JP2003130620A - Apparatus for testing shape of object - Google Patents

Apparatus for testing shape of object

Info

Publication number
JP2003130620A
JP2003130620A JP2001327268A JP2001327268A JP2003130620A JP 2003130620 A JP2003130620 A JP 2003130620A JP 2001327268 A JP2001327268 A JP 2001327268A JP 2001327268 A JP2001327268 A JP 2001327268A JP 2003130620 A JP2003130620 A JP 2003130620A
Authority
JP
Japan
Prior art keywords
shape
bump
inspected
image
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001327268A
Other languages
Japanese (ja)
Inventor
Satoru Kitamura
覚 北村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Kokusai Electric Inc
Original Assignee
Hitachi Kokusai Electric Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Kokusai Electric Inc filed Critical Hitachi Kokusai Electric Inc
Priority to JP2001327268A priority Critical patent/JP2003130620A/en
Publication of JP2003130620A publication Critical patent/JP2003130620A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To solve the problems wherein in methods for testing the shape of an object, e.g. the shape of a bump, using conventional techniques, the light cutting method, the laser scanning method and the three-dimensional testing method using conformal points can not test the shape of bump because of placing emphasis on testing the height of bump, or the test method carrying out image processing using a video camera can not test the presence or absence of an abnormal projection on the bump other than the position and size of the bump because of lighting and photographing means. SOLUTION: The apparatus for testing the shape of object, which has an illuminating means that obliquely illuminates the object under test for testing the shape, and which has a photographing means that obliquely photographs the object under test illuminated by the illuminating means in the reverse direction relative to the illumination and outputs picture signals, determines whether the shape of the object under test is good or not using data obtained by digitizing the picture signal inputted from the photographing means.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、物体の形状、たと
えば半導体装置であるLSIを製造するときの基材とな
る、シリコンウエハ上に形成されたバンプの形状良否を
検査するのに最適な物体形状検査装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optimum object for inspecting the shape of an object, for example, the shape of a bump formed on a silicon wafer, which is a base material when manufacturing an LSI which is a semiconductor device. The present invention relates to a shape inspection device.

【0002】[0002]

【従来の技術】一般的に、バンプの形状を検査する従来
の技術としては、共焦点を使用した3次元検査、光切断
方式を使用した検査、レーザスキャン方式を使用した検
査がある。また、バンプの形状の簡易的な検査方法とし
て、直上照明装置及び直上ビデオカメラを使用して、バ
ンプ上方からの映像信号を画像処理して検査を行う方法
がある。
2. Description of the Related Art Generally, as conventional techniques for inspecting the shape of bumps, there are three-dimensional inspection using confocal, inspection using optical cutting method, and inspection using laser scanning method. Further, as a simple method for inspecting the shape of the bump, there is a method of performing an image processing of an image signal from above the bump by using an illumination device directly above and a video camera directly above to perform the inspection.

【0003】[0003]

【発明が解決しようとする課題】上述したように、従来
技術による物体の形状、例えばバンプ形状の検査方法に
は、種々の方法が開発されているが、それぞれの方法に
は、以下のような問題点がある。共焦点を使用した3次
元検査、光切断方式、レーザスキャン方式は、バンプの
高さ検査に重点を置いているためバンプの形状検査が出
来ない。
As described above, various methods have been developed for the method of inspecting the shape of an object, for example, the bump shape according to the prior art, and each method has the following features. There is a problem. The three-dimensional inspection using the confocal point, the optical cutting method, and the laser scanning method focus on the bump height inspection, and therefore cannot perform the bump shape inspection.

【0004】また、ビデオカメラを使用した画像処理に
よる検査方法は、照明及び撮像方法によりバンプの位
置、サイズ以外のバンプ上の異常な突起物有無検査が出
来ないという問題がある。本発明は、これらの問題を解
決し、物体の形状及び、例えばバンプ上の異常な突起物
有無の検査を行うことを目的とする。
Further, the inspection method by image processing using a video camera has a problem in that it is impossible to inspect the presence or absence of an abnormal protrusion on the bump other than the position and size of the bump depending on the illumination and imaging methods. It is an object of the present invention to solve these problems and inspect the shape of an object and the presence or absence of an abnormal protrusion on a bump, for example.

【0005】[0005]

【課題を解決するための手段】前記問題を解決するた
め、本発明の物体形状検査装置は、移動ステージを有
し、被検査物体を移動し、前記被検査物体を斜方より撮
像した映像信号を画像処理することにより前記被検査物
体の形状検査をする装置において、形状の検査対象であ
る前記被検査物体を斜方より照明する照明手段と、該照
明手段により照明された被検査物を照明とは逆の斜方よ
り撮像し、映像信号を出力する撮像手段と、該撮像手段
から入力される前記映像信号をデジタル化したデータを
もちいて、前記被検査物体の形状の良否判定を行うもの
である。
In order to solve the above problems, an object shape inspection apparatus of the present invention has a moving stage, moves an object to be inspected, and obtains an image signal of the object to be inspected obliquely. In an apparatus for inspecting the shape of the object to be inspected by performing image processing on the object to be inspected, the illumination means obliquely illuminating the object to be inspected whose shape is to be inspected, and the object to be inspected illuminated by the illuminating means. An image pickup means for picking up an image in an oblique direction opposite to the above and outputting a video signal, and data for digitizing the video signal inputted from the image pickup means are used to judge the quality of the shape of the inspected object. Is.

【0006】[0006]

【発明の実施の形態】本発明による物体形状検査装置の
形態を実施例により説明する。図1は、本発明による物
体形状検査装置の実施例で、図2はバンプ上に発生した
突起物検査の概念図で、図3は前記検査で得られる、バ
ンプ上に発生した突起物のある場合の画像例を示す。図
1において、1は斜方照明ヘッド、2は照明光源及び電
源、3は斜方ビデオカメラ、4は撮像レンズ、5は画像
処理装置、7はビデオモニタ装置、8はコンピュータ、
9はZ方向移動ステージ、10はθ回転ステージ、11
はXY方向移動ステージ、12はステージドライバ、1
3は被検査物体である。図2において、20は斜方ビデ
オカメラ、21は撮像レンズ、22は斜方照明ヘッド、
23はバンプ上の突起物、24はバンプである。図3に
おいて、30はバンプ撮像画像、31はバンプ上の突
起、32は突起の影である。図1における各構成要素の
補足を以下に説明する。13は形状を検査する被検査物
体、10は載置した被検査物体13を回転方向にアライ
メント補正をすることができるθ回転ステージ、11は
載置した被検査物体13をX軸方向、Y軸方向へ移動さ
せることができるXY方向移動ステージ、3は斜方ビデ
オカメラ、4は被検査物体13の光学像を斜方ビデオカ
メラ3に取り入れる撮像レンズ、9は斜方ビデオカメラ
3及び斜方照明ヘッド1をZ軸方向へ移動することがで
きるZ方向移動ステージ、5は斜方ビデオカメラ3から
入力される映像信号を画像処理し、記憶し、記憶した画
像データをコンピュータ8、ビデオモニタ装置7に出力
する画像処理装置、2は光源及び照明電源装置、8は画
像処理装置5から入力される画像データをもとに検査処
理を行い、検査結果をCRTやプリンタ等へ出力すると
ともに、検査装置全般を制御するコンピュータ、12は
コンピュータ8から制御されXY方向移動ステージ1
1、θ回転ステージ10、Z方向移動ステージ9の移動
を制御駆動するステージドライバ、7は画像処理装置5
から入力される画像を表示するビデオモニタ装置であ
る。物体形状の検査を行うときの動作を説明する。ま
ず、形状を検査する被検査物体13を、XY方向移動ス
テージ11に取り付けられているθ回転ステージ10上
に載置する。つぎに、XY方向移動ステージ11および
Z方向移動ステージ9を移動し、被検査物体13のバン
プを、斜方照明ヘッド1と撮像レンズ4および斜方ビデ
オカメラ3とで構成する撮像系で全範囲にわたって個々
に撮像できるようX軸、Y軸、Z軸の位置決めを行う。
このとき、撮像レンズ4の光源と、斜方照明ヘッド1の
光軸とは被検査物体13上の、例えばバンプ搭載面上で
一致するよう設定する。つぎに、XY方向移動ステージ
11を、あらかじめコンピュータ8に登録した検査座標
情報に従い移動させ、載置してある被検査物体13のバ
ンプを撮像し、順次画像処理装置5に取り込む。図2に
示すバンプ上に発生した突起物検査の概念図において、
バンプ24上に発生した突起23を、斜方照明ヘッド2
2から光を照射して、逆の斜方に配置した斜方ビデオカ
メラ20及び撮像レンズ21にてバンプ24と突起物2
3を撮像した映像信号を図1の画像処理装置5に取り込
む。この取り込んだ画像例を図3に示す。図3のバンプ
撮像画像30において、バンプ上の突起31の画像が明
るくなるのに対して、突起の影32は画像が暗くなる。
この暗くなる突起の影32の部分を検出し、画像が暗く
なる部分が、あらかじめ設定され範囲を超えたバンプに
ついて、不良とする判定処理を行う。
BEST MODE FOR CARRYING OUT THE INVENTION The form of an object shape inspection apparatus according to the present invention will be described by way of examples. 1 is an embodiment of an object shape inspection apparatus according to the present invention, FIG. 2 is a conceptual diagram of an inspection of a protrusion generated on a bump, and FIG. 3 is a diagram showing the protrusion generated on the bump obtained by the inspection. An example of an image in the case is shown. In FIG. 1, 1 is an oblique illumination head, 2 is an illumination light source and power source, 3 is an oblique video camera, 4 is an imaging lens, 5 is an image processing device, 7 is a video monitor device, 8 is a computer,
9 is a Z-direction moving stage, 10 is a θ rotation stage, 11
Is an XY movement stage, 12 is a stage driver, 1
3 is an object to be inspected. In FIG. 2, 20 is an oblique video camera, 21 is an imaging lens, 22 is an oblique illumination head,
Reference numeral 23 is a protrusion on the bump, and 24 is a bump. In FIG. 3, 30 is a bump image, 31 is a protrusion on the bump, and 32 is the shadow of the protrusion. A supplement of each component in FIG. 1 will be described below. Reference numeral 13 denotes an inspected object whose shape is to be inspected, 10 denotes a θ rotary stage capable of performing alignment correction of the mounted inspected object 13 in the rotational direction, and 11 denotes the mounted inspected object 13 in the X-axis direction and the Y-axis. XY movement stage that can be moved in any direction, 3 is an oblique video camera, 4 is an image pickup lens that takes in the optical image of the object 13 to be inspected into the oblique video camera 3, and 9 is the oblique video camera 3 and oblique illumination. The Z-direction moving stage 5 capable of moving the head 1 in the Z-axis direction performs image processing of the video signal input from the oblique video camera 3, stores the image signal, and stores the stored image data in the computer 8 and the video monitor device 7. Image processing device for outputting to a device, 2 is a light source and a lighting power supply device, 8 is an inspection process based on image data input from the image processing device 5, and the inspection result is a CRT, a printer, or the like. And outputs, computer controlling the inspection apparatus in general, 12 XY direction moving stage 1 is controlled from the computer 8
1, a stage driver that controls and drives the movements of the θ rotation stage 10 and the Z-direction moving stage 9, and 7 is an image processing apparatus 5.
It is a video monitor device that displays an image input from the device. The operation when inspecting the object shape will be described. First, the inspected object 13 whose shape is to be inspected is placed on the θ rotary stage 10 attached to the XY direction moving stage 11. Next, the XY-direction moving stage 11 and the Z-direction moving stage 9 are moved, and the bumps of the object 13 to be inspected are covered by the imaging system including the oblique illumination head 1, the imaging lens 4, and the oblique video camera 3. The X-axis, Y-axis, and Z-axis are positioned so that they can be individually imaged.
At this time, the light source of the imaging lens 4 and the optical axis of the oblique illumination head 1 are set to coincide with each other on the inspected object 13, for example, on the bump mounting surface. Next, the XY-direction moving stage 11 is moved in accordance with the inspection coordinate information registered in the computer 8 in advance, the bumps of the mounted inspection object 13 are imaged, and sequentially captured in the image processing device 5. In the conceptual diagram of the inspection of the protrusions generated on the bumps shown in FIG.
The projection 23 generated on the bump 24 is replaced by the oblique lighting head 2
2 is irradiated with light, and the bumps 24 and the protrusions 2 are formed by the oblique video camera 20 and the imaging lens 21 which are arranged in the opposite oblique direction.
A video signal obtained by capturing image 3 is captured by the image processing device 5 in FIG. An example of this captured image is shown in FIG. In the bump captured image 30 of FIG. 3, the image of the projection 31 on the bump becomes bright, whereas the shadow 32 of the projection becomes dark.
A portion of the shadow 32 of the darkening projection is detected, and a determination process is performed to determine that a bump in which the darkening portion of the image exceeds a preset range is defective.

【0007】[0007]

【発明の効果】本発明によれば、斜方照明及び照明とは
逆の斜方ビデオカメラを使用する事により、バンプ上に
発生する突起等の不良が検出可能となる。
According to the present invention, defects such as protrusions generated on bumps can be detected by using an oblique illumination and an oblique video camera which is the reverse of the illumination.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による物体形状検査装置の一例を示す全
体構成図
FIG. 1 is an overall configuration diagram showing an example of an object shape inspection apparatus according to the present invention.

【図2】本発明によるバンプ上に発生した突起物検査の
概念図
FIG. 2 is a conceptual diagram of inspection of a protrusion generated on a bump according to the present invention.

【図3】本発明によるバンプ上に発生した突起の取り込
み画像例
FIG. 3 is an example of a captured image of a protrusion generated on a bump according to the present invention.

【符号の説明】[Explanation of symbols]

1:斜方照明ヘッド、2:照明光源及び電源、3:斜方
ビデオカメラ、4:撮像レンズ、5:画像処理装置、
7:ビテオモニタ装置、8:コンピュータ、9:Z方向
移動ステージ、10:θ回転ステージ、11:XY方向
移動ステージ、12:ステージドライバ、13:被検査
物体、20:斜方ビデオカメラ、21:撮像レンズ、2
2:斜方照明ヘッド 、23:バンプ上の突起、 2
4.バンプ、30:バンプ撮像画像、31:バンプ上の
突起、32:突起の影
1: Oblique illumination head, 2: Illumination light source and power supply, 3: Oblique video camera, 4: Imaging lens, 5: Image processing device,
7: Video monitor device, 8: Computer, 9: Z direction moving stage, 10: θ rotation stage, 11: XY direction moving stage, 12: Stage driver, 13: Inspected object, 20: Oblique video camera, 21: Imaging Lens, 2
2: Oblique illumination head, 23: Protrusion on bump, 2
4. Bump, 30: Bump image, 31: Protrusion on bump, 32: Shadow of protrusion

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 移動ステージを有し、被検査物体を移動
し、前記被検査物体を撮像した映像信号を画像処理する
ことにより前記被検査物体の形状検査をする装置におい
て、形状の検査対象である前記被検査物体を照明する手
段として、検査対象物に対する照射角度が斜方に配置さ
れた照明手段と、該照明手段により照明された被検査物
体を照明とは逆の斜方より撮像し、映像信号を出力する
撮像手段と、該撮像手段から入力される前記映像信号を
デジタル化したデータをもちい、被検査物体の形状良否
判定手段を有する事を特徴とした物体形状検査装置。
1. An apparatus for inspecting a shape of an object to be inspected by moving an object to be inspected and image-processing a video signal of the object to be inspected, which comprises a moving stage, As a means for illuminating a certain object to be inspected, an illumination means in which the irradiation angle with respect to the inspection object is obliquely arranged, and the object to be inspected illuminated by the illuminating means is imaged obliquely in the opposite direction to the illumination, An object shape inspection apparatus comprising an image pickup means for outputting a video signal and data for digitizing the video signal inputted from the image pickup means, and having a shape quality judgment means for the shape of an object to be inspected.
【請求項2】 移動ステージを有し、バンプ(突起電
極)を有するウエハを移動しながら(停止することな
く)、前記ウエハ上のバンプを斜方より撮像した映像信
号を画像処理することにより前記バンプの形状検査をす
る物体形状検査装置において、形状の検査対象である前
記バンプを照明する手段として、それぞれバンプに対す
る照明角度が斜方に配置される光源を有する照明装置
と、該照明装置により照明された被バンプを照明とは逆
の斜方より撮像し、映像信号を出力するビデオカメラ
(例えば高速シャッターテレビカメラ、ラインテレビカ
メラ等)と該ビデオ力メラから入力される前記映像信号
をデジタル化したデータをもちいて、バンプの形状の良
否判定手段を有する事を特徴とした物体形状検査装置。
2. A video signal obtained by obliquely picking up a bump on the wafer is image-processed while moving (without stopping) a wafer having a moving stage and having bumps (projection electrodes). In an object shape inspection device for inspecting the shape of a bump, as a means for illuminating the bump whose shape is to be inspected, an illuminating device having a light source whose illumination angle with respect to the bump is arranged obliquely, and illumination by the illuminating device A video camera (for example, a high-speed shutter TV camera, a line TV camera, etc.) that outputs an image signal of the bumped image picked up from the opposite direction of the illumination and digitizes the image signal input from the video camera. An object shape inspection apparatus characterized by having a quality determination unit for the shape of a bump using the obtained data.
JP2001327268A 2001-10-25 2001-10-25 Apparatus for testing shape of object Pending JP2003130620A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001327268A JP2003130620A (en) 2001-10-25 2001-10-25 Apparatus for testing shape of object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001327268A JP2003130620A (en) 2001-10-25 2001-10-25 Apparatus for testing shape of object

Publications (1)

Publication Number Publication Date
JP2003130620A true JP2003130620A (en) 2003-05-08

Family

ID=19143521

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001327268A Pending JP2003130620A (en) 2001-10-25 2001-10-25 Apparatus for testing shape of object

Country Status (1)

Country Link
JP (1) JP2003130620A (en)

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