JP2003315399A - 通信システムのチャネルをテストするための電気テストシステム - Google Patents

通信システムのチャネルをテストするための電気テストシステム

Info

Publication number
JP2003315399A
JP2003315399A JP2003099337A JP2003099337A JP2003315399A JP 2003315399 A JP2003315399 A JP 2003315399A JP 2003099337 A JP2003099337 A JP 2003099337A JP 2003099337 A JP2003099337 A JP 2003099337A JP 2003315399 A JP2003315399 A JP 2003315399A
Authority
JP
Japan
Prior art keywords
function
boards
board
function boards
electrical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003099337A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003315399A5 (enExample
Inventor
Heinz Nuessle
ヘインツ・ヌエッスル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2003315399A publication Critical patent/JP2003315399A/ja
Publication of JP2003315399A5 publication Critical patent/JP2003315399A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP2003099337A 2002-04-06 2003-04-02 通信システムのチャネルをテストするための電気テストシステム Pending JP2003315399A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP02007780.6 2002-04-06
EP02007780A EP1271167B1 (en) 2002-04-06 2002-04-06 Electrical System for testing the channels of a communication system

Publications (2)

Publication Number Publication Date
JP2003315399A true JP2003315399A (ja) 2003-11-06
JP2003315399A5 JP2003315399A5 (enExample) 2006-05-25

Family

ID=8185447

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003099337A Pending JP2003315399A (ja) 2002-04-06 2003-04-02 通信システムのチャネルをテストするための電気テストシステム

Country Status (4)

Country Link
US (1) US7149286B2 (enExample)
EP (1) EP1271167B1 (enExample)
JP (1) JP2003315399A (enExample)
DE (1) DE60200213T2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI274166B (en) * 2004-06-18 2007-02-21 Unitest Inc Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
US7707286B2 (en) * 2006-05-11 2010-04-27 Sonim Technologies, Inc. Methods for managing presence information in a real-time communications network

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3890559A (en) * 1974-05-20 1975-06-17 Gte Automatic Electric Lab Inc Circuit for monitoring and controlling multiple power supplies
US4541094A (en) * 1983-03-21 1985-09-10 Sequoia Systems, Inc. Self-checking computer circuitry
EP0212045A3 (de) * 1985-07-11 1988-01-27 Raimund Wilhelm Anpassung eines Anzeige- oder Auswertgerätes an einen Sensor
US4947427A (en) * 1987-05-15 1990-08-07 Northern Telecom Limited Protection arrangement for a telephone subscriber line interface circuit
US6247144B1 (en) * 1991-01-31 2001-06-12 Compaq Computer Corporation Method and apparatus for comparing real time operation of object code compatible processors
JPH05251519A (ja) * 1992-01-09 1993-09-28 Nec Corp 半導体デバイス測定用テスター
US5909591A (en) * 1996-06-18 1999-06-01 Lucent Technologies Inc. System and method for identifying individual modules in a modular system
JPH11155233A (ja) * 1997-11-25 1999-06-08 Advantest Corp 直流電源装置
US6459275B1 (en) * 2001-02-28 2002-10-01 Avaya Technology Corp. Detection of devices on a local area network

Also Published As

Publication number Publication date
DE60200213T2 (de) 2004-12-16
US20030189430A1 (en) 2003-10-09
EP1271167A1 (en) 2003-01-02
EP1271167B1 (en) 2004-02-18
US7149286B2 (en) 2006-12-12
DE60200213D1 (de) 2004-03-25

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