JP2003130904A - パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体 - Google Patents

パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体

Info

Publication number
JP2003130904A
JP2003130904A JP2001322787A JP2001322787A JP2003130904A JP 2003130904 A JP2003130904 A JP 2003130904A JP 2001322787 A JP2001322787 A JP 2001322787A JP 2001322787 A JP2001322787 A JP 2001322787A JP 2003130904 A JP2003130904 A JP 2003130904A
Authority
JP
Japan
Prior art keywords
parameter
parameters
correction
port
displaying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001322787A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003130904A5 (enExample
Inventor
Takashi Yamazaki
隆司 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Japan Ltd
Original Assignee
Agilent Technologies Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Japan Ltd filed Critical Agilent Technologies Japan Ltd
Priority to JP2001322787A priority Critical patent/JP2003130904A/ja
Priority to DE60218409T priority patent/DE60218409D1/de
Priority to EP02257253A priority patent/EP1316804B1/en
Priority to AT02257253T priority patent/ATE355532T1/de
Priority to US10/273,986 priority patent/US6909982B2/en
Publication of JP2003130904A publication Critical patent/JP2003130904A/ja
Publication of JP2003130904A5 publication Critical patent/JP2003130904A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP2001322787A 2001-10-19 2001-10-19 パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体 Pending JP2003130904A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2001322787A JP2003130904A (ja) 2001-10-19 2001-10-19 パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体
DE60218409T DE60218409D1 (de) 2001-10-19 2002-10-18 Verfahren zur Anzeige von Kalibrierparametern eines Geräts zum Testen eines Prüflings über Signaltore, und das entsprechende Gerät
EP02257253A EP1316804B1 (en) 2001-10-19 2002-10-18 Method of displaying calibration parameters of an apparatus having ports for testing a device, and corresponding apparatus
AT02257253T ATE355532T1 (de) 2001-10-19 2002-10-18 Verfahren zur anzeige von kalibrierparametern eines geräts zum testen eines prüflings über signaltore, und das entsprechende gerät
US10/273,986 US6909982B2 (en) 2001-10-19 2002-10-18 Display method of parameter correction conditions and recording medium on which program to display parameter correction condition is recorded

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001322787A JP2003130904A (ja) 2001-10-19 2001-10-19 パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体

Publications (2)

Publication Number Publication Date
JP2003130904A true JP2003130904A (ja) 2003-05-08
JP2003130904A5 JP2003130904A5 (enExample) 2005-06-30

Family

ID=19139770

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001322787A Pending JP2003130904A (ja) 2001-10-19 2001-10-19 パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体

Country Status (5)

Country Link
US (1) US6909982B2 (enExample)
EP (1) EP1316804B1 (enExample)
JP (1) JP2003130904A (enExample)
AT (1) ATE355532T1 (enExample)
DE (1) DE60218409D1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7869367B2 (en) * 2005-11-30 2011-01-11 Hewlett-Packard Development Company, L.P. Methods and systems for checking expected network traffic
DE102006008063A1 (de) * 2006-02-21 2007-08-23 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur Darstellung der Messergebnisse eines Netzwerkanalysators mit gleichzeitiger Toleranzanzeige
GB2519946A (en) * 2013-10-29 2015-05-13 Socowave Technologies Ltd Active antenna system and methods of testing
US11190284B2 (en) * 2019-06-20 2021-11-30 Rohde & Schwarz Gmbh & Co. Kg Switching system and method for sequential switching of radio frequency paths
WO2021242967A1 (en) * 2020-05-27 2021-12-02 Stryker Corporation Systems and methods for a user interface for calibrating a load cell
JP7417571B2 (ja) * 2021-11-05 2024-01-18 アンリツ株式会社 移動端末試験装置とそのポート接続方法
CN115356541B (zh) * 2022-07-04 2023-09-05 广东健博通科技股份有限公司 多端口天线散射参数测量方法
CN120686177A (zh) * 2025-08-22 2025-09-23 深圳市万里眼技术有限公司 校准方法、待校准设备、校准装置、校准系统及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
EP0547052B1 (en) * 1990-09-07 1996-03-13 Caterpillar Inc. Adaptive vehicle display
JP2521843B2 (ja) * 1990-10-04 1996-08-07 大日本スクリーン製造株式会社 セットアップパラメ―タ決定特性を修正する方法及び自動セットアップ装置
JPH1141629A (ja) * 1997-07-15 1999-02-12 Minolta Co Ltd 校正パターン表示装置及びこの校正パターン表示装置が適用されるカラー表示装置の表示特性測定装置
US6421624B1 (en) 1999-02-05 2002-07-16 Advantest Corp. Multi-port device analysis apparatus and method and calibration method thereof

Also Published As

Publication number Publication date
EP1316804A2 (en) 2003-06-04
EP1316804B1 (en) 2007-02-28
EP1316804A3 (en) 2004-04-21
US20030076115A1 (en) 2003-04-24
DE60218409D1 (de) 2007-04-12
US6909982B2 (en) 2005-06-21
ATE355532T1 (de) 2006-03-15

Similar Documents

Publication Publication Date Title
US5748506A (en) Calibration technique for a network analyzer
CN1673768B (zh) 校准方法和设备
US9366743B2 (en) Time domain network analyzer
CN103697928B (zh) 一种仪器校准方法及装置
CN106771649A (zh) 一种基于四端口矢量网络分析仪的多端口散射参数测试方法
US10345421B2 (en) Measurement accessory device
CN101932942B (zh) 测定误差的修正方法及电子元器件特性测定装置
JP2008261843A (ja) 自己キャリブレーション装置および方法
JP2003130904A (ja) パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体
US20070241760A1 (en) Method for partial re-calibrating a network analyzer, and a network analyzer
CN114252713A (zh) 裕度测试数据标记和预测预期裕度
US7030625B1 (en) Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurement
US7184911B2 (en) Determination apparatus and method of calibrating the apparatus
JPH11211766A (ja) 自動キャリブレーション装置
US20060210022A1 (en) Apparatus and method for processing acquired signals for arbitrary impedance loads
US11054450B2 (en) Method of calibrating a measurement and analyzing device as well as method of measuring a frequency-converting device under test
US20040249605A1 (en) Network analyzing apparatus and test method
JPWO2005116669A1 (ja) 測定誤差の補正方法及び電子部品特性測定装置
Heuermann et al. Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JP6389354B2 (ja) トータル・ネットワークの特性測定方法及び装置
CN116413533A (zh) 一种应用于模块测试夹具的自动化线损校准方法
GB2256051A (en) Temperature measuring apparatus.
CN106324541A (zh) 一种非插入式器件测量校准方法
JP4449422B2 (ja) 測定誤差の補正方法
JP4478879B2 (ja) 測定誤差の補正方法及び電子部品特性測定装置

Legal Events

Date Code Title Description
A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20040930

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20041015

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20041015

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070914

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20080228