JP2003257817A5 - - Google Patents

Download PDF

Info

Publication number
JP2003257817A5
JP2003257817A5 JP2002054162A JP2002054162A JP2003257817A5 JP 2003257817 A5 JP2003257817 A5 JP 2003257817A5 JP 2002054162 A JP2002054162 A JP 2002054162A JP 2002054162 A JP2002054162 A JP 2002054162A JP 2003257817 A5 JP2003257817 A5 JP 2003257817A5
Authority
JP
Japan
Prior art keywords
mask
light
pattern
exposure apparatus
alignment pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002054162A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003257817A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2002054162A priority Critical patent/JP2003257817A/ja
Priority claimed from JP2002054162A external-priority patent/JP2003257817A/ja
Publication of JP2003257817A publication Critical patent/JP2003257817A/ja
Publication of JP2003257817A5 publication Critical patent/JP2003257817A5/ja
Pending legal-status Critical Current

Links

JP2002054162A 2002-02-28 2002-02-28 半導体装置の製造方法 Pending JP2003257817A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002054162A JP2003257817A (ja) 2002-02-28 2002-02-28 半導体装置の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002054162A JP2003257817A (ja) 2002-02-28 2002-02-28 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JP2003257817A JP2003257817A (ja) 2003-09-12
JP2003257817A5 true JP2003257817A5 (zh) 2005-08-18

Family

ID=28665393

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002054162A Pending JP2003257817A (ja) 2002-02-28 2002-02-28 半導体装置の製造方法

Country Status (1)

Country Link
JP (1) JP2003257817A (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7375795B2 (en) * 2004-12-22 2008-05-20 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, and device manufactured thereby
JP4887958B2 (ja) * 2006-07-27 2012-02-29 凸版印刷株式会社 フォトマスク
JP4978290B2 (ja) * 2007-04-19 2012-07-18 凸版印刷株式会社 フォトマスク及びそれを用いたカラーフィルタの製造方法、カラーフィルタ及び液晶表示装置
CN109901359A (zh) * 2017-12-11 2019-06-18 长鑫存储技术有限公司 用于掩膜的对准图形、掩膜及晶圆

Similar Documents

Publication Publication Date Title
US6934008B2 (en) Multiple mask step and scan aligner
TW511149B (en) Photomask and method for manufacturing the same
JP2002122976A5 (zh)
ATE501463T1 (de) Lithographische methode zur erzeugung eines elements
JP2006527398A (ja) レチクルを設計し、半導体素子をレチクルで作製する方法
CN103472671A (zh) 具有复合偏光片的光掩膜与优化不同图案的成像方法
JPH03252659A (ja) フォトマスク及びその製造方法
JP2003257817A5 (zh)
JP3096841B2 (ja) ホトリソグラフィ方法及びそれに使用するホトリソグラフィシステム
JP2001203139A5 (zh)
JP2018159848A (ja) 光照射方法、基板上構造体の製造方法および露光装置
CN100538529C (zh) 半导体制造工艺中利用两个光掩模的二次曝光方法
US7727683B2 (en) High-transmission attenuating PSM
JP2001296650A (ja) レチクル
TWI331699B (en) Photolithographic mask and apparatus and wafer photolithography method for the same
US20050008942A1 (en) [photomask with internal assistant pattern forenhancing resolution of multi-dimension pattern]
JP2001201844A5 (zh)
KR20050003141A (ko) 콘택 패턴용 포토 마스크
US20040013948A1 (en) Chromeless PSM with chrome assistant feature
KR20080062762A (ko) 양면 패턴을 갖는 포토마스크 및 그 제조방법
KR100668731B1 (ko) 하프톤 마스크  및 그 제조방법
TW200811614A (en) Method for exposing twice by two masks in a semiconductor manufacture
KR100809709B1 (ko) 포토리소그래피용 마스크 및 이를 이용한 포토레지스트패턴의 형성 방법
KR20050097173A (ko) 스텝퍼 방식 노광용 마스크 및 이를 이용한 패턴 형성 방법
JPWO2023157888A5 (zh)