JP2004022900A - 半導体装置の作製方法 - Google Patents

半導体装置の作製方法 Download PDF

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Publication number
JP2004022900A
JP2004022900A JP2002177450A JP2002177450A JP2004022900A JP 2004022900 A JP2004022900 A JP 2004022900A JP 2002177450 A JP2002177450 A JP 2002177450A JP 2002177450 A JP2002177450 A JP 2002177450A JP 2004022900 A JP2004022900 A JP 2004022900A
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Japan
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semiconductor film
film
compound
semiconductor
metal element
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JP2002177450A
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Japanese (ja)
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JP2004022900A5 (enrdf_load_stackoverflow
Inventor
Hideaki Kuwabara
桑原 秀明
Osamu Nakamura
中村 理
Masayuki Kajiwara
梶原 誠之
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2002177450A priority Critical patent/JP2004022900A/ja
Publication of JP2004022900A publication Critical patent/JP2004022900A/ja
Publication of JP2004022900A5 publication Critical patent/JP2004022900A5/ja
Withdrawn legal-status Critical Current

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  • Thin Film Transistor (AREA)
  • Recrystallisation Techniques (AREA)
JP2002177450A 2002-06-18 2002-06-18 半導体装置の作製方法 Withdrawn JP2004022900A (ja)

Priority Applications (1)

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JP2002177450A JP2004022900A (ja) 2002-06-18 2002-06-18 半導体装置の作製方法

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JP2002177450A JP2004022900A (ja) 2002-06-18 2002-06-18 半導体装置の作製方法

Publications (2)

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JP2004022900A true JP2004022900A (ja) 2004-01-22
JP2004022900A5 JP2004022900A5 (enrdf_load_stackoverflow) 2005-10-06

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JP2002177450A Withdrawn JP2004022900A (ja) 2002-06-18 2002-06-18 半導体装置の作製方法

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006106110A (ja) * 2004-09-30 2006-04-20 Semiconductor Energy Lab Co Ltd 表示装置及びその作製方法、並びにテレビジョン装置
JP2007081327A (ja) * 2005-09-16 2007-03-29 Semiconductor Energy Lab Co Ltd 半導体装置の作製方法
JP2008015460A (ja) * 2006-06-30 2008-01-24 Lg Philips Lcd Co Ltd 液晶表示装置の製造方法及び液晶表示装置
JP2008015455A (ja) * 2006-06-30 2008-01-24 Lg Phillips Lcd Co Ltd 液晶表示装置及びその製造方法
KR20130062102A (ko) * 2011-12-02 2013-06-12 삼성디스플레이 주식회사 다결정 실리콘층의 제조 방법 및 이를 이용한 박막 트랜지스터의 형성방법
US10141190B2 (en) 2016-09-19 2018-11-27 Toshiba Memory Corporation Manufacturing method of a semiconductor device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006106110A (ja) * 2004-09-30 2006-04-20 Semiconductor Energy Lab Co Ltd 表示装置及びその作製方法、並びにテレビジョン装置
JP2007081327A (ja) * 2005-09-16 2007-03-29 Semiconductor Energy Lab Co Ltd 半導体装置の作製方法
JP2008015460A (ja) * 2006-06-30 2008-01-24 Lg Philips Lcd Co Ltd 液晶表示装置の製造方法及び液晶表示装置
JP2008015455A (ja) * 2006-06-30 2008-01-24 Lg Phillips Lcd Co Ltd 液晶表示装置及びその製造方法
KR101236726B1 (ko) 2006-06-30 2013-02-25 엘지디스플레이 주식회사 액정표시장치의 제조방법
KR20130062102A (ko) * 2011-12-02 2013-06-12 삼성디스플레이 주식회사 다결정 실리콘층의 제조 방법 및 이를 이용한 박막 트랜지스터의 형성방법
US8841194B2 (en) 2011-12-02 2014-09-23 Samsung Display Co., Ltd. Method of forming polysilicon layer and method of manufacturing thin film transistor using the polysilicon layer
KR101901361B1 (ko) 2011-12-02 2018-09-27 삼성디스플레이 주식회사 다결정 실리콘층의 제조 방법 및 이를 이용한 박막 트랜지스터의 형성방법
US10141190B2 (en) 2016-09-19 2018-11-27 Toshiba Memory Corporation Manufacturing method of a semiconductor device

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