JP2003222654A5 - - Google Patents

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Publication number
JP2003222654A5
JP2003222654A5 JP2002021048A JP2002021048A JP2003222654A5 JP 2003222654 A5 JP2003222654 A5 JP 2003222654A5 JP 2002021048 A JP2002021048 A JP 2002021048A JP 2002021048 A JP2002021048 A JP 2002021048A JP 2003222654 A5 JP2003222654 A5 JP 2003222654A5
Authority
JP
Japan
Prior art keywords
probe device
probe
conversion element
electric energy
conversion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002021048A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003222654A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2002021048A priority Critical patent/JP2003222654A/ja
Priority claimed from JP2002021048A external-priority patent/JP2003222654A/ja
Priority to TW091137043A priority patent/TWI274163B/zh
Priority to KR1020047001411A priority patent/KR100597227B1/ko
Priority to PCT/JP2003/000084 priority patent/WO2003065441A1/ja
Priority to US10/484,779 priority patent/US6933736B2/en
Publication of JP2003222654A publication Critical patent/JP2003222654A/ja
Publication of JP2003222654A5 publication Critical patent/JP2003222654A5/ja
Pending legal-status Critical Current

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JP2002021048A 2002-01-30 2002-01-30 プローブ装置 Pending JP2003222654A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2002021048A JP2003222654A (ja) 2002-01-30 2002-01-30 プローブ装置
TW091137043A TWI274163B (en) 2002-01-30 2002-12-23 Prober
KR1020047001411A KR100597227B1 (ko) 2002-01-30 2003-01-08 프로브장치
PCT/JP2003/000084 WO2003065441A1 (en) 2002-01-30 2003-01-08 Prober
US10/484,779 US6933736B2 (en) 2002-01-30 2003-01-08 Prober

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002021048A JP2003222654A (ja) 2002-01-30 2002-01-30 プローブ装置

Publications (2)

Publication Number Publication Date
JP2003222654A JP2003222654A (ja) 2003-08-08
JP2003222654A5 true JP2003222654A5 (cg-RX-API-DMAC7.html) 2005-07-28

Family

ID=27654380

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002021048A Pending JP2003222654A (ja) 2002-01-30 2002-01-30 プローブ装置

Country Status (5)

Country Link
US (1) US6933736B2 (cg-RX-API-DMAC7.html)
JP (1) JP2003222654A (cg-RX-API-DMAC7.html)
KR (1) KR100597227B1 (cg-RX-API-DMAC7.html)
TW (1) TWI274163B (cg-RX-API-DMAC7.html)
WO (1) WO2003065441A1 (cg-RX-API-DMAC7.html)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
KR100864916B1 (ko) 2002-05-23 2008-10-22 캐스케이드 마이크로테크 인코포레이티드 피시험 디바이스를 테스트하기 위한 프로브
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
WO2005065258A2 (en) 2003-12-24 2005-07-21 Cascade Microtech, Inc. Active wafer probe
DE202005021386U1 (de) 2004-07-07 2007-11-29 Cascade Microtech, Inc., Beaverton Prüfkopf mit einem Messfühler mit Membranaufhängung
JP4797341B2 (ja) * 2004-07-12 2011-10-19 トヨタ自動車株式会社 圧電素子と電気装置が重合された圧電式振動抑制装置
JP2008512680A (ja) 2004-09-13 2008-04-24 カスケード マイクロテック インコーポレイテッド 両面プロービング構造体
US7265534B2 (en) * 2004-10-20 2007-09-04 Freescale Semiconductor, Inc. Test system for device characterization
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
JP2007227899A (ja) * 2006-01-13 2007-09-06 King Yuan Electronics Co Ltd Ｚｉｆコネクタつきプローブカード、その組立方法、ウェハテストシステム、及びそれを導入したウェハテスト方法
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
WO2008050518A1 (en) * 2006-10-20 2008-05-02 Panasonic Corporation Prober device
US7750657B2 (en) * 2007-03-15 2010-07-06 Applied Materials Inc. Polishing head testing with movable pedestal
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
JP7561662B2 (ja) * 2021-03-12 2024-10-04 レーザーテック株式会社 検査装置及び振動抑制方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3208734B2 (ja) * 1990-08-20 2001-09-17 東京エレクトロン株式会社 プローブ装置
JPH05149379A (ja) 1991-11-29 1993-06-15 Takenaka Komuten Co Ltd アクテイブ除振装置
JPH0669321A (ja) 1992-08-19 1994-03-11 Tokyo Electron Yamanashi Kk プローブ装置
US5642056A (en) * 1993-12-22 1997-06-24 Tokyo Electron Limited Probe apparatus for correcting the probe card posture before testing
JPH1082204A (ja) 1996-09-10 1998-03-31 Mitsubishi Steel Mfg Co Ltd 摩擦力制御型制振装置
US5814733A (en) * 1996-09-12 1998-09-29 Motorola, Inc. Method of characterizing dynamics of a workpiece handling system
JPH11304837A (ja) 1998-04-27 1999-11-05 Yokogawa Electric Corp プローブ装置
JP4588816B2 (ja) 1999-06-15 2010-12-01 特許機器株式会社 圧電制振ユニットおよびこれを用いた制振構造
DE19952943C2 (de) 1999-11-03 2003-07-03 Infineon Technologies Ag Nadelkarten-Justageeinrichtung zur Planarisierung von Nadelsätzen einer Nadelkarte

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