JP2003057553A5 - - Google Patents
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- Publication number
- JP2003057553A5 JP2003057553A5 JP2001241946A JP2001241946A JP2003057553A5 JP 2003057553 A5 JP2003057553 A5 JP 2003057553A5 JP 2001241946 A JP2001241946 A JP 2001241946A JP 2001241946 A JP2001241946 A JP 2001241946A JP 2003057553 A5 JP2003057553 A5 JP 2003057553A5
- Authority
- JP
- Japan
- Prior art keywords
- correction data
- field curvature
- scanning
- curvature correction
- objective lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001241946A JP2003057553A (ja) | 2001-08-09 | 2001-08-09 | 共焦点走査型顕微鏡 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001241946A JP2003057553A (ja) | 2001-08-09 | 2001-08-09 | 共焦点走査型顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003057553A JP2003057553A (ja) | 2003-02-26 |
| JP2003057553A5 true JP2003057553A5 (https=) | 2005-09-22 |
Family
ID=19072301
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001241946A Pending JP2003057553A (ja) | 2001-08-09 | 2001-08-09 | 共焦点走査型顕微鏡 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2003057553A (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100585449C (zh) * | 2005-01-27 | 2010-01-27 | 伦斯勒理工学院 | 可适应性扫描光学显微镜 |
| CN104661704B (zh) * | 2012-07-18 | 2017-04-12 | 普林斯顿大学托管委员会 | 多量级光谱纳米显微镜 |
| CN106556360A (zh) * | 2015-09-24 | 2017-04-05 | 上海思信科学仪器有限公司 | 一种台阶段差在线测量方法 |
| CN106556344A (zh) * | 2015-09-24 | 2017-04-05 | 上海思信科学仪器有限公司 | 一种共焦划痕在线检测方法 |
| CN106556354A (zh) * | 2015-09-24 | 2017-04-05 | 上海思信科学仪器有限公司 | 3d轮廓在线测量仪 |
| CN106556371A (zh) * | 2015-09-24 | 2017-04-05 | 上海思信科学仪器有限公司 | 表面波纹度、粗糙度在线测量仪 |
| US11523046B2 (en) * | 2019-06-03 | 2022-12-06 | Molecular Devices, Llc | System and method to correct for variation of in-focus plane across a field of view of a microscope objective |
-
2001
- 2001-08-09 JP JP2001241946A patent/JP2003057553A/ja active Pending
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