DE60218409D1 - Verfahren zur Anzeige von Kalibrierparametern eines Geräts zum Testen eines Prüflings über Signaltore, und das entsprechende Gerät - Google Patents

Verfahren zur Anzeige von Kalibrierparametern eines Geräts zum Testen eines Prüflings über Signaltore, und das entsprechende Gerät

Info

Publication number
DE60218409D1
DE60218409D1 DE60218409T DE60218409T DE60218409D1 DE 60218409 D1 DE60218409 D1 DE 60218409D1 DE 60218409 T DE60218409 T DE 60218409T DE 60218409 T DE60218409 T DE 60218409T DE 60218409 D1 DE60218409 D1 DE 60218409D1
Authority
DE
Germany
Prior art keywords
testing
ports
under test
calibration parameters
via signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60218409T
Other languages
German (de)
English (en)
Inventor
Takashi Yamasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE60218409D1 publication Critical patent/DE60218409D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
DE60218409T 2001-10-19 2002-10-18 Verfahren zur Anzeige von Kalibrierparametern eines Geräts zum Testen eines Prüflings über Signaltore, und das entsprechende Gerät Expired - Lifetime DE60218409D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001322787A JP2003130904A (ja) 2001-10-19 2001-10-19 パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体

Publications (1)

Publication Number Publication Date
DE60218409D1 true DE60218409D1 (de) 2007-04-12

Family

ID=19139770

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60218409T Expired - Lifetime DE60218409D1 (de) 2001-10-19 2002-10-18 Verfahren zur Anzeige von Kalibrierparametern eines Geräts zum Testen eines Prüflings über Signaltore, und das entsprechende Gerät

Country Status (5)

Country Link
US (1) US6909982B2 (enExample)
EP (1) EP1316804B1 (enExample)
JP (1) JP2003130904A (enExample)
AT (1) ATE355532T1 (enExample)
DE (1) DE60218409D1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7869367B2 (en) * 2005-11-30 2011-01-11 Hewlett-Packard Development Company, L.P. Methods and systems for checking expected network traffic
DE102006008063A1 (de) * 2006-02-21 2007-08-23 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur Darstellung der Messergebnisse eines Netzwerkanalysators mit gleichzeitiger Toleranzanzeige
GB2519946A (en) * 2013-10-29 2015-05-13 Socowave Technologies Ltd Active antenna system and methods of testing
US11190284B2 (en) * 2019-06-20 2021-11-30 Rohde & Schwarz Gmbh & Co. Kg Switching system and method for sequential switching of radio frequency paths
WO2021242967A1 (en) * 2020-05-27 2021-12-02 Stryker Corporation Systems and methods for a user interface for calibrating a load cell
JP7417571B2 (ja) * 2021-11-05 2024-01-18 アンリツ株式会社 移動端末試験装置とそのポート接続方法
CN115356541B (zh) * 2022-07-04 2023-09-05 广东健博通科技股份有限公司 多端口天线散射参数测量方法
CN120686177A (zh) * 2025-08-22 2025-09-23 深圳市万里眼技术有限公司 校准方法、待校准设备、校准装置、校准系统及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
EP0547052B1 (en) * 1990-09-07 1996-03-13 Caterpillar Inc. Adaptive vehicle display
JP2521843B2 (ja) * 1990-10-04 1996-08-07 大日本スクリーン製造株式会社 セットアップパラメ―タ決定特性を修正する方法及び自動セットアップ装置
JPH1141629A (ja) * 1997-07-15 1999-02-12 Minolta Co Ltd 校正パターン表示装置及びこの校正パターン表示装置が適用されるカラー表示装置の表示特性測定装置
US6421624B1 (en) 1999-02-05 2002-07-16 Advantest Corp. Multi-port device analysis apparatus and method and calibration method thereof

Also Published As

Publication number Publication date
EP1316804A2 (en) 2003-06-04
JP2003130904A (ja) 2003-05-08
EP1316804B1 (en) 2007-02-28
EP1316804A3 (en) 2004-04-21
US20030076115A1 (en) 2003-04-24
US6909982B2 (en) 2005-06-21
ATE355532T1 (de) 2006-03-15

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8332 No legal effect for de