JP2002175956A - Semiconductor device and method of manufacturing the same - Google Patents
Semiconductor device and method of manufacturing the sameInfo
- Publication number
- JP2002175956A JP2002175956A JP2000369633A JP2000369633A JP2002175956A JP 2002175956 A JP2002175956 A JP 2002175956A JP 2000369633 A JP2000369633 A JP 2000369633A JP 2000369633 A JP2000369633 A JP 2000369633A JP 2002175956 A JP2002175956 A JP 2002175956A
- Authority
- JP
- Japan
- Prior art keywords
- identification code
- chip
- semiconductor device
- identification
- package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54413—Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
- H01L2223/5448—Located on chip prior to dicing and remaining on chip after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15312—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体装置および
その製造方法に関し、特に自身に識別コードを有する半
導体装置およびその製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device and a method for manufacturing the same, and more particularly, to a semiconductor device having an identification code in itself and a method for manufacturing the same.
【0002】[0002]
【従来の技術】従来の半導体装置はチップ自身に、それ
を識別するための情報を有してはいない。チップに識別
情報が記されていないと、他の装置と混在したりした場
合に相互の識別ができず、装置としての使用ができなく
なるという虞がある。これを防ぐために、従来はパッケ
ージ裏面にタイプ名等の情報を捺印して、この捺印を人
が目視で判読してその情報を判断していた。しかしこの
方法は、自動化ができず、捺印作業や識別にコストがか
かる等の問題があった。また、パッケージ裏面への捺印
時に発生するダストが製品の不良率を高めるという問題
もあった。2. Description of the Related Art A conventional semiconductor device does not have information for identifying the chip itself. If the identification information is not written on the chip, when the chip is mixed with another device, the chip cannot be distinguished from each other, and there is a possibility that the chip cannot be used. In order to prevent this, conventionally, information such as a type name is stamped on the back surface of the package, and the stamp is visually read by a person to judge the information. However, this method has a problem that automation cannot be performed, and the cost for stamping and identification is high. Further, there is another problem that dust generated at the time of stamping on the back surface of the package increases the defective rate of the product.
【0003】[0003]
【発明が解決しようとする課題】上述のごとく、従来の
半導体装置では、チップ自身にそれを識別するための情
報が記されていないため、他の装置のチップと混在した
場合などに区別が付かないという問題があった。これを
防ぐためにパッケージ裏面にタイプ名等の情報を捺印す
る方法が採られているが、識別が作業者の目視によって
行われなければならない等の問題があり、作業全体を自
動化することができないという欠点があった。また、捺
印時に発生するダストも問題となっていた。本発明は、
比較的簡単な方法でこの問題を解決して、チップ自身に
識別記号を記すことにより、機械的な識別を可能にし、
以後の工程の自動化を可能にした半導体装置およびその
製造方法の実現を課題とする。As described above, in a conventional semiconductor device, since information for identifying the chip itself is not described, a distinction is made when the chip is mixed with a chip of another device. There was a problem that there was no. In order to prevent this, a method of stamping information such as a type name on the back of the package has been adopted. However, there is a problem that the identification must be performed visually by an operator, and the entire work cannot be automated. There were drawbacks. Further, dust generated at the time of stamping has also been a problem. The present invention
Resolving this problem in a relatively simple way and marking the chip itself with an identification symbol allows for mechanical identification,
It is an object of the present invention to realize a semiconductor device and a method for manufacturing the same, which enable automation of subsequent steps.
【0004】[0004]
【課題を解決するための手段】上記課題を達成するた
め、本発明は、半導体装置において、半導体チップの所
定位置に識別コードを設け、この識別コードをパッケー
ジ外部から読取り可能な状態に前記半導体チップをパッ
ケージに封入したことを特徴とする。According to the present invention, there is provided a semiconductor device, comprising: an identification code provided at a predetermined position of a semiconductor chip; and the identification code being readable from outside the package. Is enclosed in a package.
【0005】また、半導体装置の製造方法において、半
導体チップの所定位置に識別コードを形成する識別コー
ド形成工程を有し、この識別コード形成工程で設けた識
別コードを読取って以後の工程に反映させることを特徴
とする。これらにより、チップ自身に識別記号を記して
機械的な識別を可能にすることができ、以後の工程の自
動化を可能にすることができる半導体装置とその製造方
法を実現することができる。In the method of manufacturing a semiconductor device, there is provided an identification code forming step of forming an identification code at a predetermined position on a semiconductor chip. The identification code provided in the identification code forming step is read and reflected in the subsequent steps. It is characterized by the following. Accordingly, it is possible to implement a semiconductor device and a method of manufacturing the same, which can be mechanically identified by writing an identification symbol on the chip itself, thereby enabling automation of subsequent steps.
【0006】[0006]
【発明の実施の形態】以下、本発明にかかる半導体装置
およびその製造方法を添付図面を参照にして詳細に説明
する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A semiconductor device according to the present invention and a method for manufacturing the same will be described below in detail with reference to the accompanying drawings.
【0007】図1に、本発明の半導体装置の一実施の形
態である固体撮像装置の外観図を示す。図1で、符号1
はチップ(撮像面にあたる)、符号2はパッケージ、符
号3はボンディングワイヤ、符号4は識別コードであ
る。本発明では、ウェーハ処理工程において、ステップ
式投影露光装置(以下ステッパと略す。)により、エッ
チングなどの処理パターンを半導体基板のレジストに露
光する際に、同時にチップ1の外周部に識別コード4を
記すようにする。そうして、以後のパッケージ組み立て
工程や検査工程においては、この識別コード4を認識す
ることでチップ1を識別し、以後の処理を自動化するこ
とができる。識別コード4としては、例えばバーコード
などを用いることができるが、必ずしもそれに限られる
ものではない。FIG. 1 is an external view of a solid-state imaging device according to an embodiment of the semiconductor device of the present invention. In FIG.
Denotes a chip (corresponding to an imaging surface), reference numeral 2 denotes a package, reference numeral 3 denotes a bonding wire, and reference numeral 4 denotes an identification code. In the present invention, in a wafer processing step, when a processing pattern such as etching is exposed on a resist of a semiconductor substrate by a step-type projection exposure apparatus (hereinafter abbreviated as a stepper), an identification code 4 is simultaneously placed on an outer peripheral portion of the chip 1. Write it down. Then, in the subsequent package assembling step and inspection step, the chip 1 is identified by recognizing the identification code 4, and the subsequent processing can be automated. As the identification code 4, for example, a bar code or the like can be used, but it is not necessarily limited thereto.
【0008】このように識別コード4をウェーハ処理工
程で露光処理によって記すことで、従来行われていた作
業者によるパッケージ裏面への捺印等の作業を無くすこ
とができると共に、より早いチップの段階から個々を識
別できるので、誤って他の装置のチップと混在した場合
などでも、人手によらずに容易にかつ高速に識別、分類
することができる。By writing the identification code 4 by exposure processing in the wafer processing step in this way, it is possible to eliminate the work of marking the back surface of the package, which has been conventionally performed by the operator, and to perform the operation from the earlier chip stage. Since the individual can be identified, it is possible to easily and quickly identify and classify even if a chip is mistakenly mixed with a chip of another device without manual operation.
【0009】次に、この識別コード4をステッパを用い
て埋め込むための方法について述べる。図2は、従来の
ステッパの概略構成図である。図2において、符号11
は光源、符号12はレチクル、符号13は集光レンズ、
符号14はウェーハ、符号15はステージである。レチ
クル12には半導体素子のパターンの数倍の拡大パター
ンが形成されており、光源11からの光をレチクル12
に投射し、そのパターンを集光レンズ13でウェーハ1
4上に投影して露光を行う。ステッパでは同一のレチク
ル12のパターンを繰り返しウェーハ14に露光させ
て、ウェーハ14に多数のチップパターンを形成する。
レチクル12の投影位置はウェーハ14を載置するステ
ージ15の移動によってウェーハ14上を移動させられ
て位置決めされ、また、ウェーハ14はステージ15に
よって上下にも移動させられ、これにより、露光焦点が
決められる。Next, a method for embedding the identification code 4 using a stepper will be described. FIG. 2 is a schematic configuration diagram of a conventional stepper. In FIG.
Is a light source, reference numeral 12 is a reticle, reference numeral 13 is a condenser lens,
Reference numeral 14 denotes a wafer, and reference numeral 15 denotes a stage. An enlarged pattern several times larger than the pattern of the semiconductor element is formed on the reticle 12, and the light from the light source 11 is
And the pattern is condensed by the condenser lens 13 to the wafer 1.
Exposure is carried out by projecting the light onto the surface 4. The stepper repeatedly exposes the same pattern of the reticle 12 to the wafer 14 to form a large number of chip patterns on the wafer 14.
The projection position of the reticle 12 is moved and positioned on the wafer 14 by the movement of the stage 15 on which the wafer 14 is mounted, and the wafer 14 is also moved up and down by the stage 15 so that the exposure focus is determined. Can be
【0010】図3に、本発明に用いられるステッパの概
略構成図を示す。図3において、符号11は光源、符号
12はレチクル、符号13は集光レンズ、符号14はウ
ェーハ、符号15はステージ、符号16は識別コード専
用レチクル、符号17は連結金具である。便利のため、
図3で図2と同一の機能のものには同一の符号を記し
た。本発明が、図2に示す従来の物と異なる点は、ステ
ージ15に連結金具17で連結された識別コード専用レ
チクル16を、集光レンズ13とウェーハ14の間に設
けた点である。FIG. 3 is a schematic structural view of a stepper used in the present invention. In FIG. 3, reference numeral 11 denotes a light source, reference numeral 12 denotes a reticle, reference numeral 13 denotes a condenser lens, reference numeral 14 denotes a wafer, reference numeral 15 denotes a stage, reference numeral 16 denotes a reticle dedicated to an identification code, and reference numeral 17 denotes a connection bracket. For convenience,
In FIG. 3, components having the same functions as those in FIG. 2 are denoted by the same reference numerals. The present invention differs from the conventional one shown in FIG. 2 in that an identification code dedicated reticle 16 connected to a stage 15 by a connection fitting 17 is provided between a condenser lens 13 and a wafer 14.
【0011】このステッパによる識別コード4のチップ
1への埋め込み動作を説明する。まず、光源11から投
射される光はレチクル12を通って集光レンズ13で集
光される。そうして、集光レンズ13で集光された光
は、識別コード専用レチクル16を通ってウェーハ14
へ照射され、ウェーハ14上のレジストが露光されてウ
ェーハ14上にパターンが形成される。識別コード専用
レチクル16には、各チップ1ごとに対応する識別コー
ドが記されている。したがって、ウェーハ14上には、
レチクル12のパターンと共に識別コード専用レチクル
16の識別コードパターンが同時に形成される。The operation of embedding the identification code 4 in the chip 1 by the stepper will be described. First, light projected from the light source 11 passes through the reticle 12 and is focused by the focusing lens 13. Then, the light condensed by the condensing lens 13 passes through the reticle 16 dedicated to the identification code, and
To expose the resist on the wafer 14 to form a pattern on the wafer 14. The identification code corresponding to each chip 1 is written on the identification code dedicated reticle 16. Therefore, on the wafer 14,
The identification code pattern of the identification code dedicated reticle 16 is formed simultaneously with the pattern of the reticle 12.
【0012】次のショットに移り、レチクル12のパタ
ーンをウェーハ14上の別の場所に形成するため、ステ
ージ15を移動させる。この時、識別コード専用レチク
ル16はステージ15と連結されているため、ステージ
15と同じ方向に移動し、レチクル12のパターンと同
時に次の識別コードパターンが形成される。これによ
り、各チップ1ごとに対応する識別コード4が記載さ
れ、この識別コードを読み取ることでチップに関する情
報が判読できるので、固体撮像装置のようにパッケージ
2が透明でパッケージ2の外部からチップ1表面の識別
コード4を読み取ることが可能な場合は、この情報をも
とに、チップダイシング以降の作業、ダイボンディン
グ、ワイヤボンディング、パッケージング、マーキン
グ、検査工程等を自動化することができる。Moving to the next shot, the stage 15 is moved to form a pattern on the reticle 12 at another location on the wafer 14. At this time, since the identification code dedicated reticle 16 is connected to the stage 15, it moves in the same direction as the stage 15, and the next identification code pattern is formed simultaneously with the pattern of the reticle 12. As a result, the identification code 4 corresponding to each chip 1 is described, and information on the chip can be read by reading the identification code. Therefore, the package 2 is transparent and the chip 1 can be read from outside the package 2 like a solid-state imaging device. If the identification code 4 on the front surface can be read, operations after chip dicing, die bonding, wire bonding, packaging, marking, inspection processes, and the like can be automated based on this information.
【0013】以上の説明は、固体撮像装置について行っ
たが、固体撮像装置以外の半導体装置においても、半導
体チップに識別コードを記し、この半導体チップをこの
識別コードが外部から読取り可能な状態にパッケージに
封入した半導体装置においては、同様に処理の自動化が
可能になる。Although the above description has been made with respect to the solid-state imaging device, in semiconductor devices other than the solid-state imaging device, an identification code is written on the semiconductor chip, and the semiconductor chip is packaged so that the identification code can be read from the outside. In the semiconductor device encapsulated in the above, the processing can be automated similarly.
【0014】[0014]
【発明の効果】以上説明したように本発明の請求項1の
発明は、半導体チップの所定位置に識別コードを設け、
この識別コードが外部から読取り可能な状態に半導体チ
ップをパッケージに封入して半導体装置を構成する。こ
れにより、チップ情報を機械的に認識してチップおよび
このチップを実装した半導体装置を識別することができ
る。したがって、以後の工程を自動化をすることもでき
る。As described above, according to the first aspect of the present invention, an identification code is provided at a predetermined position on a semiconductor chip.
A semiconductor device is constructed by enclosing a semiconductor chip in a package so that the identification code can be read from the outside. Thus, the chip information and the semiconductor device on which the chip is mounted can be identified by mechanically recognizing the chip information. Therefore, subsequent steps can be automated.
【0015】本発明の請求項2の発明は、識別コードと
してバーコードを用いる。これにより、既成の識別方
法、識別ソフトウェアを利用することができ、識別を容
易に廉価に行うことができる。According to a second aspect of the present invention, a bar code is used as the identification code. As a result, existing identification methods and identification software can be used, and identification can be performed easily and inexpensively.
【0016】本発明の請求項3の発明は、半導体装置の
製造方法において、半導体チップの所定位置に識別コー
ドを形成する識別コード形成工程を設けて、ここで設け
た識別コードを読取って以後の工程に反映させる。これ
により、チップ情報を機械的に認識してチップすなわち
半導体装置を識別することができ、以後の工程を自動化
をすることが可能な半導体装置の製造方法を実現するこ
とができる。According to a third aspect of the present invention, in a method of manufacturing a semiconductor device, an identification code forming step of forming an identification code at a predetermined position of a semiconductor chip is provided, and the identification code provided here is read and the subsequent steps are performed. Reflect it in the process. Thus, a chip, that is, a semiconductor device can be identified by mechanically recognizing chip information, and a semiconductor device manufacturing method capable of automating subsequent steps can be realized.
【0017】本発明の請求項4の発明は、識別コードと
してバーコードを用いる。これにより、既成の識別方
法、識別ソフトウェアを利用することができ、半導体装
置の識別を容易かつ廉価に行うことが可能な半導体装置
の製造方法を実現することができる。According to a fourth aspect of the present invention, a bar code is used as the identification code. As a result, the existing identification method and identification software can be used, and a semiconductor device manufacturing method that can easily and inexpensively identify a semiconductor device can be realized.
【図1】本発明の半導体装置の一実施の形態である固体
撮像装置の外観図。FIG. 1 is an external view of a solid-state imaging device which is an embodiment of a semiconductor device of the present invention.
【図2】従来のステップ式投影露光装置の概略構成図。FIG. 2 is a schematic configuration diagram of a conventional step-type projection exposure apparatus.
【図3】本発明のステップ式投影露光装置の概略構成
図。FIG. 3 is a schematic configuration diagram of a step-type projection exposure apparatus of the present invention.
1…チップ、2…パッケージ、3…ボンディングワイ
ヤ、4…識別コード、11…光源、12…レチクル、1
3…集光レンズ、14…ウェーハ、15…ステージ、1
6…識別コード専用レチクル、17…連結金具。DESCRIPTION OF SYMBOLS 1 ... Chip, 2 ... Package, 3 ... Bonding wire, 4 ... Identification code, 11 ... Light source, 12 ... Reticle, 1
3 ... Condenser lens, 14 ... Wafer, 15 ... Stage, 1
6: Reticle dedicated to identification code, 17: Connection bracket.
Claims (4)
設け、この識別コードをパッケージ外部から読取り可能
な状態に前記半導体チップをパッケージに封入したこと
を特徴とする半導体装置。1. A semiconductor device wherein an identification code is provided at a predetermined position on a semiconductor chip, and the semiconductor chip is sealed in a package so that the identification code can be read from outside the package.
を特徴とする請求項1に記載の半導体装置。2. The semiconductor device according to claim 1, wherein the identification code is a bar code.
形成する識別コード形成工程を有し、 この識別コード形成工程で設けた識別コードを読取って
以後の工程に反映させることを特徴とする半導体装置の
製造方法。3. A semiconductor device having an identification code forming step of forming an identification code at a predetermined position on a semiconductor chip, wherein the identification code provided in the identification code forming step is read and reflected in subsequent steps. Manufacturing method.
を特徴とする請求項3に記載の半導体装置の製造方法。4. The method according to claim 3, wherein the identification code is a bar code.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000369633A JP4617567B2 (en) | 2000-12-05 | 2000-12-05 | Manufacturing method of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000369633A JP4617567B2 (en) | 2000-12-05 | 2000-12-05 | Manufacturing method of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2002175956A true JP2002175956A (en) | 2002-06-21 |
JP4617567B2 JP4617567B2 (en) | 2011-01-26 |
Family
ID=18839642
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000369633A Expired - Fee Related JP4617567B2 (en) | 2000-12-05 | 2000-12-05 | Manufacturing method of semiconductor device |
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Country | Link |
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JP (1) | JP4617567B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006351772A (en) * | 2005-06-15 | 2006-12-28 | Fujifilm Holdings Corp | Method for recording identification information of semiconductor chip and imaging apparatus |
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JPS62239519A (en) * | 1986-04-11 | 1987-10-20 | Nec Corp | Monosilic integrated circuit |
JPH01212429A (en) * | 1988-02-19 | 1989-08-25 | Nec Corp | Semiconductor element |
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JPH05315207A (en) * | 1992-05-08 | 1993-11-26 | Nec Corp | Semiconductor device |
JPH06196575A (en) * | 1992-12-24 | 1994-07-15 | Kawasaki Steel Corp | Information indicating method on the surface of semiconductor chip |
JPH1126333A (en) * | 1997-06-27 | 1999-01-29 | Oki Electric Ind Co Ltd | Semiconductor device and information control system thereof |
Cited By (1)
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JP2006351772A (en) * | 2005-06-15 | 2006-12-28 | Fujifilm Holdings Corp | Method for recording identification information of semiconductor chip and imaging apparatus |
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