JP2003511667A - 識別及び検証方法 - Google Patents

識別及び検証方法

Info

Publication number
JP2003511667A
JP2003511667A JP2001528679A JP2001528679A JP2003511667A JP 2003511667 A JP2003511667 A JP 2003511667A JP 2001528679 A JP2001528679 A JP 2001528679A JP 2001528679 A JP2001528679 A JP 2001528679A JP 2003511667 A JP2003511667 A JP 2003511667A
Authority
JP
Japan
Prior art keywords
additive
discriminating
substance
identification
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001528679A
Other languages
English (en)
Japanese (ja)
Inventor
カイサー、ブルース、ジョン
プライス、エル、ステファン
ワトソン、デビッド、ジェイ
メイヤー、ガーハード、エイ
Original Assignee
エダックス インク
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by エダックス インク filed Critical エダックス インク
Publication of JP2003511667A publication Critical patent/JP2003511667A/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2001528679A 1999-10-04 2000-10-03 識別及び検証方法 Withdrawn JP2003511667A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15757399P 1999-10-04 1999-10-04
US60/157,573 1999-10-04
PCT/US2000/027151 WO2001025765A1 (en) 1999-10-04 2000-10-03 Methods for identification and verification

Publications (1)

Publication Number Publication Date
JP2003511667A true JP2003511667A (ja) 2003-03-25

Family

ID=22564335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001528679A Withdrawn JP2003511667A (ja) 1999-10-04 2000-10-03 識別及び検証方法

Country Status (14)

Country Link
EP (5) EP1137930A1 (es)
JP (1) JP2003511667A (es)
KR (1) KR20010090856A (es)
AU (10) AU2246801A (es)
BR (1) BR0007567A (es)
CA (5) CA2352357A1 (es)
DE (1) DE10083295T1 (es)
DK (1) DK200100797A (es)
ES (1) ES2184652B1 (es)
IL (1) IL143350A0 (es)
MX (2) MXPA01005575A (es)
NO (1) NO20012656L (es)
SE (1) SE0101893L (es)
WO (10) WO2001025820A2 (es)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007502421A (ja) * 2003-08-12 2007-02-08 エックス−レイ オプティカル システムズ インコーポレーテッド パターン化された表面の分析のための開口マスクを備えるｘ線蛍光システム
JP2007078521A (ja) * 2005-09-14 2007-03-29 Takiron Co Ltd 塩化ビニル樹脂成形体の識別方法及びこれに使用する塩化ビニル樹脂成形体
JP2009503521A (ja) * 2005-08-03 2009-01-29 トゥルー プロダクト アイディー テクノロジー（ベイジン）リミテッド 物品のラベル付けおよび検出の方法、およびその装置
JP2011089856A (ja) * 2009-10-21 2011-05-06 Morisei Kako:Kk ゴム製品の識別方法、ゴム製品、ゴム製品識別装置
JP2013522586A (ja) * 2010-03-11 2013-06-13 クロメック リミテッド 物体を識別および認証するための方法およびシステム
JP2018517148A (ja) * 2015-04-02 2018-06-28 ソレック ニュークリア リサーチ センター Ｘ線蛍光標識を読み取るためのシステムおよび方法

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1386144A4 (en) * 2001-01-16 2005-09-21 Keymaster Technologies Inc IDENTIFICATION AND VERIFICATION METHODS
US6909770B2 (en) 2001-12-05 2005-06-21 The United States Of America As Represented By The United States National Aeronautics And Space Administration Methods for identification and verification using vacuum XRF system
US6850592B2 (en) 2002-04-12 2005-02-01 Keymaster Technologies, Inc. Methods for identification and verification using digital equivalent data system
US7767457B2 (en) * 2004-01-20 2010-08-03 Inki Mun Method of use of taggants
US20080216255A1 (en) * 2005-09-17 2008-09-11 Robert Lee Poovey Textile Marker Application Method and Textiles Produced therefrom
US20080255098A1 (en) 2007-04-13 2008-10-16 Robert Dunn Compositions and Methods for Treatment of Psychiatric Disorders
DE102008060675B4 (de) * 2008-12-08 2012-11-08 Polysecure Gmbh Verfahren zur eindeutigen Identifizierung und Authentifizierung von Produkten zum Schutz vor Plagiaten
US9080987B2 (en) 2011-05-26 2015-07-14 Altria Client Services, Inc. Oil soluble taggants
US9244017B2 (en) 2011-05-26 2016-01-26 Altria Client Services Llc Oil detection process and apparatus
US10900897B2 (en) 2012-05-29 2021-01-26 Altria Client Services Llc Oil detection process
US9073091B2 (en) 2013-03-15 2015-07-07 Altria Client Services Inc. On-line oil and foreign matter detection system and method
US9097668B2 (en) 2013-03-15 2015-08-04 Altria Client Services Inc. Menthol detection on tobacco
CN104101697A (zh) * 2013-04-10 2014-10-15 苏州华觉智能科技有限公司 检测装置
US10650630B2 (en) 2014-10-31 2020-05-12 Honeywell International Inc. Authentication systems, authentication devices, and methods for authenticating a value article
WO2016077471A1 (en) 2014-11-11 2016-05-19 Altria Client Services Inc. Method for detecting oil on tobacco products and packaging
CN105680936B (zh) * 2016-03-03 2018-10-02 西安工程大学 一种非直视紫外光通信单次散射过程路径损耗计算方法
US11029267B2 (en) 2016-04-04 2021-06-08 Security Matters Ltd. Method and a system for XRF marking and reading XRF marks of electronic systems
JP6830607B2 (ja) 2016-04-04 2021-02-17 ソレク ニュークリア リサーチ センターＳｏｒｅｑ Ｎｕｃｌｅａｒ Ｒｅｓｅａｒｃｈ Ｃｅｎｔｅｒ Ｘｒｆをマーキングし、電子システムのｘｒｆを読み取る方法及びシステム
EP4282925A1 (en) 2022-05-23 2023-11-29 Kronos International, Inc. Post-treated titanium dioxide pigment with at least one security feature
US11879883B1 (en) * 2022-08-25 2024-01-23 Samuel Landis Precious metal source verification by trace elements

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4136778A (en) * 1975-08-12 1979-01-30 Burlington Industries, Inc. Linen sorter
US4251726A (en) * 1979-02-26 1981-02-17 Alvarez Luis W Deuterium tagged articles such as explosives and method for detection thereof
US4363965A (en) * 1980-10-03 1982-12-14 The Franklin Institute Detection and identification method employing mossbauer isotopes
US4476382A (en) * 1980-10-21 1984-10-09 Intex Inc. Encoding scheme for articles
US4445225A (en) * 1980-10-21 1984-04-24 Intex Inc. Encoding scheme for articles
US4485308A (en) * 1982-04-26 1984-11-27 General Electric Company Photo detection system
EP0139617B1 (en) * 1983-09-27 1990-09-05 Ciba-Geigy Ag Process and apparatus for applying and simultaneously fixing a chemical to a textile substrate
US4767205A (en) * 1986-01-28 1988-08-30 Flow Cytometry Standards Corporation Composition and method for hidden identification
US5185773A (en) * 1991-07-19 1993-02-09 General Motors Corporation Method and apparatus for nondestructive selective determination of a metal
JP3051013B2 (ja) * 1993-12-21 2000-06-12 株式会社東芝 不純物分析方法
GB9722475D0 (en) * 1997-10-25 1997-12-24 Wahoo Trust The Article identification means

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007502421A (ja) * 2003-08-12 2007-02-08 エックス−レイ オプティカル システムズ インコーポレーテッド パターン化された表面の分析のための開口マスクを備えるｘ線蛍光システム
JP4724662B2 (ja) * 2003-08-12 2011-07-13 エックス−レイ オプティカル システムズ インコーポレーテッド パターン化された表面の分析のための開口マスクを備えるｘ線蛍光システム
JP2009503521A (ja) * 2005-08-03 2009-01-29 トゥルー プロダクト アイディー テクノロジー（ベイジン）リミテッド 物品のラベル付けおよび検出の方法、およびその装置
JP2007078521A (ja) * 2005-09-14 2007-03-29 Takiron Co Ltd 塩化ビニル樹脂成形体の識別方法及びこれに使用する塩化ビニル樹脂成形体
JP2011089856A (ja) * 2009-10-21 2011-05-06 Morisei Kako:Kk ゴム製品の識別方法、ゴム製品、ゴム製品識別装置
JP2013522586A (ja) * 2010-03-11 2013-06-13 クロメック リミテッド 物体を識別および認証するための方法およびシステム
JP2018517148A (ja) * 2015-04-02 2018-06-28 ソレック ニュークリア リサーチ センター Ｘ線蛍光標識を読み取るためのシステムおよび方法

Also Published As

Publication number Publication date
AU2572601A (en) 2001-05-10
WO2001025763A1 (en) 2001-04-12
WO2001025764A1 (en) 2001-04-12
AU2247101A (en) 2001-05-10
AU2246801A (en) 2001-05-10
BR0007567A (pt) 2001-08-21
EP1137930A1 (en) 2001-10-04
WO2001025821A3 (en) 2001-06-07
AU2247201A (en) 2001-05-10
ES2184652A1 (es) 2003-04-01
AU2723701A (en) 2001-05-10
WO2001025766A1 (en) 2001-04-12
DK200100797A (da) 2001-07-24
NO20012656L (no) 2001-08-01
WO2001025767A1 (en) 2001-04-12
EP1218730A2 (en) 2002-07-03
WO2001025768A9 (en) 2002-05-16
WO2001025764A9 (en) 2002-09-26
NO20012656D0 (no) 2001-05-30
AU2572701A (en) 2001-05-10
WO2001025748A9 (en) 2002-09-26
EP1224459A2 (en) 2002-07-24
WO2001025767A9 (en) 2002-05-16
AU2422901A (en) 2001-05-10
WO2001025768A1 (en) 2001-04-12
MXPA02003424A (es) 2003-10-15
CA2386454A1 (en) 2001-04-12
SE0101893L (sv) 2001-07-31
WO2001025820A2 (en) 2001-04-12
CA2352357A1 (en) 2001-04-12
KR20010090856A (ko) 2001-10-19
WO2001025748A2 (en) 2001-04-12
AU2247001A (en) 2001-05-10
CA2386400A1 (en) 2001-04-12
CA2386402A1 (en) 2001-04-12
WO2001025748A3 (en) 2001-10-18
CA2386391A1 (en) 2001-04-12
EP1218731A1 (en) 2002-07-03
SE0101893D0 (sv) 2001-05-30
WO2001025765A1 (en) 2001-04-12
WO2001025820A3 (en) 2001-06-14
WO2001025821A2 (en) 2001-04-12
WO2001025747A9 (en) 2002-09-26
AU2422701A (en) 2001-05-10
AU2422801A (en) 2001-05-10
ES2184652B1 (es) 2004-09-16
WO2001025747A2 (en) 2001-04-12
WO2001025766A9 (en) 2002-09-26
EP1257815A2 (en) 2002-11-20
DE10083295T1 (de) 2002-02-14
IL143350A0 (en) 2002-04-21
WO2001025747A3 (en) 2001-10-25
MXPA01005575A (es) 2003-08-01

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Legal Events

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A300 Application deemed to be withdrawn because no request for examination was validly filed

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Effective date: 20071204