US3814937A - Pulse pile-up rejector with live-time corrector circuit - Google Patents

Pulse pile-up rejector with live-time corrector circuit Download PDF

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US3814937A
US3814937A US00246819A US24681972A US3814937A US 3814937 A US3814937 A US 3814937A US 00246819 A US00246819 A US 00246819A US 24681972 A US24681972 A US 24681972A US 3814937 A US3814937 A US 3814937A
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live
pulses
analyzer
circuit
pulse
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A Lowes
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Kevex Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity

Definitions

  • the usual process is to examine theevents in two channels, one a fast channel which barely detects the occurance of the event and the other a slower channel which may properly process and analyze the signal.
  • the rejection circuitry rejects both signals.
  • no new signals can be accepted for processing. Both of these situations, i.e., two signals arriving so close together than one distorts the other or a second signal arriving while the first signal is being processed, result in dead time.
  • this situation is corrected by inhibiting the clock which governs the counting time during the dead time period.
  • the clock which governs the counting time during the dead time period.
  • FIGURE of the drawing is a schematic diagram of an apparatus embodying the present invention.
  • DESCRIPTION OF THE PREFERRRED EMBODIMENT ferentiate the signal with a short time constant (suitably 200 ns) and it is then fed to a one-shot multivibrator 7 which puts out a constant amplitude pulse of approximately 1 to 2 microseconds each time an event occurs.
  • the output from the fast discriminator is fed to an NAND gate 9, the output of which is fed to a second one-shot multivibrator 11 having Q and Q outputs which are fed to the NAND gates 13 and 15.
  • the time constant of multivibrator 11 is selected to match the full pulse width of the quasi-Gaussian shaped main linear pulse for any particular shaping time-constant and is suitably 10 times the slow amplifier time constant.
  • the signal from the preamplifier at l is split in two parts and the second portion goes to the slow or main amplifier 5.
  • the slow amplifier 5 and the pulse stretcher generally designated 21
  • the pulse ' is amplified and stretched to 2 microseconds and the peak of the signal is detected.
  • the peak signal is then passed to the linear gate generally designated 23 and, if the gate is opened by a pulse through line 19, is
  • the apparatus is provided with a clock oscillato r 31 and the output from the clock oscillator and the Q output from flipflop 29 are fed to AND gate 33.
  • the output from AND gate 33 goes to a counter-timer 35 where the number of clock pulses is counted and the operation cut off after the desired time interval.
  • a second AND gate 37 has its output connected to the reset terminal of slip-flop 29 and one of the inputs of AND gate 37 is connected through line 39 to the multichannel analyzer which puts out a pulse if the analyzer is not busy processing asignal.
  • the other input to AND gate 37 is through line 41 and everytime the linear gate 23 is opened to the analyzer 27, line 41 is pulsed. This will operate the reset of flip-flop 29 providing that the multichannel analyzer is not bus and has put out a signal through line 39. This gives a goutput on flip-flop 29 so that the clock pulses 31 are fed into the counter-timer 35.
  • the first of said paths being a fast channel which detects pulses
  • the second of said paths being a slow channel to said multichannel analyzer which processes and gates pulses
  • a live-time clock for determining the live time period during which a series of counts is made
  • a second circuit actuated by said multichannel analyzer which shuts off said live-time clock when said multichannel analyzer is busy.
  • the analyzer of claim 1 including the following structure:
  • a pulse pile-up rejection circuit in said fast channel said circuit having means for opening a linear gate in said slow channel in the absence of overlapping Pulses,
  • said fast channel having means for stopping said live-time clock as each pulse is received

Abstract

A live-time corrector circuit is provided in an x-ray counting device wherein the dead time of the analyzer device as well as dead time caused by overlapping events are compensated for by extending the counting time.

Description

United States Patent [191 Lewes June 4, 1974 PULSE PlLE-UP REJECTOR WITH 3,382.365 5/1968 Lacour et ill 250/83.6 R 3.571639 4/1971 Metz et a]. 250/83.6 R x LIVE-TIME CORRECTOR CIRCUIT [75] Inventor: Albert Robert Lowes, Burlingame,
Primary ExaminerArchie R. Borchelt [73] Assignee: Kevex Corporation, Burlingame,
Calif.
[22] Filed: Apr. 24, 1972 [21] Appl. No.: 246,819 ABSTRACT 52 us. Cl. 250/336, 250/374 7 A live-time Corrector circuit is Provided an may 511 im. Cl. G0lt 1/00 Counting device wherein the dead time Of the analyzer [58] Field of Search 250/83.6 R, 336, 374 device as as dead time Caused by Overlapping events are compensated for by extending the counting [56] References Cited UNITED STATES PATENTS 3.037.118 5/1962 Bryant 250/83.6 R 2 Claims, 1 Drawing Figure FAST AMP 7 u 12 I? To ,1 .n. DRATE- CIRCUIT PULSE PlLE-UP REJE$TlON----- CONTROL LOGIC PULSE PILE-UP REJECTOR WITH LIVE-TIME CORRECTOR CIRCUIT SUMMARY OF THE INVENTION In the analysis of x-ray events by electronic instrumentation, a detector and its associated circuitry are looking for x-ray events which occur randomly in time. Modern high resolution x-ray energy analysis units require that the amplifier must be set for a time constant of or 6 microseconds. Since the number of expected counts mayrun into the thousands of counts per second, the long duration of the resultant pulses greatly increases the chance of pile-ups, resulting in the data recorded in the pulse height analyzer being stored in the incorrect channel, thus reducing the height of peaks and increasing the general background noise. In other words, when an event occurs, a finite time is required to process the signal and, if during this time 'a subsequent event occurs, the two signals tend to add or be superimposed on each other. This creates a false signal whose value does not correlate with either of the component signals and which must be disregarded in the analysis. Many electronic schemes have been suggested to prevent the analysis of erroneous signals and the generic term pulse pile-up rejection circuitry" is common in the industry. The usual process is to examine theevents in two channels, one a fast channel which barely detects the occurance of the event and the other a slower channel which may properly process and analyze the signal. In such circuits if a second event occurs during the time when the first event is being processed, the rejection circuitry rejects both signals. Further, during the analysis period in a multiple channel analyzer, no new signals can be accepted for processing. Both of these situations, i.e., two signals arriving so close together than one distorts the other or a second signal arriving while the first signal is being processed, result in dead time.
It is normally desirable to determine the activity of certain events during a definite time period and these results will vary as the live-time to dead time ratio changes. If the system is dead half the time, obviously only about half of the events occuring during the run are being processed.
In accordance with the present invention, this situation is corrected by inhibiting the clock which governs the counting time during the dead time period. In other words, if one wishes to analyze the events of a period such as one minute and the system is dead half the time, the real running time will be two minutes and during this period the actual count is taking place for one min- Ulti.
BRIEF DESCRIPTION OF THE DRAWINGS The sole FIGURE of the drawing is a schematic diagram of an apparatus embodying the present invention.
DESCRIPTION OF THE PREFERRRED EMBODIMENT ferentiate the signal with a short time constant (suitably 200 ns) and it is then fed to a one-shot multivibrator 7 which puts out a constant amplitude pulse of approximately 1 to 2 microseconds each time an event occurs. The output from the fast discriminator is fed to an NAND gate 9, the output of which is fed to a second one-shot multivibrator 11 having Q and Q outputs which are fed to the NAND gates 13 and 15. The time constant of multivibrator 11 is selected to match the full pulse width of the quasi-Gaussian shaped main linear pulse for any particular shaping time-constant and is suitably 10 times the slow amplifier time constant. The output from the NAND gates 13 and 15 is then fed to the set and reset gates respectively of the flip-flop 17. Output is taken from flip-flop l7'from the Q output through line 19 and served to actuate the linear gate, later described. It will be seen that enable line 19 will be actuated by a pulse from the fast discriminator unless it is inhibited by a pulse from the one-shot multivibrator 11. Should a second pulse occur during the offtime of 11, no enabling pulse will be sent through line 19. In other words, if the pulses are sufficiently far apart that they can be properly processed, enable line 19 will be activated, while if two pulses occur too close together to be properly processed, line 19 will not be activated.
As was previously mentioned, the signal from the preamplifier at l is split in two parts and the second portion goes to the slow or main amplifier 5. The latter will now be described. In the slow amplifier 5 and the pulse stretcher, generally designated 21, the pulse 'is amplified and stretched to 2 microseconds and the peak of the signal is detected. The peak signal is then passed to the linear gate generally designated 23 and, if the gate is opened by a pulse through line 19, is
passed through voltage follower 25 into a multichannel analyzer 27. The exact method of stretching the pulse, detecting the peak and analyzing it in the analyzer 27 is known to those skilled in the art and therefore has not been described in detail.
Each time an event occurs the fast amplifier pulse is also fed to the set terminal of flip-flop 29. The apparatus is provided with a clock oscillato r 31 and the output from the clock oscillator and the Q output from flipflop 29 are fed to AND gate 33. The output from AND gate 33 goes to a counter-timer 35 where the number of clock pulses is counted and the operation cut off after the desired time interval. Thus, as a pulse is received at the S terminal of flip-flop 29, the output of the clogk 31 is shut off since AND gate '33 is connected to the Q output of flip-flop 29.
A second AND gate 37 has its output connected to the reset terminal of slip-flop 29 and one of the inputs of AND gate 37 is connected through line 39 to the multichannel analyzer which puts out a pulse if the analyzer is not busy processing asignal. The other input to AND gate 37 is through line 41 and everytime the linear gate 23 is opened to the analyzer 27, line 41 is pulsed. This will operate the reset of flip-flop 29 providing that the multichannel analyzer is not bus and has put out a signal through line 39. This gives a goutput on flip-flop 29 so that the clock pulses 31 are fed into the counter-timer 35.
The overall operation of the circuit will now be apparent. Each time a pulse is received, flip-flop 29 will go to the set condition and the live-time counter 35 will be turned off. Simultaneously the pulse will be processed through the slow amplifier side of the circuit and the linear gate 23 will be opened by a pulse from line 19 unless two pulses occur close together. When the gate 23 is opened, the pulse is sent to the multichannel analyzer 27 for processing and, if the analyzer is not busy, an output pulse from line 39 will be added to that of line 41, resetting flip-flop 29 causing the clock pulses to be accumulated in 35.
The design philosophy of this circuit is extremely simple. For a given count rate, the average period between event is n T= 2 T.-=1/count rate where T,- is the actual time between events i and i-H. Therefore, although T, varies from event to event, the statistical average over a long period of time is given by the inverse of the count rate. In operation, the live-time counter 35 is enabled only if an event is stored in the analyzer and is again disabled at the next event. If the next event is also stored, the clock is again enabled for one event period, T,. Therefore, for each event stored, the clock. runs for a period T,. If the count rate is 5,000 counts per second, then T= l/5,00Q seconds. lfa livetime of 100 seconds is desired, there will be 500,000 counts stored on the average but the actual real time required to accumulate these counts will be 100 x 100/100 70 dead time].
lt will be obvious to those skilled in the art that many variations can be made without departing from the spirit of this invention.
1 claim:
1. In an analyzer for x-ray events wherein the amplitude and number of events are recorded in a multichannel analyzer and said events may occur at a rate faster than the events can be processed by said multichannel analyzer, because said analyzer exhibits dead time during processing, the improvement comprising:
a. an input circuit from the pre-amplifier of an x-ray event detector providing a series of pulses,
b. means for dividing the pulses from said input circuit into two parallel paths,
c. the first of said paths being a fast channel which detects pulses,
d. the second of said paths being a slow channel to said multichannel analyzer which processes and gates pulses,
e. a live-time clock for determining the live time period during which a series of counts is made,
f. means whereby said fast circuit actuates a pulse pile-up rejection circuit having means which stops said live-time clock when two pulses are in such close proximity that they cannot be analyzed by said multichannel analyzer, and
g. a second circuit actuated by said multichannel analyzer which shuts off said live-time clock when said multichannel analyzer is busy.
2. The analyzer of claim 1 including the following structure:
a. a pulse pile-up rejection circuit in said fast channel, said circuit having means for opening a linear gate in said slow channel in the absence of overlapping Pulses,
b. said fast channel having means for stopping said live-time clock as each pulse is received,
0. said slow channel shaping and passing pulses to a multiple channel recorder,
(1. said slow channel actuating one input of an AND gate when a pulse is processed, e. said multichannel recorder having means to send a not busy signal to the other input of said AND gate when not processing a signal, and
f. the output of said AND gate causing said live-time cloektorun.

Claims (2)

1. In an analyzer for x-ray events wherein the amplitude and number of events are recorded in a multichannel analyzer and said events may occur at a rate faster than the events can be processed by said multichannel analyzer, because said analyzer exhibits dead time during processing, the improvement comprising: a. an input circuit from the pre-amplifier of an x-ray event detector providing a series of pulses, b. means for dividing the pulses from said input circuit into two parallel paths, c. the first of said paths being a fast channel which detects pulses, d. the second of said paths being a slow channel to said multichannel analyzer which processes and gates pulses, e. a live-time clock for determining the live time period during which a series of counts is made, f. means whereby said fast circuit actuates a pulse pile-up rejection circuit having means which stops said live-time clock when two pulses are in such close proximity that they cannot be analyzed by said multichannel analyzer, and g. a second circuit actuated by said multichannel analyzer which shuts off said live-time clock when said multichannel analyzer is busy.
2. The analyzer of claim 1 including the following structure: a. a pulse pile-up rejection circuit in said fast channel, said circuit having means for opening a linear gate in said slow channel in the absence of overlapping pulses, b. said fast channel having means for stopping said live-time clock as each pulse is received, c. said slow channel shaping and passing pulses to a multiple channel recorder, d. said slow channel actuating one input of an AND gate when a pulse is processed, e. said multichannel recorder having means to send a not busy signal to the other input of said AND gate when not processing a signal, and f. the output of said AND gate causing said live-time clock to run.
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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4309606A (en) * 1976-12-06 1982-01-05 Aktiebolaget Atomenergi Measuring plate thickness
US4311909A (en) * 1980-07-23 1982-01-19 Victoreen Incorporated Geiger-Mueller tube coincidence loss correction circuit
US4419579A (en) * 1980-03-06 1983-12-06 Her Majesty The Queen In Right Of Canada Dead time compensation circuit
US4423329A (en) * 1980-11-17 1983-12-27 Junta De Energia Nuclear Gamma radiation detector probe with a halogen-quenched Geiger-Muller tube, compensated for dead time
US4476384A (en) * 1980-09-01 1984-10-09 Westphal Georg P Method of and system for determining a spectrum of radiation characteristics with full counting-loss compensation
US4491733A (en) * 1981-10-22 1985-01-01 Xetex, Inc. Radiation flux measuring system with dead-time correction
FR2557308A1 (en) * 1983-12-22 1985-06-28 Bicron Corp DEAD TIME COMPENSATION CIRCUIT FOR RADIATION DETECTOR
US4772793A (en) * 1987-10-05 1988-09-20 The United States Of America As Represented By The United States Department Of Energy Dead-time compensation for a logarithmic display rate meter
EP1269391A1 (en) * 1999-10-25 2003-01-02 Perkinelmer Instruments, Inc. Differential correction method and apparatus
US20100270472A1 (en) * 2007-06-19 2010-10-28 Koninklijke Philips Electronics N.V. Digital pulse processing for multi-spectral photon counting readout circuits
WO2019204872A1 (en) * 2018-04-27 2019-10-31 Southern Innovation International Pty Ltd Input count rate estimation in radiation pulse detectors
RU2787743C2 (en) * 2018-04-27 2023-01-12 Сазерн Инновейшн Интернэшнл Пти Лтд Count rate assessment at input in radiation pulse detectors

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3037118A (en) * 1957-02-06 1962-05-29 Atomic Energy Authority Uk Electrical counting circuits
US3382365A (en) * 1963-04-02 1968-05-07 Commissariat Energie Atomique Apparatus for measuring the half value of a current with a substantially exponentialvariation
US3573639A (en) * 1969-12-04 1971-04-06 Atomic Energy Commission Ratemeter with automatic dead-time correction

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3037118A (en) * 1957-02-06 1962-05-29 Atomic Energy Authority Uk Electrical counting circuits
US3382365A (en) * 1963-04-02 1968-05-07 Commissariat Energie Atomique Apparatus for measuring the half value of a current with a substantially exponentialvariation
US3573639A (en) * 1969-12-04 1971-04-06 Atomic Energy Commission Ratemeter with automatic dead-time correction

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4309606A (en) * 1976-12-06 1982-01-05 Aktiebolaget Atomenergi Measuring plate thickness
US4419579A (en) * 1980-03-06 1983-12-06 Her Majesty The Queen In Right Of Canada Dead time compensation circuit
US4311909A (en) * 1980-07-23 1982-01-19 Victoreen Incorporated Geiger-Mueller tube coincidence loss correction circuit
US4476384A (en) * 1980-09-01 1984-10-09 Westphal Georg P Method of and system for determining a spectrum of radiation characteristics with full counting-loss compensation
US4423329A (en) * 1980-11-17 1983-12-27 Junta De Energia Nuclear Gamma radiation detector probe with a halogen-quenched Geiger-Muller tube, compensated for dead time
US4491733A (en) * 1981-10-22 1985-01-01 Xetex, Inc. Radiation flux measuring system with dead-time correction
FR2557308A1 (en) * 1983-12-22 1985-06-28 Bicron Corp DEAD TIME COMPENSATION CIRCUIT FOR RADIATION DETECTOR
US4617680A (en) * 1983-12-22 1986-10-14 Bicron Corporation Dead time compensation circuit for radiation detector
US4772793A (en) * 1987-10-05 1988-09-20 The United States Of America As Represented By The United States Department Of Energy Dead-time compensation for a logarithmic display rate meter
EP1269391A1 (en) * 1999-10-25 2003-01-02 Perkinelmer Instruments, Inc. Differential correction method and apparatus
EP1269391A4 (en) * 1999-10-25 2012-07-04 Perkinelmer Instr Inc Differential correction method and apparatus
US20100270472A1 (en) * 2007-06-19 2010-10-28 Koninklijke Philips Electronics N.V. Digital pulse processing for multi-spectral photon counting readout circuits
US8338791B2 (en) 2007-06-19 2012-12-25 Koninklijke Philips Electronics N.V. Digital pulse processing for multi-spectral photon counting readout circuits
WO2019204872A1 (en) * 2018-04-27 2019-10-31 Southern Innovation International Pty Ltd Input count rate estimation in radiation pulse detectors
CN112384826A (en) * 2018-04-27 2021-02-19 南方创新国际股份有限公司 Input count rate estimation in a radiation pulse detector
AU2019229361B2 (en) * 2018-04-27 2021-06-24 Southern Innovation International Pty Ltd Input count rate estimation in radiation pulse detectors
US11199638B2 (en) 2018-04-27 2021-12-14 Southern Innovation International Pty Ltd Input count rate estimation in radiation pulse detectors
RU2787743C2 (en) * 2018-04-27 2023-01-12 Сазерн Инновейшн Интернэшнл Пти Лтд Count rate assessment at input in radiation pulse detectors

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