JP2000241495A - Automatic aging inspection device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To improve productivity, save labor, reduce an energy loss, reduce a facility cost, and shorten a defective analysis time in an aging inspection. SOLUTION: A temperature stress applying means 2 capable of applying continuously a temperature stress on the greater number of test objects A than the number to be inspected on a main inspection line B, separately from the main inspection line B. The main inspection line B is equipped with an aging means 4, an electric characteristic inspection means 5, quality determination means 6, and plural conveyance means 3 for conveying the test objects A between each means. The temperature stress applying means 2 having a long production lead time is processed in a batch processing as a head process prior to the main inspection line B, and the aging means 4 and the electric characteristic inspection means 5 having short production lead times are processed automatically and continuously in the main inspection line B. Hereby, the stock in hand in the process is concentrated on one spot, and the conveyance work by manpower is decreased to one time, namely, the work from the temperature stress applying means 2 to the main inspection line B, to thereby improve a work efficiency and realize labor-saving.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic aging inspection apparatus for performing an aging inspection involving heating in a process of manufacturing an inspection object.

[0002]

2. Description of the Related Art Conventionally, as shown in FIG. 12, this type of apparatus performs an aging inspection involving heating for a long time in the final process of a production line by manual transportation (inspection object for automobile). Standards for Aging and Screening of Electronic Components Japan Auto Parts Industries Association Japan
IA EL001). That is, the preheating / drying means 1
1. The object to be inspected is placed and transported on transporting means 10, 12, and 14 corresponding to the aging means 13 and the characteristic inspecting means 15, respectively, and after being processed by each means, a non-defective product is packed and shipped. At this time, each of the preheating / drying means 11, the aging means 13, and the characteristic inspection means 15 has a long production lead time and is individually batch-produced. After the preliminary heating / drying means 11, a processing step including filling and curing is performed, and thereafter, an aging inspection is performed.

[0003]

However, the above prior art has the following problems.

As shown in FIG. 12, since there are a plurality of means having a long production lead time in a process, the in-process stock in the process increases. In addition, since the inspection object is manually transferred many times to transport means having different functions in different work places, human work efficiency is low, and many workers are required.

[0005] In batch production, the temperature of the entire apparatus is raised and lowered, which causes a large energy loss and a longer production lead time.

[0006] Since defective inspection products are manually extracted, there is a possibility that defective products may be mixed with non-defective products due to an operation error.

To intermittently energize a large number of test objects,
In order to prevent the voltage drop of the power supply due to the input rush current of the DUT (several tens of times the rated current), it is necessary to prepare a power supply with a larger capacity than the rated power, which increases equipment costs. I have.

[0008] Even if a defect is found by the inspection device, the processing of all the processes is completed, so that it is necessary to disassemble the inspection object to analyze the cause of the defect, it takes an analysis time, and the amount of the loss of the defect also increases. growing.

SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to improve productivity, save manpower, reduce energy loss, reduce equipment costs, and reduce failure analysis time in aging inspection by continuous automatic production. It is an object of the present invention to provide an automatic aging inspection device capable of performing the above-mentioned.

[0010]

In order to solve the above-mentioned problems, an automatic aging inspection apparatus according to the first aspect of the present invention separates a main inspection line for performing an aging inspection on an inspection object from a main inspection line. It is characterized in that a temperature stress applying means capable of continuously applying a temperature stress to a larger number of objects to be inspected than the number of inspected lines is provided.

As described above, the temperature at which the temperature stress can be continuously applied to a larger number of test objects than the number of test objects on the main test line is separated from the main test line for performing the aging test on the test object. Since the stress applying means is provided, the in-process stock in the process is concentrated at one place, and the manual transfer operation is performed by the temperature stress applying means from the temperature stress applying means to the main inspection line.
Since it takes only a few turns, the work efficiency is increased and manpower can be saved.

Further, the equipment can be made compact while the aging inspection line is in-line, and energy can be saved because the entire equipment is not heated or cooled.

According to a second aspect of the present invention, in the automatic aging inspection apparatus according to the first aspect, the main inspection line includes an aging unit, an electrical characteristic inspection unit, a pass / fail determination unit, and a plurality of units for transporting the inspection object between these units. Transport means,
The temperature stress applying means having a long production lead time is subjected to batch processing in the first step before the main inspection line, and the aging means and the electrical characteristic inspection means having a short production lead time are automatically and continuously processed in the main inspection line.

Conventionally, the means (drying means, preheating means, aging means, electric property inspection means) having a long production lead time and individual batch production are replaced by a temperature stress applying means having a long production lead time and a production lead time. Is divided into short aging means and electrical characteristic inspection means so that the stress on the object to be inspected is equal, and the temperature stress applying means is separated from the main inspection line and batch-produced. Is automatically and continuously produced on the main inspection line, and the temperature of a small number of inspection objects is raised and lowered compared to the temperature stress applying means, so that energy loss and production lead time can be reduced.

Further, if a conventional batch apparatus is used in the process, the in-process stock of the process increases, the production flow is interrupted, and the production lead time becomes longer. On the other hand, in the above configuration, the long-time temperature stress applying means in the first step is a batch, and the in-process stock can be obtained. However, in the subsequent steps, continuous automatic production is possible, and the production lead time can be reduced. In-process inventory can be significantly reduced, and significant labor savings can be achieved.

According to a third aspect of the present invention, in the automatic aging inspection apparatus according to the second aspect, the transfer means includes a moving electrode for loading the object to be inspected and electrically connecting to the object to be inspected. A rotation preventing guide is provided on both sides of the moving rail so as to be movable on the moving rail and to prevent rotation of the moving electrode about a moving axis along the moving rail as a center of rotation.

In the conventional transporting means, the movable electrode that is docked with the connector of the object to be inspected is slid by two short moving rails. The guides become out of parallel and the sliding parts are twisted, which causes equipment failure and poor electrical connection. On the other hand, in the above configuration, the moving electrode can be moved by one moving rail, and rotation preventing guides for preventing rotation of the moving electrode around the moving axis along the moving rail are provided on both sides of the moving rail. With this arrangement, even if the transport base or the like is warped, since there is only one guide and the distance between the guides is long, it is difficult to be twisted and no failure occurs. Further, the rotation preventing guide does not cause a displacement in the rotation direction about the moving axis along the moving rail as the center of rotation.

According to a fourth aspect of the present invention, there is provided an automatic aging inspection apparatus according to the second aspect, further comprising a heat-resistant electric element having different characteristic values for each transporting means.

Conventionally, two methods, that is, a barcode and a barcode reader, and an ID card and an ID card reader are used, and both use temperatures of the reader section are limited.
Although it is difficult to use the aging inspection apparatus, as described above, since each of the transporting means is provided with a heat-resistant electric element having a different characteristic value, the operating environment temperature can be widened and the equipment cost can be reduced. In addition, the characteristic value of the electric element is read at the time of inspection, the inspection result information and the transporting means are checked, and the defective inspection product is automatically discharged, thereby preventing the defective product from being mixed due to a work error.

According to a fifth aspect of the present invention, there is provided an automatic aging inspection apparatus according to the first or second aspect, wherein a plurality of inspection objects are subjected to an aging inspection while blinking a power supply, and a power-on timing of each inspection object is input. The peak of the rush current was prevented from overlapping.

As described above, the aging inspection is performed while a plurality of inspected objects are turned on and off while the power supply is turned on and off, and the power-on timing of each inspected object is adjusted so that the peak of the input rush current does not overlap. Even with an input power supply with a small current capacity, a voltage drop of the power supply due to an input rush current (several tens of times the rated current) of the inspection object does not occur, so that the power supply capacity and equipment cost can be suppressed.

According to a sixth aspect of the present invention, in the automatic aging inspection apparatus according to the first or second aspect, the inspection object is filled and coated after the aging inspection is completed.

As described above, since the inspection object is filled and covered after the aging inspection is completed, the inspection object can be easily disassembled, the analysis time can be shortened, and the amount of defective loss can be reduced.

[0024]

DESCRIPTION OF THE PREFERRED EMBODIMENTS An automatic aging inspection apparatus according to an embodiment of the present invention will be described with reference to FIGS.

FIG. 1 is a conceptual diagram of an automatic aging inspection apparatus according to an embodiment of the present invention, FIG. 2 is a plan view showing each step of the automatic aging inspection apparatus of the embodiment of the present invention, and FIG. .

1 and 2, reference numerals 1 and 30 denote transport means, reference numerals 2 and 31 denote temperature stress applying means, reference numerals 3 and 47 denote transport means, and reference numerals 4 and 35 denote aging means (intermittent energizing means).
5, 37 are electrical characteristic inspection means, 6, 38 are pass / fail judgment means, 32 is supply means, 33 is transfer elevator means, 34
Is a constant temperature holding means for aging, 36 is a constant temperature holding means for electrical characteristic inspection, 39 is a transfer elevator means, 40 is a defective stocking means, 41 and 42 are conveyor means, 43 and 42.
44 is a palletizer robot, 45 and 46 are trays, A is an inspection object, and B is a main inspection line.

As shown in FIG. 1, a temperature stress applying means 2 is provided separately from a main inspection line B for performing an aging inspection on an inspection object A. The temperature stress applying means 2 is capable of continuously applying a temperature stress to a larger number of inspection objects A than the number of inspections on the main inspection line B. In this case, a large number of the inspection objects A are loaded on the transporting means 1 and the large number of transporting means 1 are supplied to the temperature stress applying means 2. In the temperature stress applying means 2, the inspection object A is left at a high temperature for a certain period of time within the storage guarantee temperature of the parts, thereby causing a potential initial failure to become apparent. In order to flow the inspection object A after a certain period of time to the main inspection line B, the inspection object A is transferred from the transportation means 1 to the transportation means 3 and is automatically transported between the respective means by the transportation means 3.

The main inspection line B includes an aging unit 4, an electric characteristic inspection unit 5, a pass / fail judgment unit 6, and a plurality of conveyance units 3 for conveying the inspection object A between these units. The aging means 4 performs high-temperature intermittent energization on the product for a certain time within the operation guarantee limit temperature of the product. Also, the operation of the product at that time is monitored. Electrical characteristics inspection means 5
Detects an initial defect that is not within the quality assurance of the mass-produced product within the operation guarantee limit temperature of the product, and records the inspection result in the transport unit 3. Aging means 4,
The electrical characteristic inspection means 5 also serves as a drying and preheating step. The pass / fail judgment means 6 for judging the inspection result extracts only the non-defective products from the pass / fail judgment results of the transport means 3 and sends them to the next step. The defect is discharged while remaining in the transporting means 3. Further, the aging means of this embodiment refers to high-temperature leaving, high-temperature intermittent energization, but similarly applies to other aging means such as temperature cycle, heat shock, vibration shock, continuous energization, temperature cycle energization, heat shock energization. Can adapt.

FIG. 4 is a plan view of the conveying means according to the embodiment of the present invention, FIG. 5 is a front view thereof, and FIG. 6 (a) is an explanatory view of the operation of the conveying means before docking according to the embodiment of the present invention (b). 7) is an explanatory diagram of the operation after docking, FIG.
(A) is an operation explanatory view before docking of the moving electrode and the inspection object of the transport means in the embodiment of the present invention, and (b) is an operation explanatory view after the docking. 4 to 7, 50 is a transport base, 51 is a moving rail, 52 is a sliding portion, 53 is a sliding portion, 54 is a moving electrode, 55 is a rotation prevention guide, 56 is a pilot pin, 57 is a test cable, 58 Is an external electrode, 59 is an electric element having good heat resistance,
60 is a pass / fail judgment recording means, 61 is a sliding shaft, 70 is a sliding portion mounting block, 71 is an elastic body, 72 is a guide block,
73 is an inspection pin, 74 is an inspection object connector, and 75 is an inspection object connector pin.

As shown in FIG. 4 and FIG.
A plurality of pilot pins 56, one moving rail 51, two rotation prevention guides 55, and external electrodes 58 are mounted on the transport base 50. The slide part 52 is fitted on the moving rail 51, and moves smoothly in the Y direction. The sliding portion 53 is fixed to the sliding portion 52,
Moves smoothly in the Y direction. The plurality of moving electrodes 54 are attached to the sliding portion 53. Although a resistor is used as the electric element 59 having good heat resistance, a coil or the like can be used.
When the inspection object A is loaded on the transport means 47, the inspection object A
Are positioned on the transport base 50 by the reference holes of the inspection object A and the pilot pins 56. As shown in FIG. 7, the moving electrode 54 includes a sliding portion mounting block 70, two elastic bodies 71,
Guide block 72, inspection pin 73, inspection cable 57
Is provided. The inspection pin 73 is insulated and attached to the moving electrode 54, and is connected to the external electrode 58 by an inspection cable 57. In addition, an electric element 59 having good heat resistance and having different characteristic values for each of the transport means 47 is provided with an external electrode 58.
Mounted on

The automatic aging inspection apparatus having the above-described structure batch-processes the temperature stress applying means 2 having a long production lead time in the first step before the main inspection line B, and the aging means 4 having a short production lead time and the electric characteristic inspection means. 5 is automatically processed continuously on the main inspection line B.

Next, the operation of the automatic aging inspection apparatus will be described. As shown in FIGS. 2 and 3, after a large number of the inspection objects A are loaded on the transporting unit 30, the multiple transporting units 30 are batch-input to the temperature stress applying unit 31. The inside of the temperature stress applying means 31 is kept at a set value within the guaranteed storage temperature of the parts and left for a certain period of time, so that a potential initial failure is made obvious. After a certain time has elapsed, the transporting means 30 is taken out and set on the supplying means 32. At this time, the supply unit 32 automatically takes out the inspection object A from the transportation unit 30 and automatically loads the inspection object A on the empty transportation unit 47 which is positioned by the transfer elevator unit 33. As shown in FIG. 7, the moving electrode 54 of the transport means 47 after the fixed number of the inspection objects A have been loaded.
Then, after the connector 74 of the inspection object A is automatically connected with the connector 74, the conveying means 47 is sent into the aging constant temperature holding means 34 by the conveyor means 41.

The palletizer robot 43 transfers the transport means 47 from the conveyor means 41 to the shelf 45 in the aging constant temperature holding means 34, and the electrode section of the shelf 45 and the transport means 47
Are connected, the input power supply and the output load of the intermittent energizing means 35 are connected, intermittent energization is performed in a fixed pattern shown in FIG.
Check the operation of.

After the intermittent energization is completed, the palletizer robot 43
After the transfer of the transfer means 47 from the shelf 45 to the conveyor means 41, the transfer means 47 is sent out of the aging constant temperature holding means 34. The result of the pass / fail judgment of the inspection object A is transmitted by the transport unit 4
The transporting means 47, which has been aged and stored in the pass / fail determination recording means 60 of No. 7, is sent into the constant temperature holding means 36 for electrical characteristic inspection by the conveyor means 41.

In the electrical characteristic inspection holding means 36, the palletizer robot 44 transfers the transport means 47 from the conveyor means 41 to the shelf 46, and the electrode section of the shelf 46 and the transport means 47
The external electrode 58 is connected, and an electrical characteristic test is performed to detect an initial failure which is out of the quality variation of the mass-produced product within the operation guarantee limit temperature of the product.

After the intermittent energization is completed, the palletizer robot 44
After transferring the transport means 47 from the shelf 46 to the conveyor means 41, the transport means 47 is sent out of the constant temperature holding means 36 for electrical characteristic inspection. The quality judgment result of the inspection object A is stored in the quality judgment recording means 60 of the transport means 47. Aging constant temperature holding means 34, electrical characteristic inspection constant temperature holding means 3
Reference numeral 6 also serves as drying and preheating means.

In the pass / fail judgment means 38 for judging the inspection result,
The pass / fail result is read from the pass / fail judgment recording means 60 of the transport means 47, and only the non-defective inspection object A is taken out and sent to the next step. The defective inspection object is left in the transport means 47. The transfer elevator means 39 of the transport means 47 which has completed the non-defective product removal moves down. Empty transport means 47 from which all the inspection objects A are taken out
Are transported by the conveyor means 41 to the transfer elevator means 33. Further, the transporting means 47 in which the defect remains is stored by the defective stocking means 40.

Here, the operation of automatically connecting the moving electrode 54 of the transporting means 47 and the connector 74 of the inspection object A in the above inspection process will be described. As shown in FIGS. 6 and 7, after the loading of the inspection object A is completed, the moving electrode
In the direction, the object A is advanced. When the moving electrode 54 moves in the direction of the connector 74 to be inspected, the guide block 72 enters along the outer shape of the connector 74 to be inspected. At this time, the displacement of the inspection object connector 74 in the Z direction is corrected by the two elastic bodies 71,
And the inspection object connector pin 74 can be stably contacted.

Since the transfer means 47 is used in a heated state, the transfer base 50, the sliding portion 53 and the like are warped due to thermal stress. Even if a rotational force is applied in the direction of 中 in FIG. 4 due to this warpage, the sliding portion 53 does not squeeze because it can be moved by one moving rail 51. A rotation preventing guide 55 is provided on both sides of the moving rail 51 to prevent the moving electrode 54 from rotating in the θ direction about the moving axis along the moving rail 51 even when a rotational force is applied in the θ direction in FIG. Therefore, the positional accuracy of the moving electrode 54 is guaranteed. The same effect can be obtained by a structure in which the rotation preventing guide 55 is attached to the sliding portion 53.

FIG. 8 is a conceptual diagram for obtaining the transport means No. in the embodiment of the present invention. 3 and 4
In the intermittent energizing means 35 and the electrical characteristic inspecting means 37 in the middle, the measuring circuit switching is performed by the computer body 80 programmed in each means in a state where the electrodes of each shelf are connected to the external electrodes 58 as shown in FIG. The relay 84 in the machine 83 is connected to the electric element 59 having good heat resistance of the conveying means 47 and the measuring instrument 82.
Switch to connect. The programmed computer body 80 reads the measured values from the measuring device 82,
From the read electrical characteristic values, the transport means No is calculated by using the transport means No. table (Table 1).

[0041]

[Table 1]

After completion of each inspection, the inspection result data and the transport means No. are printed out together using the printer 81,
In the pass / fail determination means 38, the defective inspection object is discharged while being placed on the transport means 47, so that the inspection data of the defective inspection object can be used for failure analysis. In the case of the drawing, the resistance 1 = 150Ω, the resistance 2 = 100Ω, and the transportation means No. is 31 from the transportation means No. table.

Conventionally, two methods, that is, a barcode and a barcode reader, and an ID card and an ID card reader have been used, and both use the temperature of the reader unit is limited.
It is difficult to use with an aging inspection device. In this method, the operating environment temperature can be widened and the equipment cost can be reduced. In addition, by providing a reference value of the electrical characteristic value, the inspection device,
It can be checked whether or not the electrical connection with the transport means has been made.

FIG. 9 is a schematic diagram of an input circuit of the intermittent energizing means according to the embodiment of the present invention, FIG. 10 is a graph showing an input rush current of the inspection object, and FIG. 11 is an intermittent energization pattern of the inspection object. FIG. When performing the aging inspection while turning on and off the power supply of a plurality of inspection objects A in the intermittent energizing means 35 and the electrical characteristic inspection means 37 in FIGS. 3 and 4, the computer main body 90 programmed as shown in FIG. As a result, the energization pattern of the plurality of inspection objects A as shown in FIG.
By turning ON / OFF the relay 94 in the input circuit switch 93 at a time interval of 0 Ts seconds, it is possible to prevent the input / output rush current of the plurality of test objects A from overlapping as shown in FIG. Even if the input power supply 92 having a smaller current capacity is used, a voltage drop of the input power supply 92 can be prevented.

Conventionally, the current capacity is Ipee for each electric device.
In this embodiment, the current capacity of the input power supply is set to Ipeak + Is × n by preventing the input rush current from being overlapped. In addition, the cost of the input power supply can be significantly reduced. (Ipeak: input rush current, Is: steady input current, n: number of test objects connected to the input power supply). Intermittent energization is possible with a power supply having a capacity of about 1/10 of the conventional one.

In the case of the inspection object A in which the processing step includes the filling and hardening step, as shown in the conventional aging inspection apparatus, the aging inspection apparatus is not brought to the final step, but the filling step is performed by the aging inspection apparatus. In the final process of the test, the aging means of the test object with temperature / intermittent power failure and electrical characteristic failure can be found before filling, so there is no need to remove the coated filler for failure analysis, Analysis time is greatly reduced, and the amount of defective loss is also reduced.

As described above, according to this embodiment, the equipment can be made compact while the aging inspection line is inlined, and energy can be saved because the entire equipment is not heated or cooled. In addition, while long-term temperature stress applying means in the first process is a batch and in-process inventory is possible, continuous automatic production is possible in subsequent processes, which can reduce production lead time and greatly increase in-process inventory. Can be greatly reduced, and significant labor savings can be achieved.

The moving electrode 54 of the transport means 47 can be moved by one moving rail 51 and a rotation preventing guide 55 for preventing rotation of the moving electrode 54 about a moving axis along the moving rail 51 as a center of rotation. Are provided on both sides of the moving rail 51, even if the transport base 50 or the like warps, the guide 55 is single and the distance between the guides 55 is long, so that it is difficult to be twisted and no trouble occurs. In addition, the rotation preventing guide 55 does not cause a displacement in the rotational direction about the moving axis along the moving rail 51 as the center of rotation. In addition, in this method, the displacement of the connector 74 can be absorbed and docked by the shape of the elastic body 71 and the guide block 72, so that the contact resistance is stably reduced even in the automatic continuous process, and the intermittent energizing process and the electrical characteristic inspection Can be measured stably.

The main inspection line is not limited to the above embodiment as long as the aging inspection can be performed on the inspection object.

[0050]

According to the automatic aging inspection apparatus of the present invention, the main inspection line for performing the aging inspection on the inspection object is separated from the main inspection line and the number of the inspection objects is larger than the number of inspections on the main inspection line. Since the temperature stress applying means capable of continuously applying the stress is provided, the in-process inventory in the process can be reduced by one.
Concentration at a location and a manual transfer operation only need to be performed once from the temperature stress applying means to the main inspection line, thereby improving work efficiency and realizing labor saving. In addition, downsizing of equipment while in-line aging inspection line,
Energy saving can be achieved because the entire equipment is not heated and cooled.

According to the second aspect of the present invention, the main inspection line includes an aging unit, an electric characteristic inspection unit, a pass / fail judgment unit, and a plurality of conveying units for conveying the inspection object between these units, and has a long production lead time. The temperature stress applying means is batch-processed in the first step before the main inspection line, and the aging means and the electrical characteristic inspection means having a short production lead time are automatically and continuously processed in the main inspection line. Since the batch apparatus is in the process, the in-process stock of the process is increased, the flow of the production is interrupted, and the problem that the production lead time is lengthened can be solved. In other words, while long-term temperature stress applying means in the first step is a batch and in-process inventory is possible, continuous automatic production is possible in the subsequent steps, which can shorten the production lead time and greatly increase in-process in-process inventory. Can be greatly reduced, and significant labor savings can be achieved.

According to the third aspect, the moving electrode is movable by one moving rail, and rotation preventing guides for preventing rotation of the moving electrode about a moving axis along the moving rail as rotation centers are provided on both sides of the moving rail. Even if the transport base is warped, since there is only one guide and the distance between the guides is long,
Hard to be twisted, no failure occurs. Further, the rotation preventing guide does not cause a displacement in the rotation direction about the moving axis along the moving rail as the center of rotation.

According to the fourth aspect, since a heat-resistant electric element having a different characteristic value is provided for each transporting means, the operating environment temperature can be widened and the equipment cost can be reduced. In addition, the characteristic value of the electric element is read at the time of inspection, the inspection result information and the transporting means are checked, and the defective inspection product is automatically discharged, thereby preventing the defective product from being mixed due to a work error.

According to a fifth aspect of the present invention, the aging inspection is performed while a plurality of test objects are blinking and the power supply is turned on and off, and the power-on timing of each test object is set so that the peak of the input rush current does not overlap. Even with an input power supply having a smaller current capacity, a voltage drop of the power supply due to an input rush current (several tens of times the rated current) of the inspection object does not occur, so that the power supply capacity and equipment cost can be suppressed.

That is, in the past, a power supply device having a current capacity exceeding Ipeak was used for each electric device, which was one of the factors that increased the equipment cost. However, by preventing the input rush current from overlapping, the input power supply was prevented. Current capacity of Ip
By keeping eek + Is × n, the cost of the input power supply can be significantly reduced. (Ipeak: input rush current, Is: steady input current, n: number of test objects connected to the input power supply).

According to the sixth aspect, the inspection object is filled and covered after the aging inspection is completed, so that the inspection object can be easily disassembled, the analysis time can be shortened, and the amount of defective loss can be reduced.

[Brief description of the drawings]

FIG. 1 is a conceptual diagram of an automatic aging inspection device according to an embodiment of the present invention.

FIG. 2 is a plan view showing each step of the automatic aging inspection device according to the embodiment of the present invention.

FIG. 3 is a front view of FIG. 2;

FIG. 4 is a plan view of a conveying unit according to the embodiment of the present invention.

FIG. 5 is a front view of FIG. 4;

FIG. 6A is an explanatory diagram of the operation of the transporting device according to the embodiment of the present invention before docking, and FIG. 6B is an explanatory diagram of the operation after the docking.

FIG. 7A is an explanatory view of an operation before docking of a moving electrode and an object to be inspected in a transport unit according to an embodiment of the present invention;
(B) is an operation explanatory view after docking.

FIG. 8 is a conceptual diagram for determining a transport means No. in the embodiment of the present invention.

FIG. 9 is a schematic diagram of an input circuit of the intermittent energizing means in the embodiment of the present invention.

FIG. 10 is a graph showing an input rush current of the inspection object of FIG. 9;

FIG. 10 is an intermittent conduction pattern diagram of the inspection object.

FIG. 12 is a conceptual diagram of a conventional aging inspection device.

[Description of Signs] 1,30 Conveying Means 2,31 Temperature Stress Applying Means 3,47 Conveying Means 4,35 Aging Means (Intermittent Conducting Means) 5,37 Electrical Characteristics Inspection Means 6,38 Pass / Fail Determination Means A Inspection Object B Main inspection line 50 Transport base 51 Moving rail 52 Slide part 53 Sliding part 54 Moving electrode 55 Rotation prevention guide 58 External electrode 59 Electric element with good heat resistance 60 Pass / fail judgment recording means 61 Sliding shaft 72 Guide block 73 Inspection pin 74 Inspection object connector 75 Inspection object connector pin

Claims (6)

[Claims] 1. A temperature stress application method capable of continuously applying a temperature stress to a larger number of test objects than the number of test objects on the main test line separately from a main test line for performing an aging test on the test object. An automatic aging inspection device characterized by comprising means. 2. The main inspection line includes an aging unit, an electric characteristic inspection unit, a pass / fail judgment unit, and a plurality of conveyance units that convey an object to be inspected between these units, and applies a temperature stress having a long production lead time. 2. An automatic aging inspection apparatus according to claim 1, wherein said means is subjected to batch processing in a first step before said main inspection line, and said aging means and electric characteristic inspection means having a short production lead time are automatically and continuously processed in said main inspection line. . 3. The transfer means includes a moving electrode for loading an object to be inspected and electrically connecting to the object to be inspected, and the moving electrode is movable along one moving rail and along the moving rail. 3. The automatic aging inspection apparatus according to claim 2, wherein rotation preventing guides for preventing rotation of the moving electrode about the moving axis as a center of rotation are provided on both sides of the moving rail. 4. The automatic aging inspection apparatus according to claim 2, further comprising a heat-resistant electric element having a different characteristic value for each transporting means. 5. The method according to claim 1, wherein an aging test is performed while a plurality of devices under test are turned on and off, and a peak of an input rush current is not overlapped at a power-on timing of each device under test. Automatic aging inspection equipment. 6. The automatic aging inspection apparatus according to claim 1, wherein the inspection object is filled and coated after the aging inspection is completed.