JP2003114658A - 表示装置及びその検査方法 - Google Patents

表示装置及びその検査方法

Info

Publication number
JP2003114658A
JP2003114658A JP2001308143A JP2001308143A JP2003114658A JP 2003114658 A JP2003114658 A JP 2003114658A JP 2001308143 A JP2001308143 A JP 2001308143A JP 2001308143 A JP2001308143 A JP 2001308143A JP 2003114658 A JP2003114658 A JP 2003114658A
Authority
JP
Japan
Prior art keywords
signal line
potential
tft
electrode
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001308143A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003114658A5 (enExample
Inventor
Jun Koyama
潤 小山
Yasushi Kubota
靖 久保田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Sharp Corp
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd, Sharp Corp filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2001308143A priority Critical patent/JP2003114658A/ja
Publication of JP2003114658A publication Critical patent/JP2003114658A/ja
Publication of JP2003114658A5 publication Critical patent/JP2003114658A5/ja
Withdrawn legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
JP2001308143A 2001-10-04 2001-10-04 表示装置及びその検査方法 Withdrawn JP2003114658A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001308143A JP2003114658A (ja) 2001-10-04 2001-10-04 表示装置及びその検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001308143A JP2003114658A (ja) 2001-10-04 2001-10-04 表示装置及びその検査方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2007112526A Division JP2007233406A (ja) 2007-04-23 2007-04-23 表示装置

Publications (2)

Publication Number Publication Date
JP2003114658A true JP2003114658A (ja) 2003-04-18
JP2003114658A5 JP2003114658A5 (enExample) 2005-06-09

Family

ID=19127491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001308143A Withdrawn JP2003114658A (ja) 2001-10-04 2001-10-04 表示装置及びその検査方法

Country Status (1)

Country Link
JP (1) JP2003114658A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004199054A (ja) * 2002-12-06 2004-07-15 Semiconductor Energy Lab Co Ltd 画像表示装置およびその検査方法
JP2007192959A (ja) * 2006-01-18 2007-08-02 Sony Corp 表示装置
CN100486395C (zh) * 2005-09-27 2009-05-06 中华映管股份有限公司 应用有源式有机发光二极管阵列的像素电路的方法
US7839372B2 (en) 2004-08-10 2010-11-23 Seiko Epson Corporation Electrooptic apparatus substrate and examining method therefor and electrooptic apparatus and electronic equipment

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004199054A (ja) * 2002-12-06 2004-07-15 Semiconductor Energy Lab Co Ltd 画像表示装置およびその検査方法
US7839372B2 (en) 2004-08-10 2010-11-23 Seiko Epson Corporation Electrooptic apparatus substrate and examining method therefor and electrooptic apparatus and electronic equipment
CN100486395C (zh) * 2005-09-27 2009-05-06 中华映管股份有限公司 应用有源式有机发光二极管阵列的像素电路的方法
JP2007192959A (ja) * 2006-01-18 2007-08-02 Sony Corp 表示装置

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