JP2002328105A - X-ray analyzer improved in sealability for spare vacuum chamber - Google Patents

X-ray analyzer improved in sealability for spare vacuum chamber

Info

Publication number
JP2002328105A
JP2002328105A JP2001279349A JP2001279349A JP2002328105A JP 2002328105 A JP2002328105 A JP 2002328105A JP 2001279349 A JP2001279349 A JP 2001279349A JP 2001279349 A JP2001279349 A JP 2001279349A JP 2002328105 A JP2002328105 A JP 2002328105A
Authority
JP
Japan
Prior art keywords
sample
seal portion
ray analyzer
cup
vacuum chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001279349A
Other languages
Japanese (ja)
Other versions
JP3600848B2 (en
Inventor
Hiroshi Sumii
弘諮 住居
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp filed Critical Rigaku Industrial Corp
Priority to JP2001279349A priority Critical patent/JP3600848B2/en
Publication of JP2002328105A publication Critical patent/JP2002328105A/en
Application granted granted Critical
Publication of JP3600848B2 publication Critical patent/JP3600848B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To prolong a span for maintenance.inspection work and to realize efficient analytical work, by restraining deposit of a separated material separated from a sample S on a seal part 14 of a sample cup 10 for forming one portion of a spare chamber 3. SOLUTION: This X-ray analyzer 1 faced with the sample cup 10 for holding a sample holder H filled with the sample S, and for forming the one portion of the spare vacuum chamber 3 in a sample carrying-in port 22 is provided with a shielding member 9 for covering the seal part 14 in an upper end of the sample cup 10 and for preventing the separated material separated from the sample S from being deposited on the seal part 14.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、予備真空室の一部
を形成する試料カップのシール部に試料からの離脱物が
付着するのを防止して、シール性を改善したX線分析装
置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray analyzer having improved sealability by preventing the detached material from a sample from adhering to a seal portion of a sample cup forming a part of a preliminary vacuum chamber. Things.

【0002】[0002]

【従来の技術】従来から、蛍光X線分析装置には、無人
化や自動化および省力化のために試料装填機を付設する
ことが行われている。この試料装填機は、試料カップ
と、これに収納される試料ホルダとを備え、このホルダ
に試料調製機で調製された試料を装填する。そして、試
料の装填後に、試料カップの全体をX線分析装置の分析
室に運び、試料カップに設けたシール部を、分析室にお
けるシャッタを有する受部に押し当てて、これら分析室
の受部と試料カップとにより形成される予備真空室を気
密に保持した状態で、この予備真空室を分析室と同一真
空度となるように真空ポンプで排気した後、受部のシャ
ッタを開いて前記ホルダに装填された試料を分析室内に
露出させ、X線を試料に照射して分析する。
2. Description of the Related Art Conventionally, an X-ray fluorescence spectrometer has been provided with a sample loading machine for unmanned operation, automation and labor saving. This sample loading machine includes a sample cup and a sample holder stored therein, and loads a sample prepared by the sample preparation machine into this holder. After the sample is loaded, the entire sample cup is carried to the analysis room of the X-ray analyzer, and the seal provided on the sample cup is pressed against a receiving portion having a shutter in the analysis room, and the receiving portions of these analysis chambers are pressed. In a state in which the preliminary vacuum chamber formed by the sample chamber and the preliminary vacuum chamber is kept airtight, the preliminary vacuum chamber is evacuated by a vacuum pump so as to have the same degree of vacuum as the analysis chamber. The sample loaded in is exposed to the analysis chamber, and the sample is irradiated with X-rays for analysis.

【0003】[0003]

【発明が解決しようとする課題】ところで、試料がイン
ゴット、ガラス、セメントまたはスラグなどの粉体を固
めたブリケットのような割れ易くて粉塵が飛散し易い場
合、この試料を前記試料ホルダに装填するとき、前記試
料カップのシール部に試料からの離脱物が付着し易く
て、この付着した離脱物によるシール不良のために、試
料分析時の真空不良が生じることがある。従って、離脱
物を取り除くために、試料カップの清掃などの保守・点
検作業を短いスパンで行う必要があった。また、試料装
填機はX線分析装置の内部(X線を遮断するための外装
パネル内)に設けられるため、前記試料カップの保守・
点検作業は、一旦X線源をオフしてX線を遮断し、X線
分析装置の外装パネルを開いて、装置内で行う必要があ
る。しかし、一旦X線を遮断すると、作業終了後にX線
をオンしてX線強度が安定するまで時間を要する。さら
に、外装パネルを開くと分析室内の恒温状態が破壊さ
れ、作業終了後、外装パネルを閉じて、その恒温状態が
安定するまで、さらに時間を要する等、作業に手間と時
間を要し、分析作業を遅延させる問題があった。
If the sample is easily broken such as briquette obtained by solidifying powder such as ingot, glass, cement or slag and dust is easily scattered, the sample is loaded into the sample holder. At this time, the detached material from the sample easily adheres to the seal portion of the sample cup, and a defective vacuum may occur during sample analysis due to poor sealing due to the attached detached material. Therefore, in order to remove the detached material, it is necessary to perform maintenance and inspection work such as cleaning of the sample cup in a short span. In addition, since the sample loader is provided inside the X-ray analyzer (in the outer panel for blocking X-rays), the maintenance and maintenance of the sample cup is performed.
Inspection work needs to be performed inside the X-ray analyzer by turning off the X-ray source and shutting off the X-ray, opening the outer panel of the X-ray analyzer. However, once the X-rays are cut off, it takes time until the X-rays are turned on after the operation is completed and the X-ray intensity is stabilized. Furthermore, opening the outer panel destroys the constant temperature state in the analysis chamber, and after the work is completed, closes the outer panel and takes more time until the constant temperature state stabilizes. There was a problem that delayed work.

【0004】本発明は、このような課題を解決して、予
備真空室の一部を形成する試料カップのシール部に試料
からの離脱物が付着するのを抑制して予備真空室のシー
ル性を高く維持し、清掃などの保守・点検作業のスパン
を長期化できて、分析作業の効率化が図れるX線分析装
置を提供することを目的としている。
SUMMARY OF THE INVENTION The present invention solves such a problem and suppresses the detachment from the sample from adhering to the seal portion of the sample cup forming a part of the preliminary vacuum chamber, thereby improving the sealing performance of the preliminary vacuum chamber. It is an object of the present invention to provide an X-ray analyzer capable of maintaining a high level, maintaining a long span of maintenance and inspection work such as cleaning, and improving the efficiency of analysis work.

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
に、本発明のX線分析装置は、試料搬入口に、試料が装
填される試料ホルダを保持し、かつX線分析装置内の予
備真空室の一部を形成する試料カップを臨ませるX線分
析装置であって、前記試料カップの上端のシール部を覆
い、試料からの離脱物が前記シール部に付着するのを防
止する遮蔽部材を備えている。
In order to achieve the above object, an X-ray analyzer of the present invention has a sample holder in which a sample is loaded at a sample carry-in port, and a preliminary holder in the X-ray analyzer. An X-ray analyzer that faces a sample cup forming a part of a vacuum chamber, wherein the shielding member covers a seal portion at an upper end of the sample cup and prevents a substance detached from a sample from adhering to the seal portion. It has.

【0006】この構成によると、前記試料カップの上端
に設けたシール部が遮蔽部材により覆われているので、
試料からの離脱物が前記シール部に付着するのが抑制さ
れる。このため、試料カップの清掃などの保守・点検作
業のスパンを長期化して分析作業の効率化が図れる。
According to this structure, the seal provided at the upper end of the sample cup is covered by the shielding member.
The detached material from the sample is prevented from adhering to the seal portion. For this reason, the span of maintenance / inspection work such as cleaning of the sample cup is lengthened, and the efficiency of the analysis work can be improved.

【0007】本発明の好ましい実施形態では、前記遮蔽
部材が、前記シール部に内周側から対向する周壁部と、
前記シール部に上側から対向する上壁部とを有する断面
L形状に形成されている。この構成によれば、前記試料
カップへの試料の装填時に、この試料からの離脱物がシ
ール部に付着するのが効果的に抑制される。
In a preferred embodiment of the present invention, the shielding member includes a peripheral wall portion facing the seal portion from an inner peripheral side,
It is formed in an L-shaped cross section having an upper wall portion facing the seal portion from above. According to this configuration, at the time of loading the sample into the sample cup, the detachment from the sample is effectively suppressed from adhering to the seal portion.

【0008】また、本発明の好ましい実施形態では、さ
らに、前記シール部と、このシール部の上方に隣接する
隣接部材との間の空間を減圧するか、またはこの空間に
高圧空気を吹き込んで、この空間内に前記離脱物が侵入
するのを防止する手段を備えている。この構成によれ
ば、前記試料カップへの試料の装填時に、この試料から
の離脱物がシール部に付着するのがより効果的に抑制さ
れる。
In a preferred embodiment of the present invention, the space between the seal portion and an adjacent member adjacent above the seal portion is decompressed, or high-pressure air is blown into this space. Means are provided for preventing the detached material from entering the space. According to this configuration, at the time of loading the sample into the sample cup, the detachment from the sample is more effectively suppressed from adhering to the seal portion.

【0009】本発明の好ましい実施形態では、さらに、
前記の試料搬入口に配置されて、X線分析装置内の予備
真空室の一部を形成する試料カップに収納された試料ホ
ルダに試料を装填する試料装填機を備え、前記試料装填
機が、前記試料を試料ホルダまで搬送する搬送手段と、
前記試料ホルダから試料を搬出する搬出手段とを備えて
いる。この構成によれば、試料が試料カップに収納され
る際に発生し易い離脱物が前記シール部に付着するのを
抑制できる。
In a preferred embodiment of the present invention,
A sample loading machine that is arranged at the sample loading port and loads a sample into a sample holder housed in a sample cup forming a part of a preliminary vacuum chamber in the X-ray analyzer, wherein the sample loading machine is Transport means for transporting the sample to a sample holder,
And an unloading means for unloading the sample from the sample holder. According to this configuration, it is possible to suppress the detachment that is likely to occur when the sample is stored in the sample cup from adhering to the seal portion.

【0010】[0010]

【発明の実施の形態】以下、本発明の実施形態を図面に
基づいて説明する。図1は、試料装填機を備えた蛍光X
線分析装置の概略を示す縦断面図である。この蛍光X線
分析装置1は、装置全体を覆う外装パネル1Aの内部に
分析室2を有し、外装パネル1Aに試料搬入口22が設
けられている。この搬入口22から前記分析室2で分析
される試料の搬入作業と分析済み試料の外部への取出作
業が行われる。試料搬入口22の外側には、試料を試料
搬入口22に搬入して、この搬入口22に臨む後述する
試料カップ10に装填する試料装填機20が配置されて
いる。外装パネル1A内で試料搬入口22の下側には、
試料カップ10を試料搬入口22と分析室2との間で搬
送する搬送装置40が設けられている。この搬送装置4
0は、図示しない昇降機と直線移送機とで構成されてい
る公知のものである。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 shows a fluorescent X with a sample loader.
It is a longitudinal section showing the outline of a line analyzer. The X-ray fluorescence spectrometer 1 has an analysis chamber 2 inside an exterior panel 1A that covers the entire apparatus, and a sample carrying port 22 is provided in the exterior panel 1A. The work of carrying in the sample to be analyzed in the analysis chamber 2 and the work of taking out the analyzed sample to the outside from the carry-in port 22 are performed. A sample loading machine 20 for loading a sample into the sample loading port 22 and loading it into a sample cup 10 described later facing the loading port 22 is disposed outside the sample loading port 22. Below the sample loading port 22 in the exterior panel 1A,
A transport device 40 for transporting the sample cup 10 between the sample entrance 22 and the analysis chamber 2 is provided. This transport device 4
Numeral 0 is a well-known device constituted by an elevator (not shown) and a linear transfer device.

【0011】図2は、前記分析室2に試料カップ10に
収納された試料ホルダHをセットして試料分析を行うと
きの状態を示す断面図である。同図のように、前記分析
室2の下方には、予備真空室3の外周を形成する筒状の
周壁4が、分析室下壁5に固定または一体形成されてい
る。分析室2の上壁にはX線を試料Sに照射するX線管
6が取り付けられ、分析室2と周壁4の内部との間の連
通口5aには、図示しない駆動機構によって回動もしく
は直線移動して連通口5aを開閉するシャッタ8が設け
られている。前記分析室2には前記X線管6のほかに、
図示しない分光器や検出器などが配置されており、所定
の真空度に保たれた分析室2内の試料SにX線管6から
X線を照射し、試料Sから発生する蛍光X線を分光器で
分光して、分光した蛍光X線の強度を検出器で測定し、
試料Sを分析する。
FIG. 2 is a sectional view showing a state in which a sample holder H housed in a sample cup 10 is set in the analysis chamber 2 and a sample analysis is performed. As shown in the figure, a cylindrical peripheral wall 4 that forms the outer periphery of the preliminary vacuum chamber 3 is fixed or integrally formed with the lower wall 5 of the analysis chamber below the analysis chamber 2. An X-ray tube 6 for irradiating the sample S with X-rays is attached to the upper wall of the analysis chamber 2, and a communication port 5 a between the analysis chamber 2 and the inside of the peripheral wall 4 is rotated or driven by a drive mechanism (not shown). A shutter 8 that moves linearly to open and close the communication port 5a is provided. In the analysis room 2, besides the X-ray tube 6,
A spectroscope, a detector, and the like (not shown) are provided, and the sample S in the analysis chamber 2 maintained at a predetermined degree of vacuum is irradiated with X-rays from the X-ray tube 6 to generate fluorescent X-rays generated from the sample S. Spectroscopy is performed and the intensity of the separated fluorescent X-rays is measured with a detector.
The sample S is analyzed.

【0012】図3は、前記試料ホルダHに試料装填機2
0により試料Sを装填するときの状態を示す断面図であ
る。同図のように、前記試料ホルダHは、試料カップ1
0側に支持される下皿71と、これに立設された複数の
支柱72と、この支柱72の上端に固定された上皿73
と、前記支柱72に上下動自由に支持されて、各皿7
1,73の間で上下動する試料Sの受皿74と、この受
皿74に上方に向かう弾性力を付加するコイルスプリン
グ75とを備えている。前記上皿73には試料Sを受け
入れる受孔76が形成され、この上皿73の上部には、
試料Sの突出を押さえ、試料Sの上面の一部(分析面)
を露出させる孔77aを形成したマスク77が装着され
ている。
FIG. 3 shows a sample loading machine 2 mounted on the sample holder H.
FIG. 9 is a cross-sectional view showing a state when a sample S is loaded according to 0. As shown in the figure, the sample holder H is a sample cup 1
A lower plate 71 supported on the 0 side, a plurality of columns 72 erected on the lower plate 71, and an upper plate 73 fixed to the upper end of the column 72
Supported vertically by the support column 72,
The tray includes a tray 74 for the sample S that moves up and down between the trays 1 and 73, and a coil spring 75 that applies an upward elastic force to the tray 74. A receiving hole 76 for receiving the sample S is formed in the upper plate 73.
A part of the upper surface of the sample S (analysis surface) is held down by suppressing the protrusion of the sample S.
A mask 77 having a hole 77a for exposing the mask 77 is mounted.

【0013】前記受皿74に試料Sを装填するときに
は、搬送装置40に設けた昇降台41により試料カップ
10の全体が上方に持ち上げられ、試料カップ10の位
置決めが行われれ、この試料カップ10の上面側が後述
する可動リング98の下面に当接される。また、試料カ
ップ10に支持される試料ホルダHは、前記遮蔽部材9
の内側から上方に突出されて、この突出状態で前記受皿
74への試料Sの装填が行われる。
When the sample S is loaded into the receiving tray 74, the whole of the sample cup 10 is lifted upward by the elevating table 41 provided in the transfer device 40, and the positioning of the sample cup 10 is performed. The side contacts the lower surface of a movable ring 98 described later. The sample holder H supported by the sample cup 10 is provided with the shielding member 9.
Then, the sample S is loaded into the tray 74 in this protruding state.

【0014】前記試料ホルダHを支持する試料カップ1
0は、搬送装置40に載置されて昇降機により昇降され
る昇降台41に着脱自在に取付けられ、試料分析時に
は、図2のように、試料カップ10の上端部が前記分析
室2の周壁4の下端開口部44の周縁部に押し当てられ
て、周壁4とともに予備真空室3を形成する。また、前
記試料カップ10のカップ本体11には、図3に示す試
料ホルダHの下皿71が載置される試料テーブル12
と、この試料テーブル12に上方へのばね力を付加する
第1ばね体13が設けられている。この第1ばね体13
は、試料分析時に前記テーブル12を介して試料ホルダ
Hの全体を上方に付勢させ、その上皿73を、図2の予
備真空室3の周壁4に軸受78を介して回転自在に支持
された試料ホルダ押え79に押し当てて、試料Sを分析
室2内に臨ませる。
A sample cup 1 for supporting the sample holder H
Numeral 0 is removably attached to a lifting table 41 which is placed on a transport device 40 and raised and lowered by an elevator. During sample analysis, the upper end of the sample cup 10 is connected to the peripheral wall 4 of the analysis chamber 2 as shown in FIG. To form a preliminary vacuum chamber 3 together with the peripheral wall 4. A sample table 12 on which a lower plate 71 of a sample holder H shown in FIG.
And a first spring 13 for applying an upward spring force to the sample table 12. This first spring body 13
2 urges the entire sample holder H upward through the table 12 during sample analysis, and the upper plate 73 is rotatably supported on the peripheral wall 4 of the preliminary vacuum chamber 3 in FIG. The sample S is pressed against the sample holder holder 79 so that the sample S faces the analysis chamber 2.

【0015】図3に示すように、前記カップ本体11
は、有底円筒形の大径受け部11aと、その下方に設け
られて前記昇降台41に挿入支持される小径首部11b
と、前記大径受け部11aの内側に同心状に形成された
筒部11cとを有している。前記受け部11aの上方外
周部には環状溝11dが形成され、この環状溝11dに
ゴムパッキンからなるシール部14が取り付けられてい
る。このシール部14は、試料分析時に、図2の周壁4
の下端開口部44の周縁部下面に押し当てられて、この
周壁4と試料カップ10とで形成される予備真空室3の
内部を外部に対して気密に保持する。
As shown in FIG. 3, the cup body 11
Is a cylindrical large-diameter receiving portion 11a having a bottom, and a small-diameter neck portion 11b provided therebelow and inserted and supported by the lift table 41.
And a cylindrical portion 11c formed concentrically inside the large-diameter receiving portion 11a. An annular groove 11d is formed in an upper outer peripheral portion of the receiving portion 11a, and a seal portion 14 made of rubber packing is attached to the annular groove 11d. When the sample is analyzed, the seal portion 14
Of the preliminary vacuum chamber 3 formed by the peripheral wall 4 and the sample cup 10 so as to be kept airtight to the outside.

【0016】図3の前記環状溝11e内の受け部11a
側には、この環状溝11eの底面から受け部11aの上
端にまで延びる内装材17が設けられている。
A receiving portion 11a in the annular groove 11e shown in FIG.
On the side, an interior material 17 extending from the bottom surface of the annular groove 11e to the upper end of the receiving portion 11a is provided.

【0017】前記試料テーブル12は、試料ホルダHの
下皿71とほぼ同一外径の円形とされ、前記搬送装置4
0の昇降台41の下面に取り付けた、スピン用モータ4
2により、その駆動軸43を介して回転され、この試料
テーブル12に載置された試料ホルダH、つまり試料S
を回転させながらX線分析を行なわせる。
The sample table 12 has a circular shape having substantially the same outer diameter as the lower plate 71 of the sample holder H.
Motor 4 attached to the lower surface of the lifting platform 41
2, the sample holder H is rotated via the drive shaft 43 and is placed on the sample table 12, that is, the sample S
X-ray analysis is performed while rotating.

【0018】前記予備真空室3は、図2のように、その
周壁4に形成された連通孔45を介して真空ポンプ46
に連結されており、分析室2および予備真空室3の内部
は、開閉弁V1,V2を介して真空ポンプ46により真
空に引かれる。予備真空室3内の真空度が分析室2内の
真空度と等しい状態になると、前記シャッタ8を開いて
試料Sの分析を行なう。試料Sの分析が終わると、シャ
ッタ8を閉じ、予備真空室3の内部を大気圧に戻し、前
記周壁4の下端開口部44から試料カップ10を離脱さ
せ、搬送装置40により試料カップ10を試料搬入口2
2に戻す。
As shown in FIG. 2, the preliminary vacuum chamber 3 is provided with a vacuum pump 46 through a communication hole 45 formed in the peripheral wall 4 thereof.
The inside of the analysis chamber 2 and the preliminary vacuum chamber 3 is evacuated by the vacuum pump 46 via the on-off valves V1 and V2. When the degree of vacuum in the preliminary vacuum chamber 3 becomes equal to the degree of vacuum in the analysis chamber 2, the shutter 8 is opened to analyze the sample S. When the analysis of the sample S is completed, the shutter 8 is closed, the inside of the preliminary vacuum chamber 3 is returned to the atmospheric pressure, the sample cup 10 is detached from the lower end opening 44 of the peripheral wall 4, and the sample cup 10 is moved by the transfer device 40 to the sample. Loading port 2
Return to 2.

【0019】図4は、外装パネル1Aの内部で分析室2
の側方に配置される試料装填機20の概略を示す斜視図
である。この試料装填機20は、分析する試料Sを、試
料カップ10に収納された試料ホルダHまで搬送する搬
送手段50と、試料ホルダHから試料Sを搬出する搬出
手段60と、前記搬送手段50で搬送された試料Sを試
料カップ10の試料ホルダHに装填させ、分析終了後の
試料SをホルダHから取り出して前記搬出手段60に排
出させる試料交換機80とを備えている。また、前記試
料装填機20には、図3に示すように、試料装填時に試
料カップ10の上部外周に設けたシール部14を覆い、
このシール部14に試料Sからの離脱物が付着するのを
防止する遮蔽部材9が設けられている。
FIG. 4 shows an analysis chamber 2 inside the exterior panel 1A.
FIG. 3 is a perspective view schematically showing a sample loader 20 arranged on a side of the sample loading device. The sample loading machine 20 includes a transport unit 50 that transports the sample S to be analyzed to the sample holder H stored in the sample cup 10, an unloading unit 60 that unloads the sample S from the sample holder H, and the transport unit 50. A sample changer 80 is provided for loading the transported sample S into the sample holder H of the sample cup 10, removing the sample S after the analysis from the holder H, and discharging the sample S to the unloading means 60. Further, as shown in FIG. 3, the sample loading machine 20 covers a seal portion 14 provided on the upper outer periphery of the sample cup 10 at the time of loading the sample.
A shielding member 9 is provided on the seal portion 14 for preventing the detached material from the sample S from adhering.

【0020】図4の搬送手段50は、ベルト走行によっ
て試料Sを搬送する搬入ベルト51と、これの搬送方向
前部側に直交状に設けられた送りテーブル52とを備
え、前記搬入ベルト51の前部側には、搬送される試料
Sを受け止めるストッパ53と、これにより受け止めら
れた試料Sを前記送りテーブル52の上面に沿って試料
交換機80に送るプッシャ54が設けられている。
The transport means 50 shown in FIG. 4 includes a carry-in belt 51 for carrying the sample S by running the belt, and a feed table 52 provided at a front portion of the carry-in belt 51 in the carrying direction. A stopper 53 for receiving the transported sample S and a pusher 54 for transporting the received sample S along the upper surface of the feed table 52 to the sample exchanger 80 are provided on the front side.

【0021】前記試料交換機80は、送りテーブル52
の試料搬送方向前部側に配置されており、モータ81で
回転する円板82と、この円板82の回転により上下動
される昇降部材83と、この昇降部材83の幅方向両側
に固定されて上下方向に延びるラック84と、これの下
方に支持されてラック84の歯部に噛み合うピニオン8
5とを備え、このピニオン85から側方に延びるピニオ
ン軸86の先端には、試料交換時に前記試料ホルダHに
設けた円盤状の受皿74を押し下げるための爪87が取
り付けられている。この爪87は、図3に示す受皿74
の外周のつば部74aに係止される。
The sample exchange device 80 includes a feed table 52
The disk 82 is arranged on the front side in the sample transport direction, and is rotated by a motor 81, an elevating member 83 which is moved up and down by the rotation of the disk 82, and fixed on both sides in the width direction of the elevating member 83. And a pinion 8 supported below and engaged with the teeth of the rack 84.
A claw 87 is attached to the tip of a pinion shaft 86 extending laterally from the pinion 85 for pushing down a disc-shaped receiving tray 74 provided on the sample holder H at the time of sample replacement. The claw 87 is connected to the saucer 74 shown in FIG.
Is locked to a flange portion 74a on the outer periphery of.

【0022】前記円板82の一側で径方向外方位置には
突起82aが突設され、一方、昇降部材83の上部には
突起82aを受け入れる水平方向に延びた長孔83aが
形成されていて、前記円板82の回転に伴う突起82a
の円運動により前記昇降部材83を上下往復動させる。
前記昇降部材83の上下動に伴うピニオン85の回転に
より爪87を揺動させて、この爪87を受皿74のつば
部74aに押し当てて、図3の実線で示すように、受皿
74をコイルスプリング75に抗しながら、送りテーブ
ル52の上面とほぼ面一となる下方の待機位置にまで移
動させ、プッシャ54の進出により送られる試料Sを受
皿74上に装填させる。受皿74上への試料Sの装填後
に、図4のモータ81の逆回転による昇降部材83の上
昇により、爪87を上方へ回動させて受皿74から退避
させる。これにより、図3のコイルスプリング75の押
圧力によって、受皿74が上皿73の下面に当接する仮
想線で示すセット位置まで持ち上げられる。
On one side of the disk 82, a projection 82a is protruded at a radially outward position, while a vertically extending elongated hole 83a for receiving the projection 82a is formed above the elevating member 83. Projection 82a associated with the rotation of the disk 82.
The vertically moving member 83 is reciprocated up and down by the circular motion.
The claw 87 is swung by the rotation of the pinion 85 accompanying the vertical movement of the elevating member 83, and the claw 87 is pressed against the flange 74 a of the tray 74, and as shown by the solid line in FIG. While moving against the spring 75, the sample S is moved to a lower standby position that is substantially flush with the upper surface of the feed table 52, and the sample S sent by the advance of the pusher 54 is loaded on the tray 74. After the loading of the sample S onto the tray 74, the lifting member 83 is raised by the reverse rotation of the motor 81 in FIG. Thereby, the receiving tray 74 is raised to the set position indicated by the imaginary line in contact with the lower surface of the upper plate 73 by the pressing force of the coil spring 75 in FIG.

【0023】図4の搬出手段60は、前記試料交換機8
0の前方に配置した搬出シュート61と、これの先端下
部に設けた回収箱62とを備え、前記プッシャ54の進
出により受皿74から取り出された試料Sを搬出シュー
ト61を介して回収箱62に排出する。
The unloading means 60 shown in FIG.
0, and a collection box 62 provided at the lower part of the tip of the unloading chute 61. The sample S taken out of the receiving tray 74 by the advance of the pusher 54 is transferred to the collection box 62 via the unloading chute 61. Discharge.

【0024】外装パネル1A(図1)における試料搬入
口22の下部に、図3の遮蔽部材9が取り付けられてい
る。図5は、遮蔽部材9と試料カップ10の部分を示す
分解斜視図である。同図のように、遮蔽部材9は、平面
形が概略ドーナツ形状とされ、試料装填時に、図3に示
す試料カップ10のシール部14に内周側から対向する
周壁部91と、この周壁部91の上部側に一体に形成さ
れ、前記シール部14に対して上側から対向する上壁部
92とを有する断面L形状に形成され、この上壁部92
の上面側には、前記試料交換機80の爪87の逃がし用
切欠部93(図5)が形成されている。
The shielding member 9 shown in FIG. 3 is attached to a lower portion of the sample entrance 22 in the outer panel 1A (FIG. 1). FIG. 5 is an exploded perspective view showing the shield member 9 and the sample cup 10. As shown in the figure, the shielding member 9 has a substantially donut shape in plan view, and has a peripheral wall portion 91 facing the seal portion 14 of the sample cup 10 shown in FIG. An upper wall 92 is formed integrally with an upper wall 91 and has an upper wall 92 opposed to the seal 14 from above.
A notch 93 (FIG. 5) for releasing the claw 87 of the sample exchanger 80 is formed on the upper surface side of the sample changer 80.

【0025】外装パネル1A(図1)には前記送りテー
ブル52と、搬出側に位置する渡し板94とが固定され
ており、前記遮蔽部材9は、図5の複数の取付ビス95
により、これら送りテーブル52と渡し板94とに取り
付けられている。試料搬入口22(図3、図4)は、こ
れら送りテーブル52と渡し板94とによって形成され
ている。
The feed table 52 and a transfer plate 94 located on the carry-out side are fixed to the exterior panel 1A (FIG. 1), and the shielding member 9 includes a plurality of mounting screws 95 shown in FIG.
, Are attached to the feed table 52 and the transfer plate 94. The sample entrance 22 (FIGS. 3 and 4) is formed by the feed table 52 and the transfer plate 94.

【0026】さらに、試料装填時に前記シール部14
(図3)の上方に隣接する隣接部材として、前記遮蔽部
材9の周壁部91の外周に可動リング98を嵌め込んで
おり、この可動リング98の上壁面に設けた取付孔98
aと前記遮蔽部材9の上壁部92との間には、複数のコ
イルスプリング97を介装させている。このコイルスプ
リング97は、試料装填時に前記可動リング98を、図
3のカップ本体11とシール部14の上面とに弾性的に
押し付けて、このシール部14に試料からの離脱物が侵
入するのを抑制する。
Further, at the time of loading the sample,
A movable ring 98 is fitted on the outer periphery of the peripheral wall portion 91 of the shielding member 9 as an adjacent member adjacent to the upper side of FIG.
A plurality of coil springs 97 are interposed between a and the upper wall portion 92 of the shielding member 9. The coil spring 97 elastically presses the movable ring 98 against the cup body 11 and the upper surface of the seal portion 14 shown in FIG. 3 when the sample is loaded, and prevents the detached material from the sample from entering the seal portion 14. Suppress.

【0027】また、前記可動リング98の内周面には、
周方向に延びるリブ98bが設けられ、一方前記遮蔽部
材9の周壁部91の外面で前記リブ98dよりも下方位
置には、係止リング99が前記外面のリング溝に嵌め込
まれており、これらリブ98dと係止リング99とによ
り、前記可動リング98の遮蔽部材9から下方への脱落
を阻止している。こうして、可動リング(隣接部材)9
8は、遮蔽部材9、送りテーブル52および渡し板94
を介して、図1のX線分析装置1の外装パネル1Aに支
持されている。
Further, on the inner peripheral surface of the movable ring 98,
On the outer surface of the peripheral wall portion 91 of the shielding member 9 below the rib 98d, a locking ring 99 is fitted in a ring groove on the outer surface. 98 d and the locking ring 99 prevent the movable ring 98 from falling down from the shielding member 9. Thus, the movable ring (adjacent member) 9
Reference numeral 8 denotes a shielding member 9, a feed table 52, and a transfer plate 94.
Through the outer panel 1A of the X-ray analyzer 1 of FIG.

【0028】図3に示すシール部14の上部内周側には
断面V形状の切込み14aを形成して、この切込み14
aと前記可動リング98の外周面との間に空間19を形
成するとともに、可動リング98の外周部に、集塵機の
ような吸引装置につながる吸引管(減圧手段)100を
接続している。この吸引管100によって空間19を減
圧し、シール部14の密閉度を高めることにより、前記
試料Sからの離脱物がシール部14に侵入して付着する
のを抑制する。前記吸入管100に代えて、前記空間1
9に高圧空気を吹き込む吹込み管(吹込み手段)100
Aを接続してもよい。その場合、吹込み管100から空
間19内に高圧空気を吹き込んで高圧空気流を形成する
ことにより、前記試料Sからの離脱物がシール部14に
侵入して付着するのを抑制する。
A notch 14a having a V-shaped cross section is formed on the inner peripheral side of the upper portion of the seal portion 14 shown in FIG.
A space 19 is formed between a and the outer peripheral surface of the movable ring 98, and a suction pipe (decompression means) 100 connected to a suction device such as a dust collector is connected to the outer peripheral portion of the movable ring 98. By reducing the pressure in the space 19 by the suction tube 100 and increasing the degree of sealing of the seal portion 14, the material detached from the sample S is prevented from entering the seal portion 14 and attaching thereto. Instead of the suction pipe 100, the space 1
A blowing pipe (blowing means) 100 for blowing high-pressure air into 9
A may be connected. In that case, high-pressure air is blown into the space 19 from the blowing pipe 100 to form a high-pressure air flow, so that the detached material from the sample S is prevented from entering the seal portion 14 and attaching thereto.

【0029】次に、以上の試料装填機20を用いて試料
Sの交換を行う場合の手順について説明する。先ず、試
料調製機で調製された試料Sは、図4に示す試料装填機
20の搬送手段50の搬入ベルト51上に、手作業また
は別の移送装置によって載置され、搬入ベルト51によ
りストッパ53の位置まで搬送された後、プッシャ54
の進出により送りテーブル52上を試料交換機80の位
置まで運ばれる。一方、この試料交換機80側において
は、図3に示す搬送装置40の昇降台41を介して試料
カップ10が予め持ち上げられて試料搬入口22に臨ん
でおり、試料カップ10の大径受け部11aの上面が可
動リング98の下面に当接されて試料カップ10が位置
決めされている。この状態でシール部14の上端は可動
リング98の下面に接触または近接しており、前記試料
カップ10に支持される試料ホルダHは、前記遮蔽部材
9の内側から上方に突出している。試料装填時には、図
4の試料交換機80により、試料ホルダHの受皿74が
押し下げられて、図3の実線で示す下方の待機位置に待
機しており、この受皿74上に、前記プッシャ54で運
ばれる試料Sが装填される。
Next, a procedure for exchanging the sample S using the sample loading machine 20 will be described. First, the sample S prepared by the sample preparation machine is placed on the carry-in belt 51 of the transfer means 50 of the sample loading machine 20 shown in FIG. After being transported to the position of
Is transported on the feed table 52 to the position of the sample exchanger 80 by the advance of. On the other hand, on the sample exchanger 80 side, the sample cup 10 is lifted in advance via the elevating table 41 of the transfer device 40 shown in FIG. Is in contact with the lower surface of the movable ring 98 to position the sample cup 10. In this state, the upper end of the seal portion 14 is in contact with or close to the lower surface of the movable ring 98, and the sample holder H supported by the sample cup 10 projects upward from the inside of the shielding member 9. At the time of loading the sample, the tray 74 of the sample holder H is pushed down by the sample exchanger 80 of FIG. 4 and stands by at the standby position below the solid line in FIG. The sample S to be loaded is loaded.

【0030】前記受皿74に試料Sが装填されると、試
料交換機80(図4)により受皿74が図3の仮想線で
示す試料セット位置まで移動されて、受皿74上の試料
Sが上皿73の受孔76に挿入セットされる。
When the sample S is loaded into the receiving tray 74, the receiving tray 74 is moved to a sample setting position indicated by a virtual line in FIG. It is inserted and set in the receiving hole 76 of 73.

【0031】以上のような試料Sの試料ホルダHへの装
填作業時に、試料Sから離脱した試料粉のような離脱物
は、前記受皿74から試料カップ10の内方に向かって
落下するが、この試料カップ10の上端外周囲に設けら
れたシール部14は、その落下離脱物と対面する全体が
前記遮蔽部材9の周壁部91と上壁部92によって覆わ
れており、しかも可動リング98の下端面はコイルスプ
リング97により前記カップ本体11の大径受け部11
aとシール部14の上面とに弾性的に押し付けられてい
るので、このシール部14の切込み14a、つまりシー
ル部14の上面に試料Sからの離脱物が侵入するのが極
力抑制される。
At the time of loading the sample S into the sample holder H as described above, the separated material such as the sample powder separated from the sample S falls from the tray 74 toward the inside of the sample cup 10. The seal portion 14 provided on the outer periphery of the upper end of the sample cup 10 is entirely covered by the peripheral wall portion 91 and the upper wall portion 92 of the shielding member 9 facing the fall-off and separation object. The lower end surface is formed by a large diameter receiving portion 11 of the cup body 11 by a coil spring 97.
a, and the upper surface of the seal portion 14 is elastically pressed against the cut portion 14a of the seal portion 14, that is, the intrusion of the detached material from the sample S into the upper surface of the seal portion 14 is suppressed as much as possible.

【0032】さらに、前記試料カップ10のカップ本体
11内にはシール部材15が配置されて、これの上端が
第2ばね体16により前記遮蔽部材9の周壁部91の下
端に押し付けられているので、前記試料Sからの離脱物
が前記シール部14の上面に付着するのがより効果的に
抑制される。また、試料Sの装填作業時には、前記可動
リング98の外周部に接続された吸引管100により、
可動リング98と前記シール部14およびカップ本体1
1の外周面との間に形成される空間19が減圧されるの
で、シール部14によるシール性が高まり、試料Sから
の離脱物がシール部14の上面に付着するのが一層効果
的に抑制される。また、吸引管100の代わりに吹込み
管100Aを設けた場合にも、空間19に高圧空気が吹
き込まれるので、この高圧空気流によって、試料Sから
の離脱物がシール部14の上面に付着するのが一層効果
的に抑制される。その結果、前記シール部14の保守・
点検作業のスパンを長期化することが可能となって、分
析作業の効率化が図れる。
Further, a sealing member 15 is disposed in the cup body 11 of the sample cup 10, and the upper end thereof is pressed against the lower end of the peripheral wall portion 91 of the shielding member 9 by the second spring 16. Further, the detachment from the sample S is more effectively prevented from adhering to the upper surface of the seal portion 14. Further, at the time of loading work of the sample S, the suction tube 100 connected to the outer peripheral portion of the movable ring 98
Movable ring 98, seal portion 14 and cup body 1
Since the pressure in the space 19 formed between the outer peripheral surface of the sample 1 and the outer peripheral surface of the sample S is reduced, the sealing performance of the seal portion 14 is improved, and the detachment of the sample S from the upper surface of the seal portion 14 is more effectively suppressed. Is done. Also, when the blowing tube 100A is provided in place of the suction tube 100, high-pressure air is blown into the space 19, and thus the high-pressure air flow causes the detached material from the sample S to adhere to the upper surface of the seal portion 14. Is more effectively suppressed. As a result, maintenance /
The span of inspection work can be lengthened, and the efficiency of analysis work can be increased.

【0033】以上のようにして、図3の試料カップ10
の試料ホルダHに試料Sの装填が行われた後には、搬送
装置40の昇降台41により、試料カップ10の全体が
前記遮蔽部材9から下方に取り出されて、図1の搬送装
置40により分析室2の下部側に運ばれ、前記昇降台4
1により持ち上げられて、図2に示すように、試料カッ
プ10のシール部14が前記分析室2の周壁4の下端開
口部44の周縁部下面に押し当てられてシールされ、こ
れら周壁4と試料カップ10で形成される予備真空室3
が気密に保持される。このとき、シール部14の上面に
離脱物が付着していないから、大きなシール力が確保さ
れる。
As described above, the sample cup 10 shown in FIG.
After the sample S is loaded into the sample holder H, the entire sample cup 10 is taken out from the shielding member 9 by the lifting table 41 of the transfer device 40 and analyzed by the transfer device 40 of FIG. Transported to the lower side of the room 2
As shown in FIG. 2, the seal portion 14 of the sample cup 10 is pressed against the lower surface of the peripheral edge of the lower end opening 44 of the peripheral wall 4 of the analysis chamber 2 to be sealed, as shown in FIG. Preliminary vacuum chamber 3 formed by cup 10
Is kept airtight. At this time, since no detached material is attached to the upper surface of the seal portion 14, a large sealing force is secured.

【0034】試料Sの分析が終了すると、前記シャッタ
8が閉じられ、予備真空室3の内部が大気圧に戻され、
搬送装置40の昇降台41により試料カップ10が下方
に降ろされて前記周壁4の下端開口部44から離脱され
る。この後、試料カップ10は搬送装置40により、図
1の試料搬入口22に臨む位置に戻され、図4の試料交
換機80によって受皿74が下方の待機位置に移動さ
れ、前記プッシャ55により、試料Sが受皿74から渡
し板94上を通って搬出手段60の搬出シュート61へ
と押し出されて、この排出シュート61から回収箱62
に排出される。また、試料Sが取り出された後には、前
述のようにして新たな試料Sが前記受皿74上に装填さ
れる。
When the analysis of the sample S is completed, the shutter 8 is closed and the inside of the preliminary vacuum chamber 3 is returned to the atmospheric pressure.
The sample cup 10 is lowered by the elevating table 41 of the transfer device 40 and is separated from the lower end opening 44 of the peripheral wall 4. Thereafter, the sample cup 10 is returned to the position facing the sample carrying-in port 22 in FIG. 1 by the transfer device 40, and the receiving tray 74 is moved to the lower standby position by the sample exchanger 80 in FIG. S is pushed out of the receiving tray 74 through the transfer plate 94 to the unloading chute 61 of the unloading means 60, and from the discharging chute 61 to the collection box 62.
Is discharged to After the sample S is taken out, a new sample S is loaded on the tray 74 as described above.

【0035】なお、以上の実施形態では、試料を自動装
填する試料装填機を有する場合について説明したが、本
発明は、予め試料を装填した試料ホルダを、試料搬入口
に設けた周知の回転式の試料交換台上に手作業で載せ
て、この試料交換台から試料カップに移すタイプのもの
(例えば特願平11−166821号参照)にも適用で
きる。
Although the above embodiment has been described with respect to the case where the apparatus has a sample loading machine for automatically loading a sample, the present invention provides a well-known rotary type in which a sample holder loaded with a sample in advance is provided at a sample loading port. (Refer to Japanese Patent Application No. 11-166821, for example) which is manually placed on a sample exchange table and transferred from the sample exchange table to a sample cup.

【0036】[0036]

【発明の効果】以上のように本発明によれば、予備真空
室の一部を形成する試料カップに設けたシール部に試料
からの離脱物が付着するのを抑制できるので、清掃など
の保守・点検作業のスパンを長期化して分析作業の効率
化を図ることができる。
As described above, according to the present invention, the detachment from the sample can be suppressed from adhering to the seal portion provided in the sample cup forming a part of the preliminary vacuum chamber. -The analysis work can be made more efficient by lengthening the span of inspection work.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態に係るX線分析装置の概略
を示す縦断面図である。
FIG. 1 is a longitudinal sectional view schematically showing an X-ray analyzer according to one embodiment of the present invention.

【図2】X線分析装置の分析室に試料カップの試料ホル
ダをセットして試料分析を行うときの状態を示す縦断面
図である。
FIG. 2 is a longitudinal sectional view showing a state where a sample analysis is performed by setting a sample holder of a sample cup in an analysis chamber of an X-ray analyzer.

【図3】試料装填機により試料カップの試料ホルダに試
料を装填するときの状態を示す縦断面図である。
FIG. 3 is a longitudinal sectional view showing a state where a sample is loaded into a sample holder of a sample cup by a sample loading machine.

【図4】試料装填機の概略を示す斜視図である。FIG. 4 is a perspective view schematically showing a sample loading machine.

【図5】試料カップと遮蔽部材の部分を示す分解斜視図
である。
FIG. 5 is an exploded perspective view showing portions of a sample cup and a shielding member.

【符号の説明】[Explanation of symbols]

1…X線分析装置、1A…外装パネル、22…試料搬入
口、3…予備真空室、9…遮蔽部材、91…周壁部、9
2…上壁部、98…隣接部材(可動リング)、10…試
料カップ、14…シール部、19…空間、50…搬送手
段、60…搬出手段、80…試料交換機、100…減圧
手段、100A…吹込み手段、H…試料ホルダ、S…試
DESCRIPTION OF SYMBOLS 1 ... X-ray analyzer, 1A ... exterior panel, 22 ... sample entrance, 3 ... preliminary vacuum chamber, 9 ... shielding member, 91 ... peripheral wall part, 9
2 ... top wall, 98 ... adjacent member (movable ring), 10 ... sample cup, 14 ... seal, 19 ... space, 50 ... transportation means, 60 ... unloading means, 80 ... sample exchange machine, 100 ... decompression means, 100A ... Blowing means, H ... Sample holder, S ... Sample

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 試料搬入口に、試料が装填される試料ホ
ルダを保持し、かつX線分析装置内の予備真空室の一部
を形成する試料カップを臨ませるX線分析装置であっ
て、 前記試料カップの上端のシール部を覆い、試料からの離
脱物が前記シール部に付着するのを防止する遮蔽部材を
備えたX線分析装置。
1. An X-ray analyzer, wherein a sample holder for loading a sample is held at a sample inlet, and a sample cup forming a part of a preliminary vacuum chamber in the X-ray analyzer is exposed. An X-ray analyzer, comprising: a shielding member that covers a seal portion at an upper end of the sample cup and prevents a substance detached from a sample from adhering to the seal portion.
【請求項2】 請求項1において、前記遮蔽部材は、前
記シール部に内周側から対向する周壁部と、前記シール
部に上側から対向する上壁部とを有する断面L形状に形
成されているX線分析装置。
2. The device according to claim 1, wherein the shielding member has an L-shaped cross section having a peripheral wall portion facing the seal portion from the inner peripheral side and an upper wall portion facing the seal portion from above. X-ray analyzer.
【請求項3】 請求項1または2において、さらに、前
記シール部とこのシール部の上方に隣接する隣接部材と
の間の空間を減圧して、この空間内に前記離脱物が侵入
するのを防止する減圧手段を備えたX線分析装置。
3. The method according to claim 1, further comprising: reducing a pressure in a space between the seal portion and an adjacent member adjacent above the seal portion to prevent the detached material from entering the space. X-ray analyzer equipped with a decompression means for preventing.
【請求項4】 請求項1または2において、さらに、前
記シール部とこのシール部の上方に隣接する隣接部材と
の間の空間に高圧空気を吹き込んで、この空間内に前記
離脱物が侵入するのを防止する吹込み手段を備えたX線
分析装置。
4. The device according to claim 1, wherein high-pressure air is blown into a space between the seal portion and an adjacent member adjacent above the seal portion, and the detached material enters the space. An X-ray analyzer provided with a blowing means for preventing the occurrence of air.
【請求項5】 請求項1から4のいずれかにおいて、さ
らに、前記の試料搬入口に配置されて、X線分析装置内
の予備真空室の一部を形成する試料カップに収納された
試料ホルダに試料を装填する試料装填機を備え、 前記試料装填機が、前記試料を試料ホルダまで搬送する
搬送手段と、前記試料ホルダから試料を搬出する搬出手
段とを備えているX線分析装置。
5. The sample holder according to claim 1, further comprising a sample cup disposed at the sample entrance and forming a part of a preliminary vacuum chamber in the X-ray analyzer. An X-ray analyzer, comprising: a sample loader for loading a sample into the sample holder; the sample loader comprising: transport means for transporting the sample to a sample holder; and unloading means for unloading the sample from the sample holder.
JP2001279349A 2001-02-28 2001-09-14 X-ray analyzer with improved sealability of the preliminary vacuum chamber Expired - Fee Related JP3600848B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001279349A JP3600848B2 (en) 2001-02-28 2001-09-14 X-ray analyzer with improved sealability of the preliminary vacuum chamber

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001053825 2001-02-28
JP2001-53825 2001-02-28
JP2001279349A JP3600848B2 (en) 2001-02-28 2001-09-14 X-ray analyzer with improved sealability of the preliminary vacuum chamber

Publications (2)

Publication Number Publication Date
JP2002328105A true JP2002328105A (en) 2002-11-15
JP3600848B2 JP3600848B2 (en) 2004-12-15

Family

ID=26610268

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3600848B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006105766A (en) * 2004-10-05 2006-04-20 Toyobo Co Ltd Device for measuring film thickness
US7230253B2 (en) 2003-08-12 2007-06-12 Samsung Sdi Co., Ltd. Carrier and analyzing apparatus including the carrier
RU173077U1 (en) * 2016-12-29 2017-08-08 Федеральное государственное автономное образовательное учреждение высшего образования "Балтийский федеральный университет имени Иммануила Канта" CAMERA FOR STUDYING ELEMENTS OF X-RAY OPTICS

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7230253B2 (en) 2003-08-12 2007-06-12 Samsung Sdi Co., Ltd. Carrier and analyzing apparatus including the carrier
JP2006105766A (en) * 2004-10-05 2006-04-20 Toyobo Co Ltd Device for measuring film thickness
JP4677754B2 (en) * 2004-10-05 2011-04-27 東洋紡績株式会社 Film thickness measuring device
RU173077U1 (en) * 2016-12-29 2017-08-08 Федеральное государственное автономное образовательное учреждение высшего образования "Балтийский федеральный университет имени Иммануила Канта" CAMERA FOR STUDYING ELEMENTS OF X-RAY OPTICS

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