JP2002280346A - Substrate processor - Google Patents

Substrate processor

Info

Publication number
JP2002280346A
JP2002280346A JP2001078267A JP2001078267A JP2002280346A JP 2002280346 A JP2002280346 A JP 2002280346A JP 2001078267 A JP2001078267 A JP 2001078267A JP 2001078267 A JP2001078267 A JP 2001078267A JP 2002280346 A JP2002280346 A JP 2002280346A
Authority
JP
Japan
Prior art keywords
liquid
substrate
processing
liquid receiving
receiving member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001078267A
Other languages
Japanese (ja)
Other versions
JP3817143B2 (en
Inventor
Koji Yasufuku
孝次 安福
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP2001078267A priority Critical patent/JP3817143B2/en
Publication of JP2002280346A publication Critical patent/JP2002280346A/en
Application granted granted Critical
Publication of JP3817143B2 publication Critical patent/JP3817143B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Cleaning By Liquid Or Steam (AREA)
  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a processor preventing components of a processing part from being corroded by liquid chemicals at carrying of a substrate processed with the liquid chemical to the next processing part, such as a rinsing/drying processing part, while suppressing the processor cost. SOLUTION: Below a substrate-carrying path for carrying the substrate W from a liquid chemical processing part 10 to the rinsing/drying processing part 12, a liquid-recovering vat 28 whose upper surface is opened from the side end part of the liquid chemical processing part to the side end part of the rinsing/drying processing part facing the side end part for recovering processing liquid flowing down from the substrate which is carried is disposed. A liquid-receiving vat 30 for receiving the processing liquid flowing down from the substrate, being carried from the side end part of the rinsing/drying processing part to a position facing the upper opening surface of a rinsing/drying processing vessel 14, is provided capable of being withdrawn.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、半導体基板、液
晶表示装置等のフラットパネルディスプレイ用のガラス
基板、フォトマスク用ガラス基板、光ディスク用基板な
どの各種基板を処理する基板処理装置に関する。
The present invention relates to a substrate processing apparatus for processing various substrates such as a semiconductor substrate, a glass substrate for a flat panel display such as a liquid crystal display device, a glass substrate for a photomask, and a substrate for an optical disk.

【0002】[0002]

【従来の技術】半導体基板等の基板を薬液処理した後に
リンス処理し、リンス処理後に乾燥処理する装置とし
て、薬液処理槽とリンス処理槽と乾燥処理槽とを順次連
設し、薬液処理槽に貯留された薬液中に基板を浸漬させ
て薬液処理した後、薬液処理槽からリンス処理槽へ基板
を搬送して、リンス処理槽に貯留されたリンス液中に基
板を浸漬させてリンス処理し、リンス処理後にリンス処
理槽から乾燥処理槽へ基板を搬送して、乾燥処理槽で基
板を乾燥処理する基板処理装置が一般に知られている。
また、前記乾燥処理槽を、薬液処理後の基板をリンス液
でリンス処理する機能を兼ね備えたリンス・乾燥処理槽
として、薬液処理槽で薬液処理された基板を薬液処理槽
からリンス・乾燥処理槽へ搬送し、リンス・乾燥処理槽
で基板をリンス処理した後に引き続いて乾燥処理する装
置構成も考えられる。
2. Description of the Related Art As a device for performing a rinsing process after a substrate such as a semiconductor substrate is subjected to a chemical treatment, and a drying treatment after the rinsing treatment, a chemical treatment tank, a rinsing treatment tank, and a drying treatment tank are sequentially connected to each other. After immersing the substrate in the stored chemical solution and performing the chemical processing, the substrate is transferred from the chemical processing tank to the rinsing processing tank, and the substrate is immersed in the rinsing liquid stored in the rinsing processing tank to perform a rinsing process. 2. Description of the Related Art A substrate processing apparatus that transports a substrate from a rinsing processing tank to a drying processing tank after a rinsing processing and dry-processes the substrate in the drying processing tank is generally known.
Further, the drying treatment tank is a rinsing / drying treatment tank also having a function of rinsing the substrate after the chemical treatment with a rinsing liquid, and the substrate subjected to the chemical treatment in the chemical treatment tank is rinsed and dried from the chemical treatment tank. The substrate may be conveyed to a rinsing / drying treatment tank, followed by rinsing the substrate, followed by a drying treatment.

【0003】[0003]

【発明が解決しようとする課題】ところが、乾燥処理す
る機能にリンス処理する機能を伴ったリンス・乾燥処理
槽とする装置構成では、薬液処理された後で薬液の付着
した基板が、基板搬送装置によってリンス・乾燥処理槽
内へ搬入されてくることになる。このため、基板の搬入
時に、基板搬送装置により保持された基板から薬液がリ
ンス・乾燥処理槽の周囲の構成部品などの上に滴り落
ち、構成部品などの表面に薬液が付着して、構成部品な
どが腐食される、といった問題が発生する。
However, in an apparatus configuration in which a rinsing / drying processing tank is provided with a rinsing function in addition to a drying function, a substrate to which a chemical is adhered after the chemical processing is transferred to a substrate transfer device. As a result, it is carried into the rinsing / drying tank. For this reason, when the substrate is carried in, the chemical solution drips from the substrate held by the substrate transfer device onto components and the like around the rinsing / drying processing tank, and the chemical solution adheres to the surface of the component and the like, and the component And the like is corroded.

【0004】このような問題は、リンス・乾燥処理槽周
囲の構成部品などの全てを、薬液に対する耐食性を有す
る材質で形成すれば解決することができる。しかしなが
ら、そのような材料は高価であり、装置コストが高くな
ってしまうので、現実的な対処方法であるとは言えな
い。
[0004] Such a problem can be solved by forming all the components around the rinsing / drying processing tank from a material having corrosion resistance to a chemical solution. However, such a material is expensive and increases the cost of the apparatus, and thus cannot be said to be a practical solution.

【0005】この発明は、以上のような事情に鑑みてな
されたものであり、薬液処理された基板をリンス・乾燥
処理部などの次の処理部へ搬送するときに、その処理部
の構成部品が薬液で腐食されることを防止することがで
き、装置コストも安価に抑えられる基板処理装置を提供
することを目的とする。
[0005] The present invention has been made in view of the above circumstances, and when transporting a substrate that has been treated with a chemical solution to a next processing unit such as a rinsing / drying processing unit, the components of that processing unit are used. It is an object of the present invention to provide a substrate processing apparatus capable of preventing the substrate from being corroded by a chemical solution and keeping the apparatus cost low.

【0006】[0006]

【課題を解決するための手段】請求項1に係る発明は、
処理液を使用して基板の処理が行われる第1処理槽を有
する第1処理部と、この第1処理部と隣り合って配設さ
れ第2処理槽を有する第2処理部と、前記第1処理槽か
ら前記第2処理槽へ、処理液が付着した状態の基板を搬
送する基板搬送手段と、基板搬送路の下方に配設され、
前記第1処理部の側端部からその側端部に対向する前記
第2処理部の側端部までの範囲にわたって上面が開口
し、搬送中の基板から流下する処理液を回収する液回収
部材と、を備えた基板処理装置において、前記第2処理
部の前記側端部から前記第2処理槽の上部開口面に臨む
位置までの範囲において搬送中の基板から流下する処理
液を受ける液受け部材を退避可能に具備したことを特徴
とする。
According to the first aspect of the present invention,
A first processing unit having a first processing tank in which a substrate is processed using a processing liquid; a second processing unit having a second processing tank disposed adjacent to the first processing unit; A substrate transfer means for transferring the substrate with the processing liquid attached thereto from the first processing tank to the second processing tank; and
A liquid recovery member that has an upper surface open over a range from a side end of the first processing unit to a side end of the second processing unit opposed to the side end, and collects a processing liquid flowing down from the substrate being transported. And a substrate receiving apparatus for receiving a processing liquid flowing down from the substrate being transported in a range from the side end of the second processing unit to a position facing the upper opening surface of the second processing tank. The member is provided so as to be retractable.

【0007】請求項2に係る発明は、請求項1記載の基
板処理装置において、前記液回収部材を固定し、前記液
受け部材を、前記液回収部材と基板搬送路との間の高さ
位置であって搬送中の基板から流下する処理液を受ける
液受け位置と退避位置との間で移動自在に支持し、その
液受け部材に、それが受けた処理液を前記液回収部材へ
導く導液路を設け、前記液受け部材を移動させる液受け
部材移動手段を有することを特徴とする。
According to a second aspect of the present invention, in the substrate processing apparatus according to the first aspect, the liquid recovery member is fixed, and the liquid receiving member is positioned at a height between the liquid recovery member and the substrate transport path. The liquid receiving member is movably supported between a liquid receiving position for receiving the processing liquid flowing down from the substrate being transported and a retreat position, and guides the processing liquid received by the liquid receiving member to the liquid collecting member. A liquid passage is provided, and a liquid receiving member moving means for moving the liquid receiving member is provided.

【0008】請求項3に係る発明は、請求項2記載の基
板処理装置において、前記液受け部材を、液受け位置と
退避位置との間で水平方向へ往復移動自在に支持したこ
とを特徴とする。
According to a third aspect of the present invention, in the substrate processing apparatus of the second aspect, the liquid receiving member is supported so as to be reciprocally movable in a horizontal direction between a liquid receiving position and a retracted position. I do.

【0009】請求項4に係る発明は、請求項2記載の基
板処理装置において、前記液受け部材を、液受け位置と
退避位置との間で水平面内において回動自在に支持した
ことを特徴とする。
According to a fourth aspect of the present invention, in the substrate processing apparatus of the second aspect, the liquid receiving member is rotatably supported in a horizontal plane between a liquid receiving position and a retracted position. I do.

【0010】請求項5に係る発明は、請求項2記載の基
板処理装置において、前記液受け部材を、液受け位置と
退避位置との間で鉛直面内において回動自在に支持した
ことを特徴とする。
According to a fifth aspect of the present invention, in the substrate processing apparatus of the second aspect, the liquid receiving member is rotatably supported in a vertical plane between a liquid receiving position and a retracted position. And

【0011】請求項6に係る発明は、請求項1記載の基
板処理装置において、前記液回収部材を、搬送中の基板
から流下する処理液を回収する液回収位置と前記第2処
理部の前記側端部から前記第2処理槽の上部開口面に臨
む位置までの範囲において搬送中の基板から流下する処
理液を受ける液受け位置との間で往復移動自在に支持し
て、液回収部材が前記液受け部材を兼用し前記液回収位
置が退避位置とされるようにし、前記液回収部材を移動
させる液回収部材移動手段を有することを特徴とする。
According to a sixth aspect of the present invention, in the substrate processing apparatus of the first aspect, the liquid collecting member is provided with a liquid collecting position for collecting a processing liquid flowing down from the substrate being transported and the liquid collecting member. In a range from the side end to a position facing the upper opening surface of the second processing tank, the liquid collecting member supports the liquid collecting member so as to be reciprocally movable between a liquid receiving position for receiving the processing liquid flowing down from the substrate being transported. The liquid receiving member is also used so that the liquid collecting position is set to the retracted position, and a liquid collecting member moving means for moving the liquid collecting member is provided.

【0012】請求項7に係る発明は、請求項1ないし請
求項6のいずれかに記載の基板処理装置において、前記
基板搬送手段が、前記第2処理槽に対して昇降可能であ
り、前記液受け部材の退避位置が、前記第2処理槽に対
して前記基板搬送手段が昇降するときに基板搬送手段と
液受け部材とが干渉しない位置であることを特徴とす
る。
According to a seventh aspect of the present invention, in the substrate processing apparatus according to any one of the first to sixth aspects, the substrate transfer means is capable of moving up and down with respect to the second processing tank, and The evacuation position of the receiving member is a position where the substrate transfer means does not interfere with the liquid receiving member when the substrate transfer means moves up and down with respect to the second processing tank.

【0013】請求項8に係る発明は、請求項1ないし請
求項7のいずれかに記載の基板処理装置において、前記
第2処理槽が、上部に基板の搬出入用の開口を有しその
開口を開閉する開閉蓋を具備した処理チャンバの内部に
配設され、前記液受け部材の退避位置が、前記開閉蓋が
前記処理チャンバの上部開口を開閉するときに開閉蓋と
液受け部材とが干渉しない位置であることを特徴とす
る。
According to an eighth aspect of the present invention, in the substrate processing apparatus according to any one of the first to seventh aspects, the second processing tank has an upper opening for loading and unloading the substrate. The retreat position of the liquid receiving member is disposed inside a processing chamber having an opening / closing lid that opens and closes, and the opening / closing lid and the liquid receiving member interfere when the opening / closing lid opens and closes the upper opening of the processing chamber. It is characterized in that it is a position where it does not.

【0014】請求項1に係る発明の基板処理装置におい
ては、第1処理部で処理された基板が基板搬送手段によ
って第1処理槽から第2処理槽へ搬送されるときに、第
1処理部の側端部からその側端部に対向する第2処理部
の側端部までの範囲では、搬送中の基板から流下する処
理液が液回収部材によって回収される。そして、第2処
理部の前記側端部から第2処理槽の上部開口面に臨む位
置までの範囲では、搬送中の基板から流下する処理液
は、液受け部材によって受けられる。液受け部材は、必
要の無いときには退避して、第2処理部での構成部材の
動作や槽間シャッタ等の動作に支障が生じないようにさ
れる。
In the substrate processing apparatus according to the first aspect of the present invention, when the substrate processed in the first processing section is transferred from the first processing tank to the second processing tank by the substrate transfer means, In the range from the side end of the second processing unit to the side end of the second processing unit facing the side end, the processing liquid flowing down from the substrate being transported is collected by the liquid collecting member. Then, in a range from the side end of the second processing unit to a position facing the upper opening surface of the second processing tank, the processing liquid flowing down from the substrate being transported is received by the liquid receiving member. The liquid receiving member is retracted when it is not necessary, so that the operation of the components in the second processing unit and the operation of the inter-tank shutter and the like are not hindered.

【0015】請求項2に係る発明の基板処理装置では、
第1処理部の側端部上方位置からその側端部に対向する
第2処理部の側端部上方位置まで搬送される途中の基板
から流下する処理液は、固定された液回収部材によって
回収される。そして、基板の搬送が行われるときには、
液受け部材移動手段によって液受け部材が液受け位置に
移動させられ、第2処理部の前記側端部上方位置から第
2処理槽の上部開口面に臨む位置まで搬送される途中の
基板から流下する処理液は、液受け部材によって受けら
れ、液受け部材の導液路を通って液回収部材へ導かれ、
液回収部材に回収される。液受け部材は、必要の無いと
きには、液受け部材移動手段によって液受け位置から退
避位置へ移動させられ、第2処理部での構成部材の動作
や槽間シャッタ等の動作に支障が生じないようにされ
る。
In the substrate processing apparatus according to the second aspect of the present invention,
The processing liquid flowing down from the substrate being transported from the position above the side end of the first processing section to the position above the side end of the second processing section facing the side end is recovered by the fixed liquid recovery member. Is done. When the substrate is transported,
The liquid receiving member is moved to the liquid receiving position by the liquid receiving member moving means, and flows down from the substrate being transported from a position above the side end of the second processing unit to a position facing the upper opening surface of the second processing tank. The processing liquid to be processed is received by the liquid receiving member, guided to the liquid collecting member through the liquid guide path of the liquid receiving member,
The liquid is collected by the liquid collecting member. The liquid receiving member is moved from the liquid receiving position to the retracted position by the liquid receiving member moving means when it is not necessary, so that the operation of the components in the second processing unit and the operation of the inter-tank shutter and the like are not hindered. To be.

【0016】請求項3に係る発明の基板処理装置では、
液受け部材が水平方向へ往復移動して、液受け位置と退
避位置との間を移動する。
In the substrate processing apparatus according to the third aspect of the present invention,
The liquid receiving member reciprocates in the horizontal direction and moves between the liquid receiving position and the retracted position.

【0017】請求項4に係る発明の基板処理装置では、
液受け部材が水平面内において回動して、液受け位置と
退避位置との間を移動する。
According to a fourth aspect of the present invention, in the substrate processing apparatus,
The liquid receiving member rotates in a horizontal plane and moves between the liquid receiving position and the retracted position.

【0018】請求項5に係る発明の基板処理装置では、
液受け部材が鉛直面内において回動して、液受け位置と
退避位置との間を移動する。
According to a fifth aspect of the present invention, in the substrate processing apparatus,
The liquid receiving member rotates in the vertical plane and moves between the liquid receiving position and the retracted position.

【0019】請求項6に係る発明の基板処理装置では、
第1処理部の側端部上方位置からその側端部に対向する
第2処理部の側端部上方位置まで基板が搬送される間
は、その基板搬送路の下方の液回収位置に液回収部材が
配置されて、基板から流下する処理液が液回収部材によ
って回収される。そして、第2処理部の前記側端部上方
位置から第2処理槽の上部開口面に臨む位置まで基板が
搬送される間は、液回収部材移動手段によって液回収部
材が液回収位置から液受け位置へ移動させられ、基板か
ら流下する処理液は、液受け部材としての役割を果たす
液回収部材によって受けられ回収される。液回収部材
は、必要の無いときには、液回収部材移動手段によって
液受け位置から退避位置でもある液回収位置へ移動させ
られ、第2処理部での構成部材の動作や槽間シャッタ等
の動作に支障が生じないようにされる。
In the substrate processing apparatus of the invention according to claim 6,
While the substrate is transported from the position above the side end of the first processing unit to the position above the side end of the second processing unit facing the side end, the liquid is collected at the liquid collecting position below the substrate transfer path. The member is disposed, and the processing liquid flowing down from the substrate is collected by the liquid collecting member. Then, while the substrate is transported from a position above the side end of the second processing section to a position facing the upper opening surface of the second processing tank, the liquid recovery member moving means moves the liquid recovery member from the liquid recovery position to the liquid receiving position. The processing liquid moved to the position and flowing down from the substrate is received and recovered by a liquid recovery member serving as a liquid receiving member. The liquid recovery member is moved from the liquid receiving position to the liquid recovery position, which is also the retracted position, by the liquid recovery member moving means when it is not necessary, and is used for the operation of the components in the second processing unit and the operation of the inter-tank shutter, etc. No hindrance will occur.

【0020】請求項7に係る発明の基板処理装置では、
液受け部材が退避位置へ移動すると、基板搬送手段が第
2処理槽に対して昇降するときに、基板搬送手段に対し
液受け部材が干渉することがない。
[0020] In the substrate processing apparatus of the invention according to claim 7,
When the liquid receiving member moves to the retreat position, the liquid receiving member does not interfere with the substrate transport means when the substrate transport means moves up and down with respect to the second processing tank.

【0021】請求項8に係る発明の基板処理装置では、
液受け部材が退避位置へ移動すると、開閉蓋が処理チャ
ンバの上部開口を開閉するときに、開閉蓋に対し液受け
部材が干渉することがない。
In the substrate processing apparatus of the invention according to claim 8,
When the liquid receiving member moves to the retracted position, the liquid receiving member does not interfere with the open / close lid when the open / close lid opens / closes the upper opening of the processing chamber.

【0022】[0022]

【発明の実施の形態】以下、この発明の好適な実施形態
について図面を参照しながら説明する。
Preferred embodiments of the present invention will be described below with reference to the drawings.

【0023】図1は、この発明の実施形態の1例を示
し、基板処理装置の概略構成を示す図であって一部を断
面で表した正面図である。この基板処理装置は、詳細を
図示していないが、薬液を貯留しその薬液中に基板が浸
漬させられて処理される薬液処理槽を有する薬液処理部
(第1処理部)10、リンス液を貯留しそのリンス液中
に基板が浸漬させられてリンス処理されるとともにリン
ス処理に引き続いて基板が乾燥処理されるリンス・乾燥
処理槽14を有するリンス・乾燥処理部(第2処理部)
12、および、複数枚の基板Wを支持する開閉自在の一
対のチャック18、18を有し薬液処理部10の薬液処
理槽からリンス・乾燥処理部12のリンス・乾燥処理槽
14へ基板Wを搬送する基板搬送装置16を備えてい
る。薬液処理部10とリンス・乾燥処理部12とは、僅
かな距離を隔てて隣り合って配設されている。図中の矢
印Aは、基板Wの搬送方向を示す。
FIG. 1 shows an example of an embodiment of the present invention, and is a diagram showing a schematic configuration of a substrate processing apparatus, and is a front view partially showing a cross section. Although not shown in detail, the substrate processing apparatus stores a chemical solution, a chemical solution processing unit (first processing unit) 10 having a chemical solution processing tank in which a substrate is immersed and processed in the chemical solution, and a rinsing solution. A rinsing / drying processing section (second processing section) having a rinsing / drying processing tank 14 in which the substrate is stored and immersed in the rinsing liquid to be rinsed and the substrate is dried following the rinsing processing.
12 and a pair of openable and closable chucks 18 and 18 for supporting a plurality of substrates W. The substrate W is transferred from the chemical processing bath of the chemical processing unit 10 to the rinsing / drying processing bath 14 of the rinsing / drying processing unit 12. It has a substrate transfer device 16 for transferring. The chemical processing section 10 and the rinsing / drying section 12 are disposed adjacent to each other with a slight distance therebetween. The arrow A in the figure indicates the direction in which the substrate W is transported.

【0024】リンス・乾燥処理部12は、リンス・乾燥
処理槽14の周囲を処理チャンバ20により囲んで構成
されている。処理チャンバ20の上部は、基板Wを搬入
しおよび搬出するために開口しており、その上部開口を
開閉する開閉蓋22が取り付けられている。開閉蓋22
は、後方側へ回動して処理チャンバ20の上部開口を開
放するようになっている。開閉蓋22と当接する処理チ
ャンバ20上部のフランジ部24の上面には、開閉蓋2
2下面とフランジ部24上面とが気密に接合されるよう
に環状のパッキン26が装着されている。
The rinsing / drying processing section 12 is constituted by surrounding a rinsing / drying processing tank 14 by a processing chamber 20. The upper portion of the processing chamber 20 is opened for loading and unloading the substrate W, and an opening / closing lid 22 for opening and closing the upper opening is attached. Lid 22
Pivots rearward to open the upper opening of the processing chamber 20. On the upper surface of the flange portion 24 at the upper part of the processing chamber 20 which is in contact with the opening / closing lid 22,
An annular packing 26 is mounted so that the lower surface 2 and the upper surface of the flange portion 24 are air-tightly joined.

【0025】薬液処理部10とリンス・乾燥処理部12
との間には、液回収バット28が配設されている。液回
収バット28は、基板搬送装置16によって基板Wの搬
送が行われる基板搬送路の下方に固定されている。そし
て、液回収バット28の上面は、薬液処理部10の、リ
ンス・乾燥処理部12側の側端部からその側端部に対向
するリンス・乾燥処理部12の側端部、すなわち処理チ
ャンバ20のフランジ部24の側端部までの範囲にわた
って開口している。
Chemical treatment section 10 and rinsing / drying section 12
A liquid recovery vat 28 is disposed between the two. The liquid recovery vat 28 is fixed below the substrate transfer path where the substrate W is transferred by the substrate transfer device 16. Then, the upper surface of the liquid recovery vat 28 is connected to the side end of the rinsing / drying processing section 12 from the side end of the rinsing / drying processing section 12 facing the rinsing / drying processing section 12, that is, the processing chamber The opening extends over the range up to the side end of the flange 24.

【0026】また、液回収バット28と基板搬送路との
間の高さ位置に液受けバット30が配置されている。液
受けバット30は、液回収バット28の直上の、二点鎖
線で示す退避位置と、処理チャンバ20の上方までせり
出した、実線で示す液受け位置との間で、水平方向へ往
復移動自在に支持されており、それら両位置間を図示し
ない移動機構によって移動させられる。液受けバット3
0は、液受け位置において、その前端がリンス・乾燥処
理槽14の上部開口面に臨むように位置し、すなわち前
端がリンス・乾燥処理槽14の一側部の上方延長線上に
位置し、後端が液回収バット28の開口面内上方に位置
するように、平面形状および大きさが決められる。
A liquid receiving vat 30 is arranged at a height between the liquid collecting vat 28 and the substrate transfer path. The liquid receiving vat 30 is reciprocally movable in the horizontal direction between a retracted position indicated by a two-dot chain line immediately above the liquid recovery vat 28 and a liquid receiving position protruded above the processing chamber 20 and indicated by a solid line. It is supported and moved between these two positions by a moving mechanism (not shown). Liquid receiving vat 3
0 is located at the liquid receiving position such that the front end thereof faces the upper opening surface of the rinsing / drying processing tank 14, that is, the front end is located on the upper extension line of one side of the rinsing / drying processing tank 14, and The planar shape and size are determined so that the end is located above the opening surface of the liquid recovery vat 28.

【0027】また、図2に断面図を示すように、液受け
バット30の内底面は、液回収バット28側が低くなっ
たテーパー面32に形成されており、液受けバット30
内の液がテーパー面32上を流れて液回収バット28内
へ流れ込むようになっている。あるいは、図3に示すよ
うに、液受けバット34の、液回収バット28側端部の
底部に、液が流出する流出孔36を形設しておき、液受
けバット34内の液が流出孔36を通って液回収バット
28内へ流れ込むような構成などとしてもよい。
As shown in the sectional view of FIG. 2, the inner bottom surface of the liquid receiving butt 30 is formed as a tapered surface 32 with the liquid collecting butt 28 side lowered.
The liquid inside flows on the tapered surface 32 and flows into the liquid collecting vat 28. Alternatively, as shown in FIG. 3, an outflow hole 36 through which the liquid flows out is formed at the bottom of the end of the liquid receiving vat 34 on the side of the liquid collecting vat 28 so that the liquid in the liquid receiving vat 34 can have an outflow hole. It is also possible to adopt a configuration in which the liquid flows into the liquid collecting vat 28 through the liquid collecting vat 36.

【0028】上記したように構成された基板処理装置に
おいて、薬液処理部10で基板の薬液処理が終了する
と、基板Wは、表面に薬液が付着した状態のままで一対
のチャック18、18に支持され、基板搬送装置16に
よって薬液処理部10の薬液処理槽からリンス・乾燥処
理部12のリンス・乾燥処理槽14へ搬送される。この
基板Wの搬送が開始される時点では、リンス・乾燥処理
部12の処理チャンバ20の開閉蓋22が開かれて、処
理チャンバ20の上部開口が開放されている。また、基
板Wの搬送に先立って、あるいは基板Wの搬送が開始さ
れるのと同時もしくはその直後に、移動機構により液受
けバット30が、二点鎖線で示す退避位置から実線で示
す液受け位置へ移動させられる。
In the substrate processing apparatus configured as described above, when the chemical processing of the substrate is completed in the chemical processing section 10, the substrate W is supported by the pair of chucks 18, 18 while the chemical is attached to the surface. Then, the substrate is transferred from the chemical processing tank of the chemical processing unit 10 to the rinsing / drying processing tank 14 of the rinsing / drying processing unit 12 by the substrate transfer device 16. When the transfer of the substrate W is started, the opening / closing lid 22 of the processing chamber 20 of the rinsing / drying processing unit 12 is opened, and the upper opening of the processing chamber 20 is opened. Prior to the transfer of the substrate W, or at the same time as or immediately after the transfer of the substrate W is started, the liquid receiving bat 30 is moved by the moving mechanism from the retracted position indicated by the two-dot chain line to the liquid receiving position indicated by the solid line. Moved to

【0029】基板Wが薬液処理槽からリンス・乾燥処理
槽14へ搬送される過程で、二点鎖線で示すように薬液
処理部10の側端部からリンス・乾燥処理部12の側端
部までの範囲を基板Wが移動中に、基板Wの表面から薬
液が滴り落ちると、その薬液は、液回収バット28内に
流下して回収される。また、リンス・乾燥処理部12の
側端部からリンス・乾燥処理槽14の上部開口面に臨む
位置までの範囲を基板Wが移動中に、基板Wの表面から
薬液が滴り落ちると、その薬液は、液受けバット30内
に流下し、液受けバット30内から液回収バット28内
に流れ込んで回収される。このため、基板Wの表面から
滴り落ちた薬液が、リンス・乾燥処理部12の処理チャ
ンバ20のパッキン26、フランジ部24等の部品上や
処理チャンバ20の内側面とリンス・乾燥処理槽14の
外側面との間などに流下して、部品や処理チャンバ20
などが腐食される、といったことが防止される。
In the process of transporting the substrate W from the chemical processing tank to the rinsing / drying processing tank 14, as shown by a two-dot chain line, from the side end of the chemical processing section 10 to the side end of the rinsing / drying processing section 12. During the movement of the substrate W in the range of the above, when the chemical liquid drops from the surface of the substrate W, the chemical liquid flows down into the liquid collecting vat 28 and is collected. Further, when the chemical liquid dripping from the surface of the substrate W while the substrate W is moving in the range from the side end of the rinsing / drying processing unit 12 to the position facing the upper opening surface of the rinsing / drying processing tank 14, the chemical liquid Flows down into the liquid receiving vat 30 and flows from the liquid receiving vat 30 into the liquid collecting vat 28 to be collected. For this reason, the chemical solution dripped from the surface of the substrate W is deposited on parts such as the packing 26 and the flange portion 24 of the processing chamber 20 of the rinsing / drying processing unit 12 and the inner surface of the processing chamber 20 and the rinsing / drying processing tank 14. The components and the processing chamber 20 flow down to the outer surface, etc.
Is prevented from being corroded.

【0030】基板Wが液受けバット30の上方を通過し
た後は、基板Wの表面から薬液が滴り落ちても、その薬
液はリンス・乾燥処理槽14内に流下するので、問題は
無い。基板Wが、実線で示すリンス・乾燥処理槽14の
上方位置まで搬送されると、液受けバット30は、移動
機構により実線で示す液受け位置から二点鎖線で示す退
避位置へ移動させられる。この後に、基板Wは、チャッ
ク18に支持されたまま下降させられ、処理チャンバ2
0の上面開口を通過して、リンス・乾燥処理槽14内に
挿入される。そして、基板搬送装置のチャック18は、
リンス・乾燥処理槽14の内部に設置された基板保持ホ
ルダ(図示せず)に基板Wを渡した後、上昇して処理チ
ャンバ20内から退出する。この後、処理チャンバ20
の開閉蓋22が閉じられて、処理チャンバ20の上部開
口が密閉され、基板のリンス・乾燥処理が行われる。以
上のような操作過程において、チャック18が昇降する
ときや開閉蓋22が開閉するときには、液受け部材30
は、二点鎖線で示した退避位置に移動しており、退避位
置は、チャック18の昇降動作や開閉蓋22の開閉動作
に対し液受け部材30が干渉しない位置であるので、液
受け部材30によって処理操作に支障が出ることはな
い。
After the substrate W has passed above the liquid receiving vat 30, even if a chemical solution drips from the surface of the substrate W, the chemical solution flows down into the rinsing / drying treatment tank 14, so that there is no problem. When the substrate W is transported to a position above the rinsing / drying treatment tank 14 shown by the solid line, the liquid receiving bat 30 is moved by the moving mechanism from the liquid receiving position shown by the solid line to the retracted position shown by the two-dot chain line. Thereafter, the substrate W is lowered while being supported by the chuck 18, and the processing chamber 2
After passing through the opening on the top surface of the rinsing / drying treatment tank 14, it is inserted into the rinsing / drying treatment tank 14. Then, the chuck 18 of the substrate transfer device is
After transferring the substrate W to a substrate holding holder (not shown) installed in the rinsing / drying processing tank 14, the substrate W is raised and retreated from the processing chamber 20. Thereafter, the processing chamber 20
Is closed, the upper opening of the processing chamber 20 is closed, and the substrate is rinsed and dried. In the above operation process, when the chuck 18 moves up and down or when the opening / closing lid 22 opens and closes, the liquid receiving member 30
Has moved to the retracted position shown by the two-dot chain line. The retracted position is a position where the liquid receiving member 30 does not interfere with the elevating operation of the chuck 18 and the opening and closing operation of the opening / closing lid 22. Does not hinder the processing operation.

【0031】上記した実施形態では、液受けバット30
を、液回収バット28の直上の退避位置と処理チャンバ
20の上方の液受け位置との間で水平方向へ往復移動自
在に支持してそれら両位置間を移動機構によって移動さ
せるようにしているが、図4に概略平面図を示すよう
に、液受けバット30を、処理チャンバ20の上方の液
受け位置と処理チャンバ20の後背側の退避位置との間
で前後水平方向へ往復移動自在に支持し、それら両位置
間を移動機構によって移動させるような構成としてもよ
い。また、図5に概略平面図を示すように、液受けバッ
ト30を水平面内において回動可能に支持し、水平面回
動機構によって液受けバット30を液受け位置から水平
面内で90°あるいは180°回動させて退避させるよ
うに構成してもよい。さらには、図6に概略正面図を示
すように、液受けバット30を鉛直面内において回動可
能に支持し、鉛直面回動機構によって液受けバット30
を液受け位置から鉛直面内で90°あるいは180°回
動させて退避させるように構成とすることも可能であ
る。
In the above embodiment, the liquid receiving vat 30
Is supported so as to be reciprocally movable in a horizontal direction between a retreat position just above the liquid collecting vat 28 and a liquid receiving position above the processing chamber 20 and is moved between these positions by a moving mechanism. As shown in a schematic plan view in FIG. 4, the liquid receiving bat 30 is supported so as to be reciprocally movable in the front-rear horizontal direction between a liquid receiving position above the processing chamber 20 and a retracted position on the rear side of the processing chamber 20. Alternatively, the moving mechanism may be used to move between these two positions. As shown in a schematic plan view in FIG. 5, the liquid receiving bat 30 is rotatably supported in a horizontal plane, and the liquid receiving bat 30 is rotated 90 ° or 180 ° in the horizontal plane from the liquid receiving position by a horizontal plane rotating mechanism. You may comprise so that it may be rotated and retracted. Further, as shown in a schematic front view in FIG. 6, the liquid receiving bat 30 is rotatably supported in a vertical plane, and the liquid receiving butt 30 is rotated by a vertical plane rotating mechanism.
Can be rotated 90 ° or 180 ° within the vertical plane from the liquid receiving position to retract.

【0032】また、上記実施形態では、液回収バット2
8を固定し、液受けバット30を退避位置と液受け位置
との間で往復移動させるようにしているが、液回収バッ
トを液受け位置まで移動させることができるように支持
するとともに、液受けバットを設けずに、液回収バット
を移動機構によって液回収位置と液受け位置との間で往
復移動させ、液回収バットが、液回収位置では本来の液
回収バットとしての役割を果たし、液受け位置では液受
け部材としての役割を果たすようにし、また、液回収位
置が退避位置ともなるような構成としてもよい。この場
合には、基板の搬送に同期させて液回収バットを移動さ
せ、基板の直下に液回収バットが位置するように制御す
る。
In the above embodiment, the liquid recovery vat 2
8 is fixed, and the liquid receiving vat 30 is reciprocated between the retracted position and the liquid receiving position. The liquid collecting vat is supported so as to be able to be moved to the liquid receiving position, and the liquid receiving vat is supported. The liquid collecting bat is reciprocated between the liquid collecting position and the liquid receiving position by the moving mechanism without providing the bat, and the liquid collecting bat functions as the original liquid collecting bat at the liquid collecting position, The position may serve as a liquid receiving member, and the liquid collecting position may be configured as a retracted position. In this case, the liquid recovery bat is moved in synchronization with the transport of the substrate, and control is performed so that the liquid recovery bat is located immediately below the substrate.

【0033】なお、上記した実施形態では、液受けバッ
ト30の液受け位置を、液受けバット30の前端がリン
ス・乾燥処理槽14の上部開口面に臨むような位置とし
たが、液受け位置を、例えばリンス・乾燥処理槽14の
上方位置までせり出すように設定してもよく、このよう
にしたときは、処理チャンバ20とリンス・乾燥処理槽
14との間に薬液が滴り落ちることを確実に防止するこ
とができる。また、上記実施形態では、基板の搬送の開
始前後に液受けバット30を退避位置から液受け位置へ
移動させるようにしているが、基板Wの搬送に同期させ
て液回収バット30を液受け位置まで移動させるように
制御してもよい。
In the above-described embodiment, the liquid receiving position of the liquid receiving vat 30 is such that the front end of the liquid receiving vat 30 faces the upper opening surface of the rinsing / drying processing tank 14. May be set to protrude, for example, to a position above the rinsing / drying processing tank 14. In such a case, it is ensured that the chemical solution drips between the processing chamber 20 and the rinsing / drying processing tank 14. Can be prevented. Further, in the above embodiment, the liquid receiving bat 30 is moved from the retracted position to the liquid receiving position before and after the start of the transfer of the substrate. However, the liquid collecting bat 30 is moved in synchronization with the transfer of the substrate W. It may be controlled to move to

【0034】[0034]

【発明の効果】請求項1に係る発明の基板処理装置を使
用すると、薬液処理された基板をリンス・乾燥処理部な
どの次の処理部へ搬送するときに、その処理部の構成部
品が薬液で腐食されることを防止することができ、装置
コストも安価に抑えることができる。
According to the substrate processing apparatus of the first aspect of the present invention, when a substrate subjected to a chemical treatment is transported to a next processing unit such as a rinsing / drying processing unit, the components of the processing unit are converted to a chemical solution. Corrosion can be prevented, and the cost of the apparatus can be reduced.

【0035】請求項2に係る発明の基板処理装置では、
固定された液回収部材と移動可能な液受け部材とによ
り、搬送中の基板から流下する処理液を回収し受けるこ
とができる。
In the substrate processing apparatus according to the second aspect of the present invention,
The processing liquid flowing down from the substrate being transported can be collected and received by the fixed liquid recovery member and the movable liquid receiving member.

【0036】請求項3ないし請求項5に係る各発明の基
板処理装置では、液受け部材が液受け位置と退避位置と
の間を移動して、請求項2に係る発明の上記効果が奏さ
れる。
In the substrate processing apparatus according to any one of the third to fifth aspects of the invention, the liquid receiving member moves between the liquid receiving position and the retracted position, so that the above-described effect of the second aspect of the invention is exhibited. You.

【0037】請求項6に係る発明の基板処理装置では、
移動可能な単独の液回収部材により、搬送中の基板から
流下する処理液を回収し受けることができる。
In the substrate processing apparatus of the invention according to claim 6,
The single movable liquid recovery member can collect and receive the processing liquid flowing down from the substrate being transported.

【0038】請求項7に係る発明の基板処理装置では、
上記効果が得られつつ、基板搬送手段と液受け部材との
干渉を避けることができる。
According to a seventh aspect of the present invention, in the substrate processing apparatus,
The interference between the substrate transfer means and the liquid receiving member can be avoided while the above effects are obtained.

【0039】請求項8に係る発明の基板処理装置では、
上記効果が得られつつ、開閉蓋と液受け部材との干渉を
避けることができる。
In the substrate processing apparatus of the invention according to claim 8,
While the above effects are obtained, interference between the opening / closing lid and the liquid receiving member can be avoided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の実施形態の1例を示し、基板処理装
置の概略構成を示す図であって一部を断面で表した正面
図である。
FIG. 1 is a front view showing an example of an embodiment of the present invention and showing a schematic configuration of a substrate processing apparatus, a part of which is shown in a cross section.

【図2】液受けバットの構成例を示す断面図である。FIG. 2 is a cross-sectional view illustrating a configuration example of a liquid receiving bat.

【図3】液受けバットの別の構成例を示す断面図であ
る。
FIG. 3 is a sectional view showing another configuration example of the liquid receiving bat.

【図4】液受けバットが液受け位置と退避位置との間で
移動するときの動作方法の例を示す概略平面図である。
FIG. 4 is a schematic plan view showing an example of an operation method when the liquid receiving bat moves between a liquid receiving position and a retracted position.

【図5】液受けバットが液受け位置と退避位置との間で
移動するときの動作方法の別の例を示す概略平面図であ
る。
FIG. 5 is a schematic plan view showing another example of an operation method when the liquid receiving bat moves between a liquid receiving position and a retracted position.

【図6】液受けバットが液受け位置と退避位置との間で
移動するときの動作方法のさらに別の例を示す概略正面
図である。
FIG. 6 is a schematic front view showing still another example of the operation method when the liquid receiving bat moves between the liquid receiving position and the retracted position.

【符号の説明】[Explanation of symbols]

10 薬液処理部(第1処理部) 12 リンス・乾燥処理部(第2処理部) 14 リンス・乾燥処理槽 16 基板搬送装置 18 基板搬送装置のチャック 20 処理チャンバ 22 開閉蓋 24 フランジ部 26 パッキン 28 液回収バット 30、34 液受けバット 32 液受けバットの内底面をなすテーパー面 36 液受けバットの流出孔 W 基板 A 基板の搬送方向 DESCRIPTION OF SYMBOLS 10 Chemical liquid processing part (1st processing part) 12 Rinse and drying processing part (2nd processing part) 14 Rinse and drying processing tank 16 Substrate transfer apparatus 18 Chuck of a substrate transfer apparatus 20 Processing chamber 22 Opening / closing lid 24 Flange part 26 Packing 28 Liquid recovery vat 30, 34 Liquid receiving vat 32 Tapered surface forming the inner bottom surface of liquid receiving vat 36 Outflow hole of liquid receiving vat W Substrate A Substrate transport direction

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01L 21/306 H01L 21/306 J ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01L 21/306 H01L 21/306 J

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 処理液を使用して基板の処理が行われる
第1処理槽を有する第1処理部と、 この第1処理部と隣り合って配設され第2処理槽を有す
る第2処理部と、 前記第1処理槽から前記第2処理槽へ、処理液が付着し
た状態の基板を搬送する基板搬送手段と、 基板搬送路の下方に配設され、前記第1処理部の側端部
からその側端部に対向する前記第2処理部の側端部まで
の範囲にわたって上面が開口し、搬送中の基板から流下
する処理液を回収する液回収部材と、を備えた基板処理
装置において、 前記第2処理部の前記側端部から前記第2処理槽の上部
開口面に臨む位置までの範囲において搬送中の基板から
流下する処理液を受ける液受け部材を退避可能に具備し
たことを特徴とする基板処理装置。
1. A first processing unit having a first processing tank for processing a substrate using a processing liquid, and a second processing unit having a second processing tank disposed adjacent to the first processing unit. And a substrate transfer means for transferring the substrate with the processing liquid attached thereto from the first processing tank to the second processing tank; and a side end of the first processing unit disposed below the substrate transfer path. And a liquid recovery member for recovering a processing liquid flowing down from the substrate being transported, the upper surface being open over a range from the portion to the side end of the second processing portion opposed to the side end thereof. In the above, a liquid receiving member for receiving a processing liquid flowing down from the substrate being transported in a range from the side end of the second processing unit to a position facing an upper opening surface of the second processing tank is provided so as to be retractable. A substrate processing apparatus characterized by the above-mentioned.
【請求項2】 請求項1記載の基板処理装置において、 前記液回収部材が固定され、 前記液受け部材が、前記液回収部材と基板搬送路との間
の高さ位置であって搬送中の基板から流下する処理液を
受ける液受け位置と退避位置との間で移動自在に支持さ
れ、その液受け部材に、それが受けた処理液を前記液回
収部材へ導く導液路が設けられ、前記液受け部材を移動
させる液受け部材移動手段を有することを特徴とする基
板処理装置。
2. The substrate processing apparatus according to claim 1, wherein the liquid collecting member is fixed, and the liquid receiving member is at a height position between the liquid collecting member and the substrate conveying path and is being transferred. The liquid receiving member is movably supported between a liquid receiving position for receiving the processing liquid flowing down from the substrate and a retracted position, and the liquid receiving member is provided with a liquid guide path for guiding the processing liquid received by the liquid collecting member to the liquid collecting member. A substrate processing apparatus comprising a liquid receiving member moving means for moving the liquid receiving member.
【請求項3】 請求項2記載の基板処理装置において、 前記液受け部材が、液受け位置と退避位置との間で水平
方向へ往復移動自在に支持されたことを特徴とする基板
処理装置。
3. The substrate processing apparatus according to claim 2, wherein the liquid receiving member is supported so as to be reciprocally movable in a horizontal direction between a liquid receiving position and a retracted position.
【請求項4】 請求項2記載の基板処理装置において、 前記液受け部材が、液受け位置と退避位置との間で水平
面内において回動自在に支持されたことを特徴とする基
板処理装置。
4. The substrate processing apparatus according to claim 2, wherein the liquid receiving member is rotatably supported in a horizontal plane between a liquid receiving position and a retracted position.
【請求項5】 請求項2記載の基板処理装置において、 前記液受け部材が、液受け位置と退避位置との間で鉛直
面内において回動自在に支持されたことを特徴とする基
板処理装置。
5. The substrate processing apparatus according to claim 2, wherein the liquid receiving member is rotatably supported in a vertical plane between a liquid receiving position and a retracted position. .
【請求項6】 請求項1記載の基板処理装置において、 前記液回収部材が、搬送中の基板から流下する処理液を
回収する液回収位置と前記第2処理部の前記側端部から
前記第2処理槽の上部開口面に臨む位置までの範囲にお
いて搬送中の基板から流下する処理液を受ける液受け位
置との間で往復移動自在に支持されて、液回収部材が前
記液受け部材を兼用し、前記液回収位置が退避位置とさ
れ、前記液回収部材を移動させる液回収部材移動手段を
有することを特徴とする基板処理装置。
6. The substrate processing apparatus according to claim 1, wherein the liquid collecting member is configured to collect a processing liquid flowing down from the substrate being transported and a liquid collecting position from the side end of the second processing unit. (2) The liquid collecting member is also reciprocally supported between a liquid receiving position for receiving the processing liquid flowing down from the substrate being transported in a range up to a position facing the upper opening surface of the processing tank, and the liquid collecting member also serves as the liquid receiving member. And a liquid recovery member moving means for moving the liquid recovery member, wherein the liquid recovery position is a retreat position.
【請求項7】 請求項1ないし請求項6のいずれかに記
載の基板処理装置において、 前記基板搬送手段が、前記第2処理槽に対して昇降可能
であり、 前記液受け部材の退避位置が、前記第2処理槽に対して
前記基板搬送手段が昇降するときに基板搬送手段と液受
け部材とが干渉しない位置であることを特徴とする基板
処理装置。
7. The substrate processing apparatus according to claim 1, wherein the substrate transfer means is capable of moving up and down with respect to the second processing tank, and wherein a retreat position of the liquid receiving member is set. A substrate processing apparatus, wherein the substrate transfer means and the liquid receiving member do not interfere with each other when the substrate transfer means moves up and down with respect to the second processing tank.
【請求項8】 請求項1ないし請求項7のいずれかに記
載の基板処理装置において、 前記第2処理槽が、上部に基板の搬出入用の開口を有し
その開口を開閉する開閉蓋を具備した処理チャンバの内
部に配設され、 前記液受け部材の退避位置が、前記開閉蓋が前記処理チ
ャンバの上部開口を開閉するときに開閉蓋と液受け部材
とが干渉しない位置であることを特徴とする基板処理装
置。
8. The substrate processing apparatus according to claim 1, wherein the second processing tank has an opening for loading and unloading the substrate at an upper portion, and an opening / closing lid for opening and closing the opening. The retreat position of the liquid receiving member is disposed inside the processing chamber provided, and the retreat position of the liquid receiving member is a position where the open / close lid and the liquid receiving member do not interfere with each other when the open / close lid opens and closes the upper opening of the processing chamber. Characteristic substrate processing equipment.
JP2001078267A 2001-03-19 2001-03-19 Substrate processing equipment Expired - Fee Related JP3817143B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001078267A JP3817143B2 (en) 2001-03-19 2001-03-19 Substrate processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001078267A JP3817143B2 (en) 2001-03-19 2001-03-19 Substrate processing equipment

Publications (2)

Publication Number Publication Date
JP2002280346A true JP2002280346A (en) 2002-09-27
JP3817143B2 JP3817143B2 (en) 2006-08-30

Family

ID=18934906

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001078267A Expired - Fee Related JP3817143B2 (en) 2001-03-19 2001-03-19 Substrate processing equipment

Country Status (1)

Country Link
JP (1) JP3817143B2 (en)

Also Published As

Publication number Publication date
JP3817143B2 (en) 2006-08-30

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