JP2002151368A - Method for manufacturing and measuring capacitor - Google Patents
Method for manufacturing and measuring capacitorInfo
- Publication number
- JP2002151368A JP2002151368A JP2000344945A JP2000344945A JP2002151368A JP 2002151368 A JP2002151368 A JP 2002151368A JP 2000344945 A JP2000344945 A JP 2000344945A JP 2000344945 A JP2000344945 A JP 2000344945A JP 2002151368 A JP2002151368 A JP 2002151368A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- ceramic capacitor
- current
- heat
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
- G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Testing Relating To Insulation (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、コンデンサの製造
方法および測定方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing and measuring a capacitor.
【０００２】[0002]
【従来の技術】従来より、セラミックコンデンサの信頼
性を確保するために、高温絶縁抵抗選別やバーンイン
（エージング）が行われている。あるいは、耐電圧測定
後、分極した高誘電率材料のセラミックコンデンサの分
極を解放する（非分極状態にする）ために、熱処理いわ
ゆる熱戻し処理が行われている。2. Description of the Related Art Conventionally, in order to ensure the reliability of a ceramic capacitor, high-temperature insulation resistance selection and burn-in (aging) have been performed. Alternatively, after the withstand voltage measurement, a heat treatment, that is, a heat return treatment, is performed to release the polarization of the polarized ceramic capacitor made of a high dielectric constant material (to make it nonpolarized).
【０００３】例えば、特開平１１−９７２９９号公報に
記載されている従来のセラミックコンデンサのエージン
グ方法は、セラミックコンデンサの安定化対策として、
加熱下で電圧を印加するエージング処理を行う。従っ
て、セラミックコンデンサに電圧を印加する保持治具と
セラミックコンデンサを加熱するためのヒータ等を、断
熱材等で覆われた加熱炉内に設け、この加熱炉内の保持
治具にセラミックコンデンサをセットするとともに、ヒ
ータにてセラミックコンデンサを含めて加熱炉内全体を
加熱していた。For example, the conventional aging method of a ceramic capacitor described in Japanese Patent Application Laid-Open No. 11-97299 discloses a method for stabilizing a ceramic capacitor.
An aging process of applying a voltage under heating is performed. Accordingly, a holding jig for applying a voltage to the ceramic capacitor, a heater for heating the ceramic capacitor, and the like are provided in a heating furnace covered with a heat insulating material or the like, and the ceramic capacitor is set in the holding jig in the heating furnace. At the same time, the entire interior of the heating furnace including the ceramic capacitor was heated by the heater.
【０００４】[0004]
【発明が解決しようとする課題】従って、従来の高温絶
縁抵抗選別やバーンインは、セラミックコンデンサを加
熱するために、加熱炉を用いる必要があり、加熱や断熱
のために装置が大型化するという問題があった。Therefore, in the conventional high-temperature insulation resistance selection and burn-in, it is necessary to use a heating furnace to heat the ceramic capacitor, and the apparatus becomes large due to heating and heat insulation. was there.
【０００５】そこで、本発明の目的は、高温絶縁抵抗選
別装置やバーンイン装置等を小型化することができるコ
ンデンサの製造方法および測定方法を提供することにあ
る。SUMMARY OF THE INVENTION An object of the present invention is to provide a method of manufacturing and measuring a capacitor which can reduce the size of a high-temperature insulation resistance selection device and a burn-in device.
【０００６】[0006]
【課題を解決するための手段および作用】前記目的を達
成するため、本発明に係るコンデンサの製造方法は、コ
ンデンサに交流電流を印加し、該コンデンサを自己発熱
させてコンデンサを所定温度に加熱して熱処理すること
を特徴とする。In order to achieve the above object, a method of manufacturing a capacitor according to the present invention comprises applying an alternating current to a capacitor, causing the capacitor to self-heat and heating the capacitor to a predetermined temperature. And heat treatment.
【０００７】以上の方法により、例えば前記熱処理が、
セラミックコンデンサを非分極状態にするための熱処理
である場合には、コンデンサに交流電流を印加すると、
コンデンサは誘電損失や電極抵抗によって自己発熱す
る。この自己発熱を利用して、耐電圧測定時に分極した
セラミックコンデンサを非分極状態にする熱戻し処理が
行われる。つまり、セラミックコンデンサのみが加熱さ
れ、熱戻し処理装置が簡略化、小型化する。According to the above method, for example, the heat treatment
If the heat treatment is to put the ceramic capacitor into a non-polarized state, when an alternating current is applied to the capacitor,
Capacitors generate heat due to dielectric loss and electrode resistance. Utilizing this self-heating, a heat return process is performed to bring the polarized ceramic capacitor into a non-polarized state at the time of withstand voltage measurement. That is, only the ceramic capacitor is heated, and the heat return processing device is simplified and downsized.
【０００８】また、本発明に係るコンデンサの測定方法
は、コンデンサに交流電流を印加し、該コンデンサを自
己発熱させて所定温度にするとともに、コンデンサに直
流電流を印加しながら該直流電流の漏れ電流を測定して
コンデンサの絶縁抵抗値を求めることを特徴とする。あ
るいは、コンデンサに交流電流を印加し、該コンデンサ
を自己発熱させて所定温度にするとともに、コンデンサ
に直流電流を印加しながら一定時間放置した後、該直流
電流の漏れ電流を測定してコンデンサのバーンインスク
リーニングを行う。Further, the method for measuring a capacitor according to the present invention comprises applying an alternating current to the capacitor, causing the capacitor to self-heat to a predetermined temperature, and applying a direct current to the capacitor to reduce the leakage current of the direct current. Is measured to determine the insulation resistance value of the capacitor. Alternatively, an alternating current is applied to the capacitor to cause the capacitor to self-heat and reach a predetermined temperature, and the capacitor is left standing for a certain period of time while applying a direct current to the capacitor. Perform screening.
【０００９】コンデンサに交流電流を印加すると、コン
デンサは誘電損失や電極抵抗によって自己発熱する。こ
の自己発熱を利用して、コンデンサを所定の温度に上昇
させ、高温状態のコンデンサの漏れ電流を測定したり、
絶縁抵抗値を求めたりする。つまり、コンデンサのみが
加熱され、高温絶縁抵抗選別装置やバーンイン装置が簡
略化、小型化する。When an alternating current is applied to a capacitor, the capacitor generates heat due to dielectric loss and electrode resistance. Utilizing this self-heating, the capacitor is raised to a predetermined temperature, and the leakage current of the capacitor in a high temperature state is measured.
For example, to determine the insulation resistance value. That is, only the capacitor is heated, and the high-temperature insulation resistance selection device and the burn-in device are simplified and downsized.
【００１０】[0010]
【発明の実施の形態】以下、本発明に係るコンデンサの
製造方法および測定方法の実施の形態について添付の図
面を参照して説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of a method for manufacturing and measuring a capacitor according to the present invention will be described below with reference to the accompanying drawings.
【００１１】［第１実施形態、図１］第１実施形態は、
セラミックコンデンサの製造方法、特に、熱戻し処理方
法について説明する。[First Embodiment, FIG. 1] In the first embodiment,
A method for manufacturing a ceramic capacitor, in particular, a heat return treatment method will be described.
【００１２】熱戻し処理は、耐電圧測定後、セラミック
コンデンサを加熱してキュリー点以上にし、分極した高
誘電率材料のセラミックコンデンサの分極を解放する
（非分極状態にする）処理である。コンデンサの耐電圧
測定時に印加される高電圧（直流電圧）によって、高誘
電率のセラミック材料が分極してしまうからである。The heat return process is a process of heating the ceramic capacitor to a temperature higher than the Curie point after the withstand voltage measurement and releasing the polarization of the ceramic capacitor made of a polarized high dielectric constant material (unpolarized state). This is because a high voltage (DC voltage) applied at the time of measuring the withstand voltage of the capacitor polarizes the ceramic material having a high dielectric constant.
【００１３】図１は、熱戻し処理のための電気回路を示
す。熱戻し処理されるセラミックコンデンサＣは、保持
端子２，３にて挟着される。これら保持端子２，３は、
交流電源１に電気的に接続されている。本第１実施形態
の場合、交流電源１にて、周波数が１００ＫＨｚの高周
波電流をセラミックコンデンサＣに印加する。これによ
り、セラミックコンデンサＣを誘電損失によって自己発
熱させて、セラミックコンデンサＣを１５０℃程度に加
熱する。この後、高周波電流の印加を停止し、セラミッ
クコンデンサＣを自然冷却させる。これにより、耐電圧
測定時に分極したセラミックコンデンサＣを非分極状態
にする熱戻し処理が行われる。この結果、セラミックコ
ンデンサＣのみが加熱され、熱戻し処理装置を簡略化、
小型化することができる。FIG. 1 shows an electric circuit for a heat return process. The ceramic capacitor C subjected to the heat return treatment is sandwiched between the holding terminals 2 and 3. These holding terminals 2 and 3 are
It is electrically connected to an AC power supply 1. In the case of the first embodiment, the AC power supply 1 applies a high-frequency current having a frequency of 100 KHz to the ceramic capacitor C. As a result, the ceramic capacitor C self-heats due to dielectric loss, and the ceramic capacitor C is heated to about 150 ° C. Thereafter, the application of the high-frequency current is stopped, and the ceramic capacitor C is cooled naturally. As a result, a heat return process for bringing the polarized ceramic capacitor C into a non-polarized state at the time of withstand voltage measurement is performed. As a result, only the ceramic capacitor C is heated, and the heat return processing device is simplified,
The size can be reduced.
【００１４】［第２実施形態、図２］第２実施形態は、
セラミックコンデンサの高温絶縁抵抗の測定方法につい
て説明する。[Second Embodiment, FIG. 2]
A method for measuring a high-temperature insulation resistance of a ceramic capacitor will be described.
【００１５】高温絶縁抵抗測定は、コンデンサに温度と
電圧を印加し、将来的に絶縁抵抗不良品となる欠陥を内
在したコンデンサ製品の欠陥部分を、温度及び電圧加速
により早期に絶縁抵抗不良として顕在化させるために行
う測定である。In the high-temperature insulation resistance measurement, a temperature and a voltage are applied to a capacitor, and a defective part of a capacitor product having a defect that will become a defective insulation resistance in the future is manifested as an insulation resistance defect early due to temperature and voltage acceleration. This is a measurement performed to make
【００１６】図２は、セラミックコンデンサＣの高温絶
縁抵抗測定のための電気回路を示す。絶縁抵抗が測定さ
れるセラミックコンデンサＣは、保持端子２，３にて挟
着される。これら保持端子２，３は、交流電源１に電気
的に接続されている。直流カット用デカップリングコン
デンサＣｄは、交流電源１側に直流電圧が印加されない
ようにするためのものである。交流カット用インダクタ
４は、直流電源６側に交流電流が流れないようにするた
めのものである。直流電源６は、セラミックコンデンサ
Ｃに直流電圧（本第２実施形態の場合、６４Ｖ）を印加
するためのものである。さらに、漏れ電流検出用電流計
５は、セラミックコンデンサＣの絶縁抵抗の劣化を検出
するために、セラミックコンデンサＣに印加される直流
電源６の電流値を監視するためのものである。本第２実
施形態の場合、交流電源１にて、周波数が１００ＫＨｚ
で電流値が２Ａｒｍｓの高周波電流を、静電容量が０．
１μＦの積層型セラミックコンデンサＣに印加する。FIG. 2 shows an electric circuit for measuring the high-temperature insulation resistance of the ceramic capacitor C. The ceramic capacitor C whose insulation resistance is measured is sandwiched between the holding terminals 2 and 3. These holding terminals 2 and 3 are electrically connected to the AC power supply 1. The DC cut decoupling capacitor Cd is for preventing a DC voltage from being applied to the AC power supply 1 side. The AC cut inductor 4 is for preventing an AC current from flowing to the DC power supply 6 side. The DC power supply 6 is for applying a DC voltage (64 V in the case of the second embodiment) to the ceramic capacitor C. Further, the leakage current detection ammeter 5 monitors the current value of the DC power supply 6 applied to the ceramic capacitor C in order to detect the deterioration of the insulation resistance of the ceramic capacitor C. In the case of the second embodiment, the frequency is 100 KHz with the AC power supply 1.
, A high-frequency current having a current value of 2 Arms and a capacitance of 0.
The voltage is applied to the 1 μF multilayer ceramic capacitor C.
【００１７】これにより、セラミックコンデンサＣを誘
電損失によって自己発熱させて、セラミックコンデンサ
Ｃを８５〜１５０℃程度（本第２実施形態の場合は８５
℃）に加熱する。この状態で、電流計５にて直流電源６
の直流電流値、すなわち、セラミックコンデンサＣを流
れる漏れ電流値を測定する。この漏れ電流値と直流電源
６の直流電圧値（６４Ｖ）とからセラミックコンデンサ
Ｃの（８５℃における）絶縁抵抗値を算出して求めるこ
とができる。As a result, the ceramic capacitor C self-heats due to dielectric loss, and the temperature of the ceramic capacitor C is about 85 to 150 ° C. (85 in the second embodiment).
C). In this state, the DC power supply 6
, That is, a leakage current value flowing through the ceramic capacitor C is measured. From this leakage current value and the DC voltage value (64 V) of the DC power supply 6, the insulation resistance value (at 85 ° C.) of the ceramic capacitor C can be calculated and obtained.
【００１８】この結果、ヒータ等の外部の加熱装置や断
熱材を用いることなく、セラミックコンデンサＣを所定
の温度にすることができ、高温絶縁抵抗選別装置を簡略
化、小型化することができる。具体的には、装置の大き
さを従来の約２／３にすることができる。As a result, the ceramic capacitor C can be set to a predetermined temperature without using an external heating device such as a heater or a heat insulating material, and the high-temperature insulation resistance selection device can be simplified and downsized. Specifically, the size of the device can be reduced to about 2/3 of the conventional size.
【００１９】［第３実施形態］第３実施形態は、セラミ
ックコンデンサのバーンインスクリーニングについて説
明する。バーンインスクリーニングも、前記第２実施形
態の高温絶縁抵抗測定と同様に、コンデンサに温度と電
圧を印加し、将来的に絶縁抵抗不良品となる欠陥を内在
したコンデンサ製品の欠陥部分を、温度及び電圧加速に
より早期に絶縁抵抗不良として顕在化させるために行う
方法である。バーンインスクリーニングのための電気回
路は、前記第２実施形態の図２と同様の回路であるの
で、その詳細な説明は省略する。[Third Embodiment] In a third embodiment, burn-in screening of a ceramic capacitor will be described. In the burn-in screening, similarly to the high-temperature insulation resistance measurement of the second embodiment, a temperature and a voltage are applied to the capacitor, and the defective portion of the capacitor product having a defect which will be a defective insulation resistance in the future is determined by the temperature and voltage. This is a method that is performed in order to promptly manifest as insulation failure due to acceleration. The electric circuit for burn-in screening is the same circuit as that of FIG. 2 of the second embodiment, and a detailed description thereof will be omitted.
【００２０】交流電源１にて、周波数が１００ＫＨｚで
電流値が２Ａｒｍｓの高周波電流を、静電容量が０．１
μＦの積層型セラミックコンデンサＣに印加する。これ
により、セラミックコンデンサＣを誘電損失によって自
己発熱させて、８５〜１５０℃程度（本第３実施形態の
場合は８５℃）に加熱する。この状態で、直流電源６に
てセラミックコンデンサＣに直流電圧を印加し一定時間
放置した後、交流電源１からの高周波電流の印加と直流
電源６からの電圧印加を停止し、セラミックコンデンサ
Ｃを自然冷却させる。セラミックコンデンサＣの温度が
常温まで下がると、電流計５にて直流電源６の直流電
流、すなわちセラミックコンデンサＣを流れる漏れ電流
を測定する。In the AC power supply 1, a high-frequency current having a frequency of 100 KHz and a current value of 2 Arms is applied to a capacitor having a capacitance of 0.1
It is applied to the μF multilayer ceramic capacitor C. As a result, the ceramic capacitor C self-heats due to dielectric loss and is heated to about 85 to 150 ° C. (85 ° C. in the case of the third embodiment). In this state, after a DC voltage is applied to the ceramic capacitor C by the DC power supply 6 and left for a certain period of time, the application of the high-frequency current from the AC power supply 1 and the application of the voltage from the DC power supply 6 are stopped, and the ceramic capacitor C is removed naturally. Let cool. When the temperature of the ceramic capacitor C drops to room temperature, the ammeter 5 measures the DC current of the DC power supply 6, that is, the leakage current flowing through the ceramic capacitor C.
【００２１】この漏れ電流と直流電源６の直流電圧値と
からセラミックコンデンサＣの絶縁抵抗値を求め、バー
ンインスクリーニング前の絶縁抵抗値と比較し、セラミ
ックコンデンサＣの絶縁抵抗の劣化の程度を検出して良
品を選別する。なお、漏れ電流の測定は、セラミックコ
ンデンサＣを高温状態にしたままで行ってもよい。こう
して、ヒータ等の外部の加熱装置や断熱材を用いること
なく、セラミックコンデンサＣを所定の温度にすること
ができ、バーンインスクリーニング装置を簡略化、小型
化することができる。The insulation resistance value of the ceramic capacitor C is determined from the leakage current and the DC voltage value of the DC power supply 6 and compared with the insulation resistance value before burn-in screening to detect the degree of deterioration of the insulation resistance of the ceramic capacitor C. To select good products. The measurement of the leakage current may be performed with the ceramic capacitor C kept in a high temperature state. Thus, the ceramic capacitor C can be set to a predetermined temperature without using an external heating device such as a heater or a heat insulating material, and the burn-in screening device can be simplified and downsized.
【００２２】［他の実施形態］なお、本発明に係るコン
デンサの製造方法および測定方法は、前記実施形態に限
定するものではなく、その要旨の範囲内で種々に変更す
ることができる。特に、コンデンサを自己発熱させる目
的で同様な交流電源を持つ種々の電気回路を選択するこ
とができる。[Other Embodiments] The method of manufacturing and measuring a capacitor according to the present invention is not limited to the above embodiment, but can be variously modified within the scope of the gist. In particular, various electric circuits having a similar AC power supply can be selected for the purpose of causing the capacitor to generate heat.
【００２３】[0023]
【発明の効果】以上の説明からも明らかなように、本発
明によれば、コンデンサに交流電流を印加したときの自
己発熱を利用し、コンデンサを所定温度にするようにし
たので、熱戻し処理装置や高温絶縁抵抗選別装置やバー
ンイン装置などを簡略化、小型化することができる。As is clear from the above description, according to the present invention, the capacitor is brought to a predetermined temperature by utilizing self-heating when an alternating current is applied to the capacitor, so that the heat return process is performed. The apparatus, high-temperature insulation resistance sorting apparatus, burn-in apparatus, and the like can be simplified and downsized.
【図１】本発明に係るコンデンサの製造方法の一実施形
態を示す電気回路図。FIG. 1 is an electric circuit diagram showing one embodiment of a method for manufacturing a capacitor according to the present invention.
【図２】本発明に係るコンデンサの測定方法の一実施形
態を示す電気回路図。FIG. 2 is an electric circuit diagram showing an embodiment of a method for measuring a capacitor according to the present invention.
１…交流電源 ２，３…保持端子 ４…交流カット用インダクタ ５…電流計 ６…直流電源 Ｃ…セラミックコンデンサ Ｃｄ…直流カット用デカップリングコンデンサ DESCRIPTION OF SYMBOLS 1 ... AC power supply 2,3 ... Holding terminal 4 ... AC cut inductor 5 ... Ammeter 6 ... DC power supply C ... Ceramic capacitor Cd ... DC cut decoupling capacitor
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 ＦＩ テーマコート゛(参考） Ｈ０１Ｇ 4/12 ３６４ Ｈ０１Ｇ 4/12 ３６４ (72)発明者 米田 康信 京都府長岡京市天神二丁目26番10号 株式 会社村田製作所内 Ｆターム(参考） 2G015 AA17 CA04 2G028 AA01 BB06 CG03 DH03 DH05 FK00 JP03 2G036 AA03 AA21 BB02 5E001 AB03 AH08 AJ02 AZ00 5E082 AB03 BC40 FG26 MM09 MM35 MM37 ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01G 4/12 364 H01G 4/12 364 (72) Inventor Yasunobu Yoneda 2-26-10 Tenjin, Nagaokakyo-shi, Kyoto No. F-term in Murata Manufacturing Co., Ltd. (reference) 2G015 AA17 CA04 2G028 AA01 BB06 CG03 DH03 DH05 FK00 JP03 2G036 AA03 AA21 BB02 5E001 AB03 AH08 AJ02 AZ00 5E082 AB03 BC40 FG26 MM09 MM35 MM37
Claims (4)
デンサを自己発熱させてコンデンサを所定温度に加熱し
て熱処理することを特徴とするコンデンサの製造方法。1. A method for manufacturing a capacitor, comprising applying an alternating current to a capacitor, causing the capacitor to self-heat, heating the capacitor to a predetermined temperature, and performing a heat treatment.
サを非分極状態にするための熱処理であることを特徴と
する請求項１記載のコンデンサの製造方法。2. The method according to claim 1, wherein the heat treatment is a heat treatment for bringing the ceramic capacitor into a non-polarized state.
デンサを自己発熱させて所定温度にするとともに、コン
デンサに直流電流を印加しながら該直流電流の漏れ電流
を測定してコンデンサの絶縁抵抗値を求めることを特徴
とするコンデンサの測定方法。3. Applying an alternating current to the capacitor, causing the capacitor to self-heat to a predetermined temperature, and measuring a leakage current of the direct current while applying a direct current to the capacitor to determine an insulation resistance value of the capacitor. A method for measuring a capacitor, which is characterized by:
デンサを自己発熱させて所定温度にするとともに、コン
デンサに直流電流を印加しながら一定時間放置した後、
該直流電流の漏れ電流を測定してコンデンサのバーンイ
ンスクリーニングを行うことを特徴とするコンデンサの
測定方法。4. Applying an alternating current to the capacitor, causing the capacitor to self-heat to a predetermined temperature, and leaving the capacitor for a certain period of time while applying a direct current to the capacitor.
A method for measuring a capacitor, comprising measuring a leakage current of the DC current and performing a burn-in screening of the capacitor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000344945A JP3791326B2 (en) | 2000-11-13 | 2000-11-13 | Capacitor measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000344945A JP3791326B2 (en) | 2000-11-13 | 2000-11-13 | Capacitor measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002151368A true JP2002151368A (en) | 2002-05-24 |
| JP3791326B2 JP3791326B2 (en) | 2006-06-28 |
Family
ID=18819065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000344945A Expired - Lifetime JP3791326B2 (en) | 2000-11-13 | 2000-11-13 | Capacitor measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3791326B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008198793A (en) * | 2007-02-13 | 2008-08-28 | Tdk Corp | Method for manufacturing electronic component |
| CN108802496A (en) * | 2018-06-11 | 2018-11-13 | 泰州隆基乐叶光伏科技有限公司 | A kind of test method of photovoltaic module glued membrane volume resistivity |
-
2000
- 2000-11-13 JP JP2000344945A patent/JP3791326B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008198793A (en) * | 2007-02-13 | 2008-08-28 | Tdk Corp | Method for manufacturing electronic component |
| CN108802496A (en) * | 2018-06-11 | 2018-11-13 | 泰州隆基乐叶光伏科技有限公司 | A kind of test method of photovoltaic module glued membrane volume resistivity |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3791326B2 (en) | 2006-06-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3603640B2 (en) | Screening method of multilayer ceramic capacitor | |
| JP2002151368A (en) | Method for manufacturing and measuring capacitor | |
| JP4082314B2 (en) | Electronic component test method and test apparatus | |
| JP5926940B2 (en) | Insulation inspection equipment | |
| JPH08227826A (en) | Method for screening laminated ceramic capacitor | |
| WO2002039128A1 (en) | Method and apparatus of nondestructive insulation test for small electric machine | |
| JP5522012B2 (en) | Capacitance element characteristic measuring method and characteristic measuring apparatus | |
| JP3760373B2 (en) | Screening method for ceramic electronic components | |
| JP2004191282A (en) | Defect inspecting method and defect inspection device | |
| JP2000164471A (en) | Selecting method of laminated ceramic capacitor | |
| KR101670097B1 (en) | System and method for testing an electrostatic chuck | |
| JP2852992B2 (en) | Inspection method of overheat protection function of semiconductor device | |
| JP7416439B2 (en) | Electronic component testing equipment | |
| JP2002055140A (en) | Method for detecting soldering failure in ic terminal by tuning type sensor coil | |
| JP3246154B2 (en) | Aging inspection equipment for capacitors | |
| JP4244791B2 (en) | Capacitor pass / fail judgment method and pass / fail judgment device | |
| JP2011091162A (en) | Inspection method and inspection system for circuit board | |
| JPH0837125A (en) | Method for screening monolithic ceramic capacitor | |
| JP2004281709A (en) | Method for inspection and for packing of stacked capacitor | |
| JPH07230939A (en) | Burn-in treatment method for capacitor | |
| JP2023125764A (en) | Electronic component testing device | |
| JP2001284197A (en) | Screening method of laminated ceramic electronic component | |
| JP2008298524A (en) | Circuit testing device and its operation method | |
| JPH09152455A (en) | Internal defect detector and method thereof for laminated ceramic capacitor | |
| CN117870912A (en) | Method and device for measuring maximum current of PTC thermosensitive element |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20051003 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20051018 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20051213 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20060314 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20060327 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 3791326 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090414 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100414 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110414 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110414 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120414 Year of fee payment: 6 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130414 Year of fee payment: 7 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140414 Year of fee payment: 8 |
|
| EXPY | Cancellation because of completion of term |