WO2001025820A3 - Methods for identification and verification - Google Patents

Methods for identification and verification Download PDF

Info

Publication number
WO2001025820A3
WO2001025820A3 PCT/US2000/026415 US0026415W WO0125820A3 WO 2001025820 A3 WO2001025820 A3 WO 2001025820A3 US 0026415 W US0026415 W US 0026415W WO 0125820 A3 WO0125820 A3 WO 0125820A3
Authority
WO
WIPO (PCT)
Prior art keywords
article
verification
taggants
taggant
identification
Prior art date
Application number
PCT/US2000/026415
Other languages
French (fr)
Other versions
WO2001025820A2 (en
Inventor
Bruce John Kaiser
L Stephen Price
David J Watson
Gerhard A Meyer
Original Assignee
Edax Inc
Bruce John Kaiser
L Stephen Price
David J Watson
Gerhard A Meyer
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Edax Inc, Bruce John Kaiser, L Stephen Price, David J Watson, Gerhard A Meyer filed Critical Edax Inc
Priority to AU22468/01A priority Critical patent/AU2246801A/en
Publication of WO2001025820A2 publication Critical patent/WO2001025820A2/en
Publication of WO2001025820A3 publication Critical patent/WO2001025820A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Abstract

An apparatus and method in which one or more taggants are detected by X-ray fluorescence analysis to identify or verify the article or its point of manufacture. The taggants are manufactured as part of the article or are placed into a coating, label, or otherwise embedded within the article for later verification of the presence or absence of the taggant. The detection apparatus (25) has an instrument housing (15) which contains various components. Gamma rays (30) from a source (20) are optionally focused by aperture (10) to impinge on a sample (11), which contains at least one taggant.
PCT/US2000/026415 1999-10-04 2000-09-26 Methods for identification and verification WO2001025820A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU22468/01A AU2246801A (en) 1999-10-04 2000-09-26 Methods for identification and verification

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15757399P 1999-10-04 1999-10-04
US60/157,573 1999-10-04

Publications (2)

Publication Number Publication Date
WO2001025820A2 WO2001025820A2 (en) 2001-04-12
WO2001025820A3 true WO2001025820A3 (en) 2001-06-14

Family

ID=22564335

Family Applications (10)

Application Number Title Priority Date Filing Date
PCT/US2000/026415 WO2001025820A2 (en) 1999-10-04 2000-09-26 Methods for identification and verification
PCT/US2000/026461 WO2001025763A1 (en) 1999-10-04 2000-09-27 Methods for identification and verification
PCT/US2000/026784 WO2001025764A1 (en) 1999-10-04 2000-09-28 Methods for identification and verification
PCT/US2000/027151 WO2001025765A1 (en) 1999-10-04 2000-10-03 Methods for identification and verification
PCT/US2000/027491 WO2001025767A1 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027418 WO2001025747A2 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027624 WO2001025821A2 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027492 WO2001025768A1 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027420 WO2001025766A1 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027423 WO2001025748A2 (en) 1999-10-04 2000-10-04 Methods for identification and verification

Family Applications After (9)

Application Number Title Priority Date Filing Date
PCT/US2000/026461 WO2001025763A1 (en) 1999-10-04 2000-09-27 Methods for identification and verification
PCT/US2000/026784 WO2001025764A1 (en) 1999-10-04 2000-09-28 Methods for identification and verification
PCT/US2000/027151 WO2001025765A1 (en) 1999-10-04 2000-10-03 Methods for identification and verification
PCT/US2000/027491 WO2001025767A1 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027418 WO2001025747A2 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027624 WO2001025821A2 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027492 WO2001025768A1 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027420 WO2001025766A1 (en) 1999-10-04 2000-10-04 Methods for identification and verification
PCT/US2000/027423 WO2001025748A2 (en) 1999-10-04 2000-10-04 Methods for identification and verification

Country Status (14)

Country Link
EP (5) EP1137930A1 (en)
JP (1) JP2003511667A (en)
KR (1) KR20010090856A (en)
AU (10) AU2246801A (en)
BR (1) BR0007567A (en)
CA (5) CA2352357A1 (en)
DE (1) DE10083295T1 (en)
DK (1) DK200100797A (en)
ES (1) ES2184652B1 (en)
IL (1) IL143350A0 (en)
MX (2) MXPA01005575A (en)
NO (1) NO20012656L (en)
SE (1) SE0101893L (en)
WO (10) WO2001025820A2 (en)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1386144A4 (en) * 2001-01-16 2005-09-21 Keymaster Technologies Inc Methods for identification and verification
US6909770B2 (en) 2001-12-05 2005-06-21 The United States Of America As Represented By The United States National Aeronautics And Space Administration Methods for identification and verification using vacuum XRF system
US6850592B2 (en) 2002-04-12 2005-02-01 Keymaster Technologies, Inc. Methods for identification and verification using digital equivalent data system
US7023955B2 (en) * 2003-08-12 2006-04-04 X-Ray Optical System, Inc. X-ray fluorescence system with apertured mask for analyzing patterned surfaces
US7767457B2 (en) * 2004-01-20 2010-08-03 Inki Mun Method of use of taggants
CN100433039C (en) * 2005-08-03 2008-11-12 正品科技（北京）有限公司 Mark method adopting chemical elements, device thereof and chemical elements marking
JP2007078521A (en) * 2005-09-14 2007-03-29 Takiron Co Ltd Discrimination method of vinyl chloride resin molded article, and vinyl chloride resin molded article used therefor
US20080216255A1 (en) * 2005-09-17 2008-09-11 Robert Lee Poovey Textile Marker Application Method and Textiles Produced therefrom
EP2150246B1 (en) 2007-04-13 2013-09-25 Dunn, Robert T. Compositions and methods for treatment of psychiatric disorders
DE102008060675B4 (en) 2008-12-08 2012-11-08 Polysecure Gmbh A method for the unique identification and authentication of products for protection against plagiarism
JP5349249B2 (en) * 2009-10-21 2013-11-20 株式会社森清化工 Rubber product identification method, rubber product, rubber product identification device
GB201004024D0 (en) * 2010-03-11 2010-04-28 Durham Scient Crystals Ltd Method and system for the identification and authentication of objects
US9080987B2 (en) 2011-05-26 2015-07-14 Altria Client Services, Inc. Oil soluble taggants
US9244017B2 (en) 2011-05-26 2016-01-26 Altria Client Services Llc Oil detection process and apparatus
US10900897B2 (en) 2012-05-29 2021-01-26 Altria Client Services Llc Oil detection process
US9073091B2 (en) 2013-03-15 2015-07-07 Altria Client Services Inc. On-line oil and foreign matter detection system and method
US9097668B2 (en) 2013-03-15 2015-08-04 Altria Client Services Inc. Menthol detection on tobacco
CN104101697A (en) * 2013-04-10 2014-10-15 苏州华觉智能科技有限公司 Detection device
US10650630B2 (en) 2014-10-31 2020-05-12 Honeywell International Inc. Authentication systems, authentication devices, and methods for authenticating a value article
US10782279B2 (en) 2014-11-11 2020-09-22 Altria Client Services Llc Method for detecting oil on tobacco products and packaging
EP3278091B1 (en) * 2015-04-02 2022-07-20 Soreq Nuclear Research Center System and method for reading x-ray-fluorescence marking
CN105680936B (en) * 2016-03-03 2018-10-02 西安工程大学 It is a kind of non-straight regarding ultraviolet communication scattering,single process path loss computing method
US11029267B2 (en) 2016-04-04 2021-06-08 Security Matters Ltd. Method and a system for XRF marking and reading XRF marks of electronic systems
WO2017175219A1 (en) * 2016-04-04 2017-10-12 Soreq Nuclear Research Center A method and a system for xrf marking and reading xrf marks of electronic systems
EP4282925A1 (en) 2022-05-23 2023-11-29 Kronos International, Inc. Post-treated titanium dioxide pigment with at least one security feature
US11879883B1 (en) * 2022-08-25 2024-01-23 Samuel Landis Precious metal source verification by trace elements

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4251726A (en) * 1979-02-26 1981-02-17 Alvarez Luis W Deuterium tagged articles such as explosives and method for detection thereof
US4363965A (en) * 1980-10-03 1982-12-14 The Franklin Institute Detection and identification method employing mossbauer isotopes
US4476382A (en) * 1980-10-21 1984-10-09 Intex Inc. Encoding scheme for articles
US4767205A (en) * 1986-01-28 1988-08-30 Flow Cytometry Standards Corporation Composition and method for hidden identification
US5185773A (en) * 1991-07-19 1993-02-09 General Motors Corporation Method and apparatus for nondestructive selective determination of a metal
US5527707A (en) * 1993-12-21 1996-06-18 Kabushiki Kaisha Toshiba Method of analyzing impurities in the surface of a semiconductor wafer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4136778A (en) * 1975-08-12 1979-01-30 Burlington Industries, Inc. Linen sorter
US4445225A (en) * 1980-10-21 1984-04-24 Intex Inc. Encoding scheme for articles
US4485308A (en) * 1982-04-26 1984-11-27 General Electric Company Photo detection system
EP0139617B1 (en) * 1983-09-27 1990-09-05 Ciba-Geigy Ag Process and apparatus for applying and simultaneously fixing a chemical to a textile substrate
GB9722475D0 (en) * 1997-10-25 1997-12-24 Wahoo Trust The Article identification means

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4251726A (en) * 1979-02-26 1981-02-17 Alvarez Luis W Deuterium tagged articles such as explosives and method for detection thereof
US4363965A (en) * 1980-10-03 1982-12-14 The Franklin Institute Detection and identification method employing mossbauer isotopes
US4476382A (en) * 1980-10-21 1984-10-09 Intex Inc. Encoding scheme for articles
US4767205A (en) * 1986-01-28 1988-08-30 Flow Cytometry Standards Corporation Composition and method for hidden identification
US5185773A (en) * 1991-07-19 1993-02-09 General Motors Corporation Method and apparatus for nondestructive selective determination of a metal
US5527707A (en) * 1993-12-21 1996-06-18 Kabushiki Kaisha Toshiba Method of analyzing impurities in the surface of a semiconductor wafer

Also Published As

Publication number Publication date
MXPA02003424A (en) 2003-10-15
AU2723701A (en) 2001-05-10
AU2247101A (en) 2001-05-10
DK200100797A (en) 2001-07-24
WO2001025748A3 (en) 2001-10-18
WO2001025767A9 (en) 2002-05-16
NO20012656D0 (en) 2001-05-30
AU2247201A (en) 2001-05-10
CA2386402A1 (en) 2001-04-12
SE0101893L (en) 2001-07-31
WO2001025765A1 (en) 2001-04-12
WO2001025766A1 (en) 2001-04-12
WO2001025763A1 (en) 2001-04-12
EP1224459A2 (en) 2002-07-24
CA2352357A1 (en) 2001-04-12
EP1218730A2 (en) 2002-07-03
EP1137930A1 (en) 2001-10-04
SE0101893D0 (en) 2001-05-30
WO2001025768A9 (en) 2002-05-16
JP2003511667A (en) 2003-03-25
WO2001025820A2 (en) 2001-04-12
BR0007567A (en) 2001-08-21
ES2184652A1 (en) 2003-04-01
MXPA01005575A (en) 2003-08-01
IL143350A0 (en) 2002-04-21
WO2001025821A3 (en) 2001-06-07
AU2572601A (en) 2001-05-10
WO2001025748A9 (en) 2002-09-26
AU2422701A (en) 2001-05-10
AU2422801A (en) 2001-05-10
EP1218731A1 (en) 2002-07-03
AU2572701A (en) 2001-05-10
WO2001025764A1 (en) 2001-04-12
WO2001025821A2 (en) 2001-04-12
WO2001025767A1 (en) 2001-04-12
ES2184652B1 (en) 2004-09-16
NO20012656L (en) 2001-08-01
AU2246801A (en) 2001-05-10
WO2001025764A9 (en) 2002-09-26
EP1257815A2 (en) 2002-11-20
WO2001025747A3 (en) 2001-10-25
WO2001025766A9 (en) 2002-09-26
CA2386391A1 (en) 2001-04-12
WO2001025748A2 (en) 2001-04-12
AU2247001A (en) 2001-05-10
CA2386400A1 (en) 2001-04-12
WO2001025747A9 (en) 2002-09-26
KR20010090856A (en) 2001-10-19
WO2001025747A2 (en) 2001-04-12
WO2001025768A1 (en) 2001-04-12
CA2386454A1 (en) 2001-04-12
AU2422901A (en) 2001-05-10
DE10083295T1 (en) 2002-02-14

Similar Documents

Publication Publication Date Title
WO2001025820A3 (en) Methods for identification and verification
WO2003074989A3 (en) Methods for identification and verification
WO2004052059A3 (en) Methods for identification and verification using vacuum xrf system
DE69737513D1 (en) PARTICULAR LABEL USING ANALYTASSAY
AU5794498A (en) Releasable nonvolatile mass-label molecules
CA2460794A1 (en) System and method for sample detection based on low-frequency spectral components
AU2001258922A1 (en) Process for identifying objects using an optical spectrometer and a transport system
ATE551656T1 (en) METHOD AND DEVICE FOR IDENTIFYING NEW MEDIA CONTENT
GB9509410D0 (en) Molecular imaging
WO2004061742A3 (en) Medical data analysis method and apparatus incorporating in vitro test data
EP1361523A3 (en) Converting numbers between measurement systems based upon semantically labeled strings
DE69835142D1 (en) DEVICE FOR DETERMINING DISTURBING SUBSTANCES IN PLASMA
WO2005010494A3 (en) Multiplexed analyte detection
WO1998048382A3 (en) Improved scratch card, and method and apparatus for validation of the same
ATE179819T1 (en) METHOD AND SYSTEM FOR CHECKING THE AUTHENTICITY OF A DATA CARRIER, AND DATA CARRIER FOR USE IN THE SYSTEM
AUPP573098A0 (en) Apparatus and method for analyzing material
WO2003069318A3 (en) An analysis apparatus and method
ATE366923T1 (en) DEVICE FOR REFERENCING FLUORESCENCE SIGNALS
WO1998002580A3 (en) Signal amplification method
MX2009007689A (en) Advanced pattern recognition systems for spectral analysis.
AU7553800A (en) Method and means for data management in a laboratory
WO2004097352A3 (en) Instrumentation, articles of manufacture, and analysis methods
ES2174154T3 (en) AUTOMATIC ANALYZER.
PT918991E (en) TEST METHOD
DK1140359T3 (en) Method of biological analysis with a means for controlling the mating of a biological analysis equipment and an associated container

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GE GH GM HR HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG US UZ VN YU ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
AK Designated states

Kind code of ref document: A3

Designated state(s): AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GE GH GM HR HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG US UZ VN YU ZW

AL Designated countries for regional patents

Kind code of ref document: A3

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG

DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

122 Ep: pct application non-entry in european phase
NENP Non-entry into the national phase

Ref country code: JP