JP2002543420A5 - - Google Patents

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Publication number
JP2002543420A5
JP2002543420A5 JP2000615593A JP2000615593A JP2002543420A5 JP 2002543420 A5 JP2002543420 A5 JP 2002543420A5 JP 2000615593 A JP2000615593 A JP 2000615593A JP 2000615593 A JP2000615593 A JP 2000615593A JP 2002543420 A5 JP2002543420 A5 JP 2002543420A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000615593A
Other languages
Japanese (ja)
Other versions
JP2002543420A (ja
Filing date
Publication date
Priority claimed from US09/303,409 external-priority patent/US6868371B1/en
Application filed filed Critical
Publication of JP2002543420A publication Critical patent/JP2002543420A/ja
Publication of JP2002543420A5 publication Critical patent/JP2002543420A5/ja
Withdrawn legal-status Critical Current

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JP2000615593A 1999-05-03 2000-04-11 プラスチック成形品の外観欠陥を定量するシステム及び方法 Withdrawn JP2002543420A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/303,409 US6868371B1 (en) 1999-05-03 1999-05-03 System and method to quantify appearance defects in molded plastic parts
US09/303,409 1999-05-03
PCT/US2000/009489 WO2000067004A1 (en) 1999-05-03 2000-04-11 System and method to quantify appearance defects in molded plastic parts

Publications (2)

Publication Number Publication Date
JP2002543420A JP2002543420A (ja) 2002-12-17
JP2002543420A5 true JP2002543420A5 (enExample) 2007-06-14

Family

ID=23171942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000615593A Withdrawn JP2002543420A (ja) 1999-05-03 2000-04-11 プラスチック成形品の外観欠陥を定量するシステム及び方法

Country Status (4)

Country Link
US (1) US6868371B1 (enExample)
EP (1) EP1177430A1 (enExample)
JP (1) JP2002543420A (enExample)
WO (1) WO2000067004A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6825266B2 (en) 2002-12-30 2004-11-30 General Electric Company Polycarbonate molding compositions and articles with improved surface aesthetics
US7230690B2 (en) * 2004-04-06 2007-06-12 Dell Products L.P. Color measurement feature for information handling system enclosure
JP2009271060A (ja) * 2008-04-08 2009-11-19 Dainichiseika Color & Chem Mfg Co Ltd 着色物品の外観評価方法
AT507939B1 (de) * 2009-03-10 2012-02-15 Polymer Competence Ct Leoben Gmbh Verfahren zum automatisierten nachweis eines defektes an einer oberfläche eines formteils
US9075446B2 (en) * 2010-03-15 2015-07-07 Qualcomm Incorporated Method and apparatus for processing and reconstructing data
WO2013063380A2 (en) 2011-10-28 2013-05-02 Ticona Llc System and process for molding polymeric articles while reducing gate blush
KR101837601B1 (ko) * 2016-05-27 2018-03-12 동국실업 주식회사 인몰드 사출용 마스터 시편 및 이를 제작하기 위한 금형

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US4314156A (en) * 1975-06-16 1982-02-02 California Institute Of Technology Automated mass spectrometer analysis system
GB2124968B (en) * 1982-08-06 1985-11-13 Mouldmaking Design Centre Limi Removing sprues from mouldings
US4920385A (en) * 1984-02-14 1990-04-24 Diffracto Ltd. Panel surface flaw inspection
AT391650B (de) * 1987-12-17 1990-11-12 Sticht Walter Anlage zur herstellung von formteilen aus kunststoff
CA2031780C (en) * 1989-12-07 1995-10-17 Thomas Joseph Saloom Method and product for extruding plastic with accent color pattern
JPH04151222A (ja) * 1990-10-15 1992-05-25 Fujitsu Ltd プラスチック筐体構造及びその製造方法及び金型構造
JPH04244487A (ja) 1991-01-31 1992-09-01 Suzuki Motor Corp 電動三輪車のカバー構造
US5220403A (en) * 1991-03-11 1993-06-15 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
US5208648A (en) * 1991-03-11 1993-05-04 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
US6485413B1 (en) * 1991-04-29 2002-11-26 The General Hospital Corporation Methods and apparatus for forward-directed optical scanning instruments
US5149547A (en) * 1991-06-12 1992-09-22 Automotive Plastic Technologies, Inc. Apparatus for multi-cavity injection molding
US5528368A (en) * 1992-03-06 1996-06-18 The United States Of America As Represented By The Department Of Health And Human Services Spectroscopic imaging device employing imaging quality spectral filters
US5541413A (en) * 1992-04-24 1996-07-30 Thiokol Corporation Acousto-optic tunable filter-based surface scanning system and process
JPH0691702A (ja) * 1992-09-14 1994-04-05 Hitachi Ltd 射出成形金型および成形方法
DE4231200C1 (de) * 1992-09-17 1993-12-16 Peguform Werke Gmbh Transportbehälter, insbesondere Flaschenkasten, sowie Verfahren zu seiner Herstellung
US5413814A (en) * 1994-03-15 1995-05-09 Bowen; Robert L. Techniques for coating articles to have the appearance of wood, leather or other naturally occurring materials
US5804117A (en) * 1994-04-05 1998-09-08 Toyoda Gosei Co., Ltd. Molding method for resin articles
GB2288461A (en) 1994-04-07 1995-10-18 Ford Motor Co System for plastics identification
JP3215881B2 (ja) * 1994-05-27 2001-10-09 イーオーエス ゲゼルシャフト ミット ベシュレンクテル ハフツング イレクトロ オプティカル システムズ 鋳込み技術に使用される方法
AU685992B2 (en) 1994-08-06 1998-01-29 Peerless Plastics Packaging Limited Manufacture of moulded plastics articles having incorporated blanks
US5606413A (en) * 1995-01-19 1997-02-25 Northrop Grumman Corporation Real time spectroscopic imaging system and method
AU5330296A (en) 1995-05-02 1996-11-21 Hans Auer Process for producing plastic cards or discs with a printed label on one or both sides
DE19528519A1 (de) 1995-08-03 1997-02-06 Tzn Forschung & Entwicklung Vorrichtung zur Detektion streifenförmiger Oberflächenfehler
DE19544634A1 (de) * 1995-11-30 1997-06-05 Feuerherm Harald Verfahren zum Blasformen von Hohlkörpern aus thermoplastischem Kunststoff
US6045502A (en) * 1996-01-17 2000-04-04 Spectrx, Inc. Analyzing system with disposable calibration device
US5793483A (en) * 1996-02-07 1998-08-11 Visidyne, Inc. Optical measurement system
CA2253710A1 (en) * 1996-04-25 1997-10-30 Spectrametrix Inc. Analyte assay using particulate labels
US6441901B2 (en) * 1996-07-23 2002-08-27 Symyx Technologies, Inc. Optical systems and methods for rapid screening of libraries of different materials
US6002480A (en) * 1997-06-02 1999-12-14 Izatt; Joseph A. Depth-resolved spectroscopic optical coherence tomography
US5859708A (en) * 1997-09-02 1999-01-12 General Electric Company Sensing blend color homogeneity
JP3361735B2 (ja) * 1997-12-01 2003-01-07 セイコーインスツルメンツ株式会社 表面分析装置
US6075608A (en) * 1998-05-11 2000-06-13 General Electric Company Blend segregation detection
US6078398A (en) * 1998-11-09 2000-06-20 General Electric Company Pattern analyzer
US5943127A (en) * 1998-11-09 1999-08-24 General Electric Company Coined line analyzer

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