JP2003240728A5 - - Google Patents
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- Publication number
- JP2003240728A5 JP2003240728A5 JP2002044187A JP2002044187A JP2003240728A5 JP 2003240728 A5 JP2003240728 A5 JP 2003240728A5 JP 2002044187 A JP2002044187 A JP 2002044187A JP 2002044187 A JP2002044187 A JP 2002044187A JP 2003240728 A5 JP2003240728 A5 JP 2003240728A5
- Authority
- JP
- Japan
- Prior art keywords
- ccd camera
- lens
- image
- mirror surface
- inspection object
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 1
Images
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002044187A JP3789097B2 (ja) | 2002-02-21 | 2002-02-21 | 被検査物の外周検査方法および外周検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002044187A JP3789097B2 (ja) | 2002-02-21 | 2002-02-21 | 被検査物の外周検査方法および外周検査装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2003240728A JP2003240728A (ja) | 2003-08-27 |
JP2003240728A5 true JP2003240728A5 (enrdf_load_stackoverflow) | 2004-12-09 |
JP3789097B2 JP3789097B2 (ja) | 2006-06-21 |
Family
ID=27783672
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002044187A Expired - Fee Related JP3789097B2 (ja) | 2002-02-21 | 2002-02-21 | 被検査物の外周検査方法および外周検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3789097B2 (enrdf_load_stackoverflow) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG157977A1 (en) * | 2008-06-23 | 2010-01-29 | Semiconductor Tech & Instr Inc | System and method for inspection of semiconductor packages |
JP6489540B2 (ja) * | 2014-02-27 | 2019-03-27 | 株式会社NejiLaw | 撮像システム、照明手段 |
US9759670B2 (en) * | 2014-12-23 | 2017-09-12 | Mitutoyo Corporation | Bore imaging system |
JP2017009542A (ja) * | 2015-06-25 | 2017-01-12 | 株式会社NejiLaw | 撮像システム |
JP6834174B2 (ja) * | 2016-05-13 | 2021-02-24 | 株式会社ジェイテクト | 外観検査方法および外観検査装置 |
JP2019117139A (ja) * | 2017-12-27 | 2019-07-18 | 株式会社ケージェーケー | ベアリングの検査方法と検査装置 |
CN114061481A (zh) * | 2020-08-04 | 2022-02-18 | 广东博智林机器人有限公司 | 一种光源组件及检测装置 |
-
2002
- 2002-02-21 JP JP2002044187A patent/JP3789097B2/ja not_active Expired - Fee Related
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