JP2002270411A - Laser trimming unit - Google Patents

Laser trimming unit

Info

Publication number
JP2002270411A
JP2002270411A JP2001072181A JP2001072181A JP2002270411A JP 2002270411 A JP2002270411 A JP 2002270411A JP 2001072181 A JP2001072181 A JP 2001072181A JP 2001072181 A JP2001072181 A JP 2001072181A JP 2002270411 A JP2002270411 A JP 2002270411A
Authority
JP
Japan
Prior art keywords
electronic component
unit
main transport
laser trimming
sub
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001072181A
Other languages
Japanese (ja)
Other versions
JP3745970B2 (en
Inventor
Tsugio Tamaishi
次男 玉石
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Weld Co Ltd
Original Assignee
Tokyo Weld Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Weld Co Ltd filed Critical Tokyo Weld Co Ltd
Priority to JP2001072181A priority Critical patent/JP3745970B2/en
Publication of JP2002270411A publication Critical patent/JP2002270411A/en
Application granted granted Critical
Publication of JP3745970B2 publication Critical patent/JP3745970B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a laser trimming unit which never deteriorates the precision of measurement due to dust generated when trimming and has high production efficiency. SOLUTION: A main transfer table 21 which holds electronic parts W and transfers them along a main transfer route while rotating, an auxiliary transfer table 31 which holds electronic parts W and transfers them along an auxiliary transfer route while rotating, a linear feeder 23 which feeds the electronic parts W, a taping unit 28 which takes out the electronic parts W, a first characteristic measuring unit 24 which measures the characteristics of the electronic parts W, a second characteristic measuring unit 26 which measures the characteristics of the electronic parts W, a laser trimming mechanism 40 which cut off the prescribed part of the electronic part W on the basis of a measurement result by the first characteristic measuring unit 24, and a dust collector 41 which removes dust that is generated when the composition material of the parts W is vaporized by the laser trimming mechanism 40 and solidified.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電子部品を搬送し
ながら所定部分をレーザ光にて切除するトリミング加工
を行うレーザトリミング装置に関し、特にトリミング加
工に伴って発生する粉塵の影響を最小限に抑えることが
できるものに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laser trimming apparatus for trimming a predetermined portion with a laser beam while transporting an electronic component, and more particularly to minimizing the influence of dust generated by the trimming process. Regarding what can be suppressed.

【0002】[0002]

【従来の技術】レーザトリミング装置は、レーザ光のパ
ワーを利用して電子部品の部分切除や部分除去等の加工
(以下、「トリミング加工」と称する。)を行い、部品
の特性を調整するものである。例えば、チップ状電子部
品の調整、すなわち高周波用コイルのインダクタンスや
抵抗値の調整等は、特性を測定しながらレーザ光を用い
てトリミング加工により行われる。しかしながら、レー
ザ光を用いたトリミング加工は、部品の組成材料の蒸発
によって行われるため、蒸発気化した材料の拡散量は元
の容積の数千倍以上にもなり、それが空中で冷却され凝
縮して微塵化し、その粉塵が周囲に付着する。このた
め、近くに測定機器があると、光学系を汚して検出し難
くしたり、電気接点を汚して接点不良が多々発生するた
め、従来は検査・測定とトリミング加工は別々の装置に
より行っていた。
2. Description of the Related Art A laser trimming apparatus performs processing such as partial cutting or partial removal of an electronic component by utilizing the power of a laser beam (hereinafter, referred to as "trimming") to adjust the characteristics of the component. It is. For example, adjustment of a chip-shaped electronic component, that is, adjustment of inductance and resistance of a high-frequency coil is performed by trimming using laser light while measuring characteristics. However, since the trimming process using laser light is performed by evaporating the composition material of the parts, the amount of diffusion of the vaporized material becomes several thousand times or more the original volume, which is cooled and condensed in the air. And the dust adheres to the surroundings. For this reason, if there is a measuring device nearby, the optical system becomes dirty and it is difficult to detect it, and the electrical contacts become dirty and contact failures often occur. Was.

【0003】[0003]

【発明が解決しようとする課題】上述した従来のレーザ
トリミング装置においては次のような問題があった。す
なわち、電子部品の特性測定とトリミング加工とを別々
の装置で行っていたため、材料の蒸発による粉塵が周囲
の機器に付着し、生産効率が低下するという問題と、装
置を設置するために広いスペースが必要になるという問
題があった。
The conventional laser trimming apparatus described above has the following problems. In other words, since the measurement of the characteristics of the electronic components and the trimming process are performed by separate devices, dust due to evaporation of the material adheres to peripheral devices, lowering production efficiency, and a large space for installing the devices. There was a problem that needed.

【0004】そこで本発明は、トリミング加工により発
生する粉塵により測定精度を低下させることがなく、ま
た生産効率の高いレーザトリミング装置を提供すること
を目的としている。
Accordingly, an object of the present invention is to provide a laser trimming apparatus which does not lower the measurement accuracy due to dust generated by the trimming process and has high production efficiency.

【0005】[0005]

【課題を解決するための手段】上記課題を解決し目的を
達成するために、本発明のレーザトリミング装置は次の
ように構成されている。
In order to solve the above-mentioned problems and achieve the object, a laser trimming apparatus according to the present invention is configured as follows.

【0006】(1)電子部品の所定部分を切除するレー
ザトリミング装置において、前記電子部品を保持し、主
搬送経路に沿って周回搬送する主搬送手段と、この主搬
送経路に隣接して設けられ、前記電子部品を保持し、副
搬送経路に沿って周回搬送する副搬送手段と、前記主搬
送経路に設けられ前記主搬送手段に前記電子部品を供給
する電子部品供給手段と、前記主搬送経路に設けられ前
記主搬送手段から前記電子部品を搬出する電子部品搬出
手段と、前記主搬送経路における前記電子部品供給手段
と前記電子部品搬出手段との間に設けられ、前記主搬送
手段と前記副搬送手段との間で前記電子部品を移載する
電子部品移載手段と、前記主搬送経路における前記電子
部品供給手段と前記電子部品移載手段との間に設けら
れ、前記電子部品の特性を測定する第1特性測定手段
と、前記主搬送経路における前記電子部品移載手段と前
記電子部品搬出手段との間に設けられ、前記電子部品の
特性を測定する第2特性測定手段と、前記副搬送経路に
設けられ前記第1特性測定手段による測定結果に基づい
て前記電子部品の所定部分を切除するレーザトリミング
手段とを備えていることを特徴とする。
(1) In a laser trimming apparatus for cutting a predetermined portion of an electronic component, a main transport means for holding the electronic component and transporting the same electronically along a main transport route, and provided adjacent to the main transport route. A sub-transporting unit that holds the electronic component and conveys the electronic component around the sub-transport route; an electronic component supply unit that is provided in the main transport route and supplies the electronic component to the main transport unit; An electronic component unloading means provided to unload the electronic component from the main transport means, and an electronic component unloading means provided between the electronic component supply means and the electronic component unloading means on the main transport path; An electronic component transfer unit that transfers the electronic component to and from a transfer unit; and an electronic component transfer unit that is provided between the electronic component supply unit and the electronic component transfer unit in the main transfer path. First characteristic measuring means for measuring the property, second characteristic measuring means provided between the electronic component transferring means and the electronic component unloading means on the main transport path, and measuring characteristics of the electronic component; A laser trimming means provided on the sub-transport path for cutting off a predetermined portion of the electronic component based on a measurement result by the first characteristic measuring means.

【0007】(2)上記(1)に記載されたレーザトリ
ミング装置であって、前記主搬送手段は、その外周に前
記電子部品を保持する電子部品保持手段を有する回転テ
ーブルを備えていることを特徴とする。
(2) In the laser trimming apparatus described in the above (1), the main transport means includes a rotary table having an electronic component holding means for holding the electronic component on an outer periphery thereof. Features.

【0008】(3)上記(1)に記載されたレーザトリ
ミング装置であって、前記副搬送手段は、その外周に前
記電子部品を保持する電子部品保持手段を有する回転テ
ーブルを備えていることを特徴とする。
(3) In the laser trimming apparatus described in (1), the sub-transporting means includes a rotary table having an electronic component holding means for holding the electronic component on an outer periphery thereof. Features.

【0009】(4)上記(2)に記載されたレーザトリ
ミング装置であって、前記主搬送手段の電子部品保持手
段は、前記電子部品の所定の被吸着面を吸着する吸着機
構であることを特徴とする。
(4) In the laser trimming device described in (2), the electronic component holding means of the main transport means is a suction mechanism for suctioning a predetermined suction surface of the electronic component. Features.

【0010】(5)上記(4)に記載されたレーザトリ
ミング装置であって、前記副搬送手段の電子部品保持手
段は、前記吸着機構による前記電子部品の被吸着面を除
く他の面のうち、対向する2面を保持することを特徴と
する。
(5) In the laser trimming apparatus described in (4), the electronic component holding means of the sub-transporting means may include a surface other than a surface to be sucked of the electronic component by the suction mechanism. , Two opposite surfaces are held.

【0011】(6)上記(1)に記載されたレーザトリ
ミング装置であって、前記主搬送経路における前記第2
特性測定手段と、前記電子部品搬出手段との間に前記第
2特定測定手段による測定結果に基づいて前記主搬送手
段から前記電子部品を排出する電子部品排出手段が設け
られていることを特徴とする。
(6) The laser trimming device according to the above (1), wherein the second portion on the main transport path is provided.
An electronic component discharging unit that discharges the electronic component from the main transport unit based on a measurement result by the second specific measuring unit is provided between the characteristic measuring unit and the electronic component unloading unit. I do.

【0012】(7)上記(1)に記載されたレーザトリ
ミング装置であって、前記副搬送経路に設けられレーザ
トリミング手段により切除された前記電子部品の粉塵を
除去する除去手段とを備えていることを特徴とする。
(7) The laser trimming apparatus according to the above (1), further comprising a removing means provided on the sub-transport path for removing dust of the electronic component cut by the laser trimming means. It is characterized by the following.

【0013】[0013]

【発明の実施の形態】図1は本発明の一実施の形態に係
るレーザトリミング装置10を示す平面図、図2はレー
ザトリミング装置10に組み込まれた吸着部22の吸着
方法を示す説明図、図3はレーザトリミング装置10に
組み込まれた副搬送テーブル31の要部を示す断面図で
ある。なお、図中Wは電子部品を示しており、Waは下
面、Wbは上面を示している。下面Waには電極Wcが
形成されている。また、上面Wbは被吸着面であり、後
述するレーザトリミング機構40によりトリミングされ
る。さらに、Wdは電子部品Wの側面を示している。
FIG. 1 is a plan view showing a laser trimming device 10 according to an embodiment of the present invention, FIG. 2 is an explanatory diagram showing a suction method of a suction portion 22 incorporated in the laser trimming device 10, FIG. 3 is a cross-sectional view showing a main part of the sub-carrying table 31 incorporated in the laser trimming device 10. In the drawings, W indicates an electronic component, Wa indicates a lower surface, and Wb indicates an upper surface. An electrode Wc is formed on the lower surface Wa. The upper surface Wb is a surface to be attracted, and is trimmed by a laser trimming mechanism 40 described later. Further, Wd indicates a side surface of the electronic component W.

【0014】レーザトリミング装置10は、電子部品W
の供給・測定・排出を行う主搬送部20と、トリミング
加工を行う副搬送部30とを備えている。
The laser trimming device 10 includes an electronic component W
A main transport unit 20 that supplies, measures, and discharges the data, and a sub transport unit 30 that performs trimming.

【0015】主搬送部20は、図1中矢印R方向に間欠
回転する主搬送テーブル21を備えている。主搬送テー
ブル21の外縁部には、円周方向に沿って電子部品Wの
上面Wbを吸着保持する吸着部22が設けられている。
吸着部22は図2に示すように吸着ノズル22aを備
え、この吸着ノズル22aは吸引装置(不図示)に接続
されている。また、主搬送テーブル21の外周には、図
1中左端から時計回りに、電子部品Wを供給するリニア
フィーダ(電子部品供給手段)23、電子部品Wの電気
的特性を測定する第1特性測定装置24、副搬送部30
との間で電子部品Wを移載する移載部25、電子部品W
の電気的特性を測定する第2特性測定装置26、不良の
電子部品Wを排出する排出トレイ(部品排出手段)2
7、電子部品WをキャリアテープCの収納凹部に収納す
るテーピング装置(電子部品搬出手段)28とを備えて
いる。
The main transport section 20 has a main transport table 21 which rotates intermittently in the direction of arrow R in FIG. At the outer edge of the main transfer table 21, a suction unit 22 that suction-holds the upper surface Wb of the electronic component W along the circumferential direction is provided.
The suction unit 22 includes a suction nozzle 22a as shown in FIG. 2, and the suction nozzle 22a is connected to a suction device (not shown). A linear feeder (electronic component supply means) 23 for supplying the electronic component W clockwise from the left end in FIG. Device 24, sub-transport unit 30
A transfer unit 25 for transferring an electronic component W between the electronic component W
Characteristic measuring device 26 for measuring the electrical characteristics of the device, a discharge tray (component discharging means) 2 for discharging a defective electronic component W
7. A taping device (electronic component unloading means) 28 for storing the electronic component W in the storage recess of the carrier tape C.

【0016】副搬送部30は、図1中矢印r方向に回転
する副搬送テーブル31を備えている。副搬送テーブル
31の外縁部には、円周方向に沿って電子部品Wの側面
Wdを把持する把持機構32が設けられている。把持機
構32は、図3に示すように、副搬送テーブル31に固
定して取り付けられた固定把持片33と、副搬送テーブ
ル31に固定部34を介して回転軸S回りに回動可能に
取り付けられた可動把持片35と、この可動把持片35
の作用端35aを図3中矢印α方向に付勢するスプリン
グ36と、可動把持片35の駆動端35bを押し上げる
押上機構37とを備えている。
The sub-transport section 30 has a sub-transport table 31 which rotates in the direction of arrow r in FIG. A gripping mechanism 32 that grips the side surface Wd of the electronic component W along the circumferential direction is provided at the outer edge of the sub-transport table 31. As shown in FIG. 3, the gripping mechanism 32 is fixedly attached to the sub-transport table 31 and is attached to the sub-transport table 31 via a fixing portion 34 so as to be rotatable around the rotation axis S. And the movable gripping piece 35
3 and a push-up mechanism 37 that pushes up the drive end 35b of the movable gripping piece 35.

【0017】また、副搬送テーブル31の外周には、電
子部品Wの上面Wbを切除するレーザトリミング機構4
0及び吸塵装置41が配置されている。
A laser trimming mechanism 4 for cutting off the upper surface Wb of the electronic component W is provided on the outer periphery of the sub-transport table 31.
0 and a dust suction device 41 are arranged.

【0018】このように構成されたレーザトリミング装
置10では、次のようにして電子部品Wのトリミングを
行う。すなわち、リニアフィーダ23で順次搬送されて
くる電子部品Wの上面Wbを吸着部22の吸着ノズル2
2aにより吸着する。次に、電子部品Wは主搬送テーブ
ル31により第1特性測定装置24まで搬送される。第
1特性測定装置24では電子部品Wの電極Wcに測定端
子(不図示)を接触させ、特性を測定する。測定終了
後、電子部品Wは移載部25まで搬送される。
In the laser trimming device 10 configured as described above, the electronic component W is trimmed as follows. That is, the upper surface Wb of the electronic component W sequentially conveyed by the linear feeder 23 is
Adsorbed by 2a. Next, the electronic component W is transported to the first characteristic measuring device 24 by the main transport table 31. In the first characteristic measuring device 24, a measurement terminal (not shown) is brought into contact with the electrode Wc of the electronic component W to measure the characteristic. After the measurement is completed, the electronic component W is transported to the transfer unit 25.

【0019】移載部25では、副搬送部30の押上機構
37が動作し、可動把持片35の作用端35aが矢印α
と逆方向に移動し、固定把持片33との間に隙間が生じ
る。一方、電子部品Wが移載部25に到達し、この隙間
に電子部品Wが位置決めされると、吸着部22による電
子部品Wの吸着が停止される。続いて、押上機構37の
動作が終了し、可動把持片35の作用端35aはスプリ
ング36の付勢により固定把持片33との間に電子部品
Wを挟み、把持する。
In the transfer section 25, the push-up mechanism 37 of the sub-transport section 30 operates, and the working end 35a of the movable gripping piece 35 points to the arrow α.
In the opposite direction, and a gap is generated between the fixed gripping piece 33. On the other hand, when the electronic component W reaches the transfer unit 25 and the electronic component W is positioned in the gap, the suction of the electronic component W by the suction unit 22 is stopped. Subsequently, the operation of the lifting mechanism 37 is completed, and the operating end 35a of the movable gripping piece 35 sandwiches and holds the electronic component W between the movable gripping piece 35 and the fixed gripping piece 33 by the bias of the spring 36.

【0020】次に、副搬送テーブル31が電子部品Wを
レーザトリミング機構40まで搬送する。レーザトリミ
ング機構40では、第1特性測定装置24によって測定
された電子部品Wの特性に基づいて、所定量のトリミン
グ加工を行う。トリミング加工によって、電子部品Wの
部分切断や部分除去した組成材料は蒸発した後、冷却し
て微塵化するが、吸塵装置41により吸引・処理され
る。これにより粉塵が主搬送部20側に影響を与えるこ
とはない。
Next, the sub-transport table 31 transports the electronic component W to the laser trimming mechanism 40. The laser trimming mechanism 40 performs a predetermined amount of trimming based on the characteristics of the electronic component W measured by the first characteristic measuring device 24. After the trimming process, the composition material that has been partially cut or partially removed from the electronic component W evaporates and then cools and becomes fine dust. As a result, the dust does not affect the main transport unit 20 side.

【0021】トリミング加工終了後、副搬送テーブル3
1が電子部品Wを移載部25まで搬送する。押上機構3
7が動作し、可動把持片35の作用端35aが矢印α方
向と逆方向に移動し、固定把持片33との間による電子
部品Wの把持が解除される。そして、吸着部22により
再度電子部品Wが吸着される。次に、電子部品Wは主搬
送テーブル31により第2特性測定装置26まで搬送さ
れる。第2特性測定装置26では電子部品Wの電極Wc
に測定端子(不図示)を接触させ、特性を測定する。こ
のとき、特性が許容範囲内であれば良品とされ、許容範
囲外であれば不良品となる。測定終了後、不良品と判断
された電子部品Wは排出トレイ(部品排出手段)27の
上方まで搬送され、吸着部22の吸着が解除される。そ
して、排出トレイ27内に収容される。
After the completion of the trimming, the sub-transport table 3
1 transports the electronic component W to the transfer unit 25. Push-up mechanism 3
7, the working end 35a of the movable gripping piece 35 moves in the direction opposite to the direction of the arrow α, and the gripping of the electronic component W between the movable gripping piece 35 and the fixed gripping piece 33 is released. Then, the electronic component W is sucked again by the suction unit 22. Next, the electronic component W is transported to the second characteristic measuring device 26 by the main transport table 31. In the second characteristic measuring device 26, the electrode Wc of the electronic component W
To a measurement terminal (not shown) to measure the characteristics. At this time, if the characteristic is within the allowable range, the product is determined to be good, and if the characteristic is out of the allowable range, it is determined to be defective. After the completion of the measurement, the electronic component W determined to be defective is transported to a position above the discharge tray (component discharge means) 27, and the suction of the suction unit 22 is released. Then, the sheet is stored in the discharge tray 27.

【0022】一方、測定終了後、良品と判断された電子
部品Wはテーピング装置28まで搬送され、キャリアテ
ープCの収納凹部に収納される。
On the other hand, after the measurement is completed, the electronic component W determined to be non-defective is transported to the taping device 28 and stored in the storage recess of the carrier tape C.

【0023】上述したように本実施の形態に係るレーザ
トリミング装置10によれば、トリミングの際に発生す
る微塵化した粉塵を副搬送部30側で処理することで、
主搬送部20側への粉塵の影響を最小限に抑えることが
でき、第1の特性測定装置24及び第2の特性測定装置
26による測定に影響を与えることがない。また、検査
・測定とレーザ加工とを同一の装置で行うため、生産効
率を高めることができるとともに、装置を設置するスペ
ースを小さくすることが可能である。
As described above, according to the laser trimming apparatus 10 according to the present embodiment, the sub-conveying section 30 processes the finely divided dust generated during trimming.
The influence of dust on the main transport unit 20 side can be minimized, and the measurement by the first characteristic measuring device 24 and the second characteristic measuring device 26 is not affected. In addition, since the inspection / measurement and the laser processing are performed by the same device, the production efficiency can be improved, and the space for installing the device can be reduced.

【0024】なお、本発明は前記実施の形態に限定され
るものではない。すなわち、上述した実施の形態では、
主搬送手段や副搬送手段として回転テーブルを用いてい
るが、コンベア等のように直線的に部品を搬送するもの
であってもよい。また、保持手段として吸引、把持等の
方法を用いているがこれらの保持方法に限られない。こ
の他、本発明の要旨を逸脱しない範囲で種々変形実施可
能であるのは勿論である。
The present invention is not limited to the above embodiment. That is, in the above-described embodiment,
Although a rotary table is used as the main transport unit and the sub-transport unit, it may be a unit that transports components linearly, such as a conveyor. In addition, methods such as suction and gripping are used as the holding means, but are not limited to these holding methods. In addition, it goes without saying that various modifications can be made without departing from the spirit of the present invention.

【0025】[0025]

【発明の効果】本発明によれば、トリミング加工により
発生した粉塵により測定精度を低下させることがなく、
また生産効率が高く、装置の設置スペースを小さくする
ことができるレーザトリミング装置を提供することが可
能となる。
According to the present invention, measurement accuracy is not reduced by dust generated by trimming.
In addition, it is possible to provide a laser trimming device that has high production efficiency and can reduce the installation space of the device.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態に係るレーザトリミング
装置を示す平面図。
FIG. 1 is a plan view showing a laser trimming device according to one embodiment of the present invention.

【図2】同レーザトリミング装置に組み込まれた吸着部
を示す断面図。
FIG. 2 is a sectional view showing a suction unit incorporated in the laser trimming apparatus.

【図3】同レーザトリミング装置に組み込まれた副搬送
テーブルの要部を示す断面図。
FIG. 3 is a sectional view showing a main part of a sub-transport table incorporated in the laser trimming apparatus.

【符号の説明】[Explanation of symbols]

10…レーザトリミング装置 20…主搬送部 21…主搬送テーブル 22…吸着部 23…リニアフィーダ(電子部品供給手段) 24…第1特性測定装置 25…移載部 26…第2特性測定装置 27…排出トレイ(部品排出手段) 28…テーピング装置(電子部品搬出手段) 30…副搬送部 31…副搬送テーブル 32…把持機構 40…レーザトリミング機構 DESCRIPTION OF SYMBOLS 10 ... Laser trimming apparatus 20 ... Main conveyance part 21 ... Main conveyance table 22 ... Suction part 23 ... Linear feeder (electronic component supply means) 24 ... 1st characteristic measuring device 25 ... Transfer part 26 ... 2nd characteristic measuring device 27 ... Discharge tray (component discharge means) 28 taping device (electronic component unloading means) 30 sub-transport section 31 sub-transport table 32 gripping mechanism 40 laser trimming mechanism

フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) // B23K 101:36 H01C 17/24 L Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat II (reference) // B23K 101: 36 H01C 17/24 L

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】電子部品の所定部分を切除するレーザトリ
ミング装置において、 前記電子部品を保持し、主搬送経路に沿って周回搬送す
る主搬送手段と、 この主搬送経路に隣接して設けられ、前記電子部品を保
持し、副搬送経路に沿って周回搬送する副搬送手段と、 前記主搬送経路に設けられ前記主搬送手段に前記電子部
品を供給する電子部品供給手段と、 前記主搬送経路に設けられ前記主搬送手段から前記電子
部品を搬出する電子部品搬出手段と、 前記主搬送経路における前記電子部品供給手段と前記電
子部品搬出手段との間に設けられ、前記主搬送手段と前
記副搬送手段との間で前記電子部品を移載する電子部品
移載手段と、 前記主搬送経路における前記電子部品供給手段と前記電
子部品移載手段との間に設けられ、前記電子部品の特性
を測定する第1特性測定手段と、 前記主搬送経路における前記電子部品移載手段と前記電
子部品搬出手段との間に設けられ、前記電子部品の特性
を測定する第2特性測定手段と、 前記副搬送経路に設けられ前記第1特性測定手段による
測定結果に基づいて前記電子部品の所定部分を切除する
レーザトリミング手段とを備えていることを特徴とする
レーザトリミング装置。
1. A laser trimming apparatus for cutting a predetermined portion of an electronic component, comprising: main transport means for holding the electronic component and transporting the same electronically along a main transport route; provided adjacent to the main transport route; A sub-transporting unit that holds the electronic component and conveys it around the sub-transport route; an electronic component supply unit that is provided in the main transport route and supplies the electronic component to the main transport unit; An electronic component unloading unit provided for unloading the electronic component from the main transport unit; and an electronic component unloading unit provided between the electronic component supply unit and the electronic component unloading unit on the main transport path, wherein the main transport unit and the sub-transport are provided. Electronic component transfer means for transferring the electronic component between the electronic component supply means and the electronic component transfer means on the main transport path; A first characteristic measuring means for measuring a characteristic of the electronic component, the second characteristic measuring means being provided between the electronic component transferring means and the electronic component unloading means on the main transport path, and measuring characteristics of the electronic component; A laser trimming device provided on a sub-transport path for cutting off a predetermined portion of the electronic component based on a measurement result by the first characteristic measuring device.
【請求項2】前記主搬送手段は、その外周に前記電子部
品を保持する電子部品保持手段を有する回転テーブルを
備えていることを特徴とする請求項1に記載のレーザト
リミング装置。
2. A laser trimming apparatus according to claim 1, wherein said main transport means includes a rotary table having an electronic component holding means for holding said electronic component on an outer periphery thereof.
【請求項3】前記副搬送手段は、その外周に前記電子部
品を保持する電子部品保持手段を有する回転テーブルを
備えていることを特徴とする請求項1に記載のレーザト
リミング装置。
3. The laser trimming apparatus according to claim 1, wherein said sub-transporting means includes a rotary table having an electronic component holding means for holding said electronic component on an outer periphery thereof.
【請求項4】前記主搬送手段の電子部品保持手段は、前
記電子部品の所定の被吸着面を吸着する吸着機構である
ことを特徴とする請求項2に記載のレーザトリミング装
置。
4. The laser trimming device according to claim 2, wherein said electronic component holding means of said main transport means is a suction mechanism for sucking a predetermined suction surface of said electronic component.
【請求項5】前記副搬送手段の電子部品保持手段は、前
記吸着機構による前記電子部品の被吸着面を除く他の面
のうち、対向する2面を保持することを特徴とする請求
項4に記載のレーザトリミング装置。
5. The electronic component holding means of the sub-transporting means holds two opposing surfaces out of surfaces other than a surface to be sucked of the electronic component by the suction mechanism. 3. The laser trimming device according to claim 1.
【請求項6】前記主搬送経路における前記第2特性測定
手段と、前記電子部品搬出手段との間に前記第2特定測
定手段による測定結果に基づいて前記主搬送手段から前
記電子部品を排出する電子部品排出手段が設けられてい
ることを特徴とする請求項1に記載のレーザトリミング
装置。
6. The electronic component is discharged from the main transport unit between the second characteristic measuring unit and the electronic component unloading unit on the main transport path based on a measurement result by the second specific measuring unit. 2. The laser trimming device according to claim 1, further comprising an electronic component discharging unit.
【請求項7】前記副搬送経路に設けられレーザトリミン
グ手段により切除された前記電子部品の粉塵を除去する
除去手段とを備えていることを特徴とする請求項1に記
載のレーザトリミング装置。
7. The laser trimming device according to claim 1, further comprising: a removing unit provided on the sub-conveying path to remove dust of the electronic component cut by the laser trimming unit.
JP2001072181A 2001-03-14 2001-03-14 Laser trimming device Expired - Lifetime JP3745970B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001072181A JP3745970B2 (en) 2001-03-14 2001-03-14 Laser trimming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001072181A JP3745970B2 (en) 2001-03-14 2001-03-14 Laser trimming device

Publications (2)

Publication Number Publication Date
JP2002270411A true JP2002270411A (en) 2002-09-20
JP3745970B2 JP3745970B2 (en) 2006-02-15

Family

ID=18929796

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001072181A Expired - Lifetime JP3745970B2 (en) 2001-03-14 2001-03-14 Laser trimming device

Country Status (1)

Country Link
JP (1) JP3745970B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006306617A (en) * 2005-03-30 2006-11-09 Ueno Seiki Kk Device and method of processing electronic parts

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006306617A (en) * 2005-03-30 2006-11-09 Ueno Seiki Kk Device and method of processing electronic parts

Also Published As

Publication number Publication date
JP3745970B2 (en) 2006-02-15

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