JP2003513250A - 差分訂正法と差分訂正装置 - Google Patents

差分訂正法と差分訂正装置

Info

Publication number
JP2003513250A
JP2003513250A JP2001534060A JP2001534060A JP2003513250A JP 2003513250 A JP2003513250 A JP 2003513250A JP 2001534060 A JP2001534060 A JP 2001534060A JP 2001534060 A JP2001534060 A JP 2001534060A JP 2003513250 A JP2003513250 A JP 2003513250A
Authority
JP
Japan
Prior art keywords
time
live
pulse
real
ratio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2001534060A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003513250A5 (enExample
Inventor
ビンガム、ラッセル、ディー
ゲドック、デイル、エイ
トラムメル、レックス、シー
トゥーメイ、ティモシー、アール
キーザー、ロナルド、エム
Original Assignee
パーキネルマー インストルメンツ、インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by パーキネルマー インストルメンツ、インコーポレイテッド filed Critical パーキネルマー インストルメンツ、インコーポレイテッド
Publication of JP2003513250A publication Critical patent/JP2003513250A/ja
Publication of JP2003513250A5 publication Critical patent/JP2003513250A5/ja
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP2001534060A 1999-10-25 2000-09-29 差分訂正法と差分訂正装置 Abandoned JP2003513250A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US16128099P 1999-10-25 1999-10-25
US60/161,280 1999-10-25
US09/614,273 2000-07-12
US09/614,273 US6327549B1 (en) 1999-10-25 2000-07-12 Differential correction method and apparatus
PCT/US2000/041033 WO2001031552A1 (en) 1999-10-25 2000-09-29 Differential correction method and apparatus

Publications (2)

Publication Number Publication Date
JP2003513250A true JP2003513250A (ja) 2003-04-08
JP2003513250A5 JP2003513250A5 (enExample) 2008-01-17

Family

ID=26857684

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001534060A Abandoned JP2003513250A (ja) 1999-10-25 2000-09-29 差分訂正法と差分訂正装置

Country Status (4)

Country Link
US (1) US6327549B1 (enExample)
EP (1) EP1269391A4 (enExample)
JP (1) JP2003513250A (enExample)
WO (1) WO2001031552A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008501954A (ja) * 2004-06-04 2008-01-24 ウィリアム ケイ ウォーバートン X線及び核分光システムにおける検出限界を向上するための方法及び装置
JP2015145877A (ja) * 2015-03-31 2015-08-13 アズビル株式会社 計数装置、物理量センサ、計数方法および物理量計測方法

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6470285B1 (en) * 1999-05-27 2002-10-22 Analyser Systems Ag Method and apparatus for multi-parameter digital pulse pileup rejection
US6545551B1 (en) * 2001-09-04 2003-04-08 The United States Of America As Represented By The Secretary Of The Navy Radiation hardened timer
US6590957B1 (en) 2002-03-13 2003-07-08 William K. Warburton Method and apparatus for producing spectra corrected for deadtime losses in spectroscopy systems operating under variable input rate conditions
TWI230514B (en) * 2003-10-29 2005-04-01 Spirox Corp Built-in self-test (BIST) apparatus and method for analog-to-digital converter (ADC)
US7269523B2 (en) * 2004-10-19 2007-09-11 Jordanov Valentin T Method and apparatus for radiation spectroscopy using seeded localized averaging (“SLA”)
US8589489B2 (en) * 2006-06-19 2013-11-19 Bomgar Method and system for providing secure remote access and control
US7430481B2 (en) * 2007-01-12 2008-09-30 R. J. Lee Group, Inc. Methods for detecting and analyzing piled-up X-rays in an X-ray spectrometry system
US8946648B2 (en) 2012-01-19 2015-02-03 Princeton Gamma-Tech Instruments Llc Dual range digital nuclear spectrometer
US9507912B2 (en) * 2012-08-31 2016-11-29 Nuvectra Corporation Method and system of simulating a pulse generator on a clinician programmer
KR102001217B1 (ko) 2012-11-01 2019-07-17 삼성전자주식회사 엑스선 검출기를 교정하는 방법
CN112986301B (zh) * 2021-02-23 2023-10-27 成都大学 一种基于sla算法的isla种子局部平均成谱算法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3072335A (en) * 1959-01-14 1963-01-08 Well Surveys Inc Analog computer for determining confidence limits of measurement
US3814937A (en) * 1972-04-24 1974-06-04 Kevex Corp Pulse pile-up rejector with live-time corrector circuit
CA1130478A (en) * 1980-03-06 1982-08-24 Philip C. East Dead time compensation circuit
AT368291B (de) 1980-09-01 1982-09-27 Westphal Georg Peter Dr Verfahren und vorrichtung zur gewinnung der verarbeitungswahrscheinlichkeit von detektorimpulsen bei der impulshoehenanalyse von kern- und roentgenstrahlen
JPS59157582A (ja) * 1983-02-28 1984-09-06 Nippon Atom Ind Group Co Ltd 放射能核種別測定装置
DE3407027A1 (de) 1983-06-23 1985-01-10 VEB Kombinat Polygraph "Werner Lamberz" Leipzig, DDR 7050 Leipzig Takterzeugungseinrichtung fuer druckmaschinen
US4599690A (en) * 1983-11-09 1986-07-08 Siemens Gammasonics, Inc. Method and circuit for correcting count rate losses of radiation events
FR2622989B1 (fr) 1987-11-06 1992-11-27 Thomson Csf Machine multiprocesseur reconfigurable pour traitement du signal
EP0410828A3 (en) * 1989-06-28 1993-03-17 Schlumberger Limited Dead time correction and regulation method and apparatus for nuclear spectroscopy
DE69413304T2 (de) * 1993-03-24 1999-05-12 Koninklijke Philips Electronics N.V., Eindhoven Strahlungsuntersuchungsgerät
US5349193A (en) 1993-05-20 1994-09-20 Princeton Gamma Tech, Inc. Highly sensitive nuclear spectrometer apparatus and method
US5608222A (en) 1995-04-07 1997-03-04 Hardy, Ii; William H. Analog to digital conversion technique for spectroscopy
US5884234A (en) 1996-08-30 1999-03-16 Schlumberger Technology Corporation Method for pulse shape regulation and discrimination in a nuclear spectroscopy system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008501954A (ja) * 2004-06-04 2008-01-24 ウィリアム ケイ ウォーバートン X線及び核分光システムにおける検出限界を向上するための方法及び装置
JP2015145877A (ja) * 2015-03-31 2015-08-13 アズビル株式会社 計数装置、物理量センサ、計数方法および物理量計測方法

Also Published As

Publication number Publication date
EP1269391A1 (en) 2003-01-02
WO2001031552A1 (en) 2001-05-03
US6327549B1 (en) 2001-12-04
EP1269391A4 (en) 2012-07-04

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