JP2002208737A - Surface mount semiconductor light emitting device - Google Patents

Surface mount semiconductor light emitting device

Info

Publication number
JP2002208737A
JP2002208737A JP2001004070A JP2001004070A JP2002208737A JP 2002208737 A JP2002208737 A JP 2002208737A JP 2001004070 A JP2001004070 A JP 2001004070A JP 2001004070 A JP2001004070 A JP 2001004070A JP 2002208737 A JP2002208737 A JP 2002208737A
Authority
JP
Japan
Prior art keywords
light emitting
semiconductor light
emitting device
support
external lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001004070A
Other languages
Japanese (ja)
Inventor
Nobuo Kobayashi
信夫 小林
Hideyuki Osawa
英之 大澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanken Electric Co Ltd
Original Assignee
Sanken Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanken Electric Co Ltd filed Critical Sanken Electric Co Ltd
Priority to JP2001004070A priority Critical patent/JP2002208737A/en
Publication of JP2002208737A publication Critical patent/JP2002208737A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

Abstract

PROBLEM TO BE SOLVED: To improve heat radiation of a semiconductor light emitting device and attain miniaturization. SOLUTION: The device comprises a support (1), a semiconductor light emitting element (2) fixed to the support (1), a first outer lead (3) disposed with a fixed distance from the support (1) and electrically connected to an electrode of the light emitting element (2), and a resin seal (4) covering the light emitting element (2) and the first lead (3). The support (1) is made of a metal and has an adhesive part 1a projecting from the resin seal (4), the adhesive part 1a of the support (1) is fixed to a wiring board (5) to form a gap (6) between the resin seal (4) and the wiring board (5), and the heat generated from the light emitting element (2) during operating is discharged from the adhesive part (1a) through the gap (6) into the ambient air.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体発光装置、
特に放熱性の高い表面実装型半導体発光装置に関するも
のである。
The present invention relates to a semiconductor light emitting device,
More particularly, the present invention relates to a surface-mount type semiconductor light emitting device having high heat dissipation.

【0002】[0002]

【従来の技術】サファイヤ基板を使用するGaN系半導
体発光素子では絶縁性基板を使用する必要はないが、裏
面にN電極又はP電極を備えた一般の半導体発光素子を
使用する従来の表面実装型半導体発光装置の構造では、
絶縁性基板の上に複数の分離する導体パターンを形成
し、一部の導体パターン上に半導体発光素子を固着する
ことにより、P電極とN電極との短絡を防ぐ必要があっ
た。
2. Description of the Related Art In a GaN-based semiconductor light emitting device using a sapphire substrate, it is not necessary to use an insulating substrate, but a conventional surface mount type light emitting device using a general semiconductor light emitting device having an N electrode or a P electrode on the back surface. In the structure of the semiconductor light emitting device,
It is necessary to prevent a short circuit between a P electrode and an N electrode by forming a plurality of separated conductor patterns on an insulating substrate and fixing a semiconductor light emitting element on some of the conductor patterns.

【0003】例えば、光反射性のエポキシ樹脂製又はセ
ラミック製等の絶縁性基板を準備し、銀(Ag)又は銅
(Cu)等の金属導体を使用して、配線、素子搭載面及
び外部取り出し用の端子を絶縁性基板の表面上にパター
ニングする。その際に、絶縁性基板を包み込むように複
数の金属製外部リードを形成する。配線導体上の所定の
位置に半導体発光素子を含む電子部品を実装した後、エ
ポキシ樹脂等の光透過性樹脂により絶縁性基板の表面及
び電子部品を封止して、モールド構造を形成する。
[0003] For example, an insulating substrate made of light-reflective epoxy resin or ceramic is prepared, and wiring, element mounting surfaces, and external extraction are made using a metal conductor such as silver (Ag) or copper (Cu). Terminals are patterned on the surface of the insulating substrate. At this time, a plurality of metal external leads are formed so as to surround the insulating substrate. After mounting an electronic component including a semiconductor light emitting element at a predetermined position on the wiring conductor, the surface of the insulating substrate and the electronic component are sealed with a light transmitting resin such as an epoxy resin to form a mold structure.

【0004】動作の際に、半導体発光装置の複数の外部
リード間に電圧を印加すると、半導体発光素子のアノー
ド電極からカソード電極に順方向電流が流れ、半導体発
光装置は点灯状態となる。点灯時に、半導体発光素子の
動作電流と電圧降下分により発生する電力損失の一部
は、半導体発光素子の発熱により消散される。特に青色
発光半導体装置に使用される窒化ガリウム系半導体発光
素子は、電圧降下及び損失電力が大きい。半導体発光素
子の発熱量をQ(℃)、損失電力量をW(W)、半導体
発光素子の熱伝導率をλ0、絶縁性基板及び導体パター
ン部の熱伝導率をλ1、実装基板の熱伝導率をλ2とする
と、半導体発光装置の発熱量は式(1)で表される。式
(1)の分母中の各熱伝導率の単位は何れも(W/℃)
である。 Q=W/(λ0×λ1×λ2) (1) 通常、半導体発光素子の発熱量をTb、周囲温度をTaとす
ると、熱に弱い半導体発光素子のPN接合部温度Tjを制
限する最大定格値Tjmaxを超えず式(2)を満足する温
度領域内で、半導体発光装置を作動させる必要がある。 Tjmax>Ta+Tb (2)
In operation, when a voltage is applied between a plurality of external leads of the semiconductor light emitting device, a forward current flows from the anode electrode to the cathode electrode of the semiconductor light emitting device, and the semiconductor light emitting device is turned on. At the time of lighting, a part of the power loss generated by the operating current and the voltage drop of the semiconductor light emitting element is dissipated by the heat generated by the semiconductor light emitting element. In particular, a gallium nitride based semiconductor light emitting element used in a blue light emitting semiconductor device has a large voltage drop and large power loss. The amount of heat generated by the semiconductor light emitting device is Q (° C.), the amount of power loss is W (W), the thermal conductivity of the semiconductor light emitting device is λ 0 , the thermal conductivity of the insulating substrate and the conductor pattern portion is λ 1 , Assuming that the thermal conductivity is λ 2 , the calorific value of the semiconductor light emitting device is expressed by the following equation (1). The unit of each thermal conductivity in the denominator of the formula (1) is (W / ° C)
It is. Q = W / (λ 0 × λ 1 × λ 2 ) (1) Normally, assuming that the heat generation amount of the semiconductor light emitting element is Tb and the ambient temperature is Ta, the PN junction temperature Tj of the semiconductor light emitting element which is weak to heat is limited. It is necessary to operate the semiconductor light emitting device within a temperature range that does not exceed the maximum rated value Tjmax and satisfies the expression (2). Tjmax> Ta + Tb (2)

【0005】半導体発光素子、絶縁性基板、導体パター
ン及び実装基板の熱伝導率が低いと、種々の問題が発生
する。第1に、PN接合部温度Tjが上昇し、温度特性の
変動により光度が低下する半導体発光素子の材料もあ
る。例えば、AlGaInP系半導体発光素子では、2
0mAで−0.5〜−1%/℃光度が低下する。第2に、半
導体発光装置を作動する際の周囲温度Taの範囲が式
(1)及び(2)の範囲内に限定される欠点がある。第
3に、抵抗を介して定電圧源に半導体発光素子を接続
し、定電圧駆動を行う際に、PN接合部温度Tjの増加に
より順方向電圧値が低下する。このため、動作点が変動
し、半導体発光素子に流れる電流値が増加し、半導体発
光素子の発熱量は飽和し難くなり、更に発熱、電流値増
加が反復され、熱暴走に至る。第4にモールド樹脂と半
導体発光素子との界面で剥離が発生し、半導体発光素子
から放射される光が剥離部分で全反射して光度が低下す
るため、製品の信頼性の低下を招来する。第5に、PN
接合部温度Tjの上昇に伴い、半導体発光素子の熱劣化が
発生し、信頼性が低下する。
[0005] When the thermal conductivity of the semiconductor light emitting element, the insulating substrate, the conductor pattern and the mounting substrate is low, various problems occur. First, there is a material for a semiconductor light emitting device in which the PN junction temperature Tj increases and the luminous intensity decreases due to a change in temperature characteristics. For example, in an AlGaInP-based semiconductor light emitting device, 2
At 0 mA, the luminous intensity decreases by -0.5 to -1% / ° C. Second, there is a disadvantage that the range of the ambient temperature Ta when the semiconductor light emitting device is operated is limited to the range of the equations (1) and (2). Third, when a semiconductor light emitting device is connected to a constant voltage source via a resistor and driven at a constant voltage, the forward voltage value decreases due to an increase in the PN junction temperature Tj. For this reason, the operating point fluctuates, the current value flowing through the semiconductor light emitting element increases, the calorific value of the semiconductor light emitting element hardly saturates, and the heat generation and the current value increase are repeated, leading to thermal runaway. Fourth, peeling occurs at the interface between the mold resin and the semiconductor light emitting element, and the light emitted from the semiconductor light emitting element is totally reflected at the peeled portion and the luminous intensity is reduced, thereby lowering the reliability of the product. Fifth, PN
As the junction temperature Tj increases, thermal degradation of the semiconductor light emitting element occurs, and reliability decreases.

【0006】前記不具合を低減するには、半導体発光装
置の温度上昇を如何に抑制できるかがポイントになる。
一定の駆動電流で駆動される半導体発光装置の発熱量を
低減するには、式(1)及び(2)より、半導体発光素
子の熱伝導率λ0を高めるか、絶縁性基板・導体パター
ンの熱伝導率λ1を高め若しくは使用材料の見直しを図
るか又は実装基板の熱伝導率λ2を高めるか何れかの方
法が考えられる。半導体発光素子の熱伝導率λ0を高め
る代わりに、半導体発光素子のサイズを増大して熱容量
を増加する方法も考えられるが、この方法では、増大す
るサイズに応じた大きな面積を有する絶縁性基板が必要
となるため、半導体発光装置の小型化が困難となり、ま
た、半導体発光素子の発光効率低下を招く。実装基板の
熱伝導率λ2を高める場合でも、実装基板と半導体発光
装置との接着面の導体パターンを広げて放熱作用を向上
して、半導体発光装置の発熱量を低減できるが、その分
実装基板の面積が広がるので、製造価格が増加する。従
って、絶縁性基板及び導体パターンの熱伝導率λ1を高
め又は使用材料の見直しを図ることが、特性面、実装面
及びコスト面でも最も効果的である。
In order to reduce the above-mentioned inconvenience, it is important how the temperature rise of the semiconductor light emitting device can be suppressed.
In order to reduce the calorific value of the semiconductor light emitting device driven by a constant drive current, the thermal conductivity λ 0 of the semiconductor light emitting element can be increased or the insulating substrate / conductor pattern can be reduced according to equations (1) and (2). either way increase the thermal conductivity lambda 2 of or mounting substrate should be reviewed higher or materials used a thermal conductivity lambda 1 is considered. Instead of increasing the thermal conductivity λ 0 of the semiconductor light emitting element, a method of increasing the heat capacity by increasing the size of the semiconductor light emitting element can be considered. In this method, an insulating substrate having a large area corresponding to the increased size is considered. Is required, it is difficult to reduce the size of the semiconductor light emitting device, and the luminous efficiency of the semiconductor light emitting element is reduced. Even when increasing the thermal conductivity lambda 2 of the mounting board, to improve the heat dissipation effect by widening a conductive pattern of the surface to be adhered to the mounting substrate and the semiconductor light emitting device, can be reduced the amount of heat generated by the semiconductor light emitting device, correspondingly mounted Since the area of the substrate increases, the manufacturing cost increases. Thus, possible to review the insulating substrate and the thermal conductivity lambda 1 enhanced or materials used in the conductive pattern, characteristic surface, it is most effective at the mounting surface and cost.

【0007】例えば、特開2000−77686号公報
は、パッケージ側壁から光信号を伝達することにより薄
形化した半導体装置を、アイランドの裏面をプリント配
線に固定して実装することにより光信号のぶれと放熱性
を改善する光半導体装置の実装構造を示す。この実装構
造では、絶縁性基板を使用せず、アイランドをプリント
配線に熱的に結合することによって半導体発光素子の放
熱性を改善することができる。この構造では、絶縁性基
板を使用する従来の半導体発光装置に比べ放熱性は非常
に優れる反面、リードの足曲げが必要になると共に、装
置が大きくなり、小型化が困難となってコストアップに
繋がる難点がある。
For example, Japanese Patent Application Laid-Open No. 2000-77686 discloses that a semiconductor device thinned by transmitting an optical signal from a package side wall is mounted with the back surface of the island fixed to a printed wiring to mount the semiconductor device. And a mounting structure of the optical semiconductor device for improving heat dissipation. In this mounting structure, the heat radiation of the semiconductor light emitting element can be improved by thermally coupling the island to the printed wiring without using the insulating substrate. This structure has excellent heat dissipation compared to conventional semiconductor light-emitting devices that use an insulating substrate, but requires the bending of leads and increases the size of the device, making miniaturization difficult and increasing costs. There is a drawback that can be connected.

【0008】[0008]

【発明が解決しようとする課題】前述の通り、半導体発
光素子の構造上の制約により、従来では代表的なアルミ
ナ製のセラミック基板等の絶縁性基板を使用する必要性
があった。絶縁性基板上にパターニングする代表的な金
属導体は、銀又は銅であるが、アルミナの熱伝導率は常
温で21(W/m/K)であり、100℃での銀(Ag)
の熱伝導率313(W/m/K)及び銅(Cu)の熱伝導
率395(W/m/K)に比べると遙かに低い。因みに、
鉄の100℃での熱伝導率は72(W/m/K)である。
このため導体パターンを通して放熱性を改善する方法も
考えられるが、一般に50μm程度の厚さに形成される
導体パターンには放熱効果を期待できず、また絶縁性基
板を金属製リードで挟む製造工程が増加する。絶縁性基
板の薄型化により、熱伝導性の向上は可能であるが、あ
る程度薄肉化すると、絶縁性基板の機械的な強度が低下
して、絶縁性基板の反り・欠け等の不具合が発生し易く
なり、取り扱いが容易でなくなる。絶縁性基板からの放
熱は、実装基板と接着させる外部電極端子のみである。
実装基板との接着面積が狭いと、放熱性が低下する反
面、逆に接触面積を増大すると、半導体発光装置の面積
もこれに応じて広くなる。本発明は、放熱性に優れた小
型の半導体発光装置を提供することを目的とする。
As described above, it has been necessary to use a typical insulating substrate such as a ceramic substrate made of alumina, because of the structural limitation of the semiconductor light emitting device. A typical metal conductor to be patterned on an insulating substrate is silver or copper. The thermal conductivity of alumina is 21 (W / m / K) at room temperature, and silver (Ag) at 100 ° C.
Of 313 (W / m / K) and 395 (W / m / K) of copper (Cu). By the way,
The thermal conductivity of iron at 100 ° C. is 72 (W / m / K).
For this reason, a method of improving heat dissipation through a conductor pattern is conceivable. However, in general, a conductor pattern formed to a thickness of about 50 μm cannot be expected to have a heat dissipation effect, and a manufacturing process in which an insulating substrate is sandwiched between metal leads is required. To increase. Thermal conductivity can be improved by reducing the thickness of the insulating substrate, but if the thickness is reduced to some extent, the mechanical strength of the insulating substrate is reduced, and problems such as warpage and chipping of the insulating substrate occur. It becomes easy to handle. Heat is radiated from the insulating substrate only to the external electrode terminals bonded to the mounting substrate.
If the bonding area with the mounting substrate is small, the heat dissipation is reduced, but if the contact area is increased, the area of the semiconductor light emitting device is correspondingly increased. An object of the present invention is to provide a small semiconductor light emitting device having excellent heat dissipation.

【0009】[0009]

【課題を解決するための手段】本発明による表面実装型
半導体発光装置は、支持体(1)と、支持体(1)に固着され
る半導体発光素子(2)と、支持体(1)から一定間隔離間し
て配置され且つ半導体発光素子(2)の電極に電気的に接
続される第1の外部リード(3)と、支持体(1)、半導体発
光素子(2)及び第1の外部リード(3)を被覆する樹脂封止
体(4)とを備えている。支持体(1)は金属により形成され
且つ樹脂封止体(4)から突出する接着部(1a)を有し、支
持体(1)の接着部(1a)を配線基板(5)に固着したとき、樹
脂封止体(4)と配線基板(5)との間に間隙(6)が形成され
るので、作動時に半導体発光素子(2)から発生する熱は
間隙(6)内で接着部(1a)から周囲の空気中に放出され
る。
A surface-mounted semiconductor light emitting device according to the present invention comprises a support (1), a semiconductor light emitting element (2) fixed to the support (1), and a support (1). A first external lead (3) disposed at a fixed distance and electrically connected to an electrode of the semiconductor light emitting device (2); a support (1); a semiconductor light emitting device (2); A resin sealing body (4) for covering the lead (3). The support (1) is formed of metal and has an adhesive portion (1a) protruding from the resin sealing body (4), and the adhesive portion (1a) of the support (1) is fixed to the wiring board (5). When the gap (6) is formed between the resin sealing body (4) and the wiring board (5), the heat generated from the semiconductor light emitting element (2) during operation is Released from (1a) into the surrounding air.

【0010】本発明の実施の形態では、支持体(1)の底
面(1b)及び第1の外部リード(3)の底面(3a)は同一平面
上に配置されるので、平面状の配線基板(5)上に支持体
(1)の底面(1b)及び第1の外部リード(3)の底面(3a)を導
電性接着材により固着することができる。支持体(1)及
び第1の外部リード(3)は同一の高さで配置される。支
持体(1)は、単一又は複数の素子載置部(7)を有する。支
持体(1)は、第1の外部リード(3)から離間する第2の外
部リードを構成してもよい。半導体発光素子(2)の電極
に電気的に接続され且つ支持体(1)及び第1の外部リー
ド(3)と同一の高さで形成される第3の外部リード(9)を
設けてもよい。第3の外部リード(9)の底面(9a)は支持
体(1)の底面(1b)及び第1の外部リード(3)の底面(3a)と
同一平面上に配置される。
In the embodiment of the present invention, since the bottom surface (1b) of the support body (1) and the bottom surface (3a) of the first external lead (3) are arranged on the same plane, a planar wiring board is provided. (5) Support on top
The bottom surface (1b) of (1) and the bottom surface (3a) of the first external lead (3) can be fixed with a conductive adhesive. The support (1) and the first external lead (3) are arranged at the same height. The support (1) has a single or a plurality of element mounting portions (7). The support (1) may constitute a second external lead that is separated from the first external lead (3). A third external lead (9) electrically connected to the electrode of the semiconductor light emitting element (2) and formed at the same height as the support (1) and the first external lead (3) may be provided. Good. The bottom surface (9a) of the third external lead (9) is arranged on the same plane as the bottom surface (1b) of the support (1) and the bottom surface (3a) of the first external lead (3).

【0011】[0011]

【発明の実施の形態】以下、本発明による表面実装型半
導体発光装置の実施の形態を図1〜図11について説明
する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a surface-mounted semiconductor light emitting device according to the present invention will be described below with reference to FIGS.

【0012】図1及び図2に示す本発明の第1の実施の
形態では、表面実装型半導体発光装置は、平坦な単一の
素子載置部(7)を有する支持体(1)と、支持体(1)の素子
載置部(7)に接着剤(13)により固着される半導体発光素
子(2)と、支持体(1)から一定間隔離間して配置され且つ
半導体発光素子(2)の電極に電気的に接続される第1の
外部リード(3)と、半導体発光素子(2)のアノード電極(2
a)と第1の外部リード(3)とを電気的に接続する第1の
リード細線(8a)と、半導体発光素子(2)のカソード電極
(2b)と第1の外部リード(3)から離間する第2の外部リ
ードを構成する支持体(1)とを電気的に接続する第2の
リード細線(8b)と、支持体(1)、半導体発光素子(2)、第
1の外部リード(3)、第1のリード細線(8a)及び第2の
リード細線(8b)を被覆する樹脂封止体(4)とを備えてい
る。半導体発光素子(2)を搭載する平坦な素子載置部(7)
は、支持体(1)に形成された集光作用のある単数又は複
数の凹部(1c)の各底面に設けられる。凹部(1c)の光反射
効率を向上するため、θ=30〜60°の傾斜を凹部(1
c)の側壁面に形成すると共に、銀(Ag)又はアルミニ
ウム(Al)等の高光反射率の金属メッキを凹部(1c)の
内側に形成することが望ましい。支持体(1)は、銅(C
u)及び銅(Cu)を使用する合金等の熱伝導性の高い
放熱性に優れた金属により形成され且つ樹脂封止体(4)
から下方に突出する接着部(1a)を有する。接着部(1a)は
配線基板(5)に形成されたランド(10)に半田(12)により
固着され、第1の外部リード(3)の底部(3a)は、ランド
(10)から離間して配線基板(5)に形成されたランド(11)
に半田(12)により固着される。半導体発光素子(2)を素
子載置部(7)に接着する接着剤(13)は、銀(Ag)等の
高反射型導電性ペーストを使用することが望ましい。ま
た高光透過性の半導体発光素子(2)の裏面は絶縁体であ
るから、接着剤(13)に非導電性の透明接着剤を使用して
も良い。第1及び第2のリード細線(8a, 8b)は、金(A
u)又はアルミニウム(Al)等の金属により構成され
る。放熱部となる接着部(1a)は、エポキシ系等の高光透
過性の樹脂封止体(4)から露出し、支持体(1)の接着部(1
a)を配線基板(5)に固着したとき、樹脂封止体(4)と配線
基板(5)との間に間隙(6)が形成される。間隙(6)の高さ
は0.1〜2.0mmの範囲で自由に設定することができ
る。従って樹脂封止体の側面から外部リードが突出する
従来の構造に比べて、横方向のサイズを縮小することが
できる。支持体(1)及び第1の外部リード(3)は同一の高
さで且つ並行に配置される。支持体(1)の接着部(1a)及
び第1の外部リード(3)の底面(3a)は同一平面上に配置
されるので、支持体(1)の接着部(1a)及び第1の外部リ
ード(3)の底面(3a)を導電性接着材となる半田(12)によ
り平面状の配線基板(5)上に固着することができる。
In the first embodiment of the present invention shown in FIGS. 1 and 2, a surface mount type semiconductor light emitting device comprises: a support (1) having a single flat element mounting portion (7); A semiconductor light-emitting element (2) fixed to an element mounting portion (7) of a support (1) by an adhesive (13); and a semiconductor light-emitting element (2) disposed at a predetermined distance from the support (1). ) And an anode electrode (2) of the semiconductor light emitting device (2).
a) a first lead wire (8a) for electrically connecting the first external lead (3) to a first external lead (3); and a cathode electrode of the semiconductor light emitting element (2).
A second thin lead wire (8b) for electrically connecting (2b) and a support (1) constituting a second external lead which is separated from the first external lead (3), and a support (1) , A semiconductor light emitting element (2), a first external lead (3), a resin thin body (4) for covering the first fine lead (8a) and the second fine lead (8b). Flat element mounting part (7) for mounting semiconductor light emitting element (2)
Is provided on each bottom surface of one or more concave portions (1c) formed on the support (1) and having a light-condensing action. In order to improve the light reflection efficiency of the concave portion (1c), the inclination of θ = 30 to 60 °
It is desirable to form a metal plating with high light reflectivity such as silver (Ag) or aluminum (Al) on the inside of the concave portion (1c) in addition to being formed on the side wall surface of c). The support (1) is made of copper (C
u) and a resin-encapsulated body made of a metal having high heat conductivity and excellent heat dissipation, such as an alloy using copper (Cu)
Has an adhesive portion (1a) projecting downward from The bonding portion (1a) is fixed to a land (10) formed on the wiring board (5) by solder (12), and the bottom (3a) of the first external lead (3) is
Land (11) formed on wiring board (5) apart from (10)
Is fixed by solder (12). As the adhesive (13) for bonding the semiconductor light emitting element (2) to the element mounting portion (7), it is desirable to use a highly reflective conductive paste such as silver (Ag). Further, since the back surface of the semiconductor light emitting element (2) having high light transmittance is an insulator, a non-conductive transparent adhesive may be used as the adhesive (13). The first and second lead wires (8a, 8b) are made of gold (A
u) or a metal such as aluminum (Al). The bonding portion (1a) serving as a heat radiating portion is exposed from the resin sealing body (4) having a high light transmission property such as an epoxy type, and the bonding portion (1
When a) is fixed to the wiring board (5), a gap (6) is formed between the resin sealing body (4) and the wiring board (5). The height of the gap (6) can be freely set within a range of 0.1 to 2.0 mm. Therefore, the size in the horizontal direction can be reduced as compared with the conventional structure in which the external leads protrude from the side surface of the resin sealing body. The support (1) and the first external lead (3) are arranged at the same height and in parallel. Since the bonding portion (1a) of the support (1) and the bottom surface (3a) of the first external lead (3) are arranged on the same plane, the bonding portion (1a) of the support (1) and the first The bottom surface (3a) of the external lead (3) can be fixed on the planar wiring board (5) by the solder (12) serving as a conductive adhesive.

【0013】図3及び図4に示す本発明の第2の実施の
形態では、第2のリード細線(8b)を介して半導体発光素
子(2)のカソード電極(2b)に電気的に接続された第3の
外部リード(9)を有し、支持体(1)から離間して配置され
た第3の外部リード(9)は支持体(1)及び第1の外部リー
ド(3)と同一の高さで形成され、第3の外部リード(9)の
底面(9a)は支持体(1)の底面(1b)及び第1の外部リード
(3)の底面(3a)と同一平面上に且つ並行に配置される。
図3及び図4に示す半導体発光素子(2)は、絶縁体であ
るサファイア基板と、サファイア基板上に形成されたP
N接合部とを備え、素子表面にアノード電極(2a)及びカ
ソード電極(2b)が形成される。
In the second embodiment of the present invention shown in FIGS. 3 and 4, the semiconductor device is electrically connected to the cathode electrode (2b) of the semiconductor light emitting device (2) through the second lead wire (8b). A third external lead (9), which is spaced apart from the support (1), is the same as the support (1) and the first external lead (3). The bottom surface (9a) of the third external lead (9) is formed with the bottom surface (1b) of the support (1) and the first external lead.
It is arranged on the same plane as the bottom surface (3a) of (3) and in parallel.
The semiconductor light emitting device (2) shown in FIGS. 3 and 4 has a sapphire substrate which is an insulator, and a P formed on the sapphire substrate.
An anode electrode (2a) and a cathode electrode (2b) are formed on the element surface.

【0014】半導体発光装置を動作させる際に、半導体
発光素子(2)から発生する熱は、樹脂封止体(4)から間隙
(6)内で露出する接着部(1a)からランド(10)に伝達され
ると共に、接着部(1a)又はランド(10)から直接間隙(6)
内の空気中に放出され、放熱効果を向上することができ
る。この場合に、素子載置部(7)と支持体(1)の底面間距
離を短縮し、支持体(1)又はランド(10)の面積を拡大す
ることにより、放熱性を更に高めることが可能である。
通常、配線基板(5)上の電源ライン及びグランドライン
を含む共通回路ラインを形成する配線は、インピーダン
ス成分を低下させて、共通ラインに印加される電圧の発
振を防ぐため、比較的太めの銅箔パターンにより形成さ
れる。このため支持体(1)を接着するランド(10)を共通
ラインにすることが望ましい。本実施の形態では、ラン
ド(10)を跨ぐジャンパー線の役割をも果たす。このた
め、パターニングされた銅箔パターンを削除して、ジャ
ンパー線の削減及び半導体発光装置の温度上昇を低減す
ることができ、配線基板(5)の小型化を図り、実装コス
トを低減することができる。支持体(1)と半導体発光素
子(2)とが電気的に絶縁状態に保持されると、配線基板
(5)のランド(10)に印可される電圧又は電流条件によら
ず、発光素子(2)は安定した動作をすることが可能であ
る。
When the semiconductor light emitting device is operated, heat generated from the semiconductor light emitting element (2) is transferred from the resin sealing body (4) to the gap.
(6) is transmitted to the land (10) from the bonding part (1a) exposed in the gap (6) and directly from the bonding part (1a) or the land (10).
It is released into the air inside, and the heat radiation effect can be improved. In this case, by shortening the distance between the element mounting portion (7) and the bottom surface of the support (1) and enlarging the area of the support (1) or the land (10), it is possible to further enhance heat radiation. It is possible.
Usually, the wiring forming the common circuit line including the power supply line and the ground line on the wiring board (5) is made of a relatively thick copper to reduce the impedance component and prevent the oscillation of the voltage applied to the common line. It is formed by a foil pattern. For this reason, it is desirable that the land (10) to which the support (1) is adhered be a common line. In the present embodiment, it also plays the role of a jumper wire straddling the land (10). For this reason, by removing the patterned copper foil pattern, it is possible to reduce the number of jumper wires and reduce the temperature rise of the semiconductor light emitting device, to reduce the size of the wiring board (5), and to reduce the mounting cost. it can. When the support (1) and the semiconductor light emitting element (2) are kept in an electrically insulated state, the wiring board
The light emitting element (2) can operate stably regardless of the voltage or current conditions applied to the land (10) of (5).

【0015】図5は、支持体(1)、第1の外部リード(3)
及び第3の外部リード(9)を配線基板(5)上に垂直に状態
に固定した側面発光が可能な第3の実施の形態を示す。
図6は、配線基板(5)に垂直に固定した支持体(1)に2つ
の素子載置部(7)を垂直方向に並設した側面発光が可能
な第4の実施の形態を示す。図6の上側に配置された半
導体発光素子(2)は図2に示す半導体発光素子(2)と同一
の構造であり、図6の下側に配置された半導体発光素子
(2)では、表面に第3の外部リード(9)からリード細線(8
a)から電力が供給されるアノード電極(2a)が形成され、
裏面に支持体(1)に電気的に接続されたカソード電極が
形成される。図6は、一対の半導体発光素子(2)が各カ
ソード電極を共通にする2色発光用装置への展開例であ
る。各半導体発光素子(2)のアノード電極(2a)に接続す
べき第1の外部リード(3)と第3の外部リード(9)との長
さが相違するので、外部リードの識別が容易となる。
FIG. 5 shows a support (1) and a first external lead (3).
A third embodiment in which side emission can be performed by fixing a third external lead (9) vertically on a wiring board (5) is shown.
FIG. 6 shows a fourth embodiment in which two element mounting portions (7) are vertically arranged side by side on a support (1) fixed vertically to a wiring board (5) to enable side emission. The semiconductor light emitting device (2) arranged on the upper side of FIG. 6 has the same structure as the semiconductor light emitting device (2) shown in FIG. 2, and the semiconductor light emitting device (2) arranged on the lower side of FIG.
In (2), a thin lead (8) is placed on the surface from the third external lead (9).
An anode electrode (2a) to which power is supplied from a) is formed,
On the back surface, a cathode electrode electrically connected to the support (1) is formed. FIG. 6 shows an example of development to a two-color light emitting device in which a pair of semiconductor light emitting elements (2) share a common cathode electrode. Since the first external lead (3) and the third external lead (9) to be connected to the anode electrode (2a) of each semiconductor light emitting element (2) are different in length, it is easy to identify the external lead. Become.

【0016】図7は、単一の素子載置部(7)に2つの半
導体発光素子(2)を配置した第5の実施の形態を示す。
図7に示す上側の半導体発光素子(2)はリード細線(8a)
を介して分離した第1の外部リード(3c)に電気的に接続
されたアノード電極(2a)を備え、図6の上側に示す半導
体発光素子(2)と同一の構造を示し、下側の半導体発光
素子(2)はリード細線(8a)を介して分離した第1の外部
リード(3d)に電気的に接続されたアノード電極(2a)を備
え、図6の下側に示す半導体発光素子(2)と同一の構造
を示す。図7に示す実施の形態では、同一の素子載置部
(7)に搭載された各第1の半導体発光素子(2)及び第2の
半導体発光素子(2)を用いた2色の半導体発光装置を示
す。
FIG. 7 shows a fifth embodiment in which two semiconductor light emitting elements (2) are arranged on a single element mounting portion (7).
The upper semiconductor light emitting element (2) shown in FIG.
6 has the same structure as the semiconductor light emitting element (2) shown in the upper part of FIG. 6, and has an anode electrode (2a) electrically connected to the first external lead (3c) separated through the same. The semiconductor light emitting device (2) includes an anode electrode (2a) electrically connected to a first external lead (3d) separated via a thin lead wire (8a), and the semiconductor light emitting device shown in the lower part of FIG. Shows the same structure as (2). In the embodiment shown in FIG. 7, the same element mounting portion
A two-color semiconductor light emitting device using each of the first semiconductor light emitting element (2) and the second semiconductor light emitting element (2) mounted on (7) is shown.

【0017】図8は、支持体(1)の上側に半導体発光素
子(2)が固着され、下側に定電圧ダイオード(14)が固着
され、半導体発光素子(2)及び定電圧ダイオード(14)は
単一の第1の外部リード(3)に接続され、図9に示す回
路を構成する第6の実施の形態を示す。定電圧ダイオー
ド(14)は半導体発光素子(2)に逆電圧が印加されたとき
にオンとなり、逆電圧に対して半導体発光素子(2)を保
護する。更にサージ電圧が印加された場合、サージ電圧
から半導体発光素子(2)を保護する機能を有している。
定電圧ダイオード(14)では、リード細線(8a)を介して第
1の外部リード(3)に接続されたアノード電極(14a)が表
面に形成され、支持体(1)に電気的に接続されたカソー
ド電極が裏面に形成される。図10は、分離して設けら
れた第1の外部リード(3c, 3d)にリード細線(8a)を介し
て接続された第7の実施の形態を示す。
FIG. 8 shows a semiconductor light emitting element (2) fixed to the upper side of the support (1), a constant voltage diode (14) fixed to the lower side, and the semiconductor light emitting element (2) and the constant voltage diode (14). ) Shows a sixth embodiment connected to a single first external lead (3) and constituting the circuit shown in FIG. The constant voltage diode (14) turns on when a reverse voltage is applied to the semiconductor light emitting device (2), and protects the semiconductor light emitting device (2) against the reverse voltage. Further, when a surge voltage is applied, the semiconductor light emitting device (2) has a function of protecting the semiconductor light emitting element (2) from the surge voltage.
In the constant voltage diode (14), an anode electrode (14a) connected to the first external lead (3) via a thin lead wire (8a) is formed on the surface, and is electrically connected to the support (1). The formed cathode electrode is formed on the back surface. FIG. 10 shows a seventh embodiment in which first external leads (3c, 3d) provided separately are connected via thin lead wires (8a).

【0018】図10に示す実施の形態は、それぞれ独立
した素子載置部(7)に搭載され且つカソード電極も独立
する第1の半導体発光素子(2)と第2の半導体発光素子
(2)を備えた2色半導体発光装置を示す。図11は、半
導体発光素子(2)及び定電圧ダイオード(14)の各アノー
ド電極が、分離して設けられた第1の外部リード(3c, 3
d)にリード細線(8a)を介して接続された半導体発光素子
(2)及び半導体発光素子(2)を制御し又は保護する集積回
路(15)を備えた第8の実施の形態を示す。白色の半導体
発光装置を構成する場合、温度上昇を抑制して、半導体
発光素子及び蛍光体の劣化を抑制できるので、大電流で
作動させても長寿命となり、また、蛍光体の温度上昇に
伴う発光効果の低下による変色も抑制でき安定した色調
を表示できる。
The embodiment shown in FIG. 10 shows a first semiconductor light emitting device (2) and a second semiconductor light emitting device which are mounted on independent device mounting portions (7) and have independent cathode electrodes.
2 shows a two-color semiconductor light emitting device provided with (2). FIG. 11 shows that each anode electrode of the semiconductor light emitting element (2) and the constant voltage diode (14) is connected to a first external lead (3c, 3c) provided separately.
Semiconductor light-emitting device connected to d) via fine lead wire (8a)
An eighth embodiment including (2) and an integrated circuit (15) for controlling or protecting the semiconductor light emitting device (2) is shown. When a white semiconductor light emitting device is configured, the temperature rise can be suppressed, and the deterioration of the semiconductor light emitting element and the phosphor can be suppressed. Discoloration due to a decrease in the light emitting effect can be suppressed, and a stable color tone can be displayed.

【0019】本発明の実施の形態では、良好な放熱が得
られ下記の作用効果が得られる。 [1] 放熱性の向上 外部に露出するフィンとなる接着部(1a)を有する支持体
(1)に直接半導体発光素子(2)を接着するので、良好な放
熱性が得られる。またランド(10)等の銅箔部の面積を必
要に応じて拡張すれば、放熱性を更に向上でき、熱減定
格特性の改善効果も期待できる。 [2] 生産性の向上 支持体(1)に半導体発光素子(2)を接着すれば、例えば、
絶縁性基板にリードを挟み込む工程を含む特殊な工程及
び付加的な部品を必要とせず、現行の生産設備を利用し
て製造が可能である。新規設備を必要とせず現有設備を
利用できるため、生産性及びコスト面的でもメリットは
ある。 [3] 小型化 熱伝導性のよい材料を使用して支持体(1)の面積を縮小
し、半導体発光装置の小型化を図ると共に、放熱性を確
保しつつ高電流で半導体発光装置を駆動できる。また配
線基板(5)の面積を低減し且つ部品点数を削減する効果
も期待できる。 [4] 信頼性 従来品に比べ部品点数が少なくなるため、信頼性は向上
する。
In the embodiment of the present invention, good heat radiation can be obtained, and the following effects can be obtained. [1] Improvement of heat dissipation Support having an adhesive part (1a) that becomes a fin exposed to the outside
Since the semiconductor light emitting element (2) is directly bonded to (1), good heat dissipation can be obtained. If the area of the copper foil portion such as the land (10) is expanded as necessary, the heat dissipation can be further improved, and the effect of improving the thermal derating characteristics can be expected. [2] Improvement in productivity If the semiconductor light emitting device (2) is bonded to the support (1), for example,
A special process including a process of sandwiching the lead between the insulating substrates and an additional component are not required, and the manufacturing can be performed using the existing production equipment. Since existing equipment can be used without the need for new equipment, there are also advantages in terms of productivity and cost. [3] Miniaturization Using a material having good heat conductivity, the area of the support body (1) is reduced, the semiconductor light emitting device is downsized, and the semiconductor light emitting device is driven at a high current while ensuring heat dissipation. it can. Further, the effect of reducing the area of the wiring board (5) and the number of components can be expected. [4] Reliability Since the number of parts is smaller than that of the conventional product, the reliability is improved.

【0020】[0020]

【発明の効果】前記のように、本発明では、放熱性に優
れた小型の半導体発光装置を実現することができる。
As described above, according to the present invention, it is possible to realize a small semiconductor light emitting device having excellent heat dissipation.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の表面実装型半導体発光装置による第
1の実施の形態を示す側面図
FIG. 1 is a side view showing a first embodiment of a surface mounted semiconductor light emitting device according to the present invention.

【図2】 図1の平面図FIG. 2 is a plan view of FIG. 1;

【図3】 本発明の表面実装型半導体発光装置による第
2の実施の形態を示す側面図
FIG. 3 is a side view showing a second embodiment of the surface mounted semiconductor light emitting device of the present invention.

【図4】 図3の平面図FIG. 4 is a plan view of FIG. 3;

【図5】 本発明の表面実装型半導体発光装置による第
3の実施の形態を示す側面図
FIG. 5 is a side view showing a third embodiment of the surface mounted semiconductor light emitting device of the present invention.

【図6】 本発明の表面実装型半導体発光装置による第
4の実施の形態を示す側面図
FIG. 6 is a side view showing a fourth embodiment of the surface mounted semiconductor light emitting device of the present invention.

【図7】 本発明の表面実装型半導体発光装置による第
5の実施の形態を示す平面図
FIG. 7 is a plan view showing a fifth embodiment of the surface-mounted semiconductor light emitting device according to the present invention.

【図8】 本発明の表面実装型半導体発光装置による第
6の実施の形態を示す平面図
FIG. 8 is a plan view showing a sixth embodiment of the surface-mounted semiconductor light emitting device according to the present invention.

【図9】 図8に示す表面実装型半導体発光装置の回路
構成を示す電気回路図
9 is an electric circuit diagram showing a circuit configuration of the surface-mounted semiconductor light emitting device shown in FIG.

【図10】 本発明の表面実装型半導体発光装置による
第7の実施の形態を示す平面図
FIG. 10 is a plan view showing a seventh embodiment of the surface-mounted semiconductor light-emitting device according to the present invention.

【図11】 本発明の表面実装型半導体発光装置による
第8の実施の形態を示す断面図
FIG. 11 is a cross-sectional view illustrating an eighth embodiment of the surface-mounted semiconductor light emitting device according to the present invention.

【符号の説明】[Explanation of symbols]

(1)・・支持体(第2の外部リード)、 (1a)・・接着
部、 (1b)・・底面、(2)・・半導体発光素子、 (3)・
・第1の外部リード、 (3a)・・底面、 (4)・・樹脂
封止体、 (5)・・配線基板、 (6)・・間隙、 (7)・
・素子載置部、(8a)・・第1のリード細線、 (8b)・・
第2のリード細線、 (9)・・第3の外部リード、 (9
a)・・底面、
(1) ··· Support (second external lead), (1a) ··· adhesive part, (1b) ··· bottom, (2) ·· semiconductor light emitting element, (3) ·
・ First external lead, (3a) ・ ・ Bottom surface, (4) ・ ・ Resin sealing body, (5) ・ ・ Wiring board, (6) ・ ・ Gap, (7) ・
・ Element mounting part, (8a) ・ ・ First lead wire, (8b) ・ ・
Second fine lead, (9) .. 3rd external lead, (9
a)

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 支持体と、該支持体に固着される半導体
発光素子と、前記支持体から一定間隔離間して配置され
且つ前記半導体発光素子の電極に電気的に接続される第
1の外部リードと、前記支持体、半導体発光素子及び第
1の外部リードを被覆する樹脂封止体とを備えた表面実
装型半導体発光装置において、 前記支持体は金属により形成され且つ前記樹脂封止体か
ら突出する接着部を有し、前記支持体の接着部を配線基
板に固着したとき、前記樹脂封止体と配線基板との間に
間隙が形成されることを特徴とする表面実装型半導体発
光装置。
1. A support, a semiconductor light-emitting device fixed to the support, and a first external device arranged at a predetermined distance from the support and electrically connected to an electrode of the semiconductor light-emitting device. In a surface-mounted semiconductor light emitting device including a lead and a resin sealing body that covers the support, the semiconductor light emitting element, and the first external lead, the support is formed of metal and is formed of a metal. A surface mounting type semiconductor light emitting device having a projecting adhesive portion, wherein a gap is formed between the resin sealing body and the wiring substrate when the adhesive portion of the support is fixed to the wiring substrate. .
【請求項2】 前記支持体の底面及び第1の外部リード
の底面は同一平面上に配置される請求項1に記載の表面
実装型半導体発光装置。
2. The surface-mounted semiconductor light emitting device according to claim 1, wherein a bottom surface of the support and a bottom surface of the first external lead are arranged on the same plane.
【請求項3】 前記支持体及び第1の外部リードは同一
の高さで配置される請求項1又は2に記載の表面実装型
半導体発光装置。
3. The surface-mounted semiconductor light emitting device according to claim 1, wherein the support and the first external lead are arranged at the same height.
【請求項4】 前記支持体は、単一又は複数の素子載置
部を有する請求項1又は2に記載の表面実装型半導体発
光装置。
4. The surface-mounted semiconductor light emitting device according to claim 1, wherein the support has a single or a plurality of element mounting portions.
【請求項5】 前記支持体は、第1の外部リードから離
間する第2の外部リードを構成する請求項1〜3の何れ
か1項に記載の表面実装型半導体発光装置。
5. The surface-mounted semiconductor light-emitting device according to claim 1, wherein the support forms a second external lead separated from the first external lead.
【請求項6】 前記半導体発光素子の電極に電気的に接
続された第3の外部リードを有し、該第3の外部リード
は前記支持体及び第1の外部リードと同一の高さで形成
され、前記第3の外部リードの底面は前記支持体の底面
及び第1の外部リードの底面と同一平面上に配置される
請求項1〜5の何れか1項に記載の表面実装型半導体発
光装置。
6. A third external lead electrically connected to an electrode of the semiconductor light emitting element, the third external lead being formed at the same height as the support and the first external lead. The surface-mounted semiconductor light emitting device according to claim 1, wherein a bottom surface of the third external lead is disposed on the same plane as a bottom surface of the support and a bottom surface of the first external lead. apparatus.
JP2001004070A 2001-01-11 2001-01-11 Surface mount semiconductor light emitting device Pending JP2002208737A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001004070A JP2002208737A (en) 2001-01-11 2001-01-11 Surface mount semiconductor light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001004070A JP2002208737A (en) 2001-01-11 2001-01-11 Surface mount semiconductor light emitting device

Publications (1)

Publication Number Publication Date
JP2002208737A true JP2002208737A (en) 2002-07-26

Family

ID=18872304

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001004070A Pending JP2002208737A (en) 2001-01-11 2001-01-11 Surface mount semiconductor light emitting device

Country Status (1)

Country Link
JP (1) JP2002208737A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006032804A (en) * 2004-07-20 2006-02-02 Koha Co Ltd Light emitting device and its manufacturing method
KR100621743B1 (en) 2004-11-08 2006-09-13 서울반도체 주식회사 Light emitting diode package employing a heat-sinking body and method of fabricating the same
JP2010087005A (en) * 2008-09-29 2010-04-15 Panasonic Electric Works Co Ltd Light emitting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006032804A (en) * 2004-07-20 2006-02-02 Koha Co Ltd Light emitting device and its manufacturing method
KR100621743B1 (en) 2004-11-08 2006-09-13 서울반도체 주식회사 Light emitting diode package employing a heat-sinking body and method of fabricating the same
JP2010087005A (en) * 2008-09-29 2010-04-15 Panasonic Electric Works Co Ltd Light emitting device

Similar Documents

Publication Publication Date Title
KR101360732B1 (en) Led package
US9276187B2 (en) Semiconductor light emitting device
US8786074B2 (en) Packaging device for matrix-arrayed semiconductor light-emitting elements of high power and high directivity
TWI395345B (en) Light-emitting diode lamp with low thermal resistance
EP2093811B1 (en) Package structure of compound semiconductor device
JP2005079329A (en) Surface-mounting light emitting diode
JP2006005290A (en) Light emitting diode
EP2428991B1 (en) Light Emitting Component with integrated control
JP2006049442A (en) Semiconductor light emission device and its manufacturing method
JPH10321909A (en) Semiconductor device
WO2008078900A1 (en) Semiconductor light emitting device package
US9425373B2 (en) Light emitting module
JP4009208B2 (en) Light emitting device
JP2005191111A (en) Package for storing light emitting element, and light emitting device
JP2012044102A (en) Light-emitting device and method of manufacturing the same and wiring board
JP2003008078A (en) Surface mounting semiconductor light emitting device
KR20110041090A (en) Light emitting apparatus
JP2002208737A (en) Surface mount semiconductor light emitting device
JP2007173875A (en) Light emitting device
JP2004207363A (en) Package for housing light emitting element and light emitting device
KR20050101737A (en) Light emitting diode package
KR101186646B1 (en) Light emitting diode
JP2006173196A (en) Light emitting device and light emitting diode using the same
KR20050113736A (en) Light emitting diode package
JP4084831B2 (en) Light emitting device