JP2002525597A - 光学位相検出器 - Google Patents

光学位相検出器

Info

Publication number
JP2002525597A
JP2002525597A JP2000571224A JP2000571224A JP2002525597A JP 2002525597 A JP2002525597 A JP 2002525597A JP 2000571224 A JP2000571224 A JP 2000571224A JP 2000571224 A JP2000571224 A JP 2000571224A JP 2002525597 A JP2002525597 A JP 2002525597A
Authority
JP
Japan
Prior art keywords
optical
phase detector
output
laser
outputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000571224A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002525597A5 (enExample
Inventor
マリオン ルイス
レベッカ ウィルソン
ピーター サンプル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Defence
Original Assignee
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Defence filed Critical UK Secretary of State for Defence
Publication of JP2002525597A publication Critical patent/JP2002525597A/ja
Publication of JP2002525597A5 publication Critical patent/JP2002525597A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/1303—Stabilisation of laser output parameters, e.g. frequency or amplitude by using a passive reference, e.g. absorption cell
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Gyroscopes (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Lasers (AREA)
  • Optical Communication System (AREA)
JP2000571224A 1998-09-22 1999-09-22 光学位相検出器 Pending JP2002525597A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB9820493.6A GB9820493D0 (en) 1998-09-22 1998-09-22 Optical phase detector
GB9820493.6 1998-09-22
PCT/GB1999/003179 WO2000017613A1 (en) 1998-09-22 1999-09-22 Optical phase detector

Publications (2)

Publication Number Publication Date
JP2002525597A true JP2002525597A (ja) 2002-08-13
JP2002525597A5 JP2002525597A5 (enExample) 2006-11-02

Family

ID=10839174

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000571224A Pending JP2002525597A (ja) 1998-09-22 1999-09-22 光学位相検出器

Country Status (11)

Country Link
US (1) US6891149B1 (enExample)
EP (1) EP1116012B1 (enExample)
JP (1) JP2002525597A (enExample)
KR (1) KR20010075299A (enExample)
CN (1) CN1328637A (enExample)
AT (1) ATE254759T1 (enExample)
AU (1) AU755090B2 (enExample)
CA (1) CA2343780C (enExample)
DE (1) DE69912969T2 (enExample)
GB (1) GB9820493D0 (enExample)
WO (1) WO2000017613A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011118360A (ja) * 2009-12-01 2011-06-16 Fujitsu Ltd 変調器をモニタする装置および方法
JP2020079980A (ja) * 2018-11-12 2020-05-28 日本電信電話株式会社 光偏微分演算装置および光ニューラルネットワーク

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US7027675B2 (en) * 2003-09-16 2006-04-11 Hrl Laboratories, Llc Frequency tuning of photonic oscillator using amplifier bias voltage
KR100584433B1 (ko) * 2003-11-25 2006-05-26 삼성전자주식회사 차등 편광 변조 방식의 광전송 시스템
US7321018B2 (en) * 2003-12-23 2008-01-22 3M Innovative Properties Company Compositions for aqueous delivery of fluorinated oligomeric silanes
JP4789460B2 (ja) * 2004-12-22 2011-10-12 株式会社アドバンテスト 光スイッチ及び光試験装置
CA2491700A1 (en) * 2004-12-24 2006-06-24 Dicos Technologies Inc. High coherence frequency stabilized semiconductor laser
US7176447B2 (en) * 2005-03-08 2007-02-13 Agilent Technologies, Inc. Electro-optic delay line frequency discriminator
JP4645655B2 (ja) * 2008-02-04 2011-03-09 富士ゼロックス株式会社 光伝送モジュール
FR2939211B1 (fr) * 2008-11-28 2010-12-17 Thales Sa Dispositif opto-electronique de discrimination de frequence, accordable en frequence
US8009940B2 (en) * 2009-03-30 2011-08-30 Infinera Corporation Photonic integrated circuit with improved signal quality and electrostatic discharge threshold
CN102129133B (zh) * 2010-01-12 2014-04-16 上海微电子装备有限公司 具有频率状态反馈功能的电光相位调制器
CN102193028B (zh) * 2010-03-05 2013-09-11 上海微电子装备有限公司 一种电光相位调制器谐振频率检测装置及检测方法
CN102279477B (zh) * 2010-06-09 2013-05-22 上海微电子装备有限公司 具有自动调整谐振频率功能的电光相位调制器
KR101123336B1 (ko) * 2010-12-30 2012-03-27 주식회사 스마트비전 광학 기반의 감지 신호 생성 장치 및 이를 포함하는 감지 신호 생성 시스템
KR101123337B1 (ko) * 2011-08-26 2012-03-27 주식회사 스마트비전 광학 기반의 감지 신호 생성 장치 및 이를 포함하는 감지 신호 생성 시스템
WO2013148757A1 (en) * 2012-03-29 2013-10-03 Imra America, Inc. Methods for precision optical frequency synthesis and molecular detection
CN103063240B (zh) * 2012-12-21 2015-04-22 新疆美特智能安全工程股份有限公司 一种基于相位载波技术的光纤传感装置
US9088369B2 (en) 2012-12-28 2015-07-21 Synergy Microwave Corporation Self injection locked phase locked looped optoelectronic oscillator
FR3002654A1 (fr) * 2013-02-26 2014-08-29 St Microelectronics Sa Modulateur optique avec correction de polarisation automatique
US9094133B2 (en) * 2013-03-12 2015-07-28 Synergy Microwave Corporation Integrated production of self injection locked self phase loop locked optoelectronic oscillator
US9288557B2 (en) * 2013-05-01 2016-03-15 The United States Of America As Represented By The Secretary Of The Army Method and apparatus for analyzing the spectrum of radio-frequency signals using unamplified fiber optic recirculation loops
KR101527601B1 (ko) * 2013-12-12 2015-06-09 한국광기술원 위상광 측정 시스템과 그 측정방법
KR101796443B1 (ko) 2014-06-10 2017-11-10 한국광기술원 위상광 측정 시스템
US9212912B1 (en) 2014-10-24 2015-12-15 Honeywell International Inc. Ring laser gyroscope on a chip with doppler-broadened gain medium
US10429244B2 (en) * 2015-03-25 2019-10-01 Nec Corporation Light measurement device
CN107894204B (zh) * 2016-10-04 2020-02-21 财团法人工业技术研究院 干涉仪及其成像方法
RU2743933C1 (ru) 2017-08-01 2021-03-01 ЗОИТИС СЕРВИСЕЗ ЭлЭлСи Устройство для анализа среды и соответствующие устройство и способ для идентификации яиц
CN107332611B (zh) * 2017-08-04 2023-05-12 中国电子科技集团公司第三十四研究所 一种数字信号控制的光纤相位补偿器及补偿方法
CN107302399B (zh) * 2017-08-04 2023-05-12 中国电子科技集团公司第三十四研究所 一种模数混合控制的光纤相位补偿器及补偿方法
US10627496B2 (en) * 2017-08-24 2020-04-21 Toyota Motor Engineering & Manufacturing North America, Inc. Photonics integrated phase measurement
US11005178B2 (en) * 2017-11-21 2021-05-11 Phase Sensitive Innovations, Inc. Antenna and antenna array configurations, antenna systems and related methods of operation
CN109211356B (zh) * 2018-11-09 2023-10-10 珠海任驰光电科技有限公司 一种基于移频技术的光纤干涉水位传感器及传感方法
EP3965300A1 (en) * 2020-09-02 2022-03-09 Imec VZW Driver circuit for driving a voltage controlled electro-optical modulator and system thereof
CN114285479B (zh) * 2021-11-29 2023-05-05 北京印刷学院 一种32倍频毫米波及太赫兹波的光子生成方法
CN114252867B (zh) * 2022-02-28 2022-05-20 深圳市海创光学有限公司 激光雷达光源及其重复频率切换方法
CN115498490A (zh) * 2022-10-14 2022-12-20 中国科学院上海光学精密机械研究所 中心频率大范围快速调谐的光纤激光器
CN117367400B (zh) * 2023-12-04 2024-03-05 江西驰宇光电科技发展有限公司 基于谐振腔程长调节的激光稳频方法及激光陀螺

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JPH0378335A (ja) * 1989-08-21 1991-04-03 Nippon Telegr & Teleph Corp <Ntt> 光ｆｓｋ周波数偏移安定化回路
JPH04335589A (ja) * 1991-05-10 1992-11-24 Nec Corp 光周波数偏移量安定化装置
JPH0595153A (ja) * 1991-10-01 1993-04-16 Nippon Telegr & Teleph Corp <Ntt> 光ｆｓｋ周波数偏移安定化回路
JPH05503999A (ja) * 1990-02-08 1993-06-24 ハーモニック・ライトウェイブズ・インコーポレイテッド ハイブリッドシステムを使用する光波偏光決定
JPH05327105A (ja) * 1992-05-20 1993-12-10 Topcon Corp 波長安定化光源装置
DE4224744A1 (de) * 1992-07-27 1994-02-03 Abb Research Ltd Vorrichtung zur Detektion loser Metallteilchen in gasisolierten Hochspannungs-Schaltanlagen
JPH09252283A (ja) * 1996-03-14 1997-09-22 Nippon Telegr & Teleph Corp <Ntt> 波長監視装置

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JPH0378335A (ja) * 1989-08-21 1991-04-03 Nippon Telegr & Teleph Corp <Ntt> 光ｆｓｋ周波数偏移安定化回路
JPH05503999A (ja) * 1990-02-08 1993-06-24 ハーモニック・ライトウェイブズ・インコーポレイテッド ハイブリッドシステムを使用する光波偏光決定
JPH04335589A (ja) * 1991-05-10 1992-11-24 Nec Corp 光周波数偏移量安定化装置
JPH0595153A (ja) * 1991-10-01 1993-04-16 Nippon Telegr & Teleph Corp <Ntt> 光ｆｓｋ周波数偏移安定化回路
JPH05327105A (ja) * 1992-05-20 1993-12-10 Topcon Corp 波長安定化光源装置
DE4224744A1 (de) * 1992-07-27 1994-02-03 Abb Research Ltd Vorrichtung zur Detektion loser Metallteilchen in gasisolierten Hochspannungs-Schaltanlagen
JPH09252283A (ja) * 1996-03-14 1997-09-22 Nippon Telegr & Teleph Corp <Ntt> 波長監視装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011118360A (ja) * 2009-12-01 2011-06-16 Fujitsu Ltd 変調器をモニタする装置および方法
US8761613B2 (en) 2009-12-01 2014-06-24 Fujitsu Limited External modulator monitoring device and external modulator monitoring method
JP2014160269A (ja) * 2009-12-01 2014-09-04 Fujitsu Ltd 外部変調器を制御する装置および方法
JP2020079980A (ja) * 2018-11-12 2020-05-28 日本電信電話株式会社 光偏微分演算装置および光ニューラルネットワーク
JP7103602B2 (ja) 2018-11-12 2022-07-20 日本電信電話株式会社 光偏微分演算装置および光ニューラルネットワーク

Also Published As

Publication number Publication date
US6891149B1 (en) 2005-05-10
DE69912969D1 (de) 2003-12-24
DE69912969T2 (de) 2004-09-02
KR20010075299A (ko) 2001-08-09
CN1328637A (zh) 2001-12-26
CA2343780A1 (en) 2000-03-30
CA2343780C (en) 2008-06-17
ATE254759T1 (de) 2003-12-15
AU755090B2 (en) 2002-12-05
WO2000017613A1 (en) 2000-03-30
EP1116012B1 (en) 2003-11-19
EP1116012A1 (en) 2001-07-18
GB9820493D0 (en) 1998-11-11
AU6212899A (en) 2000-04-10

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