DE60002518D1 - Verfahren und Vorrichtung zum adaptiven Lernen von Testfehlern zur Verminderung der Gesamtzahl von Testmessungen erforderlich in Echtzeit - Google Patents

Verfahren und Vorrichtung zum adaptiven Lernen von Testfehlern zur Verminderung der Gesamtzahl von Testmessungen erforderlich in Echtzeit

Info

Publication number
DE60002518D1
DE60002518D1 DE60002518T DE60002518T DE60002518D1 DE 60002518 D1 DE60002518 D1 DE 60002518D1 DE 60002518 T DE60002518 T DE 60002518T DE 60002518 T DE60002518 T DE 60002518T DE 60002518 D1 DE60002518 D1 DE 60002518D1
Authority
DE
Germany
Prior art keywords
measurements
real
time
test
taken
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60002518T
Other languages
English (en)
Other versions
DE60002518T2 (de
Inventor
David T Crook
Steven K List
Stephen P Rozum
Eddie L Williamson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE60002518D1 publication Critical patent/DE60002518D1/de
Application granted granted Critical
Publication of DE60002518T2 publication Critical patent/DE60002518T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DE60002518T 1999-03-01 2000-02-21 Verfahren und Vorrichtung zum adaptiven Lernen von Testfehlern zur Verminderung der Gesamtzahl von Testmessungen erforderlich in Echtzeit Expired - Fee Related DE60002518T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US259609 1994-06-14
US09/259,609 US6324486B1 (en) 1999-03-01 1999-03-01 Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time

Publications (2)

Publication Number Publication Date
DE60002518D1 true DE60002518D1 (de) 2003-06-12
DE60002518T2 DE60002518T2 (de) 2004-03-18

Family

ID=22985627

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60002518T Expired - Fee Related DE60002518T2 (de) 1999-03-01 2000-02-21 Verfahren und Vorrichtung zum adaptiven Lernen von Testfehlern zur Verminderung der Gesamtzahl von Testmessungen erforderlich in Echtzeit

Country Status (4)

Country Link
US (1) US6324486B1 (de)
EP (1) EP1039389B1 (de)
JP (1) JP2000258483A (de)
DE (1) DE60002518T2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7308614B2 (en) 2002-04-30 2007-12-11 Honeywell International Inc. Control sequencing and prognostics health monitoring for digital power conversion and load management
US6850426B2 (en) 2002-04-30 2005-02-01 Honeywell International Inc. Synchronous and bi-directional variable frequency power conversion systems
US20070162446A1 (en) * 2006-01-12 2007-07-12 Appenzeller David P Method of testing a multi-processor unit microprocessor
JP4941164B2 (ja) * 2007-08-09 2012-05-30 横河電機株式会社 基準電圧校正回路及び方法
US8643539B2 (en) * 2008-11-19 2014-02-04 Nokomis, Inc. Advance manufacturing monitoring and diagnostic tool
US9032361B2 (en) * 2011-12-15 2015-05-12 Tata Consultancy Services Limited Agile unit and regression testing framework for domain specific languages
JP5849923B2 (ja) * 2012-10-18 2016-02-03 日本電産リード株式会社 インピーダンス測定装置
US9395268B2 (en) * 2013-07-03 2016-07-19 General Electric Company Method and system to tolerance test a component
CN103592551B (zh) * 2013-11-27 2015-10-14 中国电子科技集团公司第四十一研究所 一种基于状态快照保存、无缝恢复的测量方法
CN104820147A (zh) * 2015-04-23 2015-08-05 中国电子科技集团公司第四十一研究所 一种多维环境应力条件触发处理方法
CN104931825A (zh) * 2015-06-13 2015-09-23 复旦大学 一种用于器件光学和电学测量以及真空监测的集成设备
JP2020003211A (ja) * 2016-09-29 2020-01-09 株式会社村田製作所 容量測定回路及び容量測定システム
US10448864B1 (en) 2017-02-24 2019-10-22 Nokomis, Inc. Apparatus and method to identify and measure gas concentrations
US11489847B1 (en) 2018-02-14 2022-11-01 Nokomis, Inc. System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network
CN110795265B (zh) * 2019-10-25 2021-04-02 东北大学 一种基于乐观容错方法的迭代器

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5202639A (en) 1989-01-09 1993-04-13 Schlumberger Technologies Limited Method and apparatus for testing analogue circuits

Also Published As

Publication number Publication date
EP1039389A1 (de) 2000-09-27
EP1039389B1 (de) 2003-05-07
JP2000258483A (ja) 2000-09-22
DE60002518T2 (de) 2004-03-18
US6324486B1 (en) 2001-11-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee