JP2002060927A - Mask for thin film pattern deposition - Google Patents

Mask for thin film pattern deposition

Info

Publication number
JP2002060927A
JP2002060927A JP2000242531A JP2000242531A JP2002060927A JP 2002060927 A JP2002060927 A JP 2002060927A JP 2000242531 A JP2000242531 A JP 2000242531A JP 2000242531 A JP2000242531 A JP 2000242531A JP 2002060927 A JP2002060927 A JP 2002060927A
Authority
JP
Japan
Prior art keywords
mask
thin film
pattern
color filter
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000242531A
Other languages
Japanese (ja)
Other versions
JP2002060927A5 (en
Inventor
Hisaya Nakagawara
寿哉 中川原
Masayuki Ogawa
正幸 小川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toray Industries Inc
Original Assignee
Toray Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries Inc filed Critical Toray Industries Inc
Priority to JP2000242531A priority Critical patent/JP2002060927A/en
Publication of JP2002060927A publication Critical patent/JP2002060927A/en
Publication of JP2002060927A5 publication Critical patent/JP2002060927A5/ja
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a mask for thin film pattern deposition with which an excellent color filter where a desired thin film pattern is deposited particularly on a multiple printing color filter can be obtained. SOLUTION: In addition to the primary pattern openings in the mask for thin film pattern deposition, dummy openings are further provided to their peripheries. Moreover, the occupancy of the dummy openings in the mask ranges from 2 to 20%.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、薄膜パターン成膜
用マスクに関するものである。
The present invention relates to a mask for forming a thin film pattern.

【0002】[0002]

【従来の技術】TFT方式のカラー液晶ディスプレイ
は、液晶層に対向する位置にカラーフィルターを備えて
いる。このカラーフィルターには液晶の駆動のためIT
O膜に代表されるような透明導電性の薄膜が成膜され
る。その成膜方法としてはスパッタリング法が一般的で
あり、かつ金属製のマスクを使用してカラーフィルター
上に所望の薄膜パターンを成膜・形成するマスキングス
パッタ法が従来技術として知られている。
2. Description of the Related Art A color liquid crystal display of a TFT type has a color filter at a position facing a liquid crystal layer. This color filter has an IT
A transparent conductive thin film such as an O film is formed. A sputtering method is generally used as the film forming method, and a masking sputtering method for forming and forming a desired thin film pattern on a color filter using a metal mask is known as a conventional technique.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、基板1
枚あたり6面以上のパターンを有するような多面取りの
カラーフィルターに、従来の金属製マスクを用いて透明
導電膜の1つであるITOを成膜した場合、金属製マス
クの熱膨張により成膜中にマスクが変形し、カラーフィ
ルターとの密着性が悪化するため、成膜後のカラーフィ
ルターにはITO膜の境界部分が不明瞭となるパターン
ボケと呼ばれる成膜欠陥が生じ、所望の薄膜パターンが
得られないという問題が生じる。ITO膜パターンの成
膜精度はカラーフィルターの重要な品質要素の1つであ
り、その成膜精度が悪い場合は液晶ディスプレイの表示
欠陥を引き起こす可能性もある。
However, the substrate 1
When ITO, which is one of the transparent conductive films, is formed on a multi-colored color filter having a pattern of 6 or more per sheet using a conventional metal mask, the film is formed by thermal expansion of the metal mask. Since the mask is deformed inside and the adhesion to the color filter is deteriorated, the color filter after film formation has a film formation defect called pattern blur which makes the boundary portion of the ITO film unclear, and a desired thin film pattern is formed. Is not obtained. The film formation accuracy of the ITO film pattern is one of the important quality factors of the color filter. If the film formation accuracy is poor, a display defect of the liquid crystal display may be caused.

【0004】本発明は、かかる従来技術による欠点を改
良し、特に前記のような多面取りカラーフィルター上に
所望の薄膜パターンを形成した良好なカラーフィルター
とすることが可能な薄膜パターン成膜用マスクを提供す
ることを目的とする。
The present invention has been made to solve the above-mentioned drawbacks of the prior art, and in particular, a mask for forming a thin film pattern capable of forming a good color filter in which a desired thin film pattern is formed on a multi-cavity color filter as described above. The purpose is to provide.

【0005】[0005]

【課題を解決するための手段】本発明にかかる薄膜パタ
ーン成膜用マスクは、本来のパターン開口部に加えさら
にその周囲にダミー開口部を設けるとともに、該マスク
におけるダミー開口部の占有率が2〜20%の範囲内に
あることを特徴とする。
According to the mask for forming a thin film pattern according to the present invention, a dummy opening is provided around the original pattern opening in addition to the original pattern opening, and the occupancy of the dummy opening in the mask is 2%. -20%.

【0006】このダミー開口部により、薄膜成膜中のマ
スクの熱膨張を吸収し、マスクとカラーフィルター間の
密着性を保ち、成膜欠陥のないカラーフィルターを得る
ことができる。
The dummy openings absorb the thermal expansion of the mask during thin film formation, maintain the adhesion between the mask and the color filter, and provide a color filter free from film formation defects.

【0007】[0007]

【発明の実施の形態】本発明は、薄膜パターン成膜用マ
スクにおいて、本来のパターン開口部に加え、さらにそ
の周囲にダミー開口部を設けたことを特徴とする。さら
に、該マスクにおけるダミー開口部の占有率が2〜20
%の範囲内にあることを特徴とする。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention is characterized in that a mask for forming a thin film pattern is provided with a dummy opening in addition to the original pattern opening. Further, the occupancy of the dummy opening in the mask is 2 to 20.
%.

【0008】ダミー開口部は基板の切断予定部分の外側
に設けられている。また、ダミー開口部のマスク面積占
有率は2〜20%が適切である。2%未満では熱膨張の
吸収という役割を果たさずにパターンボケが発生するの
で好ましくない。また20%を越えると、ブラスト加工
によるデポ膜の洗浄を繰り返した場合に変形しやすくな
り、マスクの平面度が損なわれるので好ましくない。さ
らに好ましくは、ダミー開口部のマスク面積占有率は9
〜11%である。
The dummy opening is provided outside the portion of the substrate to be cut. Further, the mask area occupation ratio of the dummy opening is suitably 2 to 20%. If it is less than 2%, pattern blur occurs without fulfilling the role of absorbing thermal expansion, which is not preferable. On the other hand, if it exceeds 20%, the deposited film is likely to be deformed when the cleaning of the deposited film by blasting is repeated, and the flatness of the mask is impaired. More preferably, the mask area occupancy of the dummy opening is 9
1111%.

【0009】ダミー開口部に成膜された薄膜は、後工程
で切断加工により除去される部分であるため、製品には
全く問題ない。
The thin film formed in the dummy opening is a portion which is removed by a cutting process in a later step, so that there is no problem in a product.

【0010】また、本発明にかかる薄膜成膜用マスク
は、ハンドリング性および複数回の使用を可能にするこ
とを考慮し、その材質はステンレスや42アロイなどと
いった金属であることが望ましい。
The thin film forming mask according to the present invention is desirably made of a metal such as stainless steel or 42 alloy in consideration of handling properties and enabling multiple uses.

【0011】[0011]

【実施例】実施例1 以下、本発明の実施例として3.5インチ×20面取の
カラーフィルターに透明導電膜の1つであるITO膜を
成膜する例を挙げる。
Embodiment 1 Hereinafter, as an embodiment of the present invention, an example in which an ITO film, which is one of transparent conductive films, is formed on a 3.5 inch × 20 chamfered color filter will be described.

【0012】図1は本発明の実施例に記載の薄膜パター
ン成膜用マスクの成膜前の構成図であり、図2は図1の
成膜後の構成図である。
FIG. 1 is a configuration diagram of a mask for forming a thin film pattern according to an embodiment of the present invention before film formation, and FIG. 2 is a configuration diagram of FIG. 1 after film formation.

【0013】このカラーフィルターはITO膜成膜後、
360×465mmから320×400mmのサイズに
切断するものである。なお、320×400mmのカラ
ーフィルターパターンは、切断前の360×465mm
基板の中央部にある。
This color filter is formed after forming the ITO film.
It is cut into a size of 360 × 465 mm to 320 × 400 mm. Note that the color filter pattern of 320 × 400 mm is 360 × 465 mm before cutting.
Located at the center of the substrate.

【0014】まず、本発明薄膜パターン成膜用マスクの
構造から説明する。図1に示すように、縦360mm横
470mm厚さ2mmのステンレス鋼板に本来のカラー
フィルターパターン開口部2を形成する。その後、その
周囲にダミー開口部3を形成し、薄膜用パターン成膜用
マスク1を製作する。
First, the structure of the thin film pattern forming mask of the present invention will be described. As shown in FIG. 1, an original color filter pattern opening 2 is formed in a stainless steel plate having a length of 360 mm, a width of 470 mm and a thickness of 2 mm. Thereafter, a dummy opening 3 is formed therearound, and a mask 1 for forming a pattern for a thin film is manufactured.

【0015】この時、カラーフィルターパターン開口部
2のマスク面積占有率は約50%であり、ダミー開口部
3のマスク面積占有率は10%である。
At this time, the mask area occupancy of the color filter pattern opening 2 is about 50%, and the mask area occupancy of the dummy opening 3 is 10%.

【0016】次にこのマスク1を用いて、図2に示すよ
うに、3.5インチ×20面取のカラーフィルター基板
4にITO膜からなるパターンを成膜する。ITO膜の
成膜方法はスパッタリング法である。成膜条件は圧力
0.2Pa、温度は200℃、膜厚は約140nmであ
る。
Next, as shown in FIG. 2, a pattern made of an ITO film is formed on a 3.5 inch × 20 chamfered color filter substrate 4 using the mask 1. The method for forming the ITO film is a sputtering method. The film forming conditions are a pressure of 0.2 Pa, a temperature of 200 ° C., and a film thickness of about 140 nm.

【0017】ITO成膜後の外観を検査した結果、どの
成膜パターンもボケなどの成膜欠陥なく所定の位置にパ
ターニングされていることを確認した。
As a result of inspecting the appearance after forming the ITO film, it was confirmed that all the film patterns were patterned at predetermined positions without film defects such as blur.

【0018】このマスクを用い200枚のカラーフィル
ターを成膜したが、ボケ等の成膜欠陥は全く見られなか
った。
Using this mask, 200 color filters were formed, but no film formation defects such as blurring were observed.

【0019】ITO膜成膜後、切断加工にて360×4
65mmの基板を320×400mmに切断する。マス
ク1のダミー開口部3を通して成膜されたダミー成膜部
分7は、この切断加工時に除去されるように設計してい
たため、製品としては全く問題ない。
After forming the ITO film, 360 × 4
A 65 mm substrate is cut into 320 × 400 mm. The dummy film-forming portion 7 formed through the dummy opening 3 of the mask 1 is designed so as to be removed at the time of the cutting process, so that there is no problem as a product at all.

【0020】比較例1 実施例と同サイズのステンレス鋼板に、パターン開口部
2のみを形成した薄膜成膜用マスクを製作し、実施例と
同じカラーフィルターに同条件でITO膜を成膜した。
100枚に成膜した結果、ほぼ全数においてパターンボ
ケなどの成膜欠陥が見られた。パターンボケは特に基板
中央部に多く確認された。
Comparative Example 1 A mask for forming a thin film was formed on a stainless steel plate having the same size as in the example and only the pattern opening 2 was formed, and an ITO film was formed on the same color filter as in the example under the same conditions.
As a result of film formation on 100 sheets, film formation defects such as pattern blurring were observed in almost all of them. Many pattern blurs were observed especially at the center of the substrate.

【0021】比較例2 実施例と同サイズのステンレス鋼板にパターン開口部1
を形成した後、マスク面積占有率21%のダミー開口部
を設けたマスクを製作し、実施例と同じカラーフィルタ
ーに同条件でITO膜を成膜した。24枚に成膜した結
果、パターンボケの発生は見られなかったものの約半数
の11枚にマスクとの接触によるキズが見られた。ダミ
ー開口部のマスク面積占有率が大きすぎたため、マスク
の強度が低下し変形したために平面度が損なわれ、パタ
ーンエッジと基板が接触しキズが発生したものである。
Comparative Example 2 A pattern opening 1 was formed in a stainless steel plate having the same size as that of the embodiment.
Was formed, a mask provided with a dummy opening having a mask area occupancy of 21% was manufactured, and an ITO film was formed on the same color filter as in the example under the same conditions. As a result of film formation on 24 sheets, no pattern blurring was observed, but about half of the 11 sheets showed scratches due to contact with the mask. Since the mask area occupation ratio of the dummy opening was too large, the strength of the mask was reduced and the mask was deformed, so that the flatness was impaired, and the pattern edge was brought into contact with the substrate to cause a flaw.

【0022】[0022]

【発明の効果】本発明によれば、カラーフィルターはの
透明導電性薄膜の成膜時にパターンボケなどの成膜欠陥
を発生させることなく成膜することができ、さらには品
質的にも良好なカラーフィルターを得ることができる。
特に基板1枚あたり6面以上の多面取りカラーフィルタ
ーへの透明導電性薄膜の成膜時において、その効果が顕
著である。
According to the present invention, a color filter can be formed without generating a film formation defect such as pattern blur at the time of forming a transparent conductive thin film, and the color filter is excellent in quality. A color filter can be obtained.
In particular, the effect is remarkable when a transparent conductive thin film is formed on a multi-colored color filter having six or more substrates per substrate.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例に記載の薄膜パターン成膜用マ
スクの成膜前構成図である。
FIG. 1 is a configuration diagram of a mask for forming a thin film pattern according to an embodiment of the present invention before film formation.

【図2】本発明の実施例に記載の薄膜パターン成膜用マ
スクの成膜後の構成図である。
FIG. 2 is a configuration diagram after forming a thin film pattern forming mask according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1:パターン成膜用マスク 2:パターン開口部 3:ダミー開口部 4:基板(マザー) 5:カラーフィルター(パターン成膜部) 6:切断線 7:ダミー成膜部 1: Pattern forming mask 2: Pattern opening 3: Dummy opening 4: Substrate (mother) 5: Color filter (Pattern forming part) 6: Cutting line 7: Dummy forming part

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】薄膜パターン成膜用マスクにおいて、本来
のパターン開口部に加え、さらにその周囲にダミー開口
部を設けるとともに、該マスクにおけるダミー開口部の
占有率が2〜20%の範囲内にあることを特徴とする薄
膜パターン成膜用マスク。
In a mask for forming a thin film pattern, in addition to an original pattern opening, a dummy opening is further provided around the opening, and the occupancy of the dummy opening in the mask is within a range of 2 to 20%. A thin film pattern deposition mask, characterized in that:
JP2000242531A 2000-08-10 2000-08-10 Mask for thin film pattern deposition Pending JP2002060927A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000242531A JP2002060927A (en) 2000-08-10 2000-08-10 Mask for thin film pattern deposition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000242531A JP2002060927A (en) 2000-08-10 2000-08-10 Mask for thin film pattern deposition

Publications (2)

Publication Number Publication Date
JP2002060927A true JP2002060927A (en) 2002-02-28
JP2002060927A5 JP2002060927A5 (en) 2007-09-27

Family

ID=18733536

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000242531A Pending JP2002060927A (en) 2000-08-10 2000-08-10 Mask for thin film pattern deposition

Country Status (1)

Country Link
JP (1) JP2002060927A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004296436A (en) * 2003-03-13 2004-10-21 Toray Ind Inc Organic electroluminescent device, and manufacturing method of the same
WO2006027830A1 (en) * 2004-09-08 2006-03-16 Toray Industries, Inc. Organic electroluminescent device and manufacturing method thereof
KR100814818B1 (en) 2006-07-31 2008-03-20 삼성에스디아이 주식회사 Mask for manufacturing organic light emitting display
KR100880944B1 (en) 2007-10-01 2009-02-04 엘지디스플레이 주식회사 Organic lighting emitting display device
KR100922753B1 (en) * 2002-11-29 2009-10-21 삼성모바일디스플레이주식회사 Mask for an evaporation, method of manufacturing an organic electroluminesence device thereused and organic electroluminesence device
KR100986787B1 (en) * 2003-03-19 2010-10-12 도호꾸 파이오니어 가부시끼가이샤 Film formation mask, organic el panel, and method of manufacturing the organic el panel
JP2013019026A (en) * 2011-07-12 2013-01-31 Toyota Motor Corp Mask for selectively depositing film
JP2014125671A (en) * 2012-12-27 2014-07-07 V Technology Co Ltd Vapor deposition mask, and manufacturing method of the same
WO2019003534A1 (en) * 2017-06-28 2019-01-03 株式会社ジャパンディスプレイ Vapor deposition mask
US20210108310A1 (en) * 2018-03-20 2021-04-15 Sharp Kabushiki Kaisha Film forming mask and method of manufacturing display device using same

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7837528B2 (en) 2002-11-29 2010-11-23 Samsung Mobile Display Co., Ltd. Evaporation mask, method of fabricating organic electroluminescent device using the same, and organic electroluminescent device
US8334649B2 (en) 2002-11-29 2012-12-18 Samsung Display Co., Ltd. Evaporation mask, method of fabricating organic electroluminescent device using the same, and organic electroluminescent device
KR100922753B1 (en) * 2002-11-29 2009-10-21 삼성모바일디스플레이주식회사 Mask for an evaporation, method of manufacturing an organic electroluminesence device thereused and organic electroluminesence device
JP4506214B2 (en) * 2003-03-13 2010-07-21 東レ株式会社 Organic electroluminescent device and manufacturing method thereof
JP2004296436A (en) * 2003-03-13 2004-10-21 Toray Ind Inc Organic electroluminescent device, and manufacturing method of the same
KR100986787B1 (en) * 2003-03-19 2010-10-12 도호꾸 파이오니어 가부시끼가이샤 Film formation mask, organic el panel, and method of manufacturing the organic el panel
US7821199B2 (en) 2004-09-08 2010-10-26 Toray Industries, Inc. Organic electroluminescent device and manufacturing method thereof
WO2006027830A1 (en) * 2004-09-08 2006-03-16 Toray Industries, Inc. Organic electroluminescent device and manufacturing method thereof
KR100814818B1 (en) 2006-07-31 2008-03-20 삼성에스디아이 주식회사 Mask for manufacturing organic light emitting display
KR100880944B1 (en) 2007-10-01 2009-02-04 엘지디스플레이 주식회사 Organic lighting emitting display device
JP2013019026A (en) * 2011-07-12 2013-01-31 Toyota Motor Corp Mask for selectively depositing film
JP2014125671A (en) * 2012-12-27 2014-07-07 V Technology Co Ltd Vapor deposition mask, and manufacturing method of the same
WO2019003534A1 (en) * 2017-06-28 2019-01-03 株式会社ジャパンディスプレイ Vapor deposition mask
JP2019007069A (en) * 2017-06-28 2019-01-17 株式会社ジャパンディスプレイ Vapor deposition mask
JP6998139B2 (en) 2017-06-28 2022-01-18 株式会社ジャパンディスプレイ Vapor deposition mask
US20210108310A1 (en) * 2018-03-20 2021-04-15 Sharp Kabushiki Kaisha Film forming mask and method of manufacturing display device using same
US11655536B2 (en) * 2018-03-20 2023-05-23 Sharp Kabushiki Kaisha Film forming mask and method of manufacturing display device using same

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