JP2002111472A5 - - Google Patents

Download PDF

Info

Publication number
JP2002111472A5
JP2002111472A5 JP2001247518A JP2001247518A JP2002111472A5 JP 2002111472 A5 JP2002111472 A5 JP 2002111472A5 JP 2001247518 A JP2001247518 A JP 2001247518A JP 2001247518 A JP2001247518 A JP 2001247518A JP 2002111472 A5 JP2002111472 A5 JP 2002111472A5
Authority
JP
Japan
Prior art keywords
buffer
signal
control signal
electronic circuit
generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001247518A
Other languages
English (en)
Japanese (ja)
Other versions
JP3818433B2 (ja
JP2002111472A (ja
Filing date
Publication date
Priority claimed from US09/641,085 external-priority patent/US6259282B1/en
Application filed filed Critical
Publication of JP2002111472A publication Critical patent/JP2002111472A/ja
Publication of JP2002111472A5 publication Critical patent/JP2002111472A5/ja
Application granted granted Critical
Publication of JP3818433B2 publication Critical patent/JP3818433B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2001247518A 2000-08-17 2001-08-17 外部プルアップ抵抗器検出および出力バッファの補償 Expired - Fee Related JP3818433B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/641085 2000-08-17
US09/641,085 US6259282B1 (en) 2000-08-17 2000-08-17 External pull-up resistor detection and compensation of output buffer

Publications (3)

Publication Number Publication Date
JP2002111472A JP2002111472A (ja) 2002-04-12
JP2002111472A5 true JP2002111472A5 (enExample) 2004-09-09
JP3818433B2 JP3818433B2 (ja) 2006-09-06

Family

ID=24570871

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001247518A Expired - Fee Related JP3818433B2 (ja) 2000-08-17 2001-08-17 外部プルアップ抵抗器検出および出力バッファの補償

Country Status (2)

Country Link
US (1) US6259282B1 (enExample)
JP (1) JP3818433B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7158121B2 (en) * 2001-10-19 2007-01-02 American Standard International Inc. Enhanced touch-screen display system
US7285976B2 (en) * 2005-01-31 2007-10-23 Freescale Semiconductor, Inc. Integrated circuit with programmable-impedance output buffer and method therefor
JP4937898B2 (ja) * 2005-02-04 2012-05-23 富士通株式会社 クロックバッファ
CN102571060B (zh) * 2010-12-31 2015-08-12 意法半导体研发（上海）有限公司 高频智能缓冲器

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5864244A (en) * 1997-05-09 1999-01-26 Kaplinsky; Cecil H. Tristate buffer circuit with transparent latching capability
US5905389A (en) * 1997-09-22 1999-05-18 Cypress Semiconductor Corp. Methods, circuits and devices for improving crossover performance and/or monotonicity, and applications of the same in a universal serial bus (USB) low speed output driver

Similar Documents

Publication Publication Date Title
DE102004049252A1 (de) Temperaturabtastschaltung, Temperatursensor und Periodensteuerschaltung
WO2006093635A3 (en) Method and circuit for the detection of solder-joint failures in a digital electronic package
AU2003238087A1 (en) Device for monitoring the operating state of scales
JP2007538474A5 (enExample)
WO2007102885A3 (en) Magnetic tunnel junction pressure sensors and methods
TW200512556A (en) Sensors and sensor circuits which convert sense currents to digital values
JP2003124801A5 (enExample)
CN109597115B (zh) 用于探测束流损失的设备
DE602004011809D1 (de) Tstelle
WO2003010642A3 (en) Method and apparatus for controlling signal states and leakage current during a sleep mode
EP1308736A3 (en) Test circuit and semiconductor integrated circuit effectively carrying out verification of connection of nodes
JP2002111472A5 (enExample)
TW200721673A (en) Semiconductor integrated circuit
WO2005036193A3 (fr) Sonde de mesure d'un champ magnetique
JP2003124757A5 (enExample)
CN1952853B (zh) 按键装置及其按键侦测方法
WO2004025314A8 (en) A method and apparatus for iddq measuring
US10340957B2 (en) Methods and devices for monitoring optical signals
WO2007047178A3 (en) Integrated circuit package resistance measurement
WO2003034694A3 (en) Curing lamp apparatus with electronic voice
WO2004029558A3 (en) Flow pickup circuit
WO2003067274A3 (en) Method and device for detecting faults on integrated circuits
ATE433096T1 (de) Elektronische messschaltung
CA2497220A1 (en) Method and apparatus to detect an external source
JP2004047720A (ja) 半導体装置