JP2003008078A - Surface mounting semiconductor light emitting device - Google Patents

Surface mounting semiconductor light emitting device

Info

Publication number
JP2003008078A
JP2003008078A JP2001185571A JP2001185571A JP2003008078A JP 2003008078 A JP2003008078 A JP 2003008078A JP 2001185571 A JP2001185571 A JP 2001185571A JP 2001185571 A JP2001185571 A JP 2001185571A JP 2003008078 A JP2003008078 A JP 2003008078A
Authority
JP
Japan
Prior art keywords
light emitting
semiconductor light
emitting device
support plate
external lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001185571A
Other languages
Japanese (ja)
Inventor
Nobuo Kobayashi
信夫 小林
Hideyuki Osawa
英之 大澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanken Electric Co Ltd
Original Assignee
Sanken Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanken Electric Co Ltd filed Critical Sanken Electric Co Ltd
Priority to JP2001185571A priority Critical patent/JP2003008078A/en
Publication of JP2003008078A publication Critical patent/JP2003008078A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Led Device Packages (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a surface mounting semiconductor light emitting device in which heat dissipation properties are improved while reducing the size. SOLUTION: The other flat major surface (1b) of the supporting plate (1) for a surface mounting semiconductor light emitting device projects from the bottom face (4a) of a resin sealing body (4) and a first external lead (3) extending along the edge part (1e) of the supporting plate (1) has a flat bottom face (3a) projecting from the bottom face (4a) of the resin sealing body (4) in the same direction as the other major surface (1b) of the supporting plate (1). When the other major surface (1b) of the supporting plate (1) is bonded to a wiring board (5), a gap (6) is formed between the resin sealing body (4) and the wiring board (5) and the lower parts of the supporting plate (1) and the first external lead (3) are exposed to the outer air in the gap (6) formed between the bottom face (4a) of the resin sealing body (4) and the wiring board (5).

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、半導体発光装置、
特に放熱性の高い表面実装型半導体発光装置に関するも
のである。
TECHNICAL FIELD The present invention relates to a semiconductor light emitting device,
In particular, the present invention relates to a surface mount semiconductor light emitting device having high heat dissipation.

【0002】[0002]

【従来の技術】図12及び図13に示すように、絶縁性
基板(1)の一方の主面に互いに電気的に離間した金属製
のリード(51, 52)を形成し、一方のリード(51)に半導体
発光素子(2)を固着し、リード細線(53)を介して半導体
発光素子(2)の電極を他方のリード(52)に電気的に接続
すると共に、半導体発光素子(2)及びリード細線(53)を
被覆するように絶縁性基板(1)の一方の主面に樹脂封止
体(4)を形成した表面実装形半導体装置は公知である。
各リード(51, 52)は、絶縁性基板(1)の一方の主面から
絶縁性基板(1)の側面に沿って底面まで延伸し、各リー
ド(51, 52)は、底面において配線基板(5)の対応するラ
ンド(10)に半田で接着される。
2. Description of the Related Art As shown in FIGS. 12 and 13, metal leads (51, 52) electrically separated from each other are formed on one main surface of an insulating substrate (1). The semiconductor light emitting device (2) is fixed to 51), the electrode of the semiconductor light emitting device (2) is electrically connected to the other lead (52) through the thin lead wire (53), and the semiconductor light emitting device (2) is also connected. A surface mount type semiconductor device in which a resin sealing body (4) is formed on one main surface of an insulating substrate (1) so as to cover the lead thin wire (53) is known.
Each lead (51, 52) extends from one main surface of the insulating substrate (1) to the bottom surface along the side surface of the insulating substrate (1), and each lead (51, 52) is a wiring board at the bottom surface. Soldered to the corresponding land (10) of (5).

【0003】動作の際に、表面実装形半導体発光装置の
リード(51, 52)間に電圧を印加すると、半導体発光素子
(2)のアノード電極からカソード電極に順方向電流が流
れ、半導体発光装置は点灯状態となる。点灯時に、半導
体発光素子(2)の動作電流と電圧降下分により発生する
電力損失の一部は、半導体発光素子(2)の発熱により消
散される。特に青色発光半導体装置に使用される窒化ガ
リウム系半導体発光素子は、電圧降下及び損失電力が大
きい。半導体発光素子の発熱量をQ(℃)、損失電力量
をW(W)、半導体発光素子(2)の熱伝導率をλ0、絶縁
性基板(1)及びランド(導体パターン部)(10)の熱伝導
率をλ1、配線基板(5)の熱伝導率をλ2とすると、半導
体発光装置の発熱量は式(1)で表される。式(1)に
示す分母中の各熱伝導率の単位は何れも(W/℃)であ
る。 Q=W/(λ0×λ1×λ2) (1) 通常、半導体発光素子(2)の発熱量をTb、周囲温度をTa
とすると、熱に弱い半導体発光素子(2)のPN接合部温
度Tjを制限する最大定格値Tjmaxを超えず式(2)を満
足する温度領域内で、半導体発光装置を作動させる必要
がある。 Tjmax>Ta+Tb (2)
In operation, when a voltage is applied between the leads (51, 52) of the surface-mounted semiconductor light emitting device, the semiconductor light emitting element
A forward current flows from the anode electrode to the cathode electrode of (2), and the semiconductor light emitting device is turned on. At the time of lighting, a part of the power loss generated by the operating current and the voltage drop of the semiconductor light emitting element (2) is dissipated by the heat generation of the semiconductor light emitting element (2). In particular, the gallium nitride-based semiconductor light emitting element used for the blue light emitting semiconductor device has a large voltage drop and loss power. The heat generation amount of the semiconductor light emitting element is Q (° C.), the amount of power loss is W (W), the thermal conductivity of the semiconductor light emitting element (2) is λ 0 , the insulating substrate (1) and the land (conductor pattern portion) (10 the thermal conductivity lambda 1 of) the wiring thermal conductivity of the substrate (5) and lambda 2, the amount of heat generated in the semiconductor light-emitting device is expressed by equation (1). The unit of each thermal conductivity in the denominator shown in the formula (1) is (W / ° C). Q = W / (λ 0 × λ 1 × λ 2 ) (1) Usually, the heat generation amount of the semiconductor light emitting device (2) is Tb, and the ambient temperature is Ta.
Then, it is necessary to operate the semiconductor light emitting device within a temperature range that satisfies the formula (2) without exceeding the maximum rated value Tjmax that limits the PN junction temperature Tj of the semiconductor light emitting element (2) which is weak against heat. Tjmax> Ta + Tb (2)

【0004】半導体発光素子(2)、絶縁性基板(1)、ラン
ド(10)及び配線基板(5)の熱伝導率が低いと、種々の問
題が発生する。第1に、PN接合部温度Tjが上昇し、温
度特性の変動により光度が低下する半導体発光素子の材
料もある。例えば、AlGaInP系半導体発光素子で
は、20mAで−0.5〜−1%/℃光度が低下する。第2
に、半導体発光装置を作動する際の周囲温度Taの範囲が
式(1)及び(2)の範囲内に限定される欠点がある。
第3に、抵抗を介して定電圧源に半導体発光素子を接続
し、定電圧駆動を行う際に、PN接合部温度Tjの増加に
より順方向電圧値が低下する。このため、動作点が変動
し、半導体発光素子に流れる電流値が増加し、半導体発
光素子の発熱量は飽和し難くなり、更に発熱、電流値増
加が反復され、熱暴走に至る。第4にモールド樹脂と半
導体発光素子との界面で剥離が発生し、半導体発光素子
から放射される光が剥離部分で全反射して光度が低下す
るため、製品の信頼性の低下を招来する。第5に、PN
接合部温度Tjの上昇に伴い、半導体発光素子の熱劣化が
発生し、信頼性が低下する。
When the semiconductor light emitting device (2), the insulating substrate (1), the land (10) and the wiring substrate (5) have low thermal conductivity, various problems occur. Firstly, there is also a material for a semiconductor light emitting element in which the PN junction temperature Tj rises and the luminous intensity is lowered due to a change in temperature characteristics. For example, in an AlGaInP-based semiconductor light emitting device, the luminous intensity is reduced by −0.5 to −1% / ° C. at 20 mA. Second
In addition, there is a drawback that the range of the ambient temperature Ta at the time of operating the semiconductor light emitting device is limited to the ranges of the expressions (1) and (2).
Thirdly, when the semiconductor light emitting element is connected to a constant voltage source via a resistor and constant voltage driving is performed, the forward voltage value decreases due to an increase in the PN junction temperature Tj. For this reason, the operating point fluctuates, the value of the current flowing through the semiconductor light emitting element increases, the amount of heat generated by the semiconductor light emitting element becomes difficult to saturate, and heat generation and current value increase are repeated, leading to thermal runaway. Fourthly, peeling occurs at the interface between the mold resin and the semiconductor light emitting element, and the light emitted from the semiconductor light emitting element is totally reflected at the peeled portion to reduce the luminous intensity, resulting in a decrease in product reliability. Fifth, PN
As the junction temperature Tj rises, thermal degradation of the semiconductor light emitting element occurs and reliability decreases.

【0005】前記不具合を低減するには、半導体発光装
置の温度上昇を如何に抑制できるかがポイントになる。
一定の駆動電流で駆動される半導体発光装置の発熱量を
低減するには、式(1)及び(2)より、半導体発光素
子の熱伝導率λ0を高めるか、絶縁性基板・導体パター
ンの熱伝導率λ1を高め若しくは使用材料の見直しを図
るか又は実装基板の熱伝導率λ2を高めるか何れかの方
法が考えられる。半導体発光素子の熱伝導率λ0を高め
る代わりに、半導体発光素子のサイズを増大して熱容量
を増加する方法も考えられるが、この方法では、増大す
るサイズに応じた大きな面積を有する絶縁性基板が必要
となるため、半導体発光装置の小型化が困難となり、ま
た、半導体発光素子の発光効率低下を招く。実装基板の
熱伝導率λ2を高める場合でも、実装基板と半導体発光
装置との接着面の導体パターンを広げて放熱作用を向上
して、半導体発光装置の発熱量を低減できるが、その分
実装基板の面積が広がるので、製造価格が増加する。従
って、絶縁性基板及び導体パターンの熱伝導率λ1を高
め又は使用材料の見直しを図ることが、特性面、実装面
及びコスト面でも最も効果的である。
In order to reduce the above problems, the point is how to suppress the temperature rise of the semiconductor light emitting device.
In order to reduce the heat generation amount of the semiconductor light emitting device driven by a constant drive current, the thermal conductivity λ 0 of the semiconductor light emitting element should be increased or the insulating substrate / conductor pattern should be formed according to the equations (1) and (2). Either increasing the thermal conductivity λ 1 or reviewing the material used, or increasing the thermal conductivity λ 2 of the mounting board can be considered. Instead of increasing the thermal conductivity λ 0 of the semiconductor light emitting element, a method of increasing the size of the semiconductor light emitting element to increase the heat capacity can be considered. In this method, an insulating substrate having a large area corresponding to the increasing size is used. Therefore, it is difficult to reduce the size of the semiconductor light emitting device, and the luminous efficiency of the semiconductor light emitting element is reduced. Even when the thermal conductivity λ 2 of the mounting board is increased, the conductor pattern on the bonding surface between the mounting board and the semiconductor light emitting device can be widened to improve the heat dissipation effect and reduce the heat generation amount of the semiconductor light emitting device. Since the board area is expanded, the manufacturing cost is increased. Therefore, increasing the thermal conductivity λ 1 of the insulating substrate and the conductor pattern or reviewing the materials used is most effective in terms of characteristics, mounting and cost.

【0006】例えば、特開2000−77686号公報
は、パッケージ側壁から光信号を伝達することにより薄
形化した半導体装置を、アイランドの裏面をプリント配
線に固定して実装することにより光信号のぶれと放熱性
を改善する光半導体装置の実装構造を示す。この実装構
造では、絶縁性基板を使用せず、アイランドをプリント
配線に熱的に結合することによって半導体発光素子の放
熱性を改善することができる。この構造では、絶縁性基
板を使用する従来の半導体発光装置に比べ放熱性は非常
に優れる反面、リードの足曲げが必要になると共に、装
置が大きくなり、小型化が困難となってコストアップに
繋がる難点がある。
For example, Japanese Patent Laid-Open No. 2000-77686 discloses that a semiconductor device thinned by transmitting an optical signal from a package side wall is mounted by fixing the back surface of an island to a printed wiring to cause optical signal blurring. And a mounting structure of an optical semiconductor device for improving heat dissipation. In this mounting structure, the heat dissipation of the semiconductor light emitting element can be improved by thermally coupling the island to the printed wiring without using an insulating substrate. With this structure, the heat dissipation is much better than that of the conventional semiconductor light emitting device that uses an insulating substrate, but on the other hand, the leads must be bent and the device becomes large, making it difficult to miniaturize and increasing the cost. There are difficulties connected.

【0007】[0007]

【発明が解決しようとする課題】前述の通り、半導体発
光素子の構造上の制約により、従来では代表的なアルミ
ナ製のセラミック基板等の絶縁性基板を使用する必要性
があった。絶縁性基板上にパターニングする代表的な金
属導体は、銀又は銅であるが、アルミナの熱伝導率は常
温で21(W/m/K)であり、100℃での銀(Ag)
の熱伝導率313(W/m/K)及び銅(Cu)の熱伝導
率395(W/m/K)に比べると遙かに低い。因みに、
鉄の100℃での熱伝導率は72(W/m/K)である。
このため導体パターンを通して放熱性を改善する方法も
考えられるが、一般に50μm程度の厚さに形成される
導体パターンには放熱効果を期待できず、また絶縁性基
板を金属製リードで挟む製造工程が増加する。絶縁性基
板の薄型化により、熱伝導性の向上は可能であるが、あ
る程度薄肉化すると、絶縁性基板の機械的な強度が低下
して、絶縁性基板の反り・欠け等の不具合が発生し易く
なり、取り扱いが容易でなくなる。絶縁性基板からの放
熱は、実装基板と接着させる外部電極端子のみである。
実装基板との接着面積が狭いと、放熱性が低下する反
面、逆に接触面積を増大すると、半導体発光装置の面積
もこれに応じて広くなる。本発明は、放熱性に優れた小
型の半導体発光装置を提供することを目的とする。
As described above, due to the structural restrictions of the semiconductor light emitting device, it has been necessary to use an insulating substrate such as a typical alumina ceramic substrate in the past. A typical metal conductor patterned on an insulating substrate is silver or copper, but the thermal conductivity of alumina is 21 (W / m / K) at room temperature, and silver (Ag) at 100 ° C.
The thermal conductivity is 313 (W / m / K) and that of copper (Cu) is 395 (W / m / K). By the way,
The thermal conductivity of iron at 100 ° C. is 72 (W / m / K).
Therefore, a method of improving heat dissipation through a conductor pattern is conceivable, but a heat dissipation effect cannot be expected for a conductor pattern generally formed with a thickness of about 50 μm, and a manufacturing process in which an insulating substrate is sandwiched by metal leads is required. To increase. The thermal conductivity can be improved by making the insulating substrate thinner, but if it is made thinner to some extent, the mechanical strength of the insulating substrate will decrease, causing problems such as warping or chipping of the insulating substrate. It becomes easy and difficult to handle. Heat is radiated from the insulating substrate only through the external electrode terminals that are attached to the mounting substrate.
When the adhesion area with the mounting substrate is narrow, the heat dissipation performance is reduced, while conversely, when the contact area is increased, the area of the semiconductor light emitting device is correspondingly widened. An object of the present invention is to provide a small semiconductor light emitting device having excellent heat dissipation.

【0008】[0008]

【課題を解決するための手段】本発明による表面実装型
半導体発光装置は、支持板(1)と、支持板(1)の一方の主
面(1a)に設けられた単一又は複数の素子載置部(7)に固
着された半導体発光素子(2)と、支持板(1)から一定間隔
離間して配置され且つ半導体発光素子(2)の電極に電気
的に接続された第1の外部リード(3)と、支持板(1)、半
導体発光素子(2)及び第1の外部リード(3)を被覆する樹
脂封止体(4)とを備えている。支持板(1)の平坦な他方の
主面(1b)は、樹脂封止体(4)の底面(4a)から突出し、支
持板(1)の縁部(1e)に沿って延伸する第1の外部リード
(3)は、支持板(1)の他方の主面(1b)と同一方向に樹脂封
止体(4)の底面(4a)から突出する平坦な底面(3a)を有す
る。支持板(1)の他方の主面(1b)を配線基板(5)に固着し
たとき、樹脂封止体(4)と配線基板(5)との間に間隙(6)
が形成されると共に、樹脂封止体(4)の底面(4a)と配線
基板(5)との間に形成される間隙(6)内で、支持板(1)の
低部及び第1の外部リード(3)の低部は外部空気に曝露
されるので、作動時に半導体発光素子(2)から発生する
熱は間隙(6)内で接着部(1d)から周囲の空気中に放出さ
れる。
A surface mount type semiconductor light emitting device according to the present invention comprises a support plate (1) and a single or a plurality of elements provided on one main surface (1a) of the support plate (1). A semiconductor light emitting element (2) fixed to the mounting portion (7) and a first light emitting element (2) arranged at a constant distance from the support plate (1) and electrically connected to an electrode of the semiconductor light emitting element (2). It comprises an external lead (3), a support plate (1), a semiconductor light emitting element (2) and a resin encapsulant (4) covering the first external lead (3). The other flat main surface (1b) of the support plate (1) projects from the bottom surface (4a) of the resin encapsulant (4) and extends along the edge (1e) of the support plate (1). External lead
(3) has a flat bottom surface (3a) protruding from the bottom surface (4a) of the resin sealing body (4) in the same direction as the other main surface (1b) of the support plate (1). When the other main surface (1b) of the support plate (1) is fixed to the wiring board (5), a gap (6) is formed between the resin sealing body (4) and the wiring board (5).
And the lower portion of the support plate (1) and the first portion within the gap (6) formed between the bottom surface (4a) of the resin encapsulant (4) and the wiring board (5). Since the lower part of the external lead (3) is exposed to the external air, the heat generated from the semiconductor light emitting element (2) during operation is released into the ambient air from the adhesive part (1d) within the gap (6). .

【0009】本発明の実施の形態では、支持板(1)の他
方の主面(1b)及び第1の外部リード(3)の底面(3a)は、
同一平面上に配置されので、支持板(1)の他方の主面(1
b)及び第1の外部リード(3)の底面(3a)を導電性接着材
により同時に平面状の配線基板(5)のランド(10)上に固
着することができる。支持板(1)及び第1の外部リード
(3)を同一の高さで配置し、支持板(1)は、第1の外部リ
ード(3)から離間する第2の外部リードを構成し、半導
体発光素子(2)の電極に電気的に接続され且つ支持板(1)
及び第1の外部リード(3)と同一の高さで第3の外部リ
ード(9)を形成し、支持板(1)の他方の主面(1b)及び第1
の外部リード(3)の底面(3a)と同一平面上に第3の外部
リード(9)の底面(9a)を配置してもよい。
In the embodiment of the present invention, the other main surface (1b) of the support plate (1) and the bottom surface (3a) of the first external lead (3) are
Since they are arranged on the same plane, the other main surface (1
b) and the bottom surface (3a) of the first external lead (3) can be simultaneously fixed to the land (10) of the planar wiring board (5) with a conductive adhesive. Support plate (1) and first external lead
(3) are arranged at the same height, and the support plate (1) constitutes a second external lead which is separated from the first external lead (3), and is electrically connected to the electrode of the semiconductor light emitting device (2). Connected to and support plate (1)
And the third external lead (9) is formed at the same height as the first external lead (3), and the other main surface (1b) of the support plate (1) and the first external lead (3) are formed.
The bottom surface (9a) of the third external lead (9) may be arranged on the same plane as the bottom surface (3a) of the external lead (3).

【0010】[0010]

【発明の実施の形態】以下、本発明による表面実装型半
導体発光装置の実施の形態を図1〜図11について説明
する。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of a surface mount semiconductor light emitting device according to the present invention will be described below with reference to FIGS.

【0011】図1及び図2に示す本発明の第1の実施の
形態では、表面実装型半導体発光装置は、平坦な単一の
素子載置部(7)を有する支持板(1)と、支持板(1)の素子
載置部(7)に接着材(13)により固着される半導体発光素
子(2)と、支持板(1)から一定間隔離間して配置され且つ
半導体発光素子(2)の電極に電気的に接続された第1の
外部リード(3)と、半導体発光素子(2)のアノード電極(2
a)と第1の外部リード(3)とを電気的に接続する第1の
リード細線(8a)と、半導体発光素子(2)のカソード電極
(2b)と第1の外部リード(3)から離間する第2の外部リ
ードを構成する支持板(1)とを電気的に接続する第2の
リード細線(8b)と、支持板(1)、半導体発光素子(2)、第
1の外部リード(3)、第1のリード細線(8a)及び第2の
リード細線(8b)を被覆する樹脂封止体(4)とを備えてい
る。半導体発光素子(2)を搭載する平坦な素子載置部(7)
は、支持板(1)に形成された集光作用のある単数又は複
数の凹部(1c)の各底面に設けられる。凹部(1c)の光反射
効率を向上するため、θ=30〜60°の傾斜を凹部(1
c)の側壁面に形成すると共に、銀(Ag)又はアルミニ
ウム(Al)等の高光反射率の金属メッキを凹部(1c)の
内側に形成することが望ましい。支持板(1)は、銅(C
u)及び銅(Cu)を使用する合金等の熱伝導性の高い
放熱性に優れた金属により形成され且つ樹脂封止体(4)
から下方に突出する接着部(1d)を有する。支持板(1)の
接着部(1d)は配線基板(5)に形成されたランド(10)に半
田(接着材)(12)により固着され、第1の外部リード
(3)は、支持板(1)の縁部(1e)に沿って延伸する。第1の
外部リード(3)は、支持板(1)の他方の主面(1b)と同一方
向に樹脂封止体(4)の底面(4a)から突出する平坦な底面
(3a)を有する。第1の外部リード(3)の底面(3a)は、ラ
ンド(10)から離間して配線基板(5)に形成されたランド
(11)に半田(12)により固着される。
In the first embodiment of the present invention shown in FIGS. 1 and 2, a surface mount semiconductor light emitting device is a support plate (1) having a single flat element mounting portion (7), The semiconductor light emitting element (2) fixed to the element mounting portion (7) of the support plate (1) by an adhesive material (13), and the semiconductor light emitting element (2) arranged at a constant distance from the support plate (1). ) And the first external lead (3) electrically connected to the electrode of the semiconductor light emitting device (2).
a thin lead wire (8a) for electrically connecting (a) and the first external lead (3), and a cathode electrode of the semiconductor light emitting device (2)
A second lead thin wire (8b) electrically connecting the support plate (1) constituting the second outer lead separated from the first outer lead (3) with the support plate (1). A semiconductor light emitting element (2), a first external lead (3), a first lead thin wire (8a) and a second lead thin wire (8b), and a resin sealing body (4). Flat element mounting part (7) for mounting semiconductor light emitting element (2)
Are provided on the bottom surface of each of the single or plural recesses (1c) having a light-collecting function formed on the support plate (1). In order to improve the light reflection efficiency of the concave portion (1c), an inclination of θ = 30 to 60 ° is used.
It is desirable to form a metal plate having a high light reflectance such as silver (Ag) or aluminum (Al) on the inner side of the concave portion (1c) while being formed on the side wall surface of c). The support plate (1) is made of copper (C
u) and a resin sealing body (4) made of a metal having a high heat conductivity and an excellent heat dissipation property such as an alloy using copper (Cu)
It has an adhesive portion (1d) protruding downward from. The adhesive portion (1d) of the support plate (1) is fixed to the land (10) formed on the wiring board (5) by solder (adhesive material) (12), and the first external lead
(3) extends along the edge (1e) of the support plate (1). The first external lead (3) is a flat bottom surface protruding from the bottom surface (4a) of the resin encapsulant (4) in the same direction as the other main surface (1b) of the support plate (1).
It has (3a). The bottom surface (3a) of the first external lead (3) is separated from the land (10) and is formed on the wiring board (5).
It is fixed to (11) with solder (12).

【0012】半導体発光素子(2)を素子載置部(7)に接着
する接着材(13)は、銀(Ag)等の高反射型導電性ペー
ストを使用することが望ましい。また高光透過性の半導
体発光素子(2)の裏面は絶縁体であるから、接着材(13)
に非導電性の透明接着材を使用しても良い。第1及び第
2のリード細線(8a,8b)は、金(Au)又はアルミニウ
ム(Al)等の金属により構成される。支持板(1)の他
方の主面(1b)及び放熱部となる接着部(1d)は、エポキシ
系等の高光透過性の樹脂封止体(4)の底面(4a)から露出
し、支持板(1)の接着部(1d)を配線基板(5)に固着したと
き、樹脂封止体(4)と配線基板(5)との間に間隙(6)が形
成される。間隙(6)の高さは0.1〜2.0mmの範囲で自
由に設定することができる。従って樹脂封止体の側面か
ら外部リードが突出する従来の構造に比べて、半導体発
光素子(2)の配線基板(5)からの突出高さと横方向サイズ
を縮小することができる。支持板(1)及び第1の外部リ
ード(3)は同一の高さで且つ並行に配置される。支持板
(1)の接着部(1d)及び第1の外部リード(3)の底面(3a)は
同一平面上に配置されるので、支持板(1)の接着部(1d)
及び第1の外部リード(3)の底面(3a)を導電性接着材と
なる半田(12)により平面状の配線基板(5)上に固着する
ことができる。
As the adhesive material (13) for bonding the semiconductor light emitting element (2) to the element mounting portion (7), it is desirable to use a highly reflective conductive paste such as silver (Ag). Further, since the back surface of the semiconductor light emitting device (2) having high light transmittance is an insulator, the adhesive material (13)
Alternatively, a non-conductive transparent adhesive material may be used. The first and second thin lead wires (8a, 8b) are made of metal such as gold (Au) or aluminum (Al). The other main surface (1b) of the support plate (1) and the adhesive portion (1d) that becomes the heat dissipation portion are exposed from the bottom surface (4a) of the resin encapsulant (4) having high light transmittance such as epoxy and are supported. When the adhesive portion (1d) of the plate (1) is fixed to the wiring board (5), a gap (6) is formed between the resin sealing body (4) and the wiring board (5). The height of the gap (6) can be freely set within the range of 0.1 to 2.0 mm. Therefore, the projecting height of the semiconductor light emitting element (2) from the wiring board (5) and the lateral size can be reduced as compared with the conventional structure in which the external leads project from the side surface of the resin sealing body. The support plate (1) and the first outer leads (3) are arranged at the same height and in parallel. Support plate
Since the adhesive portion (1d) of (1) and the bottom surface (3a) of the first external lead (3) are arranged on the same plane, the adhesive portion (1d) of the support plate (1)
Also, the bottom surface (3a) of the first external lead (3) can be fixed on the planar wiring board (5) by the solder (12) which is a conductive adhesive material.

【0013】図3及び図4に示す本発明の第2の実施の
形態では、第2のリード細線(8b)を介して半導体発光素
子(2)のカソード電極(2b)に電気的に接続された第3の
外部リード(9)を有し、支持板(1)から離間して配置され
た第3の外部リード(9)は支持板(1)及び第1の外部リー
ド(3)と同一の高さで形成され、第3の外部リード(9)の
底面(9a)は支持板(1)の他方の主面(1b)及び第1の外部
リード(3)の底面(3a)と同一平面上に且つ並行に配置さ
れる。図3及び図4に示す半導体発光素子(2)は、絶縁
体であるサファイア基板と、サファイア基板上に形成さ
れたPN接合部とを備え、素子表面にアノード電極(2a)
及びカソード電極(2b)が形成される。
In the second embodiment of the present invention shown in FIGS. 3 and 4, it is electrically connected to the cathode electrode (2b) of the semiconductor light emitting device (2) through the second lead thin wire (8b). The third external lead (9), which has a third external lead (9) and is spaced apart from the support plate (1), is the same as the support plate (1) and the first external lead (3). The bottom surface (9a) of the third external lead (9) is the same as the other main surface (1b) of the support plate (1) and the bottom surface (3a) of the first external lead (3). They are arranged on a plane and in parallel. The semiconductor light emitting device (2) shown in FIGS. 3 and 4 includes a sapphire substrate that is an insulator and a PN junction formed on the sapphire substrate, and the anode electrode (2a) is formed on the device surface.
And a cathode electrode (2b) is formed.

【0014】半導体発光装置を動作させる際に、半導体
発光素子(2)から発生する熱は、樹脂封止体(4)から間隙
(6)内で露出する接着部(1d)からランド(10)に伝達され
ると共に、接着部(1d)又はランド(10)から直接間隙(6)
内の空気中に放出され、放熱効果を向上することができ
る。この場合に、素子載置部(7)と支持板(1)の底面間距
離を短縮し、支持板(1)又はランド(10)の面積を拡大す
ることにより、放熱性を更に高めることが可能である。
通常、配線基板(5)上の電源ライン及びグランドライン
を含む共通回路ラインを形成する配線は、インピーダン
ス成分を低下させて、共通ラインに印加される電圧の発
振を防ぐため、比較的太めの銅箔パターンにより形成さ
れる。このため支持板(1)を接着するランド(10)を共通
ラインにすることが望ましい。本実施の形態では、ラン
ド(10)を跨ぐジャンパー線の役割をも果たす。このた
め、パターニングされた銅箔パターンを削除して、ジャ
ンパー線の削減及び半導体発光装置の温度上昇を低減す
ることができ、配線基板(5)の小型化を図り、実装コス
トを低減することができる。支持板(1)と半導体発光素
子(2)とが電気的に絶縁状態に保持されると、配線基板
(5)のランド(10)に印加される電圧又は電流条件によら
ず、発光素子(2)は安定した動作をすることが可能であ
る。図3及び図4に示す本発明の第2の実施の形態で
は、支持板(1)の側面、第1の外部リード(2)の側面及び
第3の外部リード(9)の側面が樹脂封止体(4)の側面から
突出している。従って、図3のように、配線基板(5)に
対して支持板(1)の他方の主面(1b)を対向させて固定す
ることもでき、また図5に示すように、配線基板(5)に
対して支持板(1)の側面を対向させて固定することもで
きる。
When operating the semiconductor light emitting device, the heat generated from the semiconductor light emitting element (2) is separated from the resin sealing body (4) by a gap.
It is transmitted from the adhesive part (1d) exposed in (6) to the land (10), and the gap (6) is directly transmitted from the adhesive part (1d) or the land (10).
It is released into the air inside and the heat dissipation effect can be improved. In this case, by shortening the distance between the element mounting portion (7) and the bottom surface of the support plate (1) and enlarging the area of the support plate (1) or the land (10), heat dissipation can be further improved. It is possible.
Usually, the wiring forming the common circuit line including the power supply line and the ground line on the wiring board (5) lowers the impedance component and prevents the voltage applied to the common line from oscillating. It is formed by a foil pattern. For this reason, it is desirable that the land (10) for adhering the support plate (1) to be on a common line. In the present embodiment, it also plays the role of a jumper wire straddling the land (10). Therefore, by removing the patterned copper foil pattern, it is possible to reduce the number of jumper wires and the temperature rise of the semiconductor light emitting device, and it is possible to reduce the size of the wiring board (5) and reduce the mounting cost. it can. When the support plate (1) and the semiconductor light emitting device (2) are held in an electrically insulated state, the wiring board
The light emitting element (2) can operate stably regardless of the voltage or current conditions applied to the land (10) of (5). In the second embodiment of the present invention shown in FIGS. 3 and 4, the side surface of the support plate (1), the side surface of the first external lead (2) and the side surface of the third external lead (9) are resin-sealed. It projects from the side surface of the stopper (4). Therefore, as shown in FIG. 3, the other main surface (1b) of the support plate (1) can be fixed to the wiring board (5) by facing it, and as shown in FIG. It is also possible to fix the side surface of the support plate (1) so as to face it with respect to 5).

【0015】図5は、図3及び図4に示す半導体発光装
置を配線基板(5)上に垂直に固定した側面発光が可能な
第3の実施の形態を示す。第3の実施の形態でも、支持
板(1)の他方の主面(1b)が樹脂封止体(4)から突出するの
で、良好な放熱性が得られる。図6は、配線基板(5)に
垂直に固定した支持板(1)に2つの素子載置部(7)を垂直
方向に並設した側面発光が可能な第4の実施の形態を示
す。図6の上側に配置された半導体発光素子(2)は図2
に示す半導体発光素子(2)と同一の構造であり、図6の
下側に配置された半導体発光素子(2)では、表面に第3
の外部リード(9)からリード細線(8a)から電力が供給さ
れるアノード電極(2a)が形成され、裏面に支持板(1)に
電気的に接続されたカソード電極が形成される。図6
は、一対の半導体発光素子(2)が各カソード電極を共通
にする2色発光用装置への展開例である。各半導体発光
素子(2)のアノード電極(2a)に接続すべき第1の外部リ
ード(3)と第3の外部リード(9)との長さが相違するの
で、外部リードの識別が容易となる。
FIG. 5 shows a third embodiment in which the semiconductor light emitting device shown in FIGS. 3 and 4 is vertically fixed on a wiring board (5) and side light emission is possible. Also in the third embodiment, since the other main surface (1b) of the support plate (1) projects from the resin sealing body (4), good heat dissipation can be obtained. FIG. 6 shows a fourth embodiment in which two element mounting portions (7) are vertically arranged side by side on a support plate (1) fixed vertically to a wiring board (5) to enable side surface light emission. The semiconductor light emitting device (2) arranged on the upper side of FIG.
The semiconductor light emitting device (2) shown in FIG. 6 has the same structure as the semiconductor light emitting device (2) shown in FIG.
An anode electrode (2a) to which power is supplied from the external lead (9) from the lead thin wire (8a) is formed, and a cathode electrode electrically connected to the support plate (1) is formed on the back surface. Figure 6
Is an example of development to a device for two-color light emission in which a pair of semiconductor light emitting elements (2) share each cathode electrode. Since the first external lead (3) and the third external lead (9) to be connected to the anode electrode (2a) of each semiconductor light emitting element (2) have different lengths, the external leads can be easily identified. Become.

【0016】図7は、単一の凹部(1c)に設けた2つの素
子載置部(7)にそれぞれ半導体発光素子(2)を配置した第
5の実施の形態を示す。図7に示す上側の半導体発光素
子(2)はリード細線(8a)を介して分離した第1の外部リ
ード(3c)に電気的に接続されたアノード電極(2a)を備
え、図6の上側に示す半導体発光素子(2)と同一の構造
を示し、下側の半導体発光素子(2)はリード細線(8a)を
介して分離した第1の外部リード(3d)に電気的に接続さ
れたアノード電極(2a)を備え、図6の下側に示す半導体
発光素子(2)と同一の構造を示す。図7に示す実施の形
態では、同一の素子載置部(7)に搭載された各第1の半
導体発光素子(2)及び第2の半導体発光素子(2)を用いた
2色の半導体発光装置を示す。
FIG. 7 shows a fifth embodiment in which a semiconductor light emitting element (2) is arranged on each of two element mounting portions (7) provided in a single recess (1c). The upper semiconductor light emitting device (2) shown in FIG. 7 is provided with an anode electrode (2a) electrically connected to a first external lead (3c) separated through a thin lead wire (8a). It has the same structure as the semiconductor light emitting device (2) shown in (3), and the lower semiconductor light emitting device (2) is electrically connected to the separated first external lead (3d) through the thin lead wire (8a). It has an anode electrode (2a) and has the same structure as the semiconductor light emitting device (2) shown in the lower side of FIG. In the embodiment shown in FIG. 7, two-color semiconductor light emission using each of the first semiconductor light emitting element (2) and the second semiconductor light emitting element (2) mounted on the same element mounting portion (7). Shows the device.

【0017】図8は、支持板(1)の上側に半導体発光素
子(2)が固着され、下側に定電圧ダイオード(14)が固着
され、半導体発光素子(2)及び定電圧ダイオード(14)は
単一の第1の外部リード(3)に接続され、図9に示す回
路を構成する第6の実施の形態を示す。定電圧ダイオー
ド(14)は半導体発光素子(2)に逆電圧が印加されたとき
にオンとなり、逆電圧に対して半導体発光素子(2)を保
護する。更にサージ電圧が印加された場合、サージ電圧
から半導体発光素子(2)を保護する機能を有している。
定電圧ダイオード(14)では、リード細線(8a)を介して第
1の外部リード(3)に接続されたアノード電極(14a)が表
面に形成され、支持板(1)に電気的に接続されたカソー
ド電極が裏面に形成される。図10は、分離して設けら
れた第1の外部リード(3c,3d)にリード細線(8a)を介し
て接続された第7の実施の形態を示す。
In FIG. 8, the semiconductor light emitting device (2) is fixed to the upper side of the support plate (1), and the constant voltage diode (14) is fixed to the lower side thereof, so that the semiconductor light emitting device (2) and the constant voltage diode (14) are fixed. ) Indicates a sixth embodiment which is connected to a single first external lead (3) and constitutes the circuit shown in FIG. The constant voltage diode (14) is turned on when a reverse voltage is applied to the semiconductor light emitting element (2) and protects the semiconductor light emitting element (2) against the reverse voltage. Further, when a surge voltage is applied, it has a function of protecting the semiconductor light emitting element (2) from the surge voltage.
In the constant voltage diode (14), the anode electrode (14a) connected to the first external lead (3) through the thin lead wire (8a) is formed on the surface and electrically connected to the support plate (1). And a cathode electrode is formed on the back surface. FIG. 10 shows a seventh embodiment in which the first external leads (3c, 3d) provided separately are connected via a thin lead wire (8a).

【0018】図10に示す実施の形態は、それぞれ独立
した素子載置部(7)に搭載され且つカソード電極も独立
する第1の半導体発光素子(2)と第2の半導体発光素子
(2)を備えた2色半導体発光装置を示す。図11は、半
導体発光素子(2)及び定電圧ダイオード(14)の各アノー
ド電極が、分離して設けられた第1の外部リード(3c,3
d)にリード細線(8a)を介して接続された半導体発光素子
(2)及び半導体発光素子(2)を制御し又は保護する集積回
路(15)を備えた第8の実施の形態を示す。白色の半導体
発光装置を構成する場合、温度上昇を抑制して、半導体
発光素子及び蛍光体の劣化を抑制できるので、大電流で
作動させても長寿命となり、また、蛍光体の温度上昇に
伴う発光効果の低下による変色も抑制でき安定した色調
を表示できる。
In the embodiment shown in FIG. 10, the first semiconductor light emitting element (2) and the second semiconductor light emitting element, which are mounted on independent element mounting portions (7) and also have independent cathode electrodes, are provided.
A two-color semiconductor light emitting device having (2) is shown. FIG. 11 shows that the anode electrodes of the semiconductor light emitting device (2) and the constant voltage diode (14) are separately provided on the first external lead (3c, 3).
Semiconductor light emitting device connected to d) via lead wire (8a)
An eighth embodiment comprising an integrated circuit (15) for controlling or protecting the semiconductor light emitting device (2) and the semiconductor device (2) is shown. When configuring a white semiconductor light emitting device, it is possible to suppress the temperature rise and suppress the deterioration of the semiconductor light emitting element and the phosphor, so that even if operated with a large current, the life becomes long, and with the temperature rise of the phosphor It is also possible to suppress discoloration due to a decrease in the light emitting effect and display a stable color tone.

【0019】本発明の実施の形態では、良好な放熱が得
られ下記の作用効果が得られる。 [1] 放熱性の向上 外部に露出するフィンとなる接着部(1d)を有する支持板
(1)に直接半導体発光素子(2)を接着するので、良好な放
熱性が得られる。またランド(10)等の銅箔部の面積を必
要に応じて拡張すれば、放熱性を更に向上できる。 [2] 生産性の向上 支持板(1)に半導体発光素子(2)を接着すれば、例えば、
絶縁性基板にリードを挟み込む工程を含む特殊な工程及
び付加的な部品を必要とせず、現行の生産設備を利用し
て製造が可能である。新規設備を必要とせず現有設備を
利用できるため、生産性及びコスト面的でもメリットは
ある。 [3] 小型化 熱伝導性のよい材料を使用して支持板(1)の面積を縮小
し、半導体発光装置の小型化を図ると共に、放熱性を確
保しつつ高電流で半導体発光装置を駆動できる。また配
線基板(5)の面積を低減し且つ部品点数を削減する効果
も期待できる。 [4] 信頼性 従来品に比べ部品点数が少なくなるため、信頼性は向上
する。
In the embodiment of the present invention, good heat dissipation can be obtained and the following operational effects can be obtained. [1] Improvement of heat dissipation Support plate having an adhesive portion (1d) serving as a fin exposed to the outside
Since the semiconductor light emitting element (2) is directly bonded to (1), good heat dissipation can be obtained. Further, if the area of the copper foil portion such as the land (10) is expanded as necessary, the heat dissipation can be further improved. [2] Improving productivity If the semiconductor light emitting device (2) is bonded to the support plate (1), for example,
It is possible to manufacture using the current production equipment without requiring a special process including a process of sandwiching the lead in the insulating substrate and an additional component. Since existing equipment can be used without the need for new equipment, there are advantages in terms of productivity and cost. [3] Miniaturization The size of the semiconductor light emitting device is reduced by using the material having good thermal conductivity to reduce the area of the support plate (1), and the semiconductor light emitting device is driven with high current while ensuring heat dissipation. it can. Further, the effect of reducing the area of the wiring board (5) and reducing the number of parts can be expected. [4] Reliability Since the number of parts is smaller than that of the conventional product, reliability is improved.

【0020】[0020]

【発明の効果】前記のように、本発明では、放熱性に優
れた小型の半導体発光装置を実現することができる。
As described above, according to the present invention, it is possible to realize a small semiconductor light emitting device having excellent heat dissipation.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の表面実装型半導体発光装置による第
1の実施の形態を示す側面図
FIG. 1 is a side view showing a first embodiment of a surface mount semiconductor light emitting device of the present invention.

【図2】 図1の平面図FIG. 2 is a plan view of FIG.

【図3】 本発明の表面実装型半導体発光装置による第
2の実施の形態を示す側面図
FIG. 3 is a side view showing a second embodiment of the surface mount semiconductor light emitting device of the present invention.

【図4】 図3の平面図FIG. 4 is a plan view of FIG.

【図5】 本発明の表面実装型半導体発光装置による第
3の実施の形態を示す側面図
FIG. 5 is a side view showing a third embodiment of the surface mount semiconductor light emitting device of the present invention.

【図6】 本発明の表面実装型半導体発光装置による第
4の実施の形態を示す側面図
FIG. 6 is a side view showing a fourth embodiment of a surface-mounted semiconductor light emitting device of the present invention.

【図7】 本発明の表面実装型半導体発光装置による第
5の実施の形態を示す平面図
FIG. 7 is a plan view showing a fifth embodiment of the surface-mounted semiconductor light emitting device of the present invention.

【図8】 本発明の表面実装型半導体発光装置による第
6の実施の形態を示す平面図
FIG. 8 is a plan view showing a sixth embodiment of the surface mount semiconductor light emitting device of the present invention.

【図9】 図8に示す表面実装型半導体発光装置の回路
構成を示す電気回路図
9 is an electric circuit diagram showing a circuit configuration of the surface mount semiconductor light emitting device shown in FIG.

【図10】 本発明の表面実装型半導体発光装置による
第7の実施の形態を示す平面図
FIG. 10 is a plan view showing a seventh embodiment of the surface-mounted semiconductor light emitting device of the present invention.

【図11】 本発明の表面実装型半導体発光装置による
第8の実施の形態を示す断面図
FIG. 11 is a cross-sectional view showing an eighth embodiment of a surface-mounted semiconductor light emitting device of the present invention.

【図12】 従来の表面実装型半導体発光装置の平面図FIG. 12 is a plan view of a conventional surface mount semiconductor light emitting device.

【図13】 図12に示す表面実装型半導体発光装置の
側面図
13 is a side view of the surface mount semiconductor light emitting device shown in FIG.

【符号の説明】[Explanation of symbols]

(1)・・支持体(第2の外部リード)、 (1a)・・一方
の主面、 (1b)・・他方の主面、 (1c)・・凹部、 (1
d)・・接着部、 (2)・・半導体発光素子、 (3)・・第
1の外部リード、 (3a)・・底面、 (4)・・樹脂封止
体、 (5)・・配線基板、 (6)・・間隙、 (7)・・素
子載置部、 (8a)・・第1のリード細線、(8b)・・第2
のリード細線、 (9)・・第3の外部リード、 (9a)・
・底面、
(1) ・ ・ Support (second external lead), (1a) ・ ・ One main surface, (1b) ・ ・ Other main surface, (1c) ・ ・ Concave, (1
d) ・ ・ Adhesive part, (2) ・ ・ Semiconductor light emitting element, (3) ・ ・ First external lead, (3a) ・ ・ Bottom surface, (4) ・ ・ Resin encapsulant, (5) ・ ・ Wiring Substrate, (6) .. gap, (7) .. element mounting part, (8a) .. first fine lead wire, (8b) .. second
Lead thin wire, (9) ・ ・ Third external lead, (9a) ・
・ Bottom,

フロントページの続き Fターム(参考) 4M109 AA01 BA02 CA21 DA04 DA10 DB03 DB15 EE12 GA01 GA05 5F036 AA01 BB16 BC33 BE01 5F041 AA41 AA43 AA44 AA47 DA03 DA07 DA43 Continued front page    F-term (reference) 4M109 AA01 BA02 CA21 DA04 DA10                       DB03 DB15 EE12 GA01 GA05                 5F036 AA01 BB16 BC33 BE01                 5F041 AA41 AA43 AA44 AA47 DA03                       DA07 DA43

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 支持板と、該支持板の一方の主面に設け
られた単一又は複数の素子載置部に固着された半導体発
光素子と、前記支持板から一定間隔離間して配置され且
つ前記半導体発光素子の電極に電気的に接続された第1
の外部リードと、前記支持板、前記半導体発光素子及び
第1の外部リードを被覆する樹脂封止体とを備えた表面
実装型半導体発光装置において、 前記支持板の平坦な他方の主面は、前記樹脂封止体の底
面から突出し、 前記支持板の縁部に沿って延伸する前記第1の外部リー
ドは、前記支持板の他方の主面と同一方向に前記樹脂封
止体の底面から突出する平坦な底面を有することを特徴
とする表面実装型半導体発光装置。
1. A support plate, a semiconductor light emitting device fixed to a single or a plurality of device mounting portions provided on one main surface of the support plate, and a semiconductor device arranged at a constant distance from the support plate. And a first electrically connected to the electrode of the semiconductor light emitting device
In the surface mounting type semiconductor light emitting device including the external lead of, and the support plate, the semiconductor light emitting element and a resin sealing body that covers the first external lead, the other flat main surface of the support plate is The first external lead protruding from the bottom surface of the resin sealing body and extending along the edge of the support plate projects from the bottom surface of the resin sealing body in the same direction as the other main surface of the support plate. A surface mount semiconductor light emitting device having a flat bottom surface.
【請求項2】 前記支持板の他方の主面及び前記第1の
外部リードの底面は、同一平面上に配置され且つ導電性
の接着材により配線基板のランドに接着される請求項1
に記載の表面実装型半導体発光装置。
2. The other main surface of the support plate and the bottom surface of the first external lead are arranged on the same plane and are bonded to the land of the wiring board by a conductive adhesive material.
The surface-mounted semiconductor light-emitting device according to.
【請求項3】 前記支持板及び第1の外部リードは、同
一の高さで配置される請求項1又は2に記載の表面実装
型半導体発光装置。
3. The surface mount semiconductor light emitting device according to claim 1, wherein the support plate and the first external lead are arranged at the same height.
【請求項4】 前記支持板は、第1の外部リードから離
間する第2の外部リードを構成する請求項1〜3の何れ
か1項に記載の表面実装型半導体発光装置。
4. The surface mount semiconductor light emitting device according to claim 1, wherein the support plate constitutes a second external lead that is separated from the first external lead.
【請求項5】 前記半導体発光素子の電極に電気的に接
続され且つ前記支持板及び第1の外部リードと同一の高
さで第3の外部リードを形成し、該第3の外部リードの
底面は、前記支持板の他方の主面及び前記第1の外部リ
ードの底面と同一平面上に配置される請求項1〜4の何
れか1項に記載の表面実装型半導体発光装置。
5. A third external lead, which is electrically connected to the electrode of the semiconductor light emitting device and has the same height as the supporting plate and the first external lead, and a bottom surface of the third external lead. The surface mounting type semiconductor light emitting device according to claim 1, wherein is disposed on the same plane as the other main surface of the support plate and the bottom surface of the first external lead.
JP2001185571A 2001-06-19 2001-06-19 Surface mounting semiconductor light emitting device Pending JP2003008078A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001185571A JP2003008078A (en) 2001-06-19 2001-06-19 Surface mounting semiconductor light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001185571A JP2003008078A (en) 2001-06-19 2001-06-19 Surface mounting semiconductor light emitting device

Publications (1)

Publication Number Publication Date
JP2003008078A true JP2003008078A (en) 2003-01-10

Family

ID=19025128

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001185571A Pending JP2003008078A (en) 2001-06-19 2001-06-19 Surface mounting semiconductor light emitting device

Country Status (1)

Country Link
JP (1) JP2003008078A (en)

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Publication number Priority date Publication date Assignee Title
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JPWO2007015330A1 (en) * 2005-08-03 2009-02-19 スタンレー電気株式会社 Semiconductor light emitting device and manufacturing method thereof
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Publication number Priority date Publication date Assignee Title
JP2008539576A (en) * 2005-04-27 2008-11-13 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Cooling device for light emitting semiconductor device and method of manufacturing such a cooling device
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US9082945B2 (en) 2010-12-28 2015-07-14 Rohm Co., Ltd. Light emitting element unit and method for manufacturing the same, light emitting element package and illuminating device
JP2012142410A (en) * 2010-12-28 2012-07-26 Rohm Co Ltd Light emitting element unit and method for manufacturing the same, light emitting element package, and lighting system
US9997682B2 (en) 2010-12-28 2018-06-12 Rohm Co., Ltd. Light emitting element unit and method for manufacturing the same, light emitting element package and illuminating device
JP2013012549A (en) * 2011-06-28 2013-01-17 Sharp Corp Light emitting device, light emitting device apparatus, and manufacturing method of light emitting device apparatus
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JP2014216550A (en) * 2013-04-26 2014-11-17 トヨタ自動車株式会社 Semiconductor device and polishing method of semiconductor device
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