JP2003163298A - Sealing cap for electronic element package and its manufacturing method as well as method for sealing using the cap - Google Patents

Sealing cap for electronic element package and its manufacturing method as well as method for sealing using the cap

Info

Publication number
JP2003163298A
JP2003163298A JP2001364224A JP2001364224A JP2003163298A JP 2003163298 A JP2003163298 A JP 2003163298A JP 2001364224 A JP2001364224 A JP 2001364224A JP 2001364224 A JP2001364224 A JP 2001364224A JP 2003163298 A JP2003163298 A JP 2003163298A
Authority
JP
Japan
Prior art keywords
cap
sealing
brazing material
outer peripheral
plating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001364224A
Other languages
Japanese (ja)
Other versions
JP3810000B2 (en
Inventor
Tadayoshi Saito
忠良 斉藤
Hitoshi Saito
斉藤  均
Isamu Saito
斎藤  勇
Koji Otake
康治 大竹
Yoshimi Kawakami
義美 川上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AZUMA DENKA KK
Nippon Filcon Co Ltd
Original Assignee
AZUMA DENKA KK
Nippon Filcon Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AZUMA DENKA KK, Nippon Filcon Co Ltd filed Critical AZUMA DENKA KK
Priority to JP2001364224A priority Critical patent/JP3810000B2/en
Publication of JP2003163298A publication Critical patent/JP2003163298A/en
Application granted granted Critical
Publication of JP3810000B2 publication Critical patent/JP3810000B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a sealing cap for an electronic element package having a low cost, high sealing reliability and a good conveying efficiency, and to provide a method for manufacturing the same and a method for sealing the package. <P>SOLUTION: The sealing cap for the electronic element package comprises a brazing material layer formed on the outer periphery of the one side surface of the cap made of a lithography made of a metal, and a layer containing an Au and an Sn and formed by a plating method on the outer periphery of the one side surface of the cap. The method for manufacturing the cap is provided. The method for sealing the package using the cap is provided. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、各種電子素子パッ
ケージ、特には圧電素子、表面弾性波等のセラミックパ
ッケージに使用する封止用キャップとその製造方法及び
そのキャップを使用した封止方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sealing cap for use in various electronic device packages, particularly piezoelectric devices, ceramic packages such as surface acoustic waves, a manufacturing method thereof, and a sealing method using the cap.

【0002】[0002]

【従来の技術】近年、電子機器の小型軽量化にともな
い、携帯電話等に使用されるフィルターも小型軽量化し
た表面弾性波フィルターや圧電素子等が多数使用されて
いる。この携帯電話等に使用されるフィルターは、一般
的に表面弾性波素子や圧電素子等をセラミックパッケー
ジ内に形成されたキャビティに搭載し、セラミックパッ
ケージを金属製キャップで蓋をして封止し製造される。
従来、この金属製キャップは金属板に封止用のAuSn
合金やPbSn半田等のろう材を付与したものが用いら
れている。ろう材の形状としては全面に付与したものや
最近ではキャップの外周部に付与したものがある。全面
に付与したものは、例えば、ろう材を超音波溶接やめっ
き、圧着によって全面に接着した金属板を、金型を用い
て外形を打ち抜き所要のキャップ形状としている。また
ろう材をキャップの外周部に付与する方法としては、予
め金型を用いて所要のキャップ形状に打ち抜いた金属板
に、圧延により薄膜とし、金型にて外周形状に打ち抜い
たろう材を溶着や接着する方法等がとられている。
2. Description of the Related Art In recent years, as electronic devices have become smaller and lighter, a large number of surface acoustic wave filters, piezoelectric elements and the like have also been used for filters used in mobile phones and the like. The filter used in this mobile phone is generally manufactured by mounting surface acoustic wave elements, piezoelectric elements, etc. in a cavity formed in a ceramic package and sealing the ceramic package with a metal cap. To be done.
Conventionally, this metal cap is a AuSn for sealing a metal plate.
A material provided with a brazing material such as an alloy or PbSn solder is used. As the shape of the brazing filler metal, there are a brazing filler metal applied to the entire surface and recently a brazing filler metal applied to the outer peripheral portion of the cap. For example, a metal plate having a brazing material adhered to the entire surface by ultrasonic welding, plating, or pressure bonding is punched out of its outer shape with a die to have a desired cap shape. Further, as a method of applying the brazing material to the outer peripheral portion of the cap, a metal plate punched into a desired cap shape in advance with a die is rolled into a thin film, and the brazing material punched into the outer circumferential shape with the die is welded or The method of adhesion is taken.

【0003】[0003]

【発明が解決しようとする課題】従来の金属製キャップ
で、全面にろう材を付与したものは、ろう材が不要部に
も付与されていることからコストが高くなる欠点があ
る。特に高価なAuSn合金を使用する場合は産業的に
は致命的である。PbSn半田や超音波溶接法を使用す
ると封止信頼性が低いという難点がある。この他、不要
部のろう材が封止時に漏れだし配線を短絡させる等の問
題を生じ素子の信頼性を低下させる欠点があった。この
問題を解決するために、最近になってろう材を必要部で
あるキャップ外周部のみに形成付与する方法が試みられ
ているが、ろう材の加工が極薄の微細加工となるために
高度な技術が必要となり、加工後の打ち抜き作業も薄片
であるため自動化が困難で、変形や整列ミス等の不良が
発生する問題があった。さらに、ろう材をキャップに溶
着するためには、例えばキャップの外形に合わせて多数
の穴を形成した治具の各穴にキャップとろう材をそれぞ
れ1枚ずつセットし熱溶着する必要があり、整列治具や
設備を必要とし、工程が煩雑で加工コストが嵩む問題が
ある。また、パッケージの小型化にともない、より微細
なキャップの要求に応ずることが技術的にも困難になっ
てきている。また、このキャップは、集積、整列した後
搬送用の特殊なケースに梱包されるが、微細な薄片であ
るために、その品質を維持するための衝撃緩衝材を多く
使用する必要があり、体積当たりの運搬効率が悪く、使
用後のケースや緩衝材の再使用の限界もあって、廃棄物
が多く発生する。例えば樹脂製のスティック状ケースを
用いた場合、一つのケースにキャップ300〜400個
を一列に充填するが、このケースは、使用時に一個ずつ
取り出せるような形状にしなくてはならないために、特
別の送り出し機構や、そのための溝きり等が施されてい
るので空間率が高く、体積はキャップの体積の数倍にも
なる問題がある。また、その空隙により搬送時にキャッ
プが移動したり、最悪の場合反転する等のトラブルの原
因となっている。本発明は、上記従来技術の問題点に鑑
み、低コストで製造でき封止信頼性が高く、なおかつ搬
送効率や封止時のコストをも低減させることができる封
止用キャップとその製造方法及びそのキャップを使用し
た電子素子パッケージの封止方法を提供する。
The conventional metal cap having the brazing filler metal applied to the entire surface has a drawback that the cost becomes high because the brazing filler metal is also applied to the unnecessary portion. Especially when using an expensive AuSn alloy, it is fatal industrially. The use of PbSn solder or ultrasonic welding has a drawback that sealing reliability is low. In addition to this, there is a drawback that the brazing material in the unnecessary portion leaks out at the time of sealing and short-circuits the wiring, which lowers the reliability of the element. In order to solve this problem, recently, a method of forming and applying a brazing filler metal only on the outer peripheral portion of the cap, which is a necessary portion, has been attempted. However, it is difficult to automate the punching work after processing because it is a thin piece, and defects such as deformation and misalignment occur. Further, in order to weld the brazing material to the cap, for example, it is necessary to set one cap and one brazing material in each hole of a jig in which a large number of holes are formed in accordance with the outer shape of the cap and heat-weld them. There is a problem that an alignment jig and equipment are required, the process is complicated and the processing cost is increased. In addition, with the miniaturization of packages, it is technically difficult to meet the demand for finer caps. In addition, this cap is packed and arranged in a special case for transportation after it has been aligned, but since it is a minute thin piece, it is necessary to use a lot of shock absorbing material to maintain its quality, The transportation efficiency per hit is poor, and there is a limit on the reuse of the case and cushioning material after use, and a large amount of waste is generated. For example, when a resin stick case is used, one case is filled with 300 to 400 caps in a row, but since this case must be shaped so that one cap can be taken out at the time of use, a special case is used. Since the feeding mechanism and the groove for that purpose are provided, the porosity is high, and the volume is several times the volume of the cap. Further, the gap causes troubles such as movement of the cap during transportation and, in the worst case, reversal. In view of the above-mentioned problems of the prior art, the present invention has a sealing cap that can be manufactured at low cost and has high sealing reliability, and can also reduce transport efficiency and cost at the time of sealing, a manufacturing method thereof, and a sealing cap. A method for sealing an electronic device package using the cap is provided.

【0004】[0004]

【課題を解決するための手段】本発明は、 「1. 金属製平版からなるキャップ片面外周部にろう
材層を形成した電子素子パッケージ用封止キャップにお
いて、キャップの片面外周部に、AuとSnとを含む層
をめっき法により形成した電子素子パッケージ用封止キ
ャップ。 2. めっき法により形成したAuとSnとを含む層を
加熱処理してキャップ片面外周部に融着したろう材層と
した、1項に記載された電子素子パッケージ用封止キャ
ップ。 3. AuとSnとを含む層がAuSn合金をめっきし
て形成した層である、1項または2項のいずれか1項に
記載された電子素子パッケージ用封止キャップ。 4. AuとSnとを含む層がAuまたはAuSn合金
とSnとを交互にめっきして形成した層である、1項ま
たは2項のいずれか1項に記載された電子素子パッケー
ジ用封止キャップ。 5. キャップ片面外周部のろう材形成面をキャップ面
より下方に凹状に形成し、これにろう材層を設けた、1
項ないし4項のいずれか1項に記載された電子素子パッ
ケージ用封止キャップ。 6. キャップを連結部を介してマトリックス状に多数
個整列連結した、1項ないし5項のいずれか1項に記載
された電子素子パッケージ用封止キャップ。 7. 電子素子パッケージ用封止キャップの製造方法に
おいて、金属製平版の片面に写真製版法によりマトリッ
クス状に多数個整列配置されたキャップ外周部のパター
ンを形成し、該パターン形成したキャップ外周部にAu
とSnとからなるろう材層をめっきした後、写真製版法
によりキャップ外形のパターン及びキャップ間をマトリ
ックス状に多数個整列連結する連結部のパターンを形成
し、該パターン形成したキャップ及び連結部以外の部分
をエッチングにより除去し、Snの融点以上Auの融点
以下の温度で加熱処理してキャップ外周部にAuSnろ
う材を融着させ、外周部にAuSnろう材が融着され
た、キャップが連結部を介してマトリックス状に多数個
整列連結された状態に形成することを特徴とする電子素
子パッケージ用封止キャップの製造方法。 8. 6項に記載されたマトリックス状に多数個整列連
結された電子素子パッケージ用封止キャップを用い、封
止工程または封止工程直前までマトリックス状に多数個
整列連結された状態を維持して封止を行うことを特徴と
する電子素子パッケージ用封止キャップを用いた封止方
法。」 に関する。
Means for Solving the Problems The present invention is directed to "1. In a sealing cap for an electronic element package, which comprises a metal lithographic plate and a brazing material layer formed on the outer peripheral portion of one side of the cap, Au is formed on the outer peripheral side of the one side of the cap. A sealing cap for an electronic element package in which a layer containing Sn is formed by plating 2. A layer containing Au and Sn formed by plating is heat-treated and a brazing material layer fused to the outer peripheral portion of one side of the cap. 2. The sealing cap for an electronic device package according to item 1. 3. The layer containing Au and Sn is a layer formed by plating an AuSn alloy, according to any one of items 1 and 2. 3. A sealing cap for an electronic device package, wherein the layer containing Au and Sn is a layer formed by alternately plating Au or AuSn alloy and Sn. The described electronic device package sealing cap. 5. form a braze-forming surface of the cap one side outer peripheral portion in a concave shape downward from the cap surface, this provided a brazing material layer, 1
Item 5. A sealing cap for an electronic device package according to any one of items 1 to 4. 6. The sealing cap for an electronic device package according to any one of items 1 to 5, wherein a large number of caps are aligned and connected in a matrix form via a connecting portion. 7. In a method of manufacturing a sealing cap for an electronic device package, a pattern of a plurality of cap outer peripheral portions arranged in a matrix in a matrix is formed on one surface of a metal lithographic plate by a photolithography method, and Au is formed on the outer peripheral portion of the cap on which the pattern is formed.
After plating a brazing material layer consisting of Sn and Sn, a pattern of the outer shape of the cap and a pattern of a connecting portion for aligning and connecting a plurality of caps in a matrix form are formed by a photoengraving method. Is removed by etching, and a heat treatment is performed at a temperature not lower than the melting point of Sn and not higher than the melting point of Au to fuse the AuSn brazing material to the outer peripheral portion of the cap, and the AuSn brazing material is fused to the outer peripheral portion. A method for manufacturing a sealing cap for an electronic device package, which is characterized in that a large number of them are aligned and connected in a matrix form via the parts. 8. Using the sealing cap for electronic device packages, which is arranged and connected in a matrix form as described in item 6, is sealed while maintaining a state in which a large number of arranged and connected in a matrix form until a sealing step or just before the sealing step. A sealing method using a sealing cap for an electronic device package, which comprises: Regarding

【0005】[0005]

【発明の実施の形態】本発明の特徴は、キャップの片面
外周部にめっき法によりAuとSnとを含むろう材層を
形成し、それを熱処理することによってキャップの片面
外周部にAuSnろう材を融着させたことである。キャ
ップ片面外周部の本来必要である部部にのみろう材を形
成し、不要部にろう材を形成しないため、その分ろう材
コスト分0低減でき、また、不要部のろう材が封止時に
漏れだし配線を短絡させる等して素子の信頼性を低下さ
せるという問題がない。また、ろう材をめっき法により
形成したため、ろう材を極薄に微細加工する必要がな
く、それを打ち抜いてキャップ上にそれぞれ1枚ずつセ
ットする必要もないため、さらにコストを低減させるこ
とが可能となるのである。
BEST MODE FOR CARRYING OUT THE INVENTION The feature of the present invention is that a brazing material layer containing Au and Sn is formed on the outer peripheral surface of one side of a cap by a plating method, and heat treatment is applied to the AuSn brazing material on the outer peripheral surface of one side of the cap. Is fused. Since the brazing material is formed only in the originally required part of the outer peripheral part of one side of the cap, and the brazing material is not formed in the unnecessary part, the brazing material cost can be reduced by 0, and the brazing material in the unnecessary part can be sealed. There is no problem of reducing the reliability of the element by short-circuiting the leaking wiring. In addition, since the brazing filler metal is formed by the plating method, it is not necessary to perform microfabrication of the brazing filler metal to an extremely small thickness, and it is not necessary to punch it out and set it on the cap one by one, further reducing the cost. It becomes.

【0006】外周部のパターン形成は、写真製版法を用
いるのが効率的で好適である。AuSnの割合として
は、限定されるわけではないが、Auが60〜85重量
%含まれているのが好適である。60%以下では封止信
頼性が低くなり、85%以上ではコスト的な問題や融点
が高くなる問題がある。AuとSnとを含む層の形成
は、AuSn合金をめっきして形成したり、Auまたは
AuSn合金とSnとを少なくとも2層以上交互にめっ
きして形成すればよい。AuSn合金をめっきして形成
する場合は、後工程の熱処理による熱拡散を省ける利点
があり、AuまたはAuSn合金とSnとを少なくとも
2層以上交互にめっきして形成する場合は、組織を安定
的に作成できる利点がある。また、キャップ片面外周部
のろう材形成面をキャップ面より下方に凹状に形成する
と、封止時にキャップがパッケージ内にはめ込まれるよ
うに配置されるため、封止信頼性を飛躍的に向上させる
ことができる。
It is efficient and preferable to use the photolithography method for forming the pattern on the outer peripheral portion. The proportion of AuSn is not limited, but it is preferable that Au is contained in an amount of 60 to 85% by weight. If it is 60% or less, the sealing reliability is low, and if it is 85% or more, there are problems of cost and melting point. The layer containing Au and Sn may be formed by plating an AuSn alloy or by alternately plating at least two layers of Au or AuSn alloy and Sn. When the AuSn alloy is formed by plating, there is an advantage that the thermal diffusion due to the heat treatment in the subsequent step can be omitted. When the Au or AuSn alloy and Sn are formed by alternately plating at least two layers or more, the structure is stable. There is an advantage that can be created. Also, if the brazing material forming surface of the outer peripheral portion of one side of the cap is formed in a concave shape below the cap surface, the cap is arranged so as to be fitted into the package at the time of sealing, so that the sealing reliability is dramatically improved. You can

【0007】キャップ面より下方に凹状に形成するに
は、AuとSnとからなる層をめっきする前にエッチン
グ加工やコイニニグ加工により形成すればよく、外周部
を単に一段深く形成してもよいし、溝状に形成してもよ
い。深さはキャップの大きさ等により一概にはいえない
が10〜100μm程度でよい。また、キャップを連結
部を介してマトリックス状に多数個整列連結した状態に
すると、キャップ製造時に同一平面で一括処理でき、個
々のキャップとろう材を単体で扱う必要がないため、製
造効率がよく、製造コストが低減できる。連結部とキャ
ップとの境界部にハーフエッチングやスタンピングによ
るV字状等の溝加工を施すと、封止後キャップを容易に
切り離して分離できる。さらに、封止する際にもパッケ
ージをキャップと同一ピッチに配置し、マトリックス状
に多数個整列連結されたキャップをろう材面を介して接
触させることにより一度に同時処理でき、自動供給装置
を用いて投入する等自動化も容易となり、封止工程が合
理化されて封止生産性が格段に向上し、封止コストが低
減できるとともに、整列ミス等による不良の発生も防止
できるのである。また、梱包時や搬送時の変形や裏返
り、位置ずれ等の心配がなく、特殊な梱包ケースを用い
ることなくまとめて包装するだけで出荷できる。よっ
て、梱包材の使用量を激減させ、さらに一度に運搬でき
る部品点数が増大するため、環境負荷も低減できる。
In order to form a concave portion below the cap surface, it may be formed by etching or coining before plating the layer made of Au and Sn, or the outer peripheral portion may be simply formed one step deeper. It may be formed in a groove shape. Although the depth cannot be generally determined depending on the size of the cap and the like, it may be about 10 to 100 μm. In addition, when a large number of caps are aligned and connected in a matrix through the connecting part, they can be processed collectively on the same plane during cap manufacturing, and it is not necessary to handle each cap and brazing material individually, which improves manufacturing efficiency. The manufacturing cost can be reduced. If the groove between the connecting portion and the cap is processed into a V shape by half etching or stamping, the cap can be easily separated after the sealing. Furthermore, when sealing, the packages are arranged at the same pitch as the caps, and a large number of caps aligned and connected in a matrix form are brought into contact with each other through the brazing filler metal surface to allow simultaneous processing at the same time. It is also easy to automate the process such as loading, the sealing process is rationalized, the sealing productivity is significantly improved, the sealing cost can be reduced, and the occurrence of defects due to misalignment can be prevented. In addition, there is no fear of deformation, turning over, or positional displacement during packing or transportation, and the product can be shipped by simply packaging it together without using a special packing case. Therefore, the amount of packing material used is drastically reduced, and the number of parts that can be transported at one time is increased, so that the environmental load can be reduced.

【0008】キャップの製造方法としては、キャップ外
周部やキャップ外形、連結部の形状は写真製版法により
形成し、金属板をキャップ連結部の形状に加工するの
は、エッチング加工を用いて製造するのが効率的で好適
である。例えば、金属製平版の片面に写真製版法により
マトリックス状に多数個整列配置されたキャップ外周部
のパターンを形成し、パターン形成されたキャップ外周
部にAuとSnとを含む層をめっきした後、写真製版法
によりキャップ外形のパターン及びキャップ間をマトリ
ックス状に多数個整列連結する連結部のパターンを形成
し、パターン形成したキャップ及び連結部以外の部分を
エッチングにより除去し、ついでSnの融点以下でAu
の融点以下の温度で加熱処理して、外周部にAuSnろ
う材が融着されたキャップが連結部を介してマトリック
ス状に多数個整列連結された状態に形成するのである。
パターン形成や外形加工、加熱処理等の順序は特に限定
されず任意であるが、上記の順番が不要部への高価なめ
っきの形成を防止でき、また取り扱いが容易なため、効
率的で好適である。また、加熱処理を実施する条件とし
ては、窒素ガス還元雰囲気を用いるのがよく、また、加
熱処理の前にめっき部をプレスして最密充填化するとよ
り均一なろう材が形成され好適である。特にAuまたは
AuSn合金とSnとを少なくとも2層以上交互にめっ
きして形成する場合に有効である。また、めっきをする
前に下地めっきを実施するとめっきの密着性が向上して
良好である。厚さ0.2〜5.0μm程度のNiめっき
の上に0.003〜0.015μm程度のAuめっきで
よい。キャップの材質は特に限定されるものでないが、
42%Ni−Fe合金またはコバールが熱膨張係数がS
iやセラミックと適合しており好適である。
As a method of manufacturing the cap, the outer peripheral portion of the cap, the outer shape of the cap, and the shape of the connecting portion are formed by a photolithography method, and the metal plate is processed into the shape of the cap connecting portion by etching. Is efficient and suitable. For example, by forming a pattern of a cap outer peripheral portion arranged in a matrix in a matrix form on one surface of a metal lithographic plate by a photoengraving method, and plating a layer containing Au and Sn on the patterned outer peripheral portion of the cap, A pattern of the outer shape of the cap and a pattern of a connecting portion for aligning and connecting a plurality of caps in a matrix are formed by a photoengraving method, and portions other than the patterned cap and the connecting portion are removed by etching, and then at a melting point of Sn or less. Au
The heat treatment is performed at a temperature equal to or lower than the melting point of (1) to form a state in which a large number of caps having AuSn brazing material fused to the outer peripheral portion are aligned and connected in a matrix through the connecting portions.
The order of pattern formation, outer shape processing, heat treatment, etc. is not particularly limited and is arbitrary, but the above order is effective and suitable because it can prevent formation of expensive plating on unnecessary parts and is easy to handle. is there. Further, as a condition for carrying out the heat treatment, it is preferable to use a nitrogen gas reducing atmosphere, and it is preferable to press the plating part to close-pack it before the heat treatment so that a more uniform brazing material is formed. . In particular, it is effective when Au or AuSn alloy and Sn are alternately plated in at least two layers. Further, if the undercoating is carried out before the plating, the adhesion of the plating is improved, which is favorable. Au plating having a thickness of about 0.003 to 0.015 μm may be applied on Ni plating having a thickness of about 0.2 to 5.0 μm. The material of the cap is not particularly limited,
42% Ni-Fe alloy or Kovar has a thermal expansion coefficient of S
It is suitable because it is compatible with i and ceramics.

【0009】[0009]

【実施例】次に実施例に基づき図面を参照して本発明を
具体的に説明する。図1は、マトリックス状を多数個整
列連結した電子素子パッケージ用封止キャップの一部を
示す平面図である。図1において、封止キャップ3の外
周部6にろう材4が形成されており、個々の封止キャッ
プ3は連結部2を介してマトリックス状に多数個整列連
結されている。なお、本実施例では、マトリックス状に
多数個整列連結したキャップをマザーシート1で保持し
た状態とし、マザーシート1にパイロットホール10を
形成した。マザーシートに保持したことでキャップの形
状安定性等がさらに向上し、パイロットホールを形成し
たことで、封止加工時等にこのパイロットホールを基準
として同時処理することができ、また、自動供給装置を
用いて投入する等自動化も容易となるのである。なお、
本実施例においては、キャップ外形を正方形としたが、
勿論これに限定されるわけではなく、長方形、円形等様
々な形状が採用できる。また、キャップを縦横均等に基
盤の目状に整列連結したが、これに限定されるわけでは
なく、規則性をもって整列連結されていればよく、例え
ばダイヤゴナルに整列連結してもよい。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail with reference to the drawings based on the embodiments. FIG. 1 is a plan view showing a part of a sealing cap for an electronic device package in which a large number of matrix-shaped elements are aligned and connected. In FIG. 1, a brazing material 4 is formed on the outer peripheral portion 6 of the sealing cap 3, and a large number of individual sealing caps 3 are aligned and connected in a matrix via the connecting portions 2. In this example, the pilot holes 10 were formed in the mother sheet 1 with the mother sheet 1 holding a plurality of caps aligned and connected in a matrix. The shape stability of the cap is further improved by holding it on the mother sheet, and by forming the pilot hole, it is possible to perform simultaneous processing using this pilot hole as a reference during sealing processing, etc. It is also easy to automate the process such as using. In addition,
In this embodiment, the cap has a square outer shape,
Of course, the shape is not limited to this, and various shapes such as a rectangle and a circle can be adopted. Further, although the caps are aligned and connected in the shape of the base evenly in the vertical and horizontal directions, the present invention is not limited to this, and it is sufficient that the caps are aligned and connected with regularity, and may be, for example, diagonally connected.

【0010】図2は、図1のA−A′線で切断した封止
キャップ3及び連結部2の拡大断面図である。封止キャ
ップ3の素材である金属製平版7の片面外周部6にろう
材4が形成されており、外周部6のろう材形成面がキャ
ップの普通面より下方に凹状に形成されていることがわ
かる。勿論これに限定されるわけではないが、ろう材形
成面をこのように形成することによって、封止時にキャ
ップがパッケージ内にはめ込まれるように配置されるた
め、封止信頼性を飛躍的に向上させることができるので
ある。また、ろう材4とろう材形成面との間には下地め
っきであるNiめっき8と極薄のAuめっき9が形成さ
れており、ろう材4の密着性が良好となっている。ま
た、封止キャップ3と連結部2の境界部5は、V字状の
溝加工が施されており、キャップ3の分離が容易であ
る。特にV字状である必要はなく、厚みが薄くなってい
て普通部より強度が低下していればよい。
FIG. 2 is an enlarged sectional view of the sealing cap 3 and the connecting portion 2 taken along the line AA 'in FIG. A brazing material 4 is formed on the outer peripheral portion 6 of one side of the metal lithographic plate 7 which is the material of the sealing cap 3, and the brazing material forming surface of the outer peripheral portion 6 is formed in a concave shape below the normal surface of the cap. I understand. Of course, the present invention is not limited to this, but by forming the brazing material forming surface in this way, the cap is placed so as to be fitted into the package at the time of sealing, so that the sealing reliability is dramatically improved. It can be done. Further, the Ni plating 8 as the base plating and the ultra-thin Au plating 9 are formed between the brazing material 4 and the brazing material forming surface, and the adhesion of the brazing material 4 is good. Further, the boundary portion 5 between the sealing cap 3 and the connecting portion 2 is provided with a V-shaped groove, and the cap 3 can be easily separated. It does not need to be V-shaped in particular, as long as the thickness is thin and the strength is lower than that of the ordinary portion.

【0011】次に製造方法も含めさらに具体的に説明す
る。マザーシートとなる板厚0.2mm、幅150mm、長
さ250mmの42%Ni−Feの合金製平版にフォトレ
ジストを塗布し、写真製版法により外形2.75mm角、
コーナーR0.2mm、巾0.25mmのキャップ外周部の
形状パターンを4.2mmピッチで巾方向に25個、長さ
方向に40個露光後現像し得た外周部のレジスト膜のみ
除去し、その後、ハーフエッチングにより板厚を薄く加
工し、キャップの普通面より一段下方に凹状に形成す
る。ついで、アルカリクリーナーで40℃30秒間浸漬
脱脂、水洗い、5%Hclで酸洗い、水洗い、1.0μ
mのNi及び0.008μmのAu下地めっきを行った
後、市販の20%Sn−Auめっき液を使用してAuS
n合金層をめっきし、その後フォトレジストを除去し
た。なお、めっきの厚みは熱処理後に0.035mmにな
るよう調整した。次に、再度全面にフォトレジストを塗
布し、写真製版法により、外形が2.85mm角の封止キ
ャップが巾0.3mm、長さ1.35mmの連結部で4.2
mmピッチで巾方向に25個、長さ方向に40個整列配置
された状態にパターニングし、エッチング法により不要
部を除去した。また、同時にキャップと連結部の境界部
のV字溝加工及びパイロットホールの加工を実施した。
その後、窒素雰囲気ピーク温度摂氏320℃で熱処理
し、AuSnろう材層を合金製平版に均一に溶着させ
て、マトリックス状に多数個整列連結された状態に外周
部に融点摂氏293℃、厚みが0.035mmのAuSn
ろう材が形成された封止キャップを得た。本実施例で
は、キャップ外形寸法よりめっきを形成する外周部の外
形寸法を若干小さくし、また、角にはRをつけた。勿論
これに限定されるわけではないが、このように形成する
ことによって、パターン形成のズレを許容できる効果、
及びキャップからろう材が突出するのを防止して封止時
にろう材が漏れ出すのを防止できる効果がある。その
後、上記実施例と同一ピッチでカーボン治具に配置され
た表面弾性波フィルターパッケージの上にAuSnろう
材面が接するようにマザーシートを重ねて配置したもの
を上下反転させ、ピーク温度摂氏320℃になるように
温度設定された窒素雰囲気熱処理炉を連続して通炉させ
てAuSnろう材を表面弾性波フィルターパッケージに
均一に融着させた。上記実施例を本発明の代表例とし、
キャップの片面全面に厚さ0.030mmのAuSn層を
圧着させたものを比較例1、キャップ片面の外周部のみ
に別個に用意した厚さ0.035mmのAuSn箔をセッ
ト後融着させたものを比較例2として、キャップ製造コ
スト、封止不良率及び封止コストを比較した結果を表1
に示す。コストについては、実施例の原価を100とし
た場合の相対評価で示した。
Next, the manufacturing method will be described more specifically. A photoresist is applied to a 42% Ni-Fe alloy lithographic plate having a thickness of 0.2 mm, a width of 150 mm, and a length of 250 mm, which is a mother sheet, and an outer shape is 2.75 mm square by a photoengraving method.
After exposing the shape pattern of the outer peripheral portion of the cap having a corner R of 0.2 mm and a width of 0.25 mm at a pitch of 4.2 mm in the width direction by 25 pieces and in the length direction by 40 pieces, only the outer peripheral resist film which was developed and removed was removed. The plate thickness is processed thin by half etching, and is formed in a concave shape one step below the normal surface of the cap. Then, dip and degrease in alkaline cleaner at 40 ° C for 30 seconds, wash with water, pickle with 5% Hcl, wash with water, 1.0μ
m Ni and 0.008 μm Au underlayer plating, and then AuS using a commercially available 20% Sn-Au plating solution.
The n-alloy layer was plated and then the photoresist was removed. The thickness of plating was adjusted to 0.035 mm after heat treatment. Next, the entire surface is again coated with photoresist, and by a photoengraving method, a sealing cap having an outer shape of 2.85 mm square has a width of 0.3 mm and a length of 1.35 mm at a connecting portion of 4.2.
Patterning was performed in a state in which 25 pieces were arranged in the width direction and 40 pieces were arranged in the length direction at an mm pitch, and unnecessary portions were removed by an etching method. At the same time, a V-shaped groove and a pilot hole were formed at the boundary between the cap and the connecting portion.
Then, heat treatment is performed at a nitrogen atmosphere peak temperature of 320 ° C., the AuSn brazing material layer is evenly welded to the alloy lithographic plate, and a large number of them are aligned and connected in a matrix form. 0.035 mm AuSn
A sealing cap having a brazing material formed thereon was obtained. In this embodiment, the outer dimensions of the outer peripheral portion where plating is formed are slightly smaller than the outer dimensions of the cap, and the corners are rounded. Of course, the present invention is not limited to this, but the effect of being able to allow the deviation of the pattern formation by forming in this way,
Also, there is an effect that the brazing material can be prevented from protruding from the cap, and the brazing material can be prevented from leaking at the time of sealing. Then, the surface acoustic wave filter package arranged on the carbon jig at the same pitch as that of the above-mentioned embodiment with the mother sheet stacked so that the AuSn brazing material surface is in contact was inverted upside down, and the peak temperature was 320 ° C. A nitrogen atmosphere heat treatment furnace whose temperature was set so as to be continuously passed through the AuSn brazing filler metal was uniformly fused to the surface acoustic wave filter package. The above-mentioned embodiment is a representative example of the present invention,
Comparative example 1 in which an AuSn layer having a thickness of 0.030 mm was pressure-bonded to the entire surface of one side of the cap, and a separately prepared AuSn foil having a thickness of 0.035 mm was set only on the outer peripheral portion of the one side of the cap and then fused. Table 2 shows the results of comparison of the cap manufacturing cost, the sealing defect rate, and the sealing cost.
Shown in. The cost is shown by relative evaluation when the cost in the example is 100.

【0012】[0012]

【表1】 [Table 1]

【0013】表1から明らかなように、本実施例は、比
較例の1/3〜1/13の低い封止不良率の優れた封止
効果を有しながらキャップ製造コストと封止コストの両
コストを著しく削減できたのである。また、本発明の封
止キャップは、マトリックス状に多数個整列連結された
状態であるため、積層しての梱包が可能となった。マザ
ーシート100枚を積層し、上下に補強用のボール紙を
充て、中性紙で包装した。この包装一包には、キャップ
10万個が梱包されている。梱包の大きさは、200×
300×40mm程度と従来のものと比較し約1/8に小
型化できた。
As is clear from Table 1, this embodiment has a low sealing defect rate of 1/3 to 1/13 of that of the comparative example, and has an excellent sealing effect, while reducing the cap manufacturing cost and sealing cost. Both costs have been significantly reduced. Further, since the sealing cap of the present invention is in a state in which a large number of the sealing caps are aligned and connected in a matrix, it is possible to stack and package the caps. 100 mother sheets were stacked, filled with reinforcing cardboard on the top and bottom, and wrapped with neutral paper. In this one package, 100,000 caps are packed. The size of the package is 200 ×
The size was about 300 x 40 mm, which was about 1/8 the size of the conventional one.

【0014】[0014]

【発明の効果】本発明は、本来必要である部分のみに、
めっき法によりろう材を形成したため、不要部のろう材
が封止時に漏れ出す問題がない。また、ろう材形成面を
キャップ面より下方に凹状に形成すると、封止時にキャ
ップがパッケージ内にはめ込まれるように配置されるた
め、封止信頼性を飛躍的に向上させることができる。さ
らに、キャップを連結部を介してマトリックス状に多数
個整列連結した状態にすると、同一平面で一括処理で
き、個々のキャップとろう材を単体で扱う必要がなく、
封止する際の自動化も容易となり、不良の発生を防止で
きる。また、梱包時や搬送時にも変形や裏返り、位置ず
れの心配、特殊な梱包ケースを用いる必要がなく、まと
めて包装するだけで出荷でき、梱包材の使用量を激減さ
せ、さらに一度に運搬できる部品点数が増大するため、
環境負荷も低減できるという非常に優れた効果を奏す
る。
The present invention can be applied only to the originally necessary parts.
Since the brazing filler metal is formed by the plating method, there is no problem that the brazing filler metal in the unnecessary portion leaks at the time of sealing. Further, when the brazing material forming surface is formed in a concave shape below the cap surface, the cap is arranged so as to be fitted into the package at the time of sealing, so that the sealing reliability can be dramatically improved. Furthermore, if a large number of caps are aligned and connected in a matrix through the connecting portion, they can be processed collectively on the same plane, and there is no need to handle each cap and brazing material individually.
Automation at the time of sealing becomes easy, and the occurrence of defects can be prevented. Also, when packing or transporting, there is no need to worry about deformation, flipping over, misalignment, or using a special packing case, you can ship by simply packaging in a batch, drastically reducing the amount of packing material used, and you can transport it at once Because the number of parts increases,
It has an extremely excellent effect that the environmental load can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】マトリックス状に多数個整列連結した電子素子
パッケージ用封止キャップを示す平面図である。
FIG. 1 is a plan view showing a sealing cap for an electronic device package, in which a large number of matrix-shaped sealing caps are connected.

【図2】封止キャップ及び連結部の断面図である。FIG. 2 is a cross-sectional view of a sealing cap and a connecting portion.

【符号の説明】[Explanation of symbols]

1 マザーシート 2 連結部 3 封止キャップ 4 ろう材 5 境界部 6 外周部 7 金属製平版 8 Niめっき 9 Auめっき 10 パイロットホール 1 mother sheet 2 connection 3 Sealing cap 4 brazing material 5 border 6 outer periphery 7 Metal plate 8 Ni plating 9 Au plating 10 pilot hall

───────────────────────────────────────────────────── フロントページの続き (72)発明者 斉藤 均 東京都稲城市大丸2220番地 日本フイルコ ン株式会社東京事業所内 (72)発明者 斎藤 勇 東京都大田区京浜島2丁目2番11号 株式 会社東電化内 (72)発明者 大竹 康治 東京都大田区京浜島2丁目2番11号 株式 会社東電化内 (72)発明者 川上 義美 東京都大田区京浜島2丁目2番11号 株式 会社東電化内   ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Hitoshi Saito             2220 Daimaru, Inagi-shi, Tokyo Japan Filco             Co., Ltd. Tokyo office (72) Inventor Isamu Saito             2-2-11 Keihinjima, Ota-ku, Tokyo Stocks             Company Todenka (72) Inventor Koji Otake             2-2-11 Keihinjima, Ota-ku, Tokyo Stocks             Company Todenka (72) Inventor Yoshimi Kawakami             2-2-11 Keihinjima, Ota-ku, Tokyo Stocks             Company Todenka

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 金属製平版からなるキャップ片面外周部
にろう材層を形成した電子素子パッケージ用封止キャッ
プにおいて、キャップの片面外周部に、AuとSnとを
含む層をめっき法により形成した層とした電子素子パッ
ケージ用封止キャップ。
1. A sealing cap for an electronic device package, comprising a metal lithographic plate and a brazing material layer formed on the outer peripheral surface of one side of the cap, wherein a layer containing Au and Sn is formed on the outer peripheral side of the one surface of the cap by a plating method. Layered sealing cap for electronic device packages.
【請求項2】 めっき法により形成したAuとSnとを
含む層を加熱処理してキャップ片面外周部に融着したろ
う材層とした、請求項1に記載された電子素子パッケー
ジ用封止キャップ。
2. The sealing cap for an electronic element package according to claim 1, wherein a layer containing Au and Sn formed by a plating method is heat-treated to form a brazing material layer fused to the outer peripheral portion of one surface of the cap. .
【請求項3】 AuとSnとを含む層がAuSn合金を
めっきして形成した層である、請求項1または2のいず
れか1項に記載された電子素子パッケージ用封止キャッ
プ。
3. The sealing cap for an electronic device package according to claim 1, wherein the layer containing Au and Sn is a layer formed by plating an AuSn alloy.
【請求項4】 AuとSnとを含む層がAuまたはAu
Sn合金とSnとを交互にめっきして形成した層であ
る、請求項1または2のいずれか1項に記載された電子
素子パッケージ用封止キャップ。
4. The layer containing Au and Sn is Au or Au.
The sealing cap for an electronic element package according to claim 1, which is a layer formed by alternately plating Sn alloy and Sn.
【請求項5】 キャップ片面外周部のろう材形成面をキ
ャップ面より下方に凹状に形成し、これにろう材層を設
けた、請求項1ないし4のいずれか1項に記載された電
子素子パッケージ用封止キャップ。
5. The electronic element according to claim 1, wherein a brazing material forming surface on the outer peripheral portion of one surface of the cap is formed in a concave shape below the cap surface, and a brazing material layer is provided on the brazing material forming surface. Sealing cap for package.
【請求項6】 キャップを連結部を介してマトリックス
状に多数個整列連結した、請求項1ないし5のいずれか
1項に記載された電子素子パッケージ用封止キャップ。
6. The sealing cap for an electronic device package according to claim 1, wherein a large number of caps are aligned and connected in a matrix form via a connecting portion.
【請求項7】 電子素子パッケージ用封止キャップの製
造方法において、金属製平版の片面に写真製版法により
マトリックス状に多数個整列配置されたキャップ外周部
のパターンを形成し、該パターン形成したキャップ外周
部にAuとSnとからなるろう材層をめっきした後、写
真製版法によりキャップ外形のパターン及びキャップ間
をマトリックス状に多数個整列連結する連結部のパター
ンを形成し、該パターン形成したキャップ及び連結部以
外の部分をエッチングにより除去し、Snの融点以上A
uの融点以下の温度で加熱処理してキャップ外周部にA
uSnろう材を融着させ、外周部にAuSnろう材が融
着された、キャップが連結部を介してマトリックス状に
多数個整列連結された状態に形成することを特徴とする
電子素子パッケージ用封止キャップの製造方法。
7. A method of manufacturing a sealing cap for an electronic device package, wherein a pattern of a plurality of cap outer peripheral portions arranged in a matrix in a matrix is formed on one surface of a metal lithographic plate by a photomechanical process, and the pattern-formed cap is formed. After plating a brazing material layer made of Au and Sn on the outer peripheral portion, a pattern of the outer shape of the cap and a pattern of a connecting portion for aligning and connecting a plurality of caps in a matrix form are formed by a photolithography method, and the cap having the pattern is formed. And a portion other than the connecting portion is removed by etching, and the melting point of Sn or more is A or more.
A heat treatment at a temperature below the melting point of u
A seal for an electronic element package, characterized in that a plurality of caps, in which uSn brazing material is fused and AuSn brazing material is fused on the outer peripheral portion, are formed in a state of being aligned and connected in a matrix form through a connecting portion. Method for manufacturing stop cap.
【請求項8】 請求項6に記載されたマトリックス状に
多数個整列連結された電子素子パッケージ用封止キャッ
プを用い、封止工程または封止工程直前までマトリック
ス状に多数個整列連結された状態を維持して封止を行う
ことを特徴とする電子素子パッケージ用封止キャップを
用いた封止方法。
8. A state in which a plurality of electronic device package sealing caps arranged and connected in a matrix form according to claim 6 are used in a matrix form until a sealing process or immediately before the sealing process. A sealing method using a sealing cap for an electronic device package, characterized in that the sealing is performed while maintaining the above.
JP2001364224A 2001-11-29 2001-11-29 SEALING CAP FOR ELECTRONIC DEVICE PACKAGE, ITS MANUFACTURING METHOD, AND SEALING METHOD USING THE CAP Expired - Fee Related JP3810000B2 (en)

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JP2001364224A JP3810000B2 (en) 2001-11-29 2001-11-29 SEALING CAP FOR ELECTRONIC DEVICE PACKAGE, ITS MANUFACTURING METHOD, AND SEALING METHOD USING THE CAP

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Publication number Priority date Publication date Assignee Title
JP2006100669A (en) * 2004-09-30 2006-04-13 Kyocera Kinseki Corp Case of electronic component
JP2006120915A (en) * 2004-10-22 2006-05-11 Tokuriki Honten Co Ltd Closure material
JP2006287423A (en) * 2005-03-31 2006-10-19 Kyocera Kinseki Corp Piezoelectric device and manufacturing method thereof
JP2008103460A (en) * 2006-10-18 2008-05-01 Sony Corp Semiconductor package and method for manufacturing same
JP2009141194A (en) * 2007-12-07 2009-06-25 Dainippon Printing Co Ltd Metal shield plate for semiconductor device, sheet for metal shield, semiconductor device, manufacturing method of sheet for metal shield, and manufacturing method of metal shield plate
JP2010199600A (en) * 2010-04-12 2010-09-09 Tokuriki Honten Co Ltd Sealing material and method of manufacturing the same
US7842891B2 (en) 2005-01-21 2010-11-30 Citizen Holdings Co. Ltd. Sealing board and method for producing the same
JP2011229114A (en) * 2010-02-22 2011-11-10 Nippon Dempa Kogyo Co Ltd Piezoelectric device and method of manufacturing the same

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006100669A (en) * 2004-09-30 2006-04-13 Kyocera Kinseki Corp Case of electronic component
JP2006120915A (en) * 2004-10-22 2006-05-11 Tokuriki Honten Co Ltd Closure material
JP4636849B2 (en) * 2004-10-22 2011-02-23 株式会社徳力本店 Sealing material
US7842891B2 (en) 2005-01-21 2010-11-30 Citizen Holdings Co. Ltd. Sealing board and method for producing the same
JP2006287423A (en) * 2005-03-31 2006-10-19 Kyocera Kinseki Corp Piezoelectric device and manufacturing method thereof
JP2008103460A (en) * 2006-10-18 2008-05-01 Sony Corp Semiconductor package and method for manufacturing same
JP2009141194A (en) * 2007-12-07 2009-06-25 Dainippon Printing Co Ltd Metal shield plate for semiconductor device, sheet for metal shield, semiconductor device, manufacturing method of sheet for metal shield, and manufacturing method of metal shield plate
JP2011229114A (en) * 2010-02-22 2011-11-10 Nippon Dempa Kogyo Co Ltd Piezoelectric device and method of manufacturing the same
JP2010199600A (en) * 2010-04-12 2010-09-09 Tokuriki Honten Co Ltd Sealing material and method of manufacturing the same

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