0020]
A method for manufacturing a semiconductor device according to the second embodiment of the present invention will be described.
First, on the
Next, the
[0021]
Next, the
[0022]
Next, a semiconductor device according to a third embodiment of the present invention will be described. FIG. 4 is a sectional view showing a part of the semiconductor device according to the third embodiment of the present invention. The third embodiment of the present invention is different from the second embodiment in that the insulator has a smooth slope.
[0023]
As shown in FIG. 4, in the present embodiment, the
Therefore, the
[0024]
A method for manufacturing a semiconductor device according to the third embodiment of the present invention will be described.
First, the
[0025]
Next, the
[0026]
【The invention's effect】
As described above, according to the present invention, in a semiconductor device configured by mounting a plurality of chips on one main substrate, the distance between the plurality of chips is about 10 μm without performing metal sputtering or etching. Connection can be made with a wiring having a line width. This makes it possible to reduce the size of the semiconductor device, shorten the manufacturing process, and reduce the manufacturing cost.
[Brief description of the drawings]
FIG. 1 is a plan view of a semiconductor device according to a first embodiment of the present invention.
FIG. 2 is a sectional view taken along line 2-2 shown in FIG.
FIG. 3 is a sectional view showing a part of a semiconductor device according to a second embodiment of the present invention.
FIG. 4 is a sectional view showing a part of a semiconductor device according to a third embodiment of the present invention.
[Explanation of symbols]
10 Chip Adapter 11-19 LSI
20, 50, 80
Claims (8)
入出力パッド及び所定の回路が形成され、前記チップアダプタの複数の溝にそれぞれ挿入された複数の半導体基板と、
前記複数の半導体基板及び前記チップアダプタ上に形成され、前記複数の半導体基板間において入出力パッド同士を電気的に接続する配線と、
を具備する半導体装置。A chip adapter having an insulating property in which a plurality of grooves are formed,
I / O pads and a predetermined circuit are formed, a plurality of semiconductor substrates respectively inserted into a plurality of grooves of the chip adapter,
A wiring formed on the plurality of semiconductor substrates and the chip adapter and electrically connecting input / output pads between the plurality of semiconductor substrates;
A semiconductor device comprising:
入出力パッド及び所定の回路が形成され、前記メイン基板上に固定された複数の半導体基板と、
前記メイン基板の所定の領域に形成された絶縁体と、
前記複数の半導体基板及び前記絶縁体又は前記メイン基板上に形成され、前記複数の半導体基板間において入出力パッド同士を電気的に接続する配線と、
を具備する半導体装置。A main board,
I / O pads and a predetermined circuit are formed, a plurality of semiconductor substrates fixed on the main substrate,
An insulator formed in a predetermined area of the main board,
A wiring formed on the plurality of semiconductor substrates and the insulator or the main substrate, and electrically connecting input / output pads between the plurality of semiconductor substrates;
A semiconductor device comprising:
前記複数の半導体基板及び前記チップアダプタ上に配線を形成し、前記複数の半導体基板間において入出力パッド同士を電気的に接続するステップ(b)と、を具備する半導体装置の製造方法。(A) inserting a plurality of semiconductor substrates on which input / output pads and a predetermined circuit are formed into a plurality of grooves formed in a chip adapter having an insulating property;
Forming a wiring on the plurality of semiconductor substrates and the chip adapter, and electrically connecting input / output pads between the plurality of semiconductor substrates (b).
前記メイン基板の所定の領域に絶縁体を形成するステップ(b)と、
前記複数の半導体基板及び前記絶縁体又は前記メイン基板上に配線を形成し、前記複数の半導体基板間において入出力パッド同士を電気的に接続するステップ(c)と、
を具備する半導体装置の製造方法。Fixing a plurality of semiconductor substrates on which input / output pads and a predetermined circuit are formed on a main substrate;
Forming an insulator in a predetermined region of the main substrate (b);
(C) forming wiring on the plurality of semiconductor substrates and the insulator or the main substrate, and electrically connecting input / output pads among the plurality of semiconductor substrates;
A method for manufacturing a semiconductor device comprising:
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100783276B1 (en) * | 2006-08-29 | 2007-12-06 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabricating method thereof |
KR100810889B1 (en) * | 2006-12-27 | 2008-03-10 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabricating method thereof |
KR100861223B1 (en) | 2006-12-27 | 2008-09-30 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabricating method thereof |
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2002
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100783276B1 (en) * | 2006-08-29 | 2007-12-06 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabricating method thereof |
KR100810889B1 (en) * | 2006-12-27 | 2008-03-10 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabricating method thereof |
KR100861223B1 (en) | 2006-12-27 | 2008-09-30 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabricating method thereof |
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