JP2002189020A5 - - Google Patents
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- Publication number
- JP2002189020A5 JP2002189020A5 JP2000387309A JP2000387309A JP2002189020A5 JP 2002189020 A5 JP2002189020 A5 JP 2002189020A5 JP 2000387309 A JP2000387309 A JP 2000387309A JP 2000387309 A JP2000387309 A JP 2000387309A JP 2002189020 A5 JP2002189020 A5 JP 2002189020A5
- Authority
- JP
- Japan
- Prior art keywords
- exhaust gas
- standard
- concentration
- gas measuring
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000007789 gas Substances 0.000 claims description 60
- 239000000126 substance Substances 0.000 claims description 39
- 238000005259 measurement Methods 0.000 claims description 24
- 150000002500 ions Chemical class 0.000 claims description 19
- 239000012491 analyte Substances 0.000 claims description 5
- 238000004458 analytical method Methods 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 239000013076 target substance Substances 0.000 claims description 3
- 230000000704 physical effect Effects 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims 2
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 claims 1
- KKCBUQHMOMHUOY-UHFFFAOYSA-N Na2O Inorganic materials [O-2].[Na+].[Na+] KKCBUQHMOMHUOY-UHFFFAOYSA-N 0.000 claims 1
- 239000000654 additive Substances 0.000 claims 1
- 230000000996 additive effect Effects 0.000 claims 1
- 239000000853 adhesive Substances 0.000 claims 1
- 230000001070 adhesive effect Effects 0.000 claims 1
- 239000003463 adsorbent Substances 0.000 claims 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims 1
- 238000007599 discharging Methods 0.000 claims 1
- 239000003546 flue gas Substances 0.000 claims 1
- 238000004949 mass spectrometry Methods 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 239000002808 molecular sieve Substances 0.000 claims 1
- 238000012544 monitoring process Methods 0.000 claims 1
- 239000012925 reference material Substances 0.000 claims 1
- 239000000377 silicon dioxide Substances 0.000 claims 1
- 229910000108 silver(I,III) oxide Inorganic materials 0.000 claims 1
- URGAHOPLAPQHLN-UHFFFAOYSA-N sodium aluminosilicate Chemical compound [Na+].[Al+3].[O-][Si]([O-])=O.[O-][Si]([O-])=O URGAHOPLAPQHLN-UHFFFAOYSA-N 0.000 claims 1
- 239000011148 porous material Substances 0.000 description 19
- 238000011144 upstream manufacturing Methods 0.000 description 8
- 238000004891 communication Methods 0.000 description 4
- 238000004817 gas chromatography Methods 0.000 description 4
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 150000008422 chlorobenzenes Chemical class 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 239000003570 air Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 150000002013 dioxins Chemical class 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000010220 ion permeability Effects 0.000 description 1
- 238000005040 ion trap Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000003595 mist Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000387309A JP3825251B2 (ja) | 2000-12-20 | 2000-12-20 | 排ガス測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000387309A JP3825251B2 (ja) | 2000-12-20 | 2000-12-20 | 排ガス測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002189020A JP2002189020A (ja) | 2002-07-05 |
| JP2002189020A5 true JP2002189020A5 (enExample) | 2004-09-02 |
| JP3825251B2 JP3825251B2 (ja) | 2006-09-27 |
Family
ID=18854269
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000387309A Expired - Fee Related JP3825251B2 (ja) | 2000-12-20 | 2000-12-20 | 排ガス測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3825251B2 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6888133B2 (en) * | 2002-01-30 | 2005-05-03 | Varian, Inc. | Integrated ion focusing and gating optics for ion trap mass spectrometer |
| GB0511083D0 (en) | 2005-05-31 | 2005-07-06 | Thermo Finnigan Llc | Multiple ion injection in mass spectrometry |
| JP4920067B2 (ja) * | 2009-09-24 | 2012-04-18 | 株式会社日立ハイテクノロジーズ | 化学物質モニタ装置及び化学物質モニタ方法 |
| JP2011081017A (ja) * | 2011-01-24 | 2011-04-21 | Hitachi High-Technologies Corp | 化学物質モニタ装置及び化学物質モニタ方法 |
| DE102015100567B3 (de) * | 2015-01-15 | 2015-12-10 | Avl Emission Test Systems Gmbh | Abgasprobenahmesystem und Verfahren zum Betreiben eines derartigen Abgasprobenahmesystems |
| JP6838289B2 (ja) * | 2016-06-02 | 2021-03-03 | いすゞ自動車株式会社 | 排ガス中の未然燃料量の測定方法 |
| JP7576389B2 (ja) * | 2019-02-04 | 2024-10-31 | 千代田化工建設株式会社 | フロー式有機合成方法 |
| CN113945530B (zh) * | 2021-10-19 | 2024-06-14 | 中国计量科学研究院 | 气体浓度检测方法和质谱仪 |
-
2000
- 2000-12-20 JP JP2000387309A patent/JP3825251B2/ja not_active Expired - Fee Related
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