JP3246154B2 - Aging inspection equipment for capacitors - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a capacitor aging inspection apparatus used for inspecting leakage current of a capacitor.

[0002]

2. Description of the Related Art In recent years, the market for capacitors has been expanding by taking advantage of the characteristics thereof due to the expansion of the electronic equipment market and the enhancement of performance and miniaturization. Continuing, the demand for high performance and high reliability for capacitors has been increasing year by year.

A conventional capacitor aging inspection apparatus will be described below. FIG. 8 is a perspective view showing an outline of a conventional capacitor aging inspection apparatus, in which a pallet 84 is transferred by a transfer unit 82 to a pallet 84 by a transfer unit 81 which supplies and takes out the capacitor 83.
The pallet 84 is transferred to the drum 87 by the pallet transfer unit 86. The drum 87 rotates inside the heating furnace 88 together with the pallet 84, and at this time, the condenser 83 is heated to a predetermined temperature and aged by applying a voltage. The aging-completed capacitor 83 is transferred together with the pallet 84 to the pallet transfer unit 85 by the pallet transfer unit 86, and then a leakage current test (hereinafter, referred to as LC) of the capacitor 83 is performed by the LC inspection unit 89 provided on the pallet transfer unit 85. Inspection). The capacitor 83 that has been subjected to the LC inspection is transferred by the transfer unit 82 to the transfer unit 81 and transferred.

FIG. 9 is a circuit diagram showing the structure of an LC inspection section 89 of the capacitor aging inspection apparatus. FIG. 9A is a circuit diagram at the time of aging of the capacitor, and FIG. 9B is a circuit diagram at the time of LC inspection. In the aging, a power supply contact 91 provided on a pallet 84 for each capacitor 83 is connected to a power supply 94. To the feeding rail 98
This is performed by applying an applied voltage to the capacitor 83. Note that resistors 92 and 93 are attached to each circuit of the pallet 84 so that even if the capacitor 83 is short-circuited, the aging of the other capacitors 83 is not affected.

At the time of the LC inspection, the connection between the power supply contact 91 and the power supply rail 98 is disconnected to stop applying the voltage to the capacitor 83, and the + power supply contact 97 and the LC inspection contact 96 connected to the LC inspection circuit 95 are connected to the capacitor. The connection was made by connecting the anode 83 and the cathode 83, respectively.

[0006]

However, in the conventional capacitor aging inspection apparatus, when the LC inspection is performed, the connection between the power supply contact 91 and the power supply rail 98 is disconnected to apply a voltage to the capacitor 83 for aging. It is difficult to arrange the LC inspection unit 89 on the outer periphery of the drum 87 because it is necessary to stop the operation.
When the inspection unit 89 is arranged at a place other than the outer peripheral portion of the drum 87, a pallet transport unit 85 is newly required, which causes a problem that the apparatus becomes large and the cost increases.

Further, since voltage is applied to each capacitor 83 via a power supply contact, tens of thousands of power supply contacts 91 are required in the entire apparatus, maintenance is difficult, and aging and deterioration due to failure of the power supply contact 91 occur. There were also problems such as a decrease in the reliability of the LC inspection and an increase in the product defect rate.

The present invention solves the above-mentioned conventional problems, and reduces the cost of an aging inspection device for a capacitor.
It is an object of the present invention to provide an aging inspection apparatus for a capacitor that can be downsized, facilitates maintenance of a power supply contact, and achieves aging, improved reliability of LC inspection, and reduction of a product defect rate.

[0009]

SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, an aging inspection apparatus for a capacitor according to the present invention comprises a pallet having a plurality of capacitors and an electrode for applying a voltage for aging the held capacitors. A drum that is intermittently rotated, and a heating furnace that is arranged on the outer periphery of the drum and that holds the condenser held on the pallet at a predetermined temperature, and that is adjacent to the end of the heating furnace. And an LC inspection / cooling unit arranged on the outer periphery of the drum and inspecting a leakage current of the capacitor held on the pallet, a power supply unit for applying a voltage to an electrode provided on the pallet, and a plurality of capacitors at regular intervals. And a condenser that intermittently conveys a predetermined amount by a belt and that conveys the predetermined amount intermittently by this conveyor to the drum. Or transferred to a pallet,
Alternatively, it is configured to include a transfer unit that transfers the capacitor, which has been inspected by the LC inspection / cooling unit, to the transport unit.

[0010]

With the above arrangement, the pallet transport section can be eliminated by arranging the LC inspection / cooling section on the outer periphery of the drum, so that the cost and size of the apparatus can be reduced.

In addition, since one end of the pallet is connected to the power supply portion with several power supply contacts, and a voltage is simultaneously applied to a plurality of capacitors for aging, maintenance of the power supply contacts is facilitated, and failure of the power supply contacts is caused. aging,
It is possible to suppress a decrease in the reliability of the LC inspection and an increase in the defect rate.

[0012]

An embodiment of the present invention will be described below with reference to the accompanying drawings.

FIG. 1 shows an outline of an aging inspection apparatus for a capacitor according to the embodiment. In FIG. 1, reference numeral 16 denotes a structure for holding a plurality of capacitors 17 at regular intervals and for intermittently conveying a predetermined number of capacitors. A transporting unit comprising a belt, 15 is an intermittently rotating drum, 12 is a heating furnace provided on the periphery of the drum 15, and 11 is also provided on the periphery of the drum 15 and adjacent to the end of the heating furnace 12. A plurality of LC inspection / cooling units 13 are connected at equal intervals to the outer periphery of the drum 15 so that the inside of the heating furnace 12 and the LC
A pallet 14 that intermittently moves in the inspection / cooling unit 11 is a transfer unit that transfers the condenser 17 intermittently conveyed by the conveying unit 16 to the pallet 13 or performs the reverse operation.

The components of the aging inspection apparatus for a capacitor according to the present invention thus configured will be described in detail below in the order of operation.

First, the transfer unit 14 transfers the plurality of capacitors 17 to which the predetermined amount has been intermittently transferred by the transfer unit 16, and transfers the plurality of capacitors 17 to the pallet 13 as the predetermined amount for one time.

FIG. 2 is a perspective view showing the structure of the transfer unit 14, and a chuck 20 for holding the condenser 17 is provided.
a and 20b are pivotally mounted on one end of a support frame 22 and provided with a swinging holding plate 21 having a plurality of (only the both ends are shown in the drawing, and the center is omitted). The chucks 20a and 20b are opened to simultaneously hold a predetermined number of capacitors 17, and the holding plate 21 is swung to simultaneously transfer the predetermined number of capacitors 17 to the pallet 13 waiting at the lower end.

FIG. 3 is a perspective view showing the structure of the heating furnace 12. The heating furnace 12 is a drum 15 shown in FIG.
Of the heating furnace 1 by a hot air generator 31
A hot air is supplied into the heating furnace 2 so as to keep the inside of the heating furnace 12 at a predetermined temperature.

By passing the condenser 17 held on the pallet 13 through the inside of the heating furnace 12 configured as described above, the condenser 17 is heated to a little over 100 ° C., and at the same time, the voltage applied from the power supply unit described later is reduced. Aging is performed.

FIG. 4 shows the configuration of the power supply unit.
In FIG. 4, 41 is a power supply rail, 42 is a set of power supply contacts attached to one end of the pallet 13, and 43 is a power supply.

The pallet 13 that holds the plurality of capacitors 17 in the transfer unit 14 and rotates intermittently with the drum 15 is in contact with the power supply rail 41 to which the power supply 43 is connected and the power supply contact 42 at all times. And applies a voltage simultaneously to the plurality of capacitors 17 held on the pallet 13 at the same time.

FIG. 5 shows the configuration of the LC inspection / cooling unit 11. In FIG. 5, reference numeral 13 denotes a pallet holding a plurality of capacitors 17 (only some of which are shown in the drawing and others are omitted). , 17a is a cathode terminal of the capacitor 17,
41 is a power supply rail; 56 is a cooling fan incorporated in the LC inspection / cooling unit 11; 51 is an LC inspection contact for inspecting leakage current by pressing against the cathode terminal 17a of the capacitor 17;
52 is a positive power contact, 53 is a positive power terminal, 5
4 is a negative power contact, 55 is a negative power terminal,
Reference numeral 57 denotes a contact mounting plate on which the LC inspection contact 51, the positive power supply contact 52, and the negative power supply contact 54 are mounted.

The LC inspection / cooling unit 1 configured as described above
In No. 1, the capacitor 17 that has been aged by heating and voltage application in the heating furnace 12 is cooled to room temperature by a cooling fan 56, and at the same time, an LC inspection for inspecting the leakage current of the capacitor 17 is performed. Will be described with reference to FIG.

In FIG. 6, first, the positive pole 6 of the power source 43
1 to the positive electrode 6
3 is pressed against the plus side power supply terminal 53. Similarly, the negative power supply contact 54 connected to the negative pole 62 of the power supply 43 is pressed against the negative power supply terminal 55 connected to the negative electrode 64. Here, the LC value can be measured by pressing the LC inspection contact 51 against the cathode terminal 17a of the capacitor 17 shown in FIG.
In this case, the contact between the power supply contact 42 and the power supply rail 41 for aging is maintained.

FIG. 7 is a schematic circuit diagram of the capacitor aging inspection apparatus according to the present invention when performing the LC inspection as described above. As is clear from FIG. 7, during the LC inspection,
The reason why the plus power supply contact 52 and the minus power supply contact 54 connected to the power supply 43 are newly connected to the capacitor 17 is that there is a contact resistance between the power supply rail 41 and the power supply contact 42 and the LC inspection accuracy is improved. In order to make it worse, to eliminate its influence. Further, 71 and 66 are resistors provided so that even if the capacitor 17 is short-circuited, aging of other capacitors 17 is not affected.

The capacitor 17, which has been subjected to the LC inspection in this manner, is transferred from the pallet 13 to the transfer unit 16 by the transfer unit 14 and transferred, and the operation is completed. In the same figure, reference numeral 72 denotes an LC inspection circuit.

[0026]

As described above, according to the capacitor aging inspection apparatus of the present invention, the LC inspection section can be arranged on the outer peripheral portion of the drum, so that the pallet transport section can be eliminated. The cost of the equipment is reduced to about 2 /
Not only can it be reduced to three, but the size can be reduced to about half that of the prior art.

Further, since several power supply contacts are provided at one end of the pallet and connected to the power supply unit to apply a voltage to a plurality of capacitors for aging, maintenance of the power supply contacts is facilitated, and power supply contact failure is caused. Aging, L
Many effects can be obtained, such as a decrease in the reliability of the C inspection and an increase in the defective rate.

[Brief description of the drawings]

FIG. 1 is a perspective view showing an outline of an aging inspection apparatus for a capacitor according to an embodiment of the present invention.

FIG. 2 is a perspective view showing the configuration of the transfer unit.

FIG. 3 is a perspective view showing a configuration of the heating furnace.

FIG. 4 is a perspective view showing the configuration of the power supply unit.

FIG. 5 is a partially cutaway perspective view showing the configuration of the LC inspection / cooling unit.

FIG. 6 is a perspective view showing the LC inspection unit.

FIG. 7 is a circuit diagram showing an inspection circuit configuration of the LC inspection unit.

FIG. 8 is a perspective view showing an outline of a conventional capacitor aging inspection apparatus.

9A is a circuit diagram showing a circuit configuration at the time of aging of a conventional capacitor aging inspection apparatus. FIG. 9B is a circuit diagram showing a circuit configuration at the time of the LC inspection.

[Explanation of symbols]

 Reference Signs List 11 LC inspection / cooling unit 12 Heating furnace 13 Pallet 14 Transfer unit 15 Drum 16 Conveying unit 17 Capacitor 17a Cathode terminal of capacitor 20a, 20b Chuck 21 Holding plate 22 Support frame 31 Hot air generator 41 Power supply rail 42 Power supply contact 43 Power supply 51 LC inspection contact 52 Positive power supply contact 53 Positive power supply terminal 54 Minus power supply contact 55 Minus power supply terminal 56 Cooling fan 61 Power supply positive pole 62 Power supply negative pole 63 Positive side electrode 64 Minus side electrode 65 Capacitor anode terminal 66 Resistance 71 Resistance 72 LC inspection circuit

──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Etsushi Kuraya 1006 Kazuma Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (56) References JP-A-63-153812 (JP, A) JP-A-55- 146060 (JP, A) JP-A-63-88816 (JP, A) (58) Fields investigated (Int. Cl. ⁷ , DB name) H01G 13/00-13/06

Claims (2)

(57) [Claims] 1. An intermittently rotating drum having a plurality of pallets provided with electrodes for applying a voltage for holding a plurality of capacitors and aging the held capacitors at equal intervals on an outer periphery, and an outer peripheral portion of the drum. And a heating furnace for heating the condenser held on the pallet to a predetermined temperature and inspecting a leakage current of the condenser held on the pallet adjacent to the end of the heating furnace and arranged on the outer periphery of the drum. An LC inspection / cooling unit, a power supply unit for applying a voltage to the electrodes provided on the pallet, a conveying unit using a belt for holding a plurality of capacitors at regular intervals and intermittently conveying a predetermined quantity, and Transfer capacitors intermittently conveyed by a predetermined number to pallets connected to the drum, or replace capacitors that have been inspected by the LC inspection / cooling unit. An aging inspection device for capacitors consisting of a transfer unit that transfers to a transport unit. 2. A circuit in which a power supply unit constantly applies a voltage for aging a plurality of capacitors held on a pallet, and is connected to the capacitor only when a leakage current of the capacitor is inspected by an LC inspection / cooling unit. 2. The aging inspection device for a capacitor according to claim 1, further comprising a circuit for applying a voltage.