JP2004004085A - 偏光計によって実施されるデバイスの特性解明における相対位相の不確実性を除去するためのシステム及び方法 - Google Patents

偏光計によって実施されるデバイスの特性解明における相対位相の不確実性を除去するためのシステム及び方法 Download PDF

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JP2004004085A
JP2004004085A JP2003148021A JP2003148021A JP2004004085A JP 2004004085 A JP2004004085 A JP 2004004085A JP 2003148021 A JP2003148021 A JP 2003148021A JP 2003148021 A JP2003148021 A JP 2003148021A JP 2004004085 A JP2004004085 A JP 2004004085A
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polarimeter
optical
dut
light
interferometer
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JP2004004085A5 (enExample
Inventor
Gregory D Vanwiggeren
グレゴリー・ディー・ヴァンウィゲレン
Douglas M Baney
ダグラス・エム・バネイ
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of JP2004004085A5 publication Critical patent/JP2004004085A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/338—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2003148021A 2002-05-29 2003-05-26 偏光計によって実施されるデバイスの特性解明における相対位相の不確実性を除去するためのシステム及び方法 Pending JP2004004085A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/157,682 US7009691B2 (en) 2002-05-29 2002-05-29 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter

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JP2004004085A true JP2004004085A (ja) 2004-01-08
JP2004004085A5 JP2004004085A5 (enExample) 2006-07-13

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JP2003148021A Pending JP2004004085A (ja) 2002-05-29 2003-05-26 偏光計によって実施されるデバイスの特性解明における相対位相の不確実性を除去するためのシステム及び方法

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US (1) US7009691B2 (enExample)
EP (1) EP1369662A3 (enExample)
JP (1) JP2004004085A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004340926A (ja) * 2003-02-21 2004-12-02 Thor Labs Inc 光学部品の色分散を決定するための装置および方法
JP2008532001A (ja) * 2005-02-23 2008-08-14 ライカ ジオシステムズ アクチェンゲゼルシャフト 干渉法絶対距離計の位相ノイズ補正

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US6882428B2 (en) * 2001-08-28 2005-04-19 Agilent Technologies, Inc. Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser
DE60203362T2 (de) * 2002-08-22 2005-09-08 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Mittelwertbildung durch Polarisationseffekte
US7292322B2 (en) * 2003-12-29 2007-11-06 At&T Corp. Method for increasing accuracy of measurement of mean polarization mode dispersion
US7305158B2 (en) 2004-04-15 2007-12-04 Davidson Instruments Inc. Interferometric signal conditioner for measurement of absolute static displacements and dynamic displacements of a Fabry-Perot interferometer
US7492463B2 (en) 2004-04-15 2009-02-17 Davidson Instruments Inc. Method and apparatus for continuous readout of Fabry-Perot fiber optic sensor
JP2005321328A (ja) * 2004-05-11 2005-11-17 Fujitsu Ltd 偏光状態測定装置
US7426021B2 (en) * 2004-11-29 2008-09-16 Expo Electro- Optical Engineering Inc. Interferometric optical analyzer and method for measuring the linear response of an optical component
EP1674833A3 (en) 2004-12-21 2007-05-30 Davidson Instruments, Inc. Fiber optic sensor system
EP1681540A1 (en) * 2004-12-21 2006-07-19 Davidson Instruments, Inc. Multi-channel array processor
JP2006214856A (ja) * 2005-02-03 2006-08-17 Canon Inc 測定装置及び方法
EP1869737B1 (en) * 2005-03-16 2021-05-12 Davidson Instruments, Inc. High intensity fabry-perot sensor
DE102006025122A1 (de) * 2005-05-31 2006-12-07 Yokogawa Electric Corporation, Musashino Vorrichtung zur Messung einer optischen Charakteristik
US7609385B2 (en) * 2005-08-18 2009-10-27 Alcatel-Lucent Usa Inc. Method and apparatus for characterization of the response of optical devices
US7639368B2 (en) * 2005-09-13 2009-12-29 Halliburton Energy Services, Inc. Tracking algorithm for linear array signal processor for Fabry-Perot cross-correlation pattern and method of using same
EP1818658A1 (en) 2006-02-08 2007-08-15 Carl Zeiss SMT AG Method for approximating the influence of an optical system on the state of polarisation of optical radiation
US7684051B2 (en) 2006-04-18 2010-03-23 Halliburton Energy Services, Inc. Fiber optic seismic sensor based on MEMS cantilever
WO2007126475A2 (en) * 2006-04-26 2007-11-08 Davidson Instruments, Inc. Fiber optic mems seismic sensor with mass supported by hinged beams
CN101479563A (zh) * 2006-04-28 2009-07-08 麦克罗尼克激光系统公司 用于记录图像以及表面研究的方法和装置
US8115937B2 (en) * 2006-08-16 2012-02-14 Davidson Instruments Methods and apparatus for measuring multiple Fabry-Perot gaps
CA2676246C (en) * 2007-01-24 2013-03-19 Halliburton Energy Services, Inc. Transducer for measuring environmental parameters
US9291505B2 (en) * 2012-12-07 2016-03-22 Baker Hughes Incorporated Polarization scrambling in interferometer systems
CN105874314B (zh) * 2014-04-15 2018-12-07 华为技术有限公司 光波导群速度延时测量装置及方法
WO2019051301A1 (en) * 2017-09-08 2019-03-14 Arizona Board Of Regents On Behalf Of The University Of Arizona POLARIZING AND PHASE CONTRAST MICROSCOPE
US11271646B1 (en) * 2020-12-18 2022-03-08 Huawei Technologies Co., Ltd. System, method and apparatus for monitoring optical performance
US11592354B2 (en) * 2021-02-03 2023-02-28 Nokia Solutions And Networks Oy Phase-distortion mitigation for an optical vector network analyzer

Family Cites Families (14)

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US3700334A (en) * 1970-11-13 1972-10-24 Nasa Interferometer-polarimeter
US4560279A (en) * 1978-10-17 1985-12-24 Kouns Charles W Optical method for remote determination of the geological nature of a homogeneous surface
US4479100A (en) * 1982-05-27 1984-10-23 Raytheon Company Impedance matching network comprising selectable capacitance pads and selectable inductance strips or pads
US5227623A (en) * 1992-01-31 1993-07-13 Hewlett-Packard Company Method and apparatus for measuring polarization mode dispersion in optical devices
US5777740A (en) * 1997-02-27 1998-07-07 Phase Metrics Combined interferometer/polarimeter
FR2774172B1 (fr) * 1998-01-28 2000-02-25 Inst Francais Du Petrole Methode et dispositif de mesure interferentielle de dephasage entre deux faisceaux lumineux issus d'une meme source polarisee, appliques a la refractometrie
US6204924B1 (en) * 1999-02-23 2001-03-20 Exfo Electro-Optical Engineering Inc. Method and apparatus for measuring polarization mode dispersion of optical devices
US6490043B1 (en) * 2000-02-14 2002-12-03 Aerodyne Research, Inc. Polarimetric spectral intensity modulation spectropolarimeter
US6211957B1 (en) * 2000-03-03 2001-04-03 Lucent Technologies, Inc. In-line all-fiber polarimeter
EP1113250B1 (en) * 2000-11-17 2003-02-05 Agilent Technologies, Inc. (a Delaware corporation) Method and apparatus for determining the polarisation mode dispersion of an optical device
EP1207377A3 (en) * 2000-11-17 2007-03-28 Agilent Technologies, Inc. Method and apparatus for measuring optical properties by means of the Jones matrix
JP3885528B2 (ja) * 2001-07-04 2007-02-21 株式会社日立製作所 光変調器
US6674532B2 (en) * 2001-11-02 2004-01-06 Vandelden Jay S. Interferometric polarization interrogating filter assembly and method
GB0128903D0 (en) * 2001-12-03 2002-01-23 Denselight Semiconductors Pte A travelling-wave electoabsorption modular

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004340926A (ja) * 2003-02-21 2004-12-02 Thor Labs Inc 光学部品の色分散を決定するための装置および方法
JP2008532001A (ja) * 2005-02-23 2008-08-14 ライカ ジオシステムズ アクチェンゲゼルシャフト 干渉法絶対距離計の位相ノイズ補正

Also Published As

Publication number Publication date
EP1369662A3 (en) 2005-02-02
US7009691B2 (en) 2006-03-07
EP1369662A2 (en) 2003-12-10
US20030223073A1 (en) 2003-12-04

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